FI20145524A - Aallonpituusdispersiospektrometri, röntgenfluoresenssilaite ja menetelmä - Google Patents

Aallonpituusdispersiospektrometri, röntgenfluoresenssilaite ja menetelmä

Info

Publication number
FI20145524A
FI20145524A FI20145524A FI20145524A FI20145524A FI 20145524 A FI20145524 A FI 20145524A FI 20145524 A FI20145524 A FI 20145524A FI 20145524 A FI20145524 A FI 20145524A FI 20145524 A FI20145524 A FI 20145524A
Authority
FI
Finland
Prior art keywords
ray fluorescence
crystal dispersion
fluorescence device
dispersion spectrometer
wavelength crystal
Prior art date
Application number
FI20145524A
Other languages
English (en)
Swedish (sv)
Other versions
FI125488B (fi
Inventor
Heikki Johannes Sipilä
Original Assignee
Fenno Aurum Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fenno Aurum Oy filed Critical Fenno Aurum Oy
Priority to FI20145524A priority Critical patent/FI125488B/fi
Priority to CA2893877A priority patent/CA2893877A1/en
Priority to US14/734,463 priority patent/US20150355116A1/en
Application granted granted Critical
Publication of FI20145524A publication Critical patent/FI20145524A/fi
Publication of FI125488B publication Critical patent/FI125488B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Molecular Biology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FI20145524A 2014-06-09 2014-06-09 Aallonpituusdispersiospektrometri, röntgenfluoresenssilaite ja menetelmä FI125488B (fi)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FI20145524A FI125488B (fi) 2014-06-09 2014-06-09 Aallonpituusdispersiospektrometri, röntgenfluoresenssilaite ja menetelmä
CA2893877A CA2893877A1 (en) 2014-06-09 2015-06-05 A wavelength dispersive crystal spectrometer, a x-ray fluorescence device and method therein
US14/734,463 US20150355116A1 (en) 2014-06-09 2015-06-09 Wavelength dispersive crystal spectrometer, a xray fluorescence device and a method therein

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20145524 2014-06-09
FI20145524A FI125488B (fi) 2014-06-09 2014-06-09 Aallonpituusdispersiospektrometri, röntgenfluoresenssilaite ja menetelmä

Publications (2)

Publication Number Publication Date
FI20145524A true FI20145524A (fi) 2015-10-30
FI125488B FI125488B (fi) 2015-10-30

Family

ID=54345374

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20145524A FI125488B (fi) 2014-06-09 2014-06-09 Aallonpituusdispersiospektrometri, röntgenfluoresenssilaite ja menetelmä

Country Status (3)

Country Link
US (1) US20150355116A1 (fi)
CA (1) CA2893877A1 (fi)
FI (1) FI125488B (fi)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11964304B2 (en) 2015-07-16 2024-04-23 Sortera Technologies, Inc. Sorting between metal alloys
US12017255B2 (en) 2015-07-16 2024-06-25 Sortera Technologies, Inc. Sorting based on chemical composition
WO2017011835A1 (en) 2015-07-16 2017-01-19 UHV Technologies, Inc. Material sorting system
US10722922B2 (en) 2015-07-16 2020-07-28 UHV Technologies, Inc. Sorting cast and wrought aluminum
US11969764B2 (en) 2016-07-18 2024-04-30 Sortera Technologies, Inc. Sorting of plastics
US10625304B2 (en) 2017-04-26 2020-04-21 UHV Technologies, Inc. Recycling coins from scrap
US11278937B2 (en) 2015-07-16 2022-03-22 Sortera Alloys, Inc. Multiple stage sorting
WO2017024035A1 (en) 2015-08-03 2017-02-09 UHV Technologies, Inc. Metal analysis during pharmaceutical manufacturing
WO2018200866A1 (en) 2017-04-26 2018-11-01 UHV Technologies, Inc. Material sorting using a vision system
EA202092348A1 (ru) 2018-04-20 2021-02-15 Оутотек (Финлэнд) Ой Рентгеновский флуоресцентный анализатор и способ выполнения флуоресцентного анализа
SE544488C2 (en) 2018-04-20 2022-06-21 Outotec Finland Oy Floor molding device which on its mold side comprises

