FI850840L - Anordning foer bestaemning av den diffusa reflektionsfoermaogan hos en provyta smao dimensioner. - Google Patents

Anordning foer bestaemning av den diffusa reflektionsfoermaogan hos en provyta smao dimensioner.

Info

Publication number
FI850840L
FI850840L FI850840A FI850840A FI850840L FI 850840 L FI850840 L FI 850840L FI 850840 A FI850840 A FI 850840A FI 850840 A FI850840 A FI 850840A FI 850840 L FI850840 L FI 850840L
Authority
FI
Finland
Prior art keywords
light
sample surface
emitter
determining
reflections
Prior art date
Application number
FI850840A
Other languages
English (en)
Other versions
FI850840A0 (fi
Inventor
Werner Strohmeier
Dieter Knoll
Erich Haendler
Original Assignee
Boehringer Mannheim Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Boehringer Mannheim Gmbh filed Critical Boehringer Mannheim Gmbh
Publication of FI850840A0 publication Critical patent/FI850840A0/fi
Publication of FI850840L publication Critical patent/FI850840L/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8483—Investigating reagent band
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J1/1626—Arrangements with two photodetectors, the signals of which are compared
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/34—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker
    • G01J1/36—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N2021/4776—Miscellaneous in diffuse reflection devices
    • G01N2021/478—Application in testing analytical test strips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's

Landscapes

  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Molecular Biology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FI850840A 1984-03-02 1985-03-01 Anordning foer bestaemning av den diffusa reflektionsfoermaogan hos en provyta smao dimensioner. FI850840L (fi)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19843407754 DE3407754A1 (de) 1984-03-02 1984-03-02 Geraet zur bestimmung des diffusen reflexionsvermoegens einer probenflaeche kleiner abmessungen

Publications (2)

Publication Number Publication Date
FI850840A0 FI850840A0 (fi) 1985-03-01
FI850840L true FI850840L (fi) 1985-09-03

Family

ID=6229432

Family Applications (1)

Application Number Title Priority Date Filing Date
FI850840A FI850840L (fi) 1984-03-02 1985-03-01 Anordning foer bestaemning av den diffusa reflektionsfoermaogan hos en provyta smao dimensioner.

Country Status (10)

Country Link
US (1) US4676653A (fi)
EP (1) EP0154875B1 (fi)
JP (1) JPS60205239A (fi)
KR (1) KR850006894A (fi)
AT (1) ATE34044T1 (fi)
AU (1) AU556377B2 (fi)
CA (1) CA1224640A (fi)
DE (2) DE3407754A1 (fi)
ES (1) ES8606643A1 (fi)
FI (1) FI850840L (fi)

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Also Published As

Publication number Publication date
EP0154875A3 (en) 1986-03-12
AU3911185A (en) 1985-09-05
DE3562534D1 (en) 1988-06-09
EP0154875A2 (de) 1985-09-18
ES540745A0 (es) 1986-04-16
DE3407754A1 (de) 1985-09-12
EP0154875B1 (de) 1988-05-04
ATE34044T1 (de) 1988-05-15
CA1224640A (en) 1987-07-28
KR850006894A (ko) 1985-10-21
JPS60205239A (ja) 1985-10-16
ES8606643A1 (es) 1986-04-16
US4676653A (en) 1987-06-30
FI850840A0 (fi) 1985-03-01
AU556377B2 (en) 1986-10-30

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