FI78356B - Metod foer maetning av fuktighet. - Google Patents

Metod foer maetning av fuktighet. Download PDF

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Publication number
FI78356B
FI78356B FI853529A FI853529A FI78356B FI 78356 B FI78356 B FI 78356B FI 853529 A FI853529 A FI 853529A FI 853529 A FI853529 A FI 853529A FI 78356 B FI78356 B FI 78356B
Authority
FI
Finland
Prior art keywords
opal
window
analyzer
measurement
material web
Prior art date
Application number
FI853529A
Other languages
English (en)
Finnish (fi)
Other versions
FI78356C (sv
FI853529L (fi
FI853529A0 (fi
Inventor
Pertti Puumalainen
Reijo Kuusela
Original Assignee
Puumalaisen Tutkimuslaitos Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Puumalaisen Tutkimuslaitos Oy filed Critical Puumalaisen Tutkimuslaitos Oy
Priority to FI853529A priority Critical patent/FI78356C/sv
Publication of FI853529A0 publication Critical patent/FI853529A0/fi
Priority to DE19873708141 priority patent/DE3708141A1/de
Priority to US07/026,219 priority patent/US4812665A/en
Publication of FI853529L publication Critical patent/FI853529L/fi
Application granted granted Critical
Publication of FI78356B publication Critical patent/FI78356B/fi
Publication of FI78356C publication Critical patent/FI78356C/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3554—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for determining moisture content
    • G01N21/3559—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for determining moisture content in sheets, e.g. in paper
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G01N2021/8609—Optical head specially adapted
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3554—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for determining moisture content

Claims (6)

1. Netod för mätande av fuktighet hos material, som tillver-kas i form av en massabana, i synnerhet papper eller mot-svarande, i vilken ur en pä ma terialbanans (1) ena sida placerad infrarödkälla (2) utsänds infrarödstrAlning, in-5 frarödsträlningen kapas i stycken (3), leds pa material-banan (1) genom ett opalfönster (6) för att sprida sträl-ningen och mäts frän ett annat, mellan materialbanan ooh analysatorerna (4, 5) placerat opalfönster (7) sälunda, att intensiteten hos den genom materialbanan kommande in-10 frarödsträlningens mätningsväglängd mäts med en mätnings-analysator (4) och att intensiteten hos infrarödsträlningens referensväglängd mäts med en referensanalysator (5) samtidigt, kännetecknad av, att vinkein mellan analysatorerna (4, 5) och det senare opalfönstret 15 ändras och analysatorerna stalls in i en sadan vinkel i förhällande tili det senare opalfönstret, att i mätningen erhllls för fuktigheten samma värde oberoende av material-banans ställning mellan opalfönstren. : 20
2. Metod i enlighet med patentkrav 1, känneteck nad av, att med mätningsanalysatorn och med referens-analysatorn betraktas alltid samma omräde pä opalfönstrets (7) yta.
3. Metod i enlighet med patentkrav 1 eller 2, kän netecknad av, att vinkein mellan mätningsanalysatorn och referensanalysatorn och/eller vinkein mellan vardera analysatorn och opalfönstret justeras oberoende av övriga regleringar för att uppnä samma värde för fuktig-30 heten vid att platsen för materialbanan byts tili en annan.
4. Metod i enlighet med nägot av patentkraven 1-3, kännetecknad av, att mätnings- och referensvägläng-derna är möjligast närä varandra, varvid materialbanans 35 fuktighet räknas ut med tillhjälp av kända kalibrerings-
FI853529A 1985-09-16 1985-09-16 Metod för mätning av fuktighet FI78356C (sv)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FI853529A FI78356C (sv) 1985-09-16 1985-09-16 Metod för mätning av fuktighet
DE19873708141 DE3708141A1 (de) 1985-09-16 1987-03-13 Feuchtigkeitsmessverfahren
US07/026,219 US4812665A (en) 1985-09-16 1987-03-16 Method and apparatus for measuring of humidity

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI853529A FI78356C (sv) 1985-09-16 1985-09-16 Metod för mätning av fuktighet
FI853529 1985-09-16

Publications (4)

Publication Number Publication Date
FI853529A0 FI853529A0 (fi) 1985-09-16
FI853529L FI853529L (fi) 1987-03-17
FI78356B true FI78356B (fi) 1989-03-31
FI78356C FI78356C (sv) 1989-07-10

