FI20135961A - Mallinnusjärjestely ja menetelmät ja järjestelmä kolmiulotteisen pinnan topografian mallintamiseksi - Google Patents

Mallinnusjärjestely ja menetelmät ja järjestelmä kolmiulotteisen pinnan topografian mallintamiseksi Download PDF

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Publication number
FI20135961A
FI20135961A FI20135961A FI20135961A FI20135961A FI 20135961 A FI20135961 A FI 20135961A FI 20135961 A FI20135961 A FI 20135961A FI 20135961 A FI20135961 A FI 20135961A FI 20135961 A FI20135961 A FI 20135961A
Authority
FI
Finland
Prior art keywords
topography
mapping
procedures
systems
well
Prior art date
Application number
FI20135961A
Other languages
English (en)
Swedish (sv)
Inventor
Jorma Palmén
Original Assignee
Aalto Korkeakoulusäätiö
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aalto Korkeakoulusäätiö filed Critical Aalto Korkeakoulusäätiö
Priority to FI20135961A priority Critical patent/FI20135961A/fi
Priority to JP2016516614A priority patent/JP6612740B2/ja
Priority to US15/024,141 priority patent/US20160238377A1/en
Priority to EP14806335.7A priority patent/EP3049756B1/en
Priority to PCT/FI2014/050730 priority patent/WO2015044524A1/en
Publication of FI20135961A publication Critical patent/FI20135961A/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2504—Calibration devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2509—Color coding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2531—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings, projected with variable angle of incidence on the object, and one detection device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/42—Simultaneous measurement of distance and other co-ordinates
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20—Image signal generators
    • H04N13/204—Image signal generators using stereoscopic image cameras
    • H04N13/254—Image signal generators using stereoscopic image cameras in combination with electromagnetic radiation sources for illuminating objects

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
FI20135961A 2013-09-25 2013-09-25 Mallinnusjärjestely ja menetelmät ja järjestelmä kolmiulotteisen pinnan topografian mallintamiseksi FI20135961A (fi)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FI20135961A FI20135961A (fi) 2013-09-25 2013-09-25 Mallinnusjärjestely ja menetelmät ja järjestelmä kolmiulotteisen pinnan topografian mallintamiseksi
JP2016516614A JP6612740B2 (ja) 2013-09-25 2014-09-25 モデリング構成及び三次元表面のトポグラフィーをモデリングする方法及びシステム
US15/024,141 US20160238377A1 (en) 2013-09-25 2014-09-25 Modeling arrangement and methods and system for modeling the topography of a three-dimensional surface
EP14806335.7A EP3049756B1 (en) 2013-09-25 2014-09-25 Modeling arrangement and method and system for modeling the topography of a three-dimensional surface
PCT/FI2014/050730 WO2015044524A1 (en) 2013-09-25 2014-09-25 Modeling arrangement and methods and system for modeling the topography of a three-dimensional surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20135961A FI20135961A (fi) 2013-09-25 2013-09-25 Mallinnusjärjestely ja menetelmät ja järjestelmä kolmiulotteisen pinnan topografian mallintamiseksi

Publications (1)

Publication Number Publication Date
FI20135961A true FI20135961A (fi) 2015-03-26

Family

ID=52003816

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20135961A FI20135961A (fi) 2013-09-25 2013-09-25 Mallinnusjärjestely ja menetelmät ja järjestelmä kolmiulotteisen pinnan topografian mallintamiseksi

Country Status (5)

Country Link
US (1) US20160238377A1 (fi)
EP (1) EP3049756B1 (fi)
JP (1) JP6612740B2 (fi)
FI (1) FI20135961A (fi)
WO (1) WO2015044524A1 (fi)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10612912B1 (en) 2017-10-31 2020-04-07 Facebook Technologies, Llc Tileable structured light projection system
US10521926B1 (en) 2018-03-21 2019-12-31 Facebook Technologies, Llc Tileable non-planar structured light patterns for wide field-of-view depth sensing
FI128523B (fi) * 2018-06-07 2020-07-15 Ladimo Oy 3D-pinnan topografian mallintaminen
CN108645392B (zh) * 2018-07-16 2024-02-06 西安微普光电技术有限公司 一种相机安装姿态校准方法及装置
EP3879226B1 (en) * 2018-11-08 2023-01-04 Chengdu Pin Tai Ding Feng Business Administration Three-dimensional measurement device
US10866322B2 (en) * 2018-12-31 2020-12-15 Datalogic Usa, Inc. Identification of shadowing on flat-top volumetric objects scanned by laser scanning devices
KR20210126738A (ko) 2019-02-20 2021-10-20 트리나미엑스 게엠베하 적어도 하나의 대상체를 조명하기 위한 프로젝터를 구비하는 검출기
JP2023512280A (ja) 2020-01-31 2023-03-24 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 物体認識のための検出器
CN111538353B (zh) * 2020-05-12 2021-10-19 南京航空航天大学 一种隧道检测车稳定装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6690474B1 (en) * 1996-02-12 2004-02-10 Massachusetts Institute Of Technology Apparatus and methods for surface contour measurement
AU2001227574A1 (en) * 2000-01-10 2001-07-24 Massachusetts Institute Of Technology Apparatus and methods for surface contour measurement
US6603561B2 (en) * 2001-02-20 2003-08-05 Thomas D. Ditto Chromatic diffraction range finder
US20040125205A1 (en) * 2002-12-05 2004-07-01 Geng Z. Jason System and a method for high speed three-dimensional imaging
US6762427B1 (en) * 2002-12-20 2004-07-13 Delphi Technologies, Inc. Object surface characterization using optical triangulaton and a single camera
US7747067B2 (en) * 2003-10-08 2010-06-29 Purdue Research Foundation System and method for three dimensional modeling
US7002699B2 (en) * 2004-02-23 2006-02-21 Delphi Technologies, Inc. Identification and labeling of beam images of a structured beam matrix
WO2006107955A1 (en) * 2005-04-06 2006-10-12 Dimensional Photonics International, Inc. Multiple channel interferometric surface contour measurement system
WO2009024758A1 (en) * 2007-08-17 2009-02-26 Renishaw Plc Non-contact probe
US8717417B2 (en) * 2009-04-16 2014-05-06 Primesense Ltd. Three-dimensional mapping and imaging
GB0921461D0 (en) * 2009-12-08 2010-01-20 Qinetiq Ltd Range based sensing
JP2013079854A (ja) * 2011-10-03 2013-05-02 Topcon Corp ３次元計測システム及び３次元計測方法
JP6041513B2 (ja) * 2012-04-03 2016-12-07 キヤノン株式会社 画像処理装置、画像処理方法及びプログラム
US20140111616A1 (en) * 2012-10-21 2014-04-24 Ilya Blayvas Structured light 3D scanner with refractive non-absorbing pattern forming element

Also Published As

Publication number Publication date
WO2015044524A1 (en) 2015-04-02
JP6612740B2 (ja) 2019-11-27
JP2016537612A (ja) 2016-12-01
EP3049756B1 (en) 2021-12-01
EP3049756A1 (en) 2016-08-03
US20160238377A1 (en) 2016-08-18

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