FI844219A0 - Maetningsfoerfarande foer impedanser, saerskilt smao kapacitanser, vid vilket man anvaender en eller flera referenser. - Google Patents

Maetningsfoerfarande foer impedanser, saerskilt smao kapacitanser, vid vilket man anvaender en eller flera referenser.

Info

Publication number
FI844219A0
FI844219A0 FI844219A FI844219A FI844219A0 FI 844219 A0 FI844219 A0 FI 844219A0 FI 844219 A FI844219 A FI 844219A FI 844219 A FI844219 A FI 844219A FI 844219 A0 FI844219 A0 FI 844219A0
Authority
FI
Finland
Prior art keywords
referenser
maetningsfoerfarande
kapacitanser
impedanser
anvaender
Prior art date
Application number
FI844219A
Other languages
English (en)
Other versions
FI70485B (fi
FI70485C (fi
Inventor
Matti Lyyra
Original Assignee
Vaisala Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vaisala Oy filed Critical Vaisala Oy
Priority to FI844219A priority Critical patent/FI70485C/fi
Publication of FI844219A0 publication Critical patent/FI844219A0/fi
Priority to EP85850329A priority patent/EP0186635A1/en
Priority to JP60239238A priority patent/JPS61112971A/ja
Priority to US06/791,911 priority patent/US4751654A/en
Publication of FI70485B publication Critical patent/FI70485B/fi
Application granted granted Critical
Publication of FI70485C publication Critical patent/FI70485C/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/005—Circuits for altering the indicating characteristic, e.g. making it non-linear

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Measuring Fluid Pressure (AREA)
FI844219A 1984-10-26 1984-10-26 Maetningsfoerfarande foer impedanser saerskilt smao kapacitanser vid vilket man anvaender en eller flera referenser FI70485C (fi)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FI844219A FI70485C (fi) 1984-10-26 1984-10-26 Maetningsfoerfarande foer impedanser saerskilt smao kapacitanser vid vilket man anvaender en eller flera referenser
EP85850329A EP0186635A1 (en) 1984-10-26 1985-10-22 A method of measuring impedances, particularly low capacitances, by using one or more references
JP60239238A JPS61112971A (ja) 1984-10-26 1985-10-25 １個もしくはそれ以上の基準を用いてインピーダンス、特に低容量を測定するインピーダンス測定方法
US06/791,911 US4751654A (en) 1984-10-26 1985-10-28 Method of and arrangement for measuring impedances in measuring circuits having programmed memory

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI844219 1984-10-26
FI844219A FI70485C (fi) 1984-10-26 1984-10-26 Maetningsfoerfarande foer impedanser saerskilt smao kapacitanser vid vilket man anvaender en eller flera referenser

Publications (3)

Publication Number Publication Date
FI844219A0 true FI844219A0 (fi) 1984-10-26
FI70485B FI70485B (fi) 1986-03-27
FI70485C FI70485C (fi) 1986-09-19

Family

ID=8519794

Family Applications (1)

Application Number Title Priority Date Filing Date
FI844219A FI70485C (fi) 1984-10-26 1984-10-26 Maetningsfoerfarande foer impedanser saerskilt smao kapacitanser vid vilket man anvaender en eller flera referenser

Country Status (4)

