ES8505110A1 - Un metodo para detectar y medir, en una muestra de metal fundido, particulas suspendidas de tamano mayor que uno predeterminado - Google Patents

Un metodo para detectar y medir, en una muestra de metal fundido, particulas suspendidas de tamano mayor que uno predeterminado

Info

Publication number
ES8505110A1
ES8505110A1 ES530246A ES530246A ES8505110A1 ES 8505110 A1 ES8505110 A1 ES 8505110A1 ES 530246 A ES530246 A ES 530246A ES 530246 A ES530246 A ES 530246A ES 8505110 A1 ES8505110 A1 ES 8505110A1
Authority
ES
Spain
Prior art keywords
path
micrometers
aluminum
passage
detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES530246A
Other languages
English (en)
Other versions
ES530246A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Limca Research Inc
Original Assignee
Limca Research Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=23873458&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ES8505110(A1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Limca Research Inc filed Critical Limca Research Inc
Publication of ES530246A0 publication Critical patent/ES530246A0/es
Publication of ES8505110A1 publication Critical patent/ES8505110A1/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/06—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a liquid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/13—Details pertaining to apertures

Landscapes

  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Dispersion Chemistry (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Treatment Of Steel In Its Molten State (AREA)
  • Manufacture Of Alloys Or Alloy Compounds (AREA)
  • Manufacture Of Metal Powder And Suspensions Thereof (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Manufacture And Refinement Of Metals (AREA)

Abstract

METODO Y APARATO PARA LA DETECCION DE PARTICULAS NO CONDUCTORAS EN METALES FUNDIDOS, TALES COMO ALUMINIO, GALIO, ZINC Y PLOMO, QUE PUEDEN SER LICUADOS Y VACIADOS EN UN RECIPIENTE REFRACTARIO ADECUADO.EL METODO COMPRENDE LAS SIGUIENTES OPERACIONES: PRIMERA, SE ESTABLECE UN TRAYECTO DE CORRIENTE, QUE INCLUYE METAL FUNDIDO DE LA MUESTRA, ENTRE DOS ELECTRODOS Y A TRAVES DE UN PASO DE AREA PREDETERMINADA DE SECCION TRANSVERSAL; SEGUNDA, SE HACE PASAR LA MUESTRA DE METAL FUNDIDO A DICHO TRAYECTO DE CORRIENTEY A TRAVES DE DICHO PASO, MIENTRAS SE MANTIENE UNA CORRIENTE ELECTRICA A TRAVES DEL TRAYECTO DE CORRIENTE; Y POR ULTIMO, SE MIDE LA DIFERENCIA DE TENSION ENTRE DICHOS ELECTRODOS.
ES530246A 1983-03-03 1984-03-02 Un metodo para detectar y medir, en una muestra de metal fundido, particulas suspendidas de tamano mayor que uno predeterminado Expired ES8505110A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/471,908 US4555662A (en) 1983-03-03 1983-03-03 Method and apparatus for the detection and measurement of particulates in molten metal

Publications (2)

Publication Number Publication Date
ES530246A0 ES530246A0 (es) 1985-04-16
ES8505110A1 true ES8505110A1 (es) 1985-04-16

Family

ID=23873458

Family Applications (1)

Application Number Title Priority Date Filing Date
ES530246A Expired ES8505110A1 (es) 1983-03-03 1984-03-02 Un metodo para detectar y medir, en una muestra de metal fundido, particulas suspendidas de tamano mayor que uno predeterminado

Country Status (15)