Family Cites Families (21)

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Publication number Priority date Publication date Assignee Title
US2853617A (en) * 1955-01-27 1958-09-23 California Inst Res Found Focusing crystal for x-rays and method of manufacture
US3160749A (en) * 1962-10-19 1964-12-08 Philips Corp Spectrometer with novel plural crystal arrangement
US3424428A (en) * 1965-08-09 1969-01-28 Thiokol Chemical Corp X-ray spectroscope assembly having an analyzer block composed of annealed pyrolytic graphite on an optically accurate surface
JPS55109951A (en) * 1979-02-19 1980-08-23 Rigaku Denki Kogyo Kk Xxray spectroscope
JPS55112553A (en) * 1979-02-22 1980-08-30 Rigaku Denki Kogyo Kk Xxray spectroscope
US4238529A (en) * 1979-08-02 1980-12-09 North American Philips Corp. Long wave-length x-ray diffraction crystal
US4785470A (en) * 1983-10-31 1988-11-15 Ovonic Synthetic Materials Company, Inc. Reflectivity and resolution X-ray dispersive and reflective structures for carbon, beryllium and boron analysis
NL8700488A (nl) * 1987-02-27 1988-09-16 Philips Nv Roentgen analyse apparaat met saggitaal gebogen analyse kristal.
US5164975A (en) * 1991-06-13 1992-11-17 The United States Of America As Represented By The United States Department Of Energy Multiple wavelength X-ray monochromators
US5185773A (en) * 1991-07-19 1993-02-09 General Motors Corporation Method and apparatus for nondestructive selective determination of a metal
EP0753140A1 (en) * 1995-01-27 1997-01-15 Koninklijke Philips Electronics N.V. Method for ge-xrf x-ray analysis of materials, and apparatus for carrying out the method
JP3923101B2 (ja) * 1995-07-25 2007-05-30 株式会社リガク Ｘ線モノクロメータ及びそれを用いたｘ線回折装置
JP3821414B2 (ja) * 1998-04-03 2006-09-13 株式会社リガク Ｘ線回折分析方法及びｘ線回折分析装置
GB0027429D0 (en) * 2000-11-09 2000-12-27 Oxford Instr Analytical Ltd Apparatus for analysing a sample
US6546069B1 (en) * 2002-04-24 2003-04-08 Rigaxu/Msc, Inc. Combined wave dispersive and energy dispersive spectrometer
DE10236640B4 (de) * 2002-08-09 2004-09-16 Siemens Ag Vorrichtung und Verfahren zur Erzeugung monochromatischer Röntgenstrahlung
US7634052B2 (en) * 2006-10-24 2009-12-15 Thermo Niton Analyzers Llc Two-stage x-ray concentrator
GB2476255B (en) * 2009-12-17 2012-03-07 Thermo Fisher Scient Ecublens Sarl Method and apparatus for performing x-ray analysis of a sample
US8946645B2 (en) * 2012-01-30 2015-02-03 Alexander De Volpi Radiation-monitoring diagnostic hodoscope system for nuclear-power reactors
US9268043B2 (en) * 2012-09-27 2016-02-23 Alexander DeVolpi Radiation-monitoring system with correlated hodoscopes
DE102012023344A1 (de) * 2012-11-29 2014-06-05 Bernhard Müller Vorrichtung und Verfahren zur Röntgenfluoreszenzanalyse von Kontrastmittelverteilungen

Also Published As

Publication number Publication date
CA2893877A1 (en) 2015-12-09
US20150355116A1 (en) 2015-12-10
FI125488B (fi) 2015-10-30

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