FI20155675A - Menetelmä ja laitteisto pinnan korkeuden mittaamiseksi - Google Patents

Menetelmä ja laitteisto pinnan korkeuden mittaamiseksi

Info

Publication number
FI20155675A
FI20155675A FI20155675A FI20155675A FI20155675A FI 20155675 A FI20155675 A FI 20155675A FI 20155675 A FI20155675 A FI 20155675A FI 20155675 A FI20155675 A FI 20155675A FI 20155675 A FI20155675 A FI 20155675A
Authority
FI
Finland
Prior art keywords
measuring surface
surface elevation
elevation
measuring
Prior art date
Application number
FI20155675A
Other languages
English (en)
Swedish (sv)
Other versions
FI127908B (fi
Inventor
Kai Ojala
Original Assignee
Teknologian Tutkimuskeskus Vtt Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teknologian Tutkimuskeskus Vtt Oy filed Critical Teknologian Tutkimuskeskus Vtt Oy
Priority to FI20155675A priority Critical patent/FI127908B/fi
Priority to PCT/FI2016/050657 priority patent/WO2017051074A1/en
Priority to EP16774698.1A priority patent/EP3353489B1/en
Priority to US15/760,796 priority patent/US11047674B2/en
Publication of FI20155675A publication Critical patent/FI20155675A/fi
Application granted granted Critical
Publication of FI127908B publication Critical patent/FI127908B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0608—Height gauges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B13/00—Optical objectives specially designed for the purposes specified below
    • G02B13/22—Telecentric objectives or lens systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/4205—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
FI20155675A 2015-09-22 2015-09-22 Menetelmä ja laitteisto pinnan korkeuden mittaamiseksi FI127908B (fi)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FI20155675A FI127908B (fi) 2015-09-22 2015-09-22 Menetelmä ja laitteisto pinnan korkeuden mittaamiseksi
PCT/FI2016/050657 WO2017051074A1 (en) 2015-09-22 2016-09-21 Method and apparatus for measuring the height of a surface
EP16774698.1A EP3353489B1 (en) 2015-09-22 2016-09-21 Method and apparatus for measuring the height of a surface
US15/760,796 US11047674B2 (en) 2015-09-22 2016-09-21 Method and apparatus for measuring the height of a surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20155675A FI127908B (fi) 2015-09-22 2015-09-22 Menetelmä ja laitteisto pinnan korkeuden mittaamiseksi

Publications (2)

Publication Number Publication Date
FI20155675A true FI20155675A (fi) 2017-03-23
FI127908B FI127908B (fi) 2019-05-15

Family

ID=57042901

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20155675A FI127908B (fi) 2015-09-22 2015-09-22 Menetelmä ja laitteisto pinnan korkeuden mittaamiseksi

Country Status (4)

Country Link
US (1) US11047674B2 (fi)
EP (1) EP3353489B1 (fi)
FI (1) FI127908B (fi)
WO (1) WO2017051074A1 (fi)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114160961A (zh) * 2021-12-14 2022-03-11 深圳快造科技有限公司 用于标定激光加工参数的系统和方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112832958B (zh) * 2021-02-20 2024-03-08 中国华能集团清洁能源技术研究院有限公司 一种基于光色散的风机塔筒倾斜监测装置及方法
CN116385437B (zh) * 2023-06-05 2023-08-25 山东中清智能科技股份有限公司 一种多视角的多图像融合方法及装置

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114160961A (zh) * 2021-12-14 2022-03-11 深圳快造科技有限公司 用于标定激光加工参数的系统和方法
CN114160961B (zh) * 2021-12-14 2023-10-13 深圳快造科技有限公司 用于标定激光加工参数的系统和方法

Also Published As

Publication number Publication date
US11047674B2 (en) 2021-06-29
EP3353489B1 (en) 2021-03-03
FI127908B (fi) 2019-05-15
WO2017051074A1 (en) 2017-03-30
EP3353489A1 (en) 2018-08-01
US20180252516A1 (en) 2018-09-06

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