DK395787A - Apparat til konstatering af beliggenheden af testomraader paa en teststrimmel, og til vending af denne - Google Patents

Apparat til konstatering af beliggenheden af testomraader paa en teststrimmel, og til vending af denne

Info

Publication number
DK395787A
DK395787A DK395787A DK395787A DK395787A DK 395787 A DK395787 A DK 395787A DK 395787 A DK395787 A DK 395787A DK 395787 A DK395787 A DK 395787A DK 395787 A DK395787 A DK 395787A
Authority
DK
Denmark
Prior art keywords
guide
turning
test
location
determining
Prior art date
Application number
DK395787A
Other languages
English (en)
Other versions
DK395787D0 (da
DK167129B1 (da
Inventor
Juergen Gross
Ruediger Simonek
Original Assignee
Hoechst Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoechst Ag filed Critical Hoechst Ag
Publication of DK395787D0 publication Critical patent/DK395787D0/da
Publication of DK395787A publication Critical patent/DK395787A/da
Application granted granted Critical
Publication of DK167129B1 publication Critical patent/DK167129B1/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00039—Transport arrangements specific to flat sample substrates, e.g. pusher blade
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00099—Characterised by type of test elements
    • G01N2035/00108—Test strips, e.g. paper

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Controlling Rewinding, Feeding, Winding, Or Abnormalities Of Webs (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Wire Bonding (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Slide Fasteners (AREA)
  • Manufacture Of Motors, Generators (AREA)
DK395787A 1986-07-30 1987-07-29 Apparat til konstatering af beliggenheden af testomraader paa en teststrimmel, og til vending af denne DK167129B1 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3625704 1986-07-30
DE19863625704 DE3625704A1 (de) 1986-07-30 1986-07-30 Vorrichtung zum feststellen der lage der testfelder eines teststreifens und wenden desselben

Publications (3)

Publication Number Publication Date
DK395787D0 DK395787D0 (da) 1987-07-29
DK395787A true DK395787A (da) 1988-01-31
DK167129B1 DK167129B1 (da) 1993-08-30

Family

ID=6306265

Family Applications (1)

Application Number Title Priority Date Filing Date
DK395787A DK167129B1 (da) 1986-07-30 1987-07-29 Apparat til konstatering af beliggenheden af testomraader paa en teststrimmel, og til vending af denne

Country Status (11)

Country Link
US (1) US4972935A (da)
EP (1) EP0255077B1 (da)
JP (1) JPS6337244A (da)
AT (1) ATE85708T1 (da)
AU (1) AU7624387A (da)
CA (1) CA1321160C (da)
DE (2) DE3625704A1 (da)
DK (1) DK167129B1 (da)
ES (1) ES2039383T3 (da)
FI (1) FI91450C (da)
NO (1) NO172366C (da)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3807565A1 (de) * 1988-03-08 1989-09-21 Boehringer Mannheim Gmbh Vorrichtung zur ueberfuehrung von teststreifen zu einer untersuchungseinrichtung
DE8804264U1 (de) * 1988-03-29 1988-05-19 Boehringer Mannheim Gmbh, 6800 Mannheim Vorrichtung zur Überführung eines Teststreifens von einer ersten Unterlage zu einer zweiten Unterlage
DE3844105A1 (de) * 1988-12-28 1990-07-05 Boehringer Mannheim Gmbh Testtraeger-analysesystem
GB9018608D0 (en) * 1989-08-30 2013-11-13 Texas Instruments Inc Durable wideband anti-reflection coating for infrared windows
US5133636A (en) * 1990-05-08 1992-07-28 International Business Machines Corporation System for chip orientation
JP2771367B2 (ja) * 1991-11-14 1998-07-02 株式会社日立製作所 試験片供給装置およびそれを用いた分析装置
DE4204245A1 (de) * 1992-02-13 1993-08-19 Boehringer Mannheim Gmbh Vorrichtung zum lagerichtigen zufuehren von teststreifen zu einer analyseeinrichtung
DE4310583A1 (de) * 1993-03-31 1994-10-06 Boehringer Mannheim Gmbh Teststreifenanalysesystem
JP3331256B2 (ja) * 1994-05-10 2002-10-07 バイエルコーポレーション 試験片表裏判別手段
DE4431902C2 (de) * 1994-09-07 1997-04-30 Franz Gaertner Vereinzelungsvorrichtung
DE4438574A1 (de) * 1994-10-28 1996-05-02 Smr Sondermasch Ruhla Gmbh Vorrichtung zum Sortieren von Werkstücken
JP3557042B2 (ja) * 1996-04-19 2004-08-25 ペガサスミシン製造株式会社 生地片移送装置
WO2005119268A1 (ja) * 2004-06-02 2005-12-15 Arkray, Inc. 分析用具の向き選択機構および分析装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1551104A (da) * 1966-10-29 1968-12-27
US3724648A (en) * 1971-04-14 1973-04-03 Sundstrand Engelberg Bar feeder apparatus
GB1485508A (en) * 1973-07-31 1977-09-14 Olympus Optical Co System for detecting the chemical composition of a fluid
JPS56413A (en) * 1979-06-14 1981-01-06 Bridgestone Corp Discharging method and apparatus for multilayer rubber dam
DE3625705A1 (de) * 1986-07-30 1988-02-11 Hoechst Ag Vorrichtung zum automatischen zufuehren von teststreifen in eine analysenapparatur

Also Published As

Publication number Publication date
AU7624387A (en) 1988-02-04
EP0255077A3 (en) 1989-06-14
NO873179D0 (no) 1987-07-29
EP0255077B1 (de) 1993-02-10
FI91450B (fi) 1994-03-15
FI873291A0 (fi) 1987-07-28
ES2039383T3 (es) 1993-10-01
NO873179L (no) 1988-02-01
CA1321160C (en) 1993-08-10
NO172366C (no) 1993-07-07
DK395787D0 (da) 1987-07-29
US4972935A (en) 1990-11-27
FI873291A (fi) 1988-01-31
FI91450C (fi) 1994-06-27
DE3784113D1 (de) 1993-03-25
NO172366B (no) 1993-03-29
JPS6337244A (ja) 1988-02-17
DK167129B1 (da) 1993-08-30
DE3625704A1 (de) 1988-02-11
EP0255077A2 (de) 1988-02-03
ATE85708T1 (de) 1993-02-15

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Legal Events

Date Code Title Description
B1 Patent granted (law 1993)
PBP Patent lapsed