FI932625A - Anordning och foerfarande foer detektering av ytfel i laonga, i roerelse befintliga metallprodukter - Google Patents
Anordning och foerfarande foer detektering av ytfel i laonga, i roerelse befintliga metallprodukter Download PDFInfo
- Publication number
- FI932625A FI932625A FI932625A FI932625A FI932625A FI 932625 A FI932625 A FI 932625A FI 932625 A FI932625 A FI 932625A FI 932625 A FI932625 A FI 932625A FI 932625 A FI932625 A FI 932625A
- Authority
- FI
- Finland
- Prior art keywords
- detection
- production
- metal products
- products
- metal
- Prior art date
Links
- 238000001514 detection method Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/102—Video camera
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10016—Video; Image sequence
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30136—Metal
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Textile Engineering (AREA)
- Health & Medical Sciences (AREA)
- Quality & Reliability (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9206987A FR2692355B1 (fr) | 1992-06-10 | 1992-06-10 | Dispositif et procede de detection au defile de defauts de surface sur des produits longs metalliques. |
Publications (2)
Publication Number | Publication Date |
---|---|
FI932625A0 FI932625A0 (fi) | 1993-06-09 |
FI932625A true FI932625A (fi) | 1993-12-11 |
Family
ID=9430583
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI932625A FI932625A (fi) | 1992-06-10 | 1993-06-09 | Anordning och foerfarande foer detektering av ytfel i laonga, i roerelse befintliga metallprodukter |
Country Status (5)
Country | Link |
---|---|
US (1) | US5408104A (fi) |
EP (1) | EP0574336B1 (fi) |
DE (1) | DE69326914D1 (fi) |
FI (1) | FI932625A (fi) |
FR (1) | FR2692355B1 (fi) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB9219550D0 (en) * | 1992-09-16 | 1992-10-28 | British Nuclear Fuels Plc | The inspection of cylindrical |
JPH07131779A (ja) * | 1993-09-10 | 1995-05-19 | Sony Corp | 図形検査方法及び図形検査装置 |
DE19636864C1 (de) * | 1996-09-11 | 1998-01-02 | Philips Patentverwaltung | Längendetektion von schräglaufenden Kratzern |
PT836093E (pt) * | 1996-10-10 | 2004-06-30 | Elpatronic Ag | Processo e dispositivo para a verificacao optica de costuras de soldadura |
JP4096533B2 (ja) * | 2001-08-31 | 2008-06-04 | 松下電工株式会社 | 画像処理検査システム |
US20030118230A1 (en) * | 2001-12-22 | 2003-06-26 | Haoshi Song | Coiled tubing inspection system using image pattern recognition |
DE10351925B4 (de) * | 2003-11-07 | 2005-11-17 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren und Vorrichtung zur Erkennung von Oberflächenfehlern |
FR2864623B1 (fr) * | 2003-12-26 | 2006-08-04 | Renault Sas | Procede et installation pour le controle automatique d'une soudure d'un assemblage de pieces |
EP2461157B1 (en) * | 2005-04-21 | 2018-10-03 | Sumitomo Electric Industries, Ltd. | Superconducting wire inspection device and inspection method |
CN100390530C (zh) * | 2005-05-31 | 2008-05-28 | 哈尔滨工业大学 | 线阵图像式带钢表面在线缺陷检测装置及其检测方法 |
US8265373B2 (en) * | 2007-06-15 | 2012-09-11 | The Yokohama Rubber Co., Ltd. | Method and apparatus for inspecting appearance of long-length objects |
JP2011107024A (ja) * | 2009-11-19 | 2011-06-02 | Sumitomo Wiring Syst Ltd | 筒形圧着端子の外観検査装置 |
ITRM20110623A1 (it) * | 2011-11-25 | 2013-05-26 | Ct Sviluppo Materiali Spa | Metodo di ispezione superficiale per prodotti lunghi ed apparato idoneo alla sua realizzazione. |
CN103091332B (zh) * | 2013-01-16 | 2014-09-24 | 浙江科技学院 | 一种基于机器视觉的u型粉管的检测方法及其检测系统 |
CN104646993B (zh) * | 2015-02-09 | 2017-02-01 | 浙江拓峰科技有限公司 | 一种夹桩自动上料及质量检测装置 |
CN105158259A (zh) * | 2015-08-14 | 2015-12-16 | 浙江江山三友电子有限公司 | 灯丝涂粉质量实时检测装置 |
ITUB20155646A1 (it) * | 2015-11-18 | 2017-05-18 | Gd Spa | Metodo di ispezione di un elemento allungato. |
ITUB20155673A1 (it) * | 2015-11-18 | 2017-05-18 | Gd Spa | Unita di ispezione di un elemento allungato. |
US20190096057A1 (en) | 2017-05-11 | 2019-03-28 | Jacob Nathaniel Allen | Object inspection system and method for inspecting an object |
DE202023105500U1 (de) | 2023-09-21 | 2023-10-17 | Gesellschaft zur Förderung angewandter Informatik e. V. | Vorrichtung zum Erkennen von Fehlern einer umfangseitigen Oberfläche eines durch die Vorrichtung hindurchgeführten metallischen Langprodukts |
CN117705821B (zh) * | 2024-02-05 | 2024-04-16 | 烟台西蒙西塑料包装品有限公司 | 复合软管缺陷红外检测装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3412503A1 (de) * | 1984-04-03 | 1985-10-10 | Siemens AG, 1000 Berlin und 8000 München | Verfahren und vorrichtung zur auswertung eines mit einem bildwandler erfassten videobildes |
US4817184A (en) * | 1986-04-14 | 1989-03-28 | Vartec Corporation | Electronic inspection system and methods of inspection |
GB8822183D0 (en) * | 1988-09-21 | 1988-10-26 | Radix Systems Ltd | Method & apparatus for processing line scan optical images |
DE69008623T2 (de) * | 1989-06-30 | 1994-08-18 | Jaguar Cars | Verfahren und Vorrichtung zur Untersuchung von Oberflächenfehlern. |
GB9024936D0 (en) * | 1990-11-16 | 1991-01-02 | Leicester Polytechnic | Methods and apparatus for fabric inspection |
-
1992
- 1992-06-10 FR FR9206987A patent/FR2692355B1/fr not_active Expired - Fee Related
-
1993
- 1993-06-08 EP EP93420232A patent/EP0574336B1/fr not_active Expired - Lifetime
- 1993-06-08 DE DE69326914T patent/DE69326914D1/de not_active Expired - Lifetime
- 1993-06-09 FI FI932625A patent/FI932625A/fi unknown
- 1993-06-10 US US08/074,404 patent/US5408104A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
FR2692355A1 (fr) | 1993-12-17 |
US5408104A (en) | 1995-04-18 |
FR2692355B1 (fr) | 1997-06-20 |
EP0574336A1 (fr) | 1993-12-15 |
FI932625A0 (fi) | 1993-06-09 |
DE69326914D1 (de) | 1999-12-09 |
EP0574336B1 (fr) | 1999-11-03 |
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