FI20115073A0 - Laitteisto, menetelmä ja reaktiokammio - Google Patents
Laitteisto, menetelmä ja reaktiokammioInfo
- Publication number
- FI20115073A0 FI20115073A0 FI20115073A FI20115073A FI20115073A0 FI 20115073 A0 FI20115073 A0 FI 20115073A0 FI 20115073 A FI20115073 A FI 20115073A FI 20115073 A FI20115073 A FI 20115073A FI 20115073 A0 FI20115073 A0 FI 20115073A0
- Authority
- FI
- Finland
- Prior art keywords
- procedure
- reaction chamber
- chamber
- reaction
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45544—Atomic layer deposition [ALD] characterized by the apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/6719—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20115073A FI20115073A0 (fi) | 2011-01-26 | 2011-01-26 | Laitteisto, menetelmä ja reaktiokammio |
US13/991,977 US10167551B2 (en) | 2011-01-26 | 2012-01-24 | Apparatus, method and reaction chamber |
DE112012000579T DE112012000579T5 (de) | 2011-01-26 | 2012-01-24 | Anlage, Verfahren und Reaktionskammer |
PCT/FI2012/050061 WO2012101326A1 (en) | 2011-01-26 | 2012-01-24 | Apparatus, method and reaction chamber |
CN201280004806.7A CN103298974B (zh) | 2011-01-26 | 2012-01-24 | 装置、方法以及反应腔室 |
TW101102786A TWI573183B (zh) | 2011-01-26 | 2012-01-30 | 處理基板表面之裝置、將基板載入用以處理基板表面之裝置之方法及反應腔室 |
US16/201,714 US10590536B2 (en) | 2011-01-26 | 2018-11-27 | Apparatus, method and reaction chamber |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20115073A FI20115073A0 (fi) | 2011-01-26 | 2011-01-26 | Laitteisto, menetelmä ja reaktiokammio |
Publications (1)
Publication Number | Publication Date |
---|---|
FI20115073A0 true FI20115073A0 (fi) | 2011-01-26 |
Family
ID=43528559
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20115073A FI20115073A0 (fi) | 2011-01-26 | 2011-01-26 | Laitteisto, menetelmä ja reaktiokammio |
Country Status (6)
Country | Link |
---|---|
US (2) | US10167551B2 (fi) |
CN (1) | CN103298974B (fi) |
DE (1) | DE112012000579T5 (fi) |
FI (1) | FI20115073A0 (fi) |
TW (1) | TWI573183B (fi) |
WO (1) | WO2012101326A1 (fi) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104201294B (zh) * | 2014-07-10 | 2016-10-05 | 深圳市华星光电技术有限公司 | 一种操作平台 |
US20190032212A1 (en) * | 2016-02-10 | 2019-01-31 | Beneq Oy | An apparatus for atomic layer deposition |
US20210162037A1 (en) | 2016-05-04 | 2021-06-03 | Curevac Ag | Influenza mrna vaccines |
TWI650889B (zh) * | 2016-07-22 | 2019-02-11 | 南韓商Ncd股份有限公司 | 在oled上形成無機薄層的方法 |
FI129502B (fi) * | 2019-04-25 | 2022-03-31 | Beneq Oy | Lähtöaineen syöttökaappi |
CN110195216A (zh) * | 2019-07-15 | 2019-09-03 | 浙江祺跃科技有限公司 | 一种原子层沉积设备 |
CN113564564B (zh) * | 2021-07-02 | 2022-10-21 | 华中科技大学 | 原子层沉积装置 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6174377B1 (en) * | 1997-03-03 | 2001-01-16 | Genus, Inc. | Processing chamber for atomic layer deposition processes |
JP3367421B2 (ja) | 1998-04-16 | 2003-01-14 | 東京エレクトロン株式会社 | 被処理体の収納装置及び搬出入ステージ |
JP2001291655A (ja) * | 2000-04-07 | 2001-10-19 | Tokyo Electron Ltd | 疎水化処理の評価方法、レジストパターンの形成方法及びレジストパターン形成システム |
DE10161469A1 (de) | 2001-12-13 | 2003-07-03 | Schott Glas | Volumenoptimierter Reaktor zur beidseitig gleichzeitigen Beschichtung von Brillengläsern |
US6916374B2 (en) | 2002-10-08 | 2005-07-12 | Micron Technology, Inc. | Atomic layer deposition methods and atomic layer deposition tools |
FI119478B (fi) * | 2005-04-22 | 2008-11-28 | Beneq Oy | Reaktori |
GB0510051D0 (en) * | 2005-05-17 | 2005-06-22 | Forticrete Ltd | Interlocking roof tiles |
JP2008192642A (ja) | 2007-01-31 | 2008-08-21 | Tokyo Electron Ltd | 基板処理装置 |
US20080202419A1 (en) | 2007-02-27 | 2008-08-28 | Smith John M | Gas manifold directly attached to substrate processing chamber |
EP2011898B1 (en) * | 2007-07-03 | 2021-04-07 | Beneq Oy | Method in depositing metal oxide materials |
US7897525B2 (en) | 2008-12-31 | 2011-03-01 | Archers Inc. | Methods and systems of transferring, docking and processing substrates |
FI123539B (fi) * | 2009-02-09 | 2013-06-28 | Beneq Oy | ALD-reaktori, menetelmä ALD-reaktorin lataamiseksi ja tuotantolinja |
FI122940B (fi) | 2009-02-09 | 2012-09-14 | Beneq Oy | Reaktiokammio |
FI123487B (fi) | 2009-06-15 | 2013-05-31 | Beneq Oy | Laitteisto atomikerroskasvatuksen suorittamiseksi substraatin pinnalle |
-
2011
- 2011-01-26 FI FI20115073A patent/FI20115073A0/fi not_active Application Discontinuation
-
2012
- 2012-01-24 WO PCT/FI2012/050061 patent/WO2012101326A1/en active Application Filing
- 2012-01-24 CN CN201280004806.7A patent/CN103298974B/zh active Active
- 2012-01-24 US US13/991,977 patent/US10167551B2/en active Active
- 2012-01-24 DE DE112012000579T patent/DE112012000579T5/de active Pending
- 2012-01-30 TW TW101102786A patent/TWI573183B/zh active
-
2018
- 2018-11-27 US US16/201,714 patent/US10590536B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US20190127850A1 (en) | 2019-05-02 |
TW201241893A (en) | 2012-10-16 |
US20130269608A1 (en) | 2013-10-17 |
CN103298974A (zh) | 2013-09-11 |
US10590536B2 (en) | 2020-03-17 |
CN103298974B (zh) | 2015-06-10 |
DE112012000579T5 (de) | 2013-11-21 |
US10167551B2 (en) | 2019-01-01 |
WO2012101326A1 (en) | 2012-08-02 |
TWI573183B (zh) | 2017-03-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FD | Application lapsed |