Family

ID=8521346

Family Applications (1)

Application Number Title Priority Date Filing Date
FI853529A FI78356C (sv) 1985-09-16 1985-09-16 Metod för mätning av fuktighet

Country Status (3)

Country Link
US (1) US4812665A (sv)
DE (1) DE3708141A1 (sv)
FI (1) FI78356C (sv)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3027161B2 (ja) * 1989-07-14 2000-03-27 株式会社リコー 画像形成装置における画像濃度検知装置
DE4040101A1 (de) * 1990-12-14 1992-06-17 Siemens Ag Materialfeuchte-messverfahren, verwendung und messeinrichtung zur durchfuehrung des verfahrens
US5963336A (en) * 1995-10-10 1999-10-05 American Air Liquide Inc. Chamber effluent monitoring system and semiconductor processing system comprising absorption spectroscopy measurement system, and methods of use
US5742399A (en) * 1996-04-18 1998-04-21 American Air Liquide, Inc. Method for stabilizing the wavelength in a laser spectrometer system
US5818578A (en) * 1995-10-10 1998-10-06 American Air Liquide Inc. Polygonal planar multipass cell, system and apparatus including same, and method of use
US5949537A (en) 1996-04-18 1999-09-07 American Air Liquide Inc. In-line cell for absorption spectroscopy
US5880850A (en) * 1996-04-18 1999-03-09 American Air Liquide Inc Method and system for sensitive detection of molecular species in a vacuum by harmonic detection spectroscopy
DE19701904C2 (de) * 1997-01-21 2002-02-14 Michael Tummuscheit Vorrichtung zur quantitativen Bestimmung der Oberflächenfeuchte mit Hilfe eines kombinierten Verfahrens
US6442736B1 (en) 2000-10-03 2002-08-27 L'air Liquide Societe Anonyme A Directoire Et Conseil De Surveillance Pour L'etude Et L'expolitation Des Procedes Georges Claude Semiconductor processing system and method for controlling moisture level therein
DE10305598A1 (de) * 2003-02-11 2004-08-19 Voith Paper Patent Gmbh Messverfahren und Messeinrichtung zur Bestimmung des Feuchtigkeitsgehaltes einer Materialbahn
US7397563B2 (en) 2005-11-08 2008-07-08 Honeywell International Inc. Pass-line insensitive sensor
US7460233B2 (en) * 2005-11-08 2008-12-02 Honeywell International Inc. Pass-line and tilt insensitive sensor
US7619740B2 (en) * 2007-10-11 2009-11-17 Honeywell International Inc. Microgloss measurement of paper and board
US8148690B2 (en) * 2009-09-24 2012-04-03 ABB, Ltd. Method and apparatus for on-line web property measurement
DK3222952T3 (en) * 2011-09-06 2019-04-08 Rv Holding B V Method and system for freeze-drying injectable compositions, in particular pharmaceutical compositions
RU2669156C1 (ru) * 2017-11-09 2018-10-08 Акционерное общество "ГМС Нефтемаш" Поточный влагомер
RU2704034C1 (ru) * 2019-01-29 2019-10-23 Акционерное общество "ГМС Нефтемаш" Поточный влагомер

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3641349A (en) * 1969-09-29 1972-02-08 Measurex Corp Method for measuring the amount of substance associated with a base material
US3675019A (en) * 1971-03-19 1972-07-04 Measurex Corp Apparatus for measuring the amount of a substance that is associated with a base material
US3965356A (en) * 1975-04-30 1976-06-22 Measurex Corporation Apparatus for measuring a predetermined characteristic of a material using two or more wavelengths of radiation
US4006358A (en) * 1975-06-12 1977-02-01 Measurex Corporation Method and apparatus for measuring the amount of moisture that is associated with a web of moving material
US4052615A (en) * 1976-07-30 1977-10-04 Industrial Nucleonics Corporation Spherical cavity method and apparatus for measuring a sheet material property using infrared radiation
US4171918A (en) * 1976-12-27 1979-10-23 Sentrol Systems Ltd. Infrared moisture measuring apparatus

Also Published As

Publication number Publication date
DE3708141A1 (de) 1988-09-22
US4812665A (en) 1989-03-14
FI78356C (sv) 1989-07-10
FI853529L (fi) 1987-03-17
FI853529A0 (fi) 1985-09-16

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Owner name: PUUMALAISEN TUTKIMUSLAITOS OY