FI20085741A - Kuvantamisjärjestely - Google Patents

Kuvantamisjärjestely Download PDF

Info

Publication number
FI20085741A
FI20085741A FI20085741A FI20085741A FI20085741A FI 20085741 A FI20085741 A FI 20085741A FI 20085741 A FI20085741 A FI 20085741A FI 20085741 A FI20085741 A FI 20085741A FI 20085741 A FI20085741 A FI 20085741A
Authority
FI
Finland
Prior art keywords
imaging
Prior art date
Application number
FI20085741A
Other languages
English (en)
Swedish (sv)
Other versions
FI122448B (fi
FI20085741A0 (fi
Inventor
Juha Kalevi Parviainen
Ate Johannes Korkalainen
Markku Tapani Maentylae
Heimo Ihalainen
Toni Kuparinen
Hans Bertel Nystroem
Bo Erik Alexander Sundqvist
Markku Juhani Markkanen
Original Assignee
Lappeenrannan Teknillinen Ylio
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lappeenrannan Teknillinen Ylio filed Critical Lappeenrannan Teknillinen Ylio
Priority to FI20085741A priority Critical patent/FI122448B/fi
Publication of FI20085741A0 publication Critical patent/FI20085741A0/fi
Priority to PCT/FI2009/050569 priority patent/WO2010010229A1/en
Priority to EP09800104A priority patent/EP2313738A1/en
Publication of FI20085741A publication Critical patent/FI20085741A/fi
Application granted granted Critical
Publication of FI122448B publication Critical patent/FI122448B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G01N2021/8663—Paper, e.g. gloss, moisture content

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
FI20085741A 2008-07-23 2008-07-23 Kuvantamisjärjestely FI122448B (fi)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FI20085741A FI122448B (fi) 2008-07-23 2008-07-23 Kuvantamisjärjestely
PCT/FI2009/050569 WO2010010229A1 (en) 2008-07-23 2009-06-25 Imaging arrangement
EP09800104A EP2313738A1 (en) 2008-07-23 2009-06-25 Imaging arrangement

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20085741 2008-07-23
FI20085741A FI122448B (fi) 2008-07-23 2008-07-23 Kuvantamisjärjestely

Publications (3)

Publication Number Publication Date
FI20085741A0 FI20085741A0 (fi) 2008-07-23
FI20085741A true FI20085741A (fi) 2010-01-24
FI122448B FI122448B (fi) 2012-01-31

Family

ID=39677618

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20085741A FI122448B (fi) 2008-07-23 2008-07-23 Kuvantamisjärjestely

Country Status (3)

Country Link
EP (1) EP2313738A1 (fi)
FI (1) FI122448B (fi)
WO (1) WO2010010229A1 (fi)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102087320B1 (ko) * 2012-01-06 2020-03-10 케미라 오와이제이 크레이프된 소재의 특성화 방법
WO2015102644A1 (en) * 2014-01-06 2015-07-09 Hewlett-Packard Development Company, L.P. Paper classification based on three-dimensional characteristics
JP7209610B2 (ja) * 2019-10-15 2023-01-20 株式会社アドバンテスト 光学試験用装置および光学測定器具の試験方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3752556A (en) * 1971-06-02 1973-08-14 R Kurtz Real time moving scene holographic camera system
US5365084A (en) * 1991-02-20 1994-11-15 Pressco Technology, Inc. Video inspection system employing multiple spectrum LED illumination
JPH07286968A (ja) * 1994-04-20 1995-10-31 Sumitomo Metal Ind Ltd 表面欠陥検査装置
US5982493A (en) * 1998-06-02 1999-11-09 Motorola, Inc. Apparatus and method for acquiring multiple images
JP2000131042A (ja) * 1998-10-27 2000-05-12 Technical Systems:Kk 被検査物体の欠陥判定用カメラおよびこれを用いた欠陥判定装置
SE511985C2 (sv) 1999-01-28 2000-01-10 Skogsind Tekn Foskningsinst Topografisk bestämning av en av infallande ljus belyst yta
US6597006B1 (en) * 2001-10-09 2003-07-22 Kla-Tencor Technologies Corp. Dual beam symmetric height systems and methods
US7777199B2 (en) * 2004-09-17 2010-08-17 Wichita State University System and method for capturing image sequences at ultra-high framing rates

Also Published As

Publication number Publication date
FI122448B (fi) 2012-01-31
WO2010010229A1 (en) 2010-01-28
FI20085741A0 (fi) 2008-07-23
EP2313738A1 (en) 2011-04-27

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