FI864307A0 - Anordning och foerfarande foer avsaettning av skuggmaskade tunnfilmsmoenster. - Google Patents
Anordning och foerfarande foer avsaettning av skuggmaskade tunnfilmsmoenster.Info
- Publication number
- FI864307A0 FI864307A0 FI864307A FI864307A FI864307A0 FI 864307 A0 FI864307 A0 FI 864307A0 FI 864307 A FI864307 A FI 864307A FI 864307 A FI864307 A FI 864307A FI 864307 A0 FI864307 A0 FI 864307A0
- Authority
- FI
- Finland
- Prior art keywords
- tunnfilmsmoenster
- skuggmaskade
- avsaettning
- anordination
- faring equipment
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
- C23C14/042—Coating on selected surface areas, e.g. using masks using masks
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/04—Coating on selected surface areas, e.g. using masks
- C23C16/042—Coating on selected surface areas, e.g. using masks using masks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
- H01L21/682—Mask-wafer alignment
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Physical Vapour Deposition (AREA)
- Electroluminescent Light Sources (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/790,695 US4746548A (en) | 1985-10-23 | 1985-10-23 | Method for registration of shadow masked thin-film patterns |
US79069585 | 1985-10-23 |
Publications (4)
Publication Number | Publication Date |
---|---|
FI864307A0 true FI864307A0 (fi) | 1986-10-23 |
FI864307A FI864307A (fi) | 1987-04-24 |
FI82845B FI82845B (fi) | 1991-01-15 |
FI82845C FI82845C (fi) | 1991-04-25 |
Family
ID=25151490
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI864307A FI82845C (fi) | 1985-10-23 | 1986-10-23 | Anordning och foerfarande foer att rikta in figurer av tunnfilmsstruktur. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4746548A (fi) |
EP (1) | EP0220685A3 (fi) |
JP (1) | JPS6299782A (fi) |
CA (1) | CA1283281C (fi) |
FI (1) | FI82845C (fi) |
Families Citing this family (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4952420A (en) * | 1988-10-12 | 1990-08-28 | Advanced Dielectric Technologies, Inc. | Vapor deposition patterning method |
DE3925085C1 (fi) * | 1989-07-28 | 1991-01-10 | Battelle-Institut Ev, 6000 Frankfurt, De | |
US5296916A (en) * | 1991-04-18 | 1994-03-22 | International Business Machines Corp. | Mask alignment system for components with extremely sensitive surfaces |
US5272502A (en) * | 1991-07-31 | 1993-12-21 | Minoru Saiki | Double-surface concurrent exposure device |
JPH05290970A (ja) * | 1992-04-14 | 1993-11-05 | Fuji Electric Co Ltd | 薄膜エレクトロルミネセンス素子の製造方法 |
DE4302851A1 (de) * | 1993-02-02 | 1994-08-04 | Leybold Ag | Vorrichtung zum Anbringen und/oder Entfernen einer Maske an einem Substrat |
US6780465B2 (en) * | 2000-12-28 | 2004-08-24 | Seiko Epson Corporation | Method for making thin film and electronic apparatus |
US6581278B2 (en) * | 2001-01-16 | 2003-06-24 | St Assembly Test Service Ltd. | Process and support carrier for flexible substrates |
TW560102B (en) * | 2001-09-12 | 2003-11-01 | Itn Energy Systems Inc | Thin-film electrochemical devices on fibrous or ribbon-like substrates and methd for their manufacture and design |
US20030068559A1 (en) * | 2001-09-12 | 2003-04-10 | Armstrong Joseph H. | Apparatus and method for the design and manufacture of multifunctional composite materials with power integration |
US6821348B2 (en) * | 2002-02-14 | 2004-11-23 | 3M Innovative Properties Company | In-line deposition processes for circuit fabrication |
US20030151118A1 (en) * | 2002-02-14 | 2003-08-14 | 3M Innovative Properties Company | Aperture masks for circuit fabrication |
US6897164B2 (en) * | 2002-02-14 | 2005-05-24 | 3M Innovative Properties Company | Aperture masks for circuit fabrication |
US7006202B2 (en) * | 2002-02-21 | 2006-02-28 | Lg.Philips Lcd Co., Ltd. | Mask holder for irradiating UV-rays |
KR100480705B1 (ko) * | 2002-07-03 | 2005-04-06 | 엘지전자 주식회사 | 유기 el 소자 제작용 새도우 마스크 및 그 제조 방법 |
US7410919B2 (en) * | 2003-06-27 | 2008-08-12 | International Business Machines Corporation | Mask and substrate alignment for solder bump process |
US20060086321A1 (en) * | 2004-10-22 | 2006-04-27 | Advantech Global, Ltd | Substrate-to-mask alignment and securing system with temperature control for use in an automated shadow mask vacuum deposition process |
JP4331707B2 (ja) * | 2004-12-16 | 2009-09-16 | 三星モバイルディスプレイ株式會社 | 整列システム、垂直型トレイ移送装置及びこれを具備した蒸着装置 |
