FI20031658A0 - Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisesti - Google Patents
Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisestiInfo
- Publication number
- FI20031658A0 FI20031658A0 FI20031658A FI20031658A FI20031658A0 FI 20031658 A0 FI20031658 A0 FI 20031658A0 FI 20031658 A FI20031658 A FI 20031658A FI 20031658 A FI20031658 A FI 20031658A FI 20031658 A0 FI20031658 A0 FI 20031658A0
- Authority
- FI
- Finland
- Prior art keywords
- mass spectrometry
- spectrometry
- mass
- Prior art date
Links
- 238000004949 mass spectrometry Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/168—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission field ionisation, e.g. corona discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0013—Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components
- H01J49/0018—Microminiaturised spectrometers, e.g. chip-integrated devices, Micro-Electro-Mechanical Systems [MEMS]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/60—Construction of the column
- G01N30/6095—Micromachined or nanomachined, e.g. micro- or nanosize
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
- G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20031658A FI119747B (fi) | 2003-11-14 | 2003-11-14 | Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisesti |
CA002545368A CA2545368A1 (en) | 2003-11-14 | 2004-11-15 | Method and apparatus for mass spectrometric analysis |
PCT/FI2004/000683 WO2005047848A2 (en) | 2003-11-14 | 2004-11-15 | Method and apparatus for mass spectrometric analysis |
US10/579,225 US7863559B2 (en) | 2003-11-14 | 2004-11-15 | Method and apparatus for mass spectrometric analysis |
JP2006538878A JP4767864B2 (ja) | 2003-11-14 | 2004-11-15 | 質量分析方法と装置 |
EP04798292A EP1683179A2 (en) | 2003-11-14 | 2004-11-15 | Method and apparatus for mass spectrometric analysis |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20031658 | 2003-11-14 | ||
FI20031658A FI119747B (fi) | 2003-11-14 | 2003-11-14 | Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisesti |
Publications (3)
Publication Number | Publication Date |
---|---|
FI20031658A0 true FI20031658A0 (fi) | 2003-11-14 |
FI20031658A FI20031658A (fi) | 2005-05-15 |
FI119747B FI119747B (fi) | 2009-02-27 |
Family
ID=29558629
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20031658A FI119747B (fi) | 2003-11-14 | 2003-11-14 | Menetelmä ja laitteisto näytteiden tutkimiseksi massaspektrometrisesti |
Country Status (6)
Country | Link |
---|---|
US (1) | US7863559B2 (fi) |
EP (1) | EP1683179A2 (fi) |
JP (1) | JP4767864B2 (fi) |
CA (1) | CA2545368A1 (fi) |
FI (1) | FI119747B (fi) |
WO (1) | WO2005047848A2 (fi) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102007052500A1 (de) * | 2007-11-02 | 2009-06-04 | Helmholtz Zentrum München Deutsches Forschungszentrum Für Gesundheit Und Umwelt (Gmbh) | Verfahren und Vorrichtung für den Nachweis von mindestens einer Zielsubstanz |
US8716655B2 (en) * | 2009-07-02 | 2014-05-06 | Tricorntech Corporation | Integrated ion separation spectrometer |
JP5995643B2 (ja) * | 2012-10-11 | 2016-09-21 | ヒューマン・メタボローム・テクノロジーズ株式会社 | 酸性化合物の検出方法 |
CA2916138C (en) * | 2013-06-21 | 2023-03-21 | Smiths Detection Montreal Inc. | Method and device for a coated corona ionization source |
EP3109612A1 (en) * | 2015-06-26 | 2016-12-28 | Nina Wojtas | Mems deposition trap for vacuum transducer protection |