Country Link
US (1) US4751654A (fi)
EP (1) EP0186635A1 (fi)
JP (1) JPS61112971A (fi)
FI (1) FI70485C (fi)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4860232A (en) * 1987-04-22 1989-08-22 Massachusetts Institute Of Technology Digital technique for precise measurement of variable capacitance
JP2670297B2 (ja) * 1988-06-08 1997-10-29 株式会社テック 電気掃除機の基準出力設定方法
US5034757A (en) * 1989-10-02 1991-07-23 Xerox Corporation LED printing array current control
JPH04231814A (ja) * 1990-09-13 1992-08-20 Sumitomo Electric Ind Ltd 光ファイバジャイロ
EP0481127B1 (en) * 1990-10-15 1994-03-02 Roberto Bruttini A digital and programmable measuring and control instrument, particularly for non-linear signals
JPH0560712A (ja) * 1991-09-05 1993-03-12 Nippon Steel Corp 気体中の水分濃度測定方法
US5499023A (en) * 1992-05-27 1996-03-12 Kaye Instruments, Inc. Method of and apparatus for automated sensor diagnosis through quantitative measurement of one of sensor-to-earth conductance or loop resistance
IT1266369B1 (it) * 1993-05-25 1996-12-27 Weber Srl Unita' di misura e conversione.
DE4418176A1 (de) * 1994-05-25 1996-02-15 Thomson Brandt Gmbh Meßeinrichtung mit linearer bzw. digitaler Meßwertsignalausgabe für Meßobjekte nichtlinearer Meßwertänderungscharakteristik
DE59409796D1 (de) * 1994-11-11 2001-08-09 Endress Hauser Gmbh Co Anordnung zur Linearisierung und Temperaturkompensation von Sensorsignalen
US5821742A (en) * 1994-11-30 1998-10-13 Utility Test Equipment Company Computerized solid state energy meter test system and method of testing
CH690202A5 (de) * 1994-12-27 2000-05-31 Gegauf Fritz Ag Messanordnung, Messfühlerr für dieselbe und Verfahren zur Herstellung der- bzw. desselben.
JP3851375B2 (ja) * 1996-04-18 2006-11-29 アジレント・テクノロジーズ・インク インピーダンス測定装置
US5792938A (en) * 1996-12-13 1998-08-11 Panametrics, Inc. Humidity sensor with differential thermal detection and method of sensing
WO2005033002A2 (en) * 2003-09-30 2005-04-14 The Research Foundation Of State University Of New York Device and method of partially separating gas
DE102005034672A1 (de) * 2005-07-25 2007-02-01 Siemens Ag Verfahren zum Betreiben eines digitalen Sensors
US10018613B2 (en) 2006-11-16 2018-07-10 General Electric Company Sensing system and method for analyzing a fluid at an industrial site
US10914698B2 (en) 2006-11-16 2021-02-09 General Electric Company Sensing method and system
US7911345B2 (en) * 2008-05-12 2011-03-22 General Electric Company Methods and systems for calibration of RFID sensors
JP6031889B2 (ja) * 2012-08-22 2016-11-24 富士通株式会社 計測装置及び計測方法
EP2757352B1 (fr) * 2013-01-17 2015-11-18 EM Microelectronic-Marin SA Système de contrôle et méthode de gestion de capteur
LU100901B1 (en) * 2018-08-08 2020-02-17 Iee Sa Method of Compensating Temperature Influence in Capacitive Measurements
DE112019002572T5 (de) * 2018-05-23 2021-03-11 Iee International Electronics & Engineering S.A. Verfahren zur Kompensation eines Temperatureinflusses bei kapazitiven Messungen
CN117330604B (zh) * 2023-12-01 2024-05-07 深圳市城市公共安全技术研究院有限公司 自动化温度补偿方法、装置、计算机设备及存储介质

Family Cites Families (21)

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US2591600A (en) * 1948-11-26 1952-04-01 Washington Inst Of Technology Radiosonde calibration method
US2753547A (en) * 1954-03-02 1956-07-03 Applied Science Corp Of Prince Compensated data transmission
US3480857A (en) * 1967-12-27 1969-11-25 Ibm Digital method and apparatus for measuring small inductances and capacitances
US3735371A (en) * 1971-06-02 1973-05-22 Sun Oil Co Pennsylvania Arrangement for multiplexing of a plurality of remotely-located capacitive probes
US3750155A (en) * 1971-08-03 1973-07-31 Johnson Service Co Temperature monitoring circuit
US4342089A (en) * 1976-09-02 1982-07-27 Genrad, Inc. Method of and apparatus for automatic measurement of circuit parameters with microprocessor calculation techniques
CH615503A5 (fi) * 1977-02-08 1980-01-31 Zumbach Electronic Ag
GB2006970B (en) * 1977-09-23 1982-03-31 Testut Aequitas Capacitance measuring device
FI54664C (fi) * 1977-10-14 1979-01-10 Vaisala Oy Elektronisk omkopplingstroemstaellare i synnerhet foer telemeteranvaendning i sonder
US4192005A (en) * 1977-11-21 1980-03-04 Kulite Semiconductor Products, Inc. Compensated pressure transducer employing digital processing techniques
US4195349A (en) * 1978-01-26 1980-03-25 Lynes, Inc. Self calibrating environmental condition sensing and recording apparatus
US4187459A (en) * 1978-02-13 1980-02-05 Automatic Systems Laboratories Limited Digital measurement of impedance ratios
US4295091B1 (en) * 1978-10-12 1995-08-15 Vaisala Oy Circuit for measuring low capacitances
CA1144986A (en) * 1980-08-20 1983-04-19 Canadian General Electric Company Limited Frequency determining apparatus
US4405990A (en) * 1981-05-26 1983-09-20 Caterpillar Tractor Co. Apparatus for determining the ratio of two signal repetition rates
JPS5829096A (ja) * 1981-08-13 1983-02-21 株式会社東芝 プロセス変数伝送器
US4481514A (en) * 1982-03-09 1984-11-06 Beukers Laboratories, Inc. Microprocessor based radiosonde
US4546441A (en) * 1982-07-22 1985-10-08 John Burch Method and apparatus for time based measurement of impedance
US4593370A (en) * 1982-07-26 1986-06-03 Hayati Balkanli Environmental measuring and recording apparatus
US4598381A (en) * 1983-03-24 1986-07-01 Rosemount Inc. Pressure compensated differential pressure sensor and method
US4592002A (en) * 1983-12-13 1986-05-27 Honeywell Inc. Method of digital temperature compensation and a digital data handling system utilizing the same

Also Published As

Publication number Publication date
JPS61112971A (ja) 1986-05-30
EP0186635A1 (en) 1986-07-02
FI70485B (fi) 1986-03-27
US4751654A (en) 1988-06-14
FI70485C (fi) 1986-09-19

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Legal Events

Date Code Title Description
MM Patent lapsed

Owner name: VAISALA OY