ES8102356A1 - Un difractometro para polvo,de rayos x - Google Patents

Un difractometro para polvo,de rayos x

Info

Publication number
ES8102356A1
ES8102356A1 ES488509A ES488509A ES8102356A1 ES 8102356 A1 ES8102356 A1 ES 8102356A1 ES 488509 A ES488509 A ES 488509A ES 488509 A ES488509 A ES 488509A ES 8102356 A1 ES8102356 A1 ES 8102356A1
Authority
ES
Spain
Prior art keywords
specimen
theta
detector
alpha
angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES488509A
Other languages
English (en)
Other versions
ES488509A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Publication of ES488509A0 publication Critical patent/ES488509A0/es
Publication of ES8102356A1 publication Critical patent/ES8102356A1/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

DIFRACTOMETRO DE RAYOS X PARA DETERMINACION DE LA TEXTURA Y ESTRUCTURA DE MUESTRAS DE POLVO. SOBRE UN ESPECIMEN (1) DE POLVO INCIDEN LOS RAYOS X (2) PROCEDENTES DE UNA FUENTE MONOCROMATICA (3); LOS RAYOS X DIFRACTADOS (5) POR EL ESPECIMEN (1), LLEGAN A UN DETECTOR (6), A TRAVES DE UNA HENDIDURA (7) DE RECEPCION QUE LIMITA LA DIVERGENCIA DEL HAZ DIFRACTADO. TANTO EL DETECTOR (6) COMO EL ESPECIMEN (1) GIRAN ALREDEDOR DE UN EJE GEOMETRICO COMUN (8), HACIENDOLO EL DETECTOR (6) A DOBLE VELOCIDAD QUE EL ESPECIMEN (1); LA ROTACION ES PRODUCIDA POR UN MOTOR (9) DE MOVIMIENTO POR PASOS MEDIANTE EL MECANISMO APROPIADO. EL DETECTOR (6) VA SOBRE UNA CORREDERA (15), PUDIENDO ACERCARSE AL ESPECIMEN (1) EN PASOS CON UNA RELACION K QUE DEPENDE DE LA DISTANCIA QUE HAY DEL DETECTOR (6) AL ESPECIMEN (1), Y DE ESTE A LA FUENTE MONOCROMATICA (3).
ES488509A 1979-01-31 1980-01-30 Un difractometro para polvo,de rayos x Expired ES8102356A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/007,880 US4199678A (en) 1979-01-31 1979-01-31 Asymmetric texture sensitive X-ray powder diffractometer

Publications (2)

Publication Number Publication Date
ES488509A0 ES488509A0 (es) 1980-12-16
ES8102356A1 true ES8102356A1 (es) 1980-12-16

Family

ID=21728595

Family Applications (1)

Application Number Title Priority Date Filing Date
ES488509A Expired ES8102356A1 (es) 1979-01-31 1980-01-30 Un difractometro para polvo,de rayos x

Country Status (7)

Country Link
US (1) US4199678A (es)
EP (1) EP0014500B1 (es)
JP (1) JPS6022292B2 (es)
AU (1) AU525463B2 (es)
CA (1) CA1141483A (es)
DE (1) DE3060311D1 (es)
ES (1) ES8102356A1 (es)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5744841A (en) * 1980-09-01 1982-03-13 Hitachi Ltd Method and apparatus for x-ray diffraction
GB2198920B (en) * 1986-12-18 1990-11-14 Univ Moskovsk Apparatus for x-ray studies of crystalline matter
EP0512620A3 (en) * 1991-05-07 1995-07-05 Koninklijke Philips Electronics N.V. X-ray analysis apparatus
JP2904055B2 (ja) * 1995-05-30 1999-06-14 株式会社島津製作所 Ｘ線回折装置
US6751287B1 (en) 1998-05-15 2004-06-15 The Trustees Of The Stevens Institute Of Technology Method and apparatus for x-ray analysis of particle size (XAPS)
DK1466166T3 (da) * 2002-01-15 2006-10-09 Avantium Int Bv Fremgangsmåde til udförelse af pulverdiffraktionsanalyse
ITMI20020097A1 (it) * 2002-01-21 2003-07-21 Consorzio Pisa Ricerche Diffrattometro e metodo per svolgere analisi diffrattrometriche
KR20050037086A (ko) * 2003-10-17 2005-04-21 삼성전자주식회사 Ｘ선 회절 분석기 및 이 분석기의 측정 위치 보정방법
EP2612134B1 (en) * 2010-09-01 2019-10-23 Spectral Instruments Imaging, LLC Methods and systems for producing visible light and x-ray image data
JP6685078B2 (ja) * 2013-03-15 2020-04-22 プロト マニュファクチャリング リミテッド Ｘ線回折装置およびｘ線回折装置駆動方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE488126A (es) * 1948-03-27
NL85501C (es) * 1952-11-08
DE1463283B2 (de) * 1964-05-15 1971-10-28 Digitale steuerung der bewegung von maschinen und apparate teilen insbesondere der beweglichen organe von roentgen diffraktometern
US3509336A (en) * 1969-03-07 1970-04-28 Exxon Research Engineering Co Apparatus and method for obtaining x-ray diffraction patterns

Also Published As

Publication number Publication date
ES488509A0 (es) 1980-12-16
JPS55124050A (en) 1980-09-24
AU525463B2 (en) 1982-11-04
CA1141483A (en) 1983-02-15
US4199678A (en) 1980-04-22
EP0014500A1 (en) 1980-08-20
AU5497380A (en) 1981-08-06
JPS6022292B2 (ja) 1985-06-01
DE3060311D1 (en) 1982-06-09
EP0014500B1 (en) 1982-04-28

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