US11162972B2 (en) * | 2018-05-23 | 2021-11-02 | University Of Central Florida Research Foundation, Inc. | Resonant MEMS piezoelectric sensor |
JP6922961B2 (ja) * | 2018-10-18 | 2021-08-18 | 株式会社村田製作所 | 回転運動検出用微小電気機械デバイス |
US20230024038A1 (en) * | 2020-02-28 | 2023-01-26 | Georgetown University | Apparatus and methods for detection and quantification of elements in molecules |
DE102020214695B4 (de) * | 2020-11-23 | 2022-06-09 | Micro-Sensys Gmbh | Vorrichtung zur Ermittlung eines Füllstands einer Flüssigkeit in einem Behälter |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH065228B2 (ja) * | 1983-12-13 | 1994-01-19 | 株式会社日立製作所 | 大気圧イオン化式試料導入装置 |
JP2633974B2 (ja) * | 1990-04-18 | 1997-07-23 | 株式会社日立製作所 | 試料のイオン化および質量分析のための装置 |
US5259254A (en) * | 1991-09-25 | 1993-11-09 | Cetac Technologies, Inc. | Sample introduction system for inductively coupled plasma and other gas-phase, or particle, detectors utilizing ultrasonic nebulization, and method of use |
US5750988A (en) * | 1994-07-11 | 1998-05-12 | Hewlett-Packard Company | Orthogonal ion sampling for APCI mass spectrometry |
AU5800499A (en) | 1998-09-17 | 2000-04-03 | Advanced Bioanalytical Services, Inc. | Integrated monolithic microfabricated electrospray and liquid chromatography system and method |
EP1155435A4 (en) | 1999-01-08 | 2004-08-11 | Univ Northeastern | ELECTRO-PNEUMATIC DISTRIBUTOR FOR MULTIPLEX ANALYTICAL MICROSYSTEM DEVICES |
US6690004B2 (en) * | 1999-07-21 | 2004-02-10 | The Charles Stark Draper Laboratory, Inc. | Method and apparatus for electrospray-augmented high field asymmetric ion mobility spectrometry |
JP3618262B2 (ja) * | 1999-10-13 | 2005-02-09 | 株式会社日立製作所 | 質量分析計及びそのイオン源 |
US6610978B2 (en) * | 2001-03-27 | 2003-08-26 | Agilent Technologies, Inc. | Integrated sample preparation, separation and introduction microdevice for inductively coupled plasma mass spectrometry |
US6649908B2 (en) * | 2001-09-20 | 2003-11-18 | Agilent Technologies, Inc. | Multiplexing capillary array for atmospheric pressure ionization-mass spectrometry |
GB2391694B (en) * | 2002-08-01 | 2006-03-01 | Microsaic Systems Ltd | Monolithic micro-engineered mass spectrometer |
US7417225B2 (en) * | 2002-09-25 | 2008-08-26 | Thermo Finnigan Llc | Apparatus and method for adjustment of ion separation resolution in FAIMS |
US7057170B2 (en) * | 2004-03-12 | 2006-06-06 | Northrop Grumman Corporation | Compact ion gauge using micromachining and MISOC devices |
GB2422951B (en) * | 2005-02-07 | 2010-07-28 | Microsaic Systems Ltd | Integrated analytical device |
-
2003
- 2003-11-14 FI FI20031658A patent/FI119747B/fi not_active IP Right Cessation
-
2004
- 2004-11-15 JP JP2006538878A patent/JP4767864B2/ja not_active Expired - Fee Related
- 2004-11-15 US US10/579,225 patent/US7863559B2/en not_active Expired - Fee Related
- 2004-11-15 CA CA002545368A patent/CA2545368A1/en not_active Abandoned
- 2004-11-15 WO PCT/FI2004/000683 patent/WO2005047848A2/en active Application Filing
- 2004-11-15 EP EP04798292A patent/EP1683179A2/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
JP4767864B2 (ja) | 2011-09-07 |
EP1683179A2 (en) | 2006-07-26 |
US20090108193A1 (en) | 2009-04-30 |
CA2545368A1 (en) | 2005-05-26 |
WO2005047848A2 (en) | 2005-05-26 |
FI119747B (fi) | 2009-02-27 |
FI20031658A (fi) | 2005-05-15 |
WO2005047848A3 (en) | 2005-08-18 |
US7863559B2 (en) | 2011-01-04 |
JP2007511755A (ja) | 2007-05-10 |
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Legal Events
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