FI3607390T3 - Optinen komponentti jaksoittaisen valokuvion muodostamiseksi - Google Patents

Optinen komponentti jaksoittaisen valokuvion muodostamiseksi Download PDF

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Publication number
FI3607390T3
FI3607390T3 FIEP18717675.5T FI18717675T FI3607390T3 FI 3607390 T3 FI3607390 T3 FI 3607390T3 FI 18717675 T FI18717675 T FI 18717675T FI 3607390 T3 FI3607390 T3 FI 3607390T3
Authority
FI
Finland
Prior art keywords
light
optical component
waveguide
sample
input light
Prior art date
Application number
FIEP18717675.5T
Other languages
English (en)
Finnish (fi)
Inventor
Balpreet Singh Ahluwalia
Thomas R Huser
Olav Gaute Hellesø
Original Assignee
Univ I Tromsoe Norges Arktiske Univ
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GBGB1705660.7A external-priority patent/GB201705660D0/en
Application filed by Univ I Tromsoe Norges Arktiske Univ filed Critical Univ I Tromsoe Norges Arktiske Univ
Application granted granted Critical
Publication of FI3607390T3 publication Critical patent/FI3607390T3/fi

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
    • G02B27/0905—Dividing and/or superposing multiple light beams
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0635—Structured illumination, e.g. with grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/08—Optical fibres; light guides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/108—Miscellaneous

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Microscoopes, Condenser (AREA)
  • Optical Integrated Circuits (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • Glass Compositions (AREA)
FIEP18717675.5T 2017-04-07 2018-04-05 Optinen komponentti jaksoittaisen valokuvion muodostamiseksi FI3607390T3 (fi)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
NO20170592 2017-04-07
GBGB1705660.7A GB201705660D0 (en) 2017-04-07 2017-04-07 Optical component for generating a periodic light pattern
PCT/GB2018/050917 WO2018185489A1 (en) 2017-04-07 2018-04-05 Optical component for generating a periodic light pattern

Publications (1)

Publication Number Publication Date
FI3607390T3 true FI3607390T3 (fi) 2025-02-03

Family

ID=61972160

Family Applications (1)

Application Number Title Priority Date Filing Date
FIEP18717675.5T FI3607390T3 (fi) 2017-04-07 2018-04-05 Optinen komponentti jaksoittaisen valokuvion muodostamiseksi

Country Status (12)

Country Link
US (1) US11454791B2 (https=)
EP (1) EP3607390B1 (https=)
JP (1) JP7211965B2 (https=)
KR (1) KR102579187B1 (https=)
CN (1) CN110709756A (https=)
AU (1) AU2018248702B2 (https=)
CA (1) CA3062850A1 (https=)
DK (1) DK3607390T3 (https=)
ES (1) ES3009441T3 (https=)
FI (1) FI3607390T3 (https=)
SG (1) SG11201909327QA (https=)
WO (1) WO2018185489A1 (https=)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109374578B (zh) * 2018-11-30 2021-01-08 浙江大学 一种移频量调控方法以及基于该方法的超分辨显微成像方法
DE102018131217A1 (de) * 2018-12-06 2020-06-10 Universität Bielefeld Optisches Modul zur Erzeugung von Beleuchtungsmustern für die strukturierte Beleuchtungsmikroskopie
CN114096829A (zh) * 2019-07-10 2022-02-25 ams有限公司 包括集成片上光波导的光热气体检测器
TWI868263B (zh) * 2019-12-06 2025-01-01 美商伊路米納有限公司 從影像中估計值的裝置和方法以及相關的處理器可讀取媒體
DE102019134947A1 (de) * 2019-12-18 2021-06-24 Universität Bielefeld Anordnung und verfahren zur lichtblattmikroskopie
US12196672B2 (en) 2020-05-07 2025-01-14 Hand Held Products, Inc. Apparatuses, systems, and methods for sample testing
US12553885B2 (en) 2020-05-07 2026-02-17 Hand Held Products, Inc. Apparatuses, systems, and methods for sample testing
DE102020212112A1 (de) * 2020-09-25 2022-03-31 Karlsruher Institut für Technologie Optisches Wellenleiterbauelement und Verfahren zu dessen Herstellung
US11846574B2 (en) 2020-10-29 2023-12-19 Hand Held Products, Inc. Apparatuses, systems, and methods for sample capture and extraction
US12429701B2 (en) 2021-12-13 2025-09-30 Samsung Electronics Co., Ltd. Augmented reality device based on curved waveguide, method therefor, augmented reality glasses based on said device
EP4202295B1 (en) * 2021-12-21 2026-01-28 Imec VZW Light distribution device, illumination system and imaging system for imaging of samples within microscopy
WO2025253331A1 (en) 2024-06-06 2025-12-11 Politecnico Di Milano Engineered microscope slide for structured illumination