US20070137568A1 (en) * | 2005-12-16 | 2007-06-21 | Schreiber Brian E | Reciprocating aperture mask system and method |
US7763114B2 (en) * | 2005-12-28 | 2010-07-27 | 3M Innovative Properties Company | Rotatable aperture mask assembly and deposition system |
US20070262326A1 (en) * | 2006-05-10 | 2007-11-15 | Touchtek Corporation | LED multi-layer metals primary electrodes manufacturing process & installation |
US7690104B2 (en) * | 2008-02-20 | 2010-04-06 | Apple Inc. | Technique for reducing wasted material on a printed circuit board panel |
US20110107964A1 (en) * | 2009-11-10 | 2011-05-12 | Molten Corporation | Object Holding Apparatus |
US20130092085A1 (en) * | 2011-10-17 | 2013-04-18 | Synos Technology, Inc. | Linear atomic layer deposition apparatus |
US9051637B2 (en) * | 2011-11-10 | 2015-06-09 | Veeco Ald Inc. | Securing of shadow mask and substrate on susceptor of deposition apparatus |
US9579680B2 (en) * | 2013-01-31 | 2017-02-28 | Wki Holding Company, Inc. | Self-centering magnetic masking system |
US20140240859A1 (en) * | 2013-02-28 | 2014-08-28 | Corning Incorporated | Optic obscuration assembly, method and system for working on an optical element, and resulting optical element |
CN103882375B (zh) * | 2014-03-12 | 2016-03-09 | 京东方科技集团股份有限公司 | 一种掩膜板及其制作方法 |
WO2017129245A1 (en) * | 2016-01-28 | 2017-08-03 | Applied Materials, Inc. | Mask arrangement for masking a substrate and method for aligning a mask to a substrate |
US11715662B2 (en) * | 2020-12-11 | 2023-08-01 | Applied Materials, Inc. | Actively clamped carrier assembly for processing tools |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3510349A (en) * | 1966-11-15 | 1970-05-05 | Us Air Force | Vacuum deposited interconnection matrix |
US3678892A (en) * | 1970-05-19 | 1972-07-25 | Western Electric Co | Pallet and mask for substrates |
US4013502A (en) * | 1973-06-18 | 1977-03-22 | Texas Instruments Incorporated | Stencil process for high resolution pattern replication |
US4096821A (en) * | 1976-12-13 | 1978-06-27 | Westinghouse Electric Corp. | System for fabricating thin-film electronic components |
JPS54103552A (en) * | 1978-02-01 | 1979-08-15 | Hitachi Electronics | Pattern formation method |
US4344988A (en) * | 1978-08-01 | 1982-08-17 | Nippon Sheet Glass Co., Ltd. | Method for forming patterned coating |
US4303489A (en) * | 1978-08-21 | 1981-12-01 | Vac-Tec Systems, Inc. | Method and apparatus for producing a variable intensity pattern of sputtering material on a substrate |
US4278710A (en) * | 1979-08-27 | 1981-07-14 | The United States Of America As Represented By The Secretary Of The Navy | Apparatus and method for submicron pattern generation |
US4305801A (en) * | 1980-04-16 | 1981-12-15 | The United States Of America As Represented By The United States Department Of Energy | Line-of-sight deposition method |
JPS5754265A (ja) * | 1980-09-18 | 1982-03-31 | Toshiba Corp | Kinzokuhimakukeiseihoho |
US4335161A (en) * | 1980-11-03 | 1982-06-15 | Xerox Corporation | Thin film transistors, thin film transistor arrays, and a process for preparing the same |
US4492180A (en) * | 1981-03-16 | 1985-01-08 | Applied Magnetics Corporation | Apparatus for indexing and registering a selected deposition mask to a substrate and method therefor |
US4511599A (en) * | 1983-03-01 | 1985-04-16 | Sigmatron Associates | Mask for vacuum depositing back metal electrodes on EL panel |
JPS59190358A (ja) * | 1983-04-12 | 1984-10-29 | Fujitsu Ltd | マスク蒸着装置のパタ−ン合わせ構造 |
US4615781A (en) * | 1985-10-23 | 1986-10-07 | Gte Products Corporation | Mask assembly having mask stress relieving feature |
-
1985
- 1985-10-23 US US06/790,695 patent/US4746548A/en not_active Expired - Lifetime
-
1986
- 1986-10-07 CA CA000519971A patent/CA1283281C/en not_active Expired - Lifetime
- 1986-10-22 JP JP61249799A patent/JPS6299782A/ja active Pending
- 1986-10-23 FI FI864307A patent/FI82845C/fi not_active IP Right Cessation
- 1986-10-23 EP EP86114727A patent/EP0220685A3/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
US4746548A (en) | 1988-05-24 |
FI82845B (fi) | 1991-01-15 |
JPS6299782A (ja) | 1987-05-09 |
EP0220685A2 (en) | 1987-05-06 |
FI82845C (fi) | 1991-04-25 |
FI864307A (fi) | 1987-04-24 |
CA1283281C (en) | 1991-04-23 |
EP0220685A3 (en) | 1989-03-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM | Patent lapsed |
Owner name: GTE PRODUCTS CORPORATION |