Country Link
US (1) US4555662A (es)
EP (1) EP0119770B2 (es)
JP (1) JPS59171834A (es)
KR (1) KR900005610B1 (es)
AT (1) ATE43012T1 (es)
AU (1) AU564184B2 (es)
BR (1) BR8401030A (es)
CA (1) CA1203996A (es)
DE (1) DE3478143D1 (es)
ES (1) ES8505110A1 (es)
IN (1) IN160387B (es)
MX (1) MX161197A (es)
MY (1) MY100693A (es)
NO (1) NO161996C (es)
ZA (1) ZA841303B (es)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8414856D0 (en) * 1984-06-11 1984-07-18 Alcan Int Ltd Detection and measurement of suspended particles in molten metal
GB8505047D0 (en) * 1985-02-27 1985-03-27 Alcan Int Ltd Studying particles
US4977517A (en) * 1988-09-21 1990-12-11 Toni Diagnostics, Inc. Leak and clog detection and removal system for use with particle counters
CA1315127C (en) * 1989-02-03 1993-03-30 Raynald Hachey Apparatus for particle determination in liquid metals
US5198749A (en) * 1989-04-27 1993-03-30 R. Guthrie Research Associates Inc. Single-use disposable molten metal inclusion sensor
WO1990013015A1 (en) * 1989-04-27 1990-11-01 R. Guthrie Research Associates Inc Continuous-use molten metal inclusion sensor
CA1328679C (en) * 1989-05-18 1994-04-19 Raynald Hachey Apparatus for particle determination in liquid metals
US5834928A (en) * 1995-10-04 1998-11-10 Alcan International Limited Method and apparatus for the detection and measurement of solid particles in molten metal
US6693443B2 (en) * 1999-04-02 2004-02-17 Worcester Polytechnic Institute Systems for detecting and measuring inclusions
US6337564B2 (en) 1999-04-13 2002-01-08 Alcoa Inc. Detecting and classifying hard and soft inclusions in liquid metal
KR100797859B1 (ko) * 2000-09-12 2008-01-24 헤라우스 일렉트로-나이트 인터내셔날 엔. 브이. 용금 중의 입자상 물질의 검출 및 측정 장치
DE60305127T2 (de) * 2002-11-21 2006-11-16 Heraeus Electro-Nite International N.V. Verbesserte Vorrichtung und Verfahren zur Detektierung und Messung von Partikeln in einer Metallschmelze
EP3348992B1 (en) 2004-03-04 2019-10-30 Novelis, Inc. Electrode configuration for limca
JP5053242B2 (ja) 2007-11-30 2012-10-17 古河電気工業株式会社 銅合金材の製造方法及びその装置
JP5224363B2 (ja) 2007-11-30 2013-07-03 古河電気工業株式会社 連続鋳造中の溶融金属の成分調製方法及びその装置
US8199023B2 (en) * 2008-10-15 2012-06-12 Alcoa Inc. Systems, methods and apparatus for tapping a metal electrolysis cell
CN102116802B (zh) * 2010-01-06 2013-05-15 哈尔滨理工大学 金属熔体电阻率快速检测装置及检测方法
EP2906927B1 (en) * 2012-10-15 2021-08-04 ABB Inc. Liquid metal cleanliness analyzer
CA2896727C (en) 2013-03-12 2020-07-14 Novelis Inc. Methods of and apparatus for determining particle inclusion and size in molten metal
EP2948752B1 (en) 2013-03-12 2017-05-03 Novelis, Inc. Methods of and apparatus for measuring metal cleanliness
DE102013006182B4 (de) 2013-04-08 2019-04-25 Thomas Fröhlich Vorrichtung und Verfahren zur Detektion von Partikeln in Flüssigmetallen
FI125886B (fi) * 2014-01-29 2016-03-31 Ilkka Jaakkola Järjestelmä sähköä johtavien partikkeleiden eliminoimiseksi
CN104007170B (zh) * 2014-05-19 2016-10-05 中国科学院大学 基于电磁原理的通过状态转化测量金属液纯净度的方法
DE102017121595A1 (de) * 2017-09-18 2019-03-21 Aktiengesellschaft der Dillinger Hüttenwerke Verfahren zur Analyse von Partikeln in Stahl, insbesondere von Ausscheidungen oder/und Einschlüssen
KR102309284B1 (ko) * 2018-08-03 2021-10-06 주식회사 엘지에너지솔루션 고분자 솔루션의 미용해물 측정법

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2656508A (en) * 1949-08-27 1953-10-20 Wallace H Coulter Means for counting particles suspended in a fluid
US3259842A (en) * 1959-08-19 1966-07-05 Coulter Electronics Particle analyzing device
US3921006A (en) * 1974-09-16 1975-11-18 Coulter Electronics Particle counting apparatus including isolated manometer
US3963984A (en) * 1974-11-04 1976-06-15 Coulter Electronics, Inc. Method and system for cleaning an aperture in a particle study device
US4140966A (en) * 1977-09-02 1979-02-20 Coulter Electronics, Inc. Particle analyzing apparatus and fluid circulating system therefor

Also Published As

Publication number Publication date
EP0119770B2 (en) 1996-01-03
BR8401030A (pt) 1984-10-09
US4555662A (en) 1985-11-26
MX161197A (es) 1990-08-15
AU564184B2 (en) 1987-08-06
IN160387B (es) 1987-07-11
EP0119770A3 (en) 1985-09-18
ES530246A0 (es) 1985-04-16
CA1203996A (en) 1986-05-06
JPS59171834A (ja) 1984-09-28
EP0119770A2 (en) 1984-09-26
ATE43012T1 (de) 1989-05-15
NO161996C (no) 2000-07-03
DE3478143D1 (en) 1989-06-15
JPH0146813B2 (es) 1989-10-11
NO161996B (no) 1989-07-10
ZA841303B (en) 1984-09-26
MY100693A (en) 1991-01-17
NO840795L (no) 1984-09-04
KR840009136A (ko) 1984-12-24
EP0119770B1 (en) 1989-05-10
KR900005610B1 (ko) 1990-07-31
AU2529384A (en) 1984-09-06

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