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US5666197A (en) 1996-08-21 1997-09-09 Polaroid Corporation Apparatus and methods employing phase control and analysis of evanescent illumination for imaging and metrology of subwavelength lateral surface topography
US6255642B1 (en) 1999-06-23 2001-07-03 Massachusetts Institute Of Technology Standing wave total internal reflection imaging
US7376304B2 (en) 2001-09-27 2008-05-20 Bio-Rad Laboratories, Inc. Biochemical assay detection using a fiber optic exciter
US20070147766A1 (en) 2003-11-12 2007-06-28 Mattsson Kent E Low loss silicon oxynitride optical waveguide, a method of its manufacture and an optical device
WO2006058187A2 (en) 2004-11-23 2006-06-01 Robert Eric Betzig Optical lattice microscopy
EP3936857B1 (en) 2006-09-01 2023-06-21 Pacific Biosciences Of California, Inc. Substrates, systems and methods for analyzing materials
US8537461B2 (en) 2007-11-26 2013-09-17 Carl Zeiss Microimaging Gmbh Method and configuration for the optical detection of an illuminated specimen
US20090219607A1 (en) 2008-01-17 2009-09-03 Baylor College Of Medicine Method and apparatus for enhanced resolution microscopy of living biological nanostructures
DE102008009216A1 (de) 2008-02-13 2009-08-20 Carl Zeiss Microimaging Gmbh Vorrichtung und Verfahren zum räumlich hochauflösenden Abbilden einer Struktur einer Probe
WO2010088418A1 (en) 2009-01-29 2010-08-05 The Regents Of The University Of California High resolution structured illumination microscopy
DE102012009836A1 (de) * 2012-05-16 2013-11-21 Carl Zeiss Microscopy Gmbh Lichtmikroskop und Verfahren zur Bildaufnahme mit einem Lichtmikroskop
DE102012020877A1 (de) 2012-10-17 2014-04-17 Carl Zeiss Microscopy Gmbh Optikanordnung und Lichtmikroskop
JP6191140B2 (ja) 2013-01-17 2017-09-06 株式会社ニコン 構造化照明装置及び構造化照明顕微鏡装置
CN104459971B (zh) * 2014-12-24 2016-01-13 中国科学院半导体研究所 一种基于集成光子芯片的结构光照明显微成像系统
WO2017068620A1 (ja) 2015-10-19 2017-04-27 株式会社ニコン 構造化照明顕微鏡、観察方法、及び顕微鏡制御プログラム

Also Published As

Publication number Publication date
ES3009441T3 (en) 2025-03-26
EP3607390A1 (en) 2020-02-12
BR112019021050A2 (pt) 2020-05-12
AU2018248702A1 (en) 2019-11-14
WO2018185489A1 (en) 2018-10-11
CA3062850A1 (en) 2018-10-11
DK3607390T3 (da) 2025-01-27
US20210109334A1 (en) 2021-04-15
SG11201909327QA (en) 2019-11-28
EP3607390B1 (en) 2024-10-30
AU2018248702B2 (en) 2022-07-21
JP7211965B2 (ja) 2023-01-24
US11454791B2 (en) 2022-09-27
CN110709756A (zh) 2020-01-17
KR102579187B1 (ko) 2023-09-14
KR20190133255A (ko) 2019-12-02
JP2020516881A (ja) 2020-06-11

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