FI873291A - Laite koeliuskan koekenttien aseman toteamiseksi ja liuskan kääntämiseksi - Google Patents

Laite koeliuskan koekenttien aseman toteamiseksi ja liuskan kääntämiseksi Download PDF

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Publication number
FI873291A
FI873291A FI873291A FI873291A FI873291A FI 873291 A FI873291 A FI 873291A FI 873291 A FI873291 A FI 873291A FI 873291 A FI873291 A FI 873291A FI 873291 A FI873291 A FI 873291A
Authority
FI
Finland
Prior art keywords
strip
guide
test
turning
determining
Prior art date
Application number
FI873291A
Other languages
English (en)
Swedish (sv)
Other versions
FI91450B (fi
FI873291A0 (fi
FI91450C (fi
Inventor
Juergen Gross
Ruediger Simonek
Original Assignee
Hoechst Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoechst Ag filed Critical Hoechst Ag
Publication of FI873291A0 publication Critical patent/FI873291A0/fi
Publication of FI873291A publication Critical patent/FI873291A/fi
Publication of FI91450B publication Critical patent/FI91450B/fi
Application granted granted Critical
Publication of FI91450C publication Critical patent/FI91450C/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00039—Transport arrangements specific to flat sample substrates, e.g. pusher blade
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00099—Characterised by type of test elements
    • G01N2035/00108—Test strips, e.g. paper

Landscapes

  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Controlling Rewinding, Feeding, Winding, Or Abnormalities Of Webs (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Slide Fasteners (AREA)
  • Manufacture Of Motors, Generators (AREA)
  • Wire Bonding (AREA)
  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
FI873291A 1986-07-30 1987-07-28 Laite koeliuskan koekenttien aseman toteamiseksi ja liuskan kääntämiseksi FI91450C (fi)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3625704 1986-07-30
DE19863625704 DE3625704A1 (de) 1986-07-30 1986-07-30 Vorrichtung zum feststellen der lage der testfelder eines teststreifens und wenden desselben

Publications (4)

Publication Number Publication Date
FI873291A0 FI873291A0 (fi) 1987-07-28
FI873291A true FI873291A (fi) 1988-01-31
FI91450B FI91450B (fi) 1994-03-15
FI91450C FI91450C (fi) 1994-06-27

Family

ID=6306265

Family Applications (1)

Application Number Title Priority Date Filing Date
FI873291A FI91450C (fi) 1986-07-30 1987-07-28 Laite koeliuskan koekenttien aseman toteamiseksi ja liuskan kääntämiseksi

Country Status (11)

Country Link
US (1) US4972935A (fi)
EP (1) EP0255077B1 (fi)
JP (1) JPS6337244A (fi)
AT (1) ATE85708T1 (fi)
AU (1) AU7624387A (fi)
CA (1) CA1321160C (fi)
DE (2) DE3625704A1 (fi)
DK (1) DK167129B1 (fi)
ES (1) ES2039383T3 (fi)
FI (1) FI91450C (fi)
NO (1) NO172366C (fi)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3807565A1 (de) * 1988-03-08 1989-09-21 Boehringer Mannheim Gmbh Vorrichtung zur ueberfuehrung von teststreifen zu einer untersuchungseinrichtung
DE8804264U1 (de) * 1988-03-29 1988-05-19 Boehringer Mannheim Gmbh, 6800 Mannheim Vorrichtung zur Überführung eines Teststreifens von einer ersten Unterlage zu einer zweiten Unterlage
DE3844105A1 (de) * 1988-12-28 1990-07-05 Boehringer Mannheim Gmbh Testtraeger-analysesystem
GB9018608D0 (en) * 1989-08-30 2013-11-13 Texas Instruments Inc Durable wideband anti-reflection coating for infrared windows
US5133636A (en) * 1990-05-08 1992-07-28 International Business Machines Corporation System for chip orientation
JP2771367B2 (ja) * 1991-11-14 1998-07-02 株式会社日立製作所 試験片供給装置およびそれを用いた分析装置
DE4204245A1 (de) * 1992-02-13 1993-08-19 Boehringer Mannheim Gmbh Vorrichtung zum lagerichtigen zufuehren von teststreifen zu einer analyseeinrichtung
DE4310583A1 (de) * 1993-03-31 1994-10-06 Boehringer Mannheim Gmbh Teststreifenanalysesystem
JP3331256B2 (ja) * 1994-05-10 2002-10-07 バイエルコーポレーション 試験片表裏判別手段
DE4431902C2 (de) * 1994-09-07 1997-04-30 Franz Gaertner Vereinzelungsvorrichtung
DE4438574A1 (de) * 1994-10-28 1996-05-02 Smr Sondermasch Ruhla Gmbh Vorrichtung zum Sortieren von Werkstücken
JP3557042B2 (ja) * 1996-04-19 2004-08-25 ペガサスミシン製造株式会社 生地片移送装置
JP4576549B2 (ja) * 2004-06-02 2010-11-10 アークレイ株式会社 分析用具の向き選択機構および分析装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH484432A (it) * 1966-10-29 1970-01-15 Vicario Guido Procedimento e apparecchiatura per l'esecuzione automatica di analisi chimiche
US3724648A (en) * 1971-04-14 1973-04-03 Sundstrand Engelberg Bar feeder apparatus
GB1485506A (en) * 1973-07-31 1977-09-14 Olympus Optical Co System for detecting the particular chemical composition of a fluid
JPS56413A (en) * 1979-06-14 1981-01-06 Bridgestone Corp Discharging method and apparatus for multilayer rubber dam
DE3625705A1 (de) * 1986-07-30 1988-02-11 Hoechst Ag Vorrichtung zum automatischen zufuehren von teststreifen in eine analysenapparatur

Also Published As

Publication number Publication date
JPS6337244A (ja) 1988-02-17
EP0255077A3 (en) 1989-06-14
NO172366B (no) 1993-03-29
AU7624387A (en) 1988-02-04
DK395787D0 (da) 1987-07-29
ATE85708T1 (de) 1993-02-15
US4972935A (en) 1990-11-27
FI91450B (fi) 1994-03-15
DK395787A (da) 1988-01-31
DK167129B1 (da) 1993-08-30
FI873291A0 (fi) 1987-07-28
DE3625704A1 (de) 1988-02-11
EP0255077A2 (de) 1988-02-03
CA1321160C (en) 1993-08-10
ES2039383T3 (es) 1993-10-01
DE3784113D1 (de) 1993-03-25
NO873179D0 (no) 1987-07-29
NO873179L (no) 1988-02-01
FI91450C (fi) 1994-06-27
EP0255077B1 (de) 1993-02-10
NO172366C (no) 1993-07-07

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Legal Events

Date Code Title Description
BB Publication of examined application
MM Patent lapsed
MM Patent lapsed

Owner name: HOECHST AKTIENGESELLSCHAFT