ES367221A1 - Procedimiento y dispositivo para la produccion de iones. - Google Patents

Procedimiento y dispositivo para la produccion de iones.

Info

Publication number
ES367221A1
ES367221A1 ES367221A ES367221A ES367221A1 ES 367221 A1 ES367221 A1 ES 367221A1 ES 367221 A ES367221 A ES 367221A ES 367221 A ES367221 A ES 367221A ES 367221 A1 ES367221 A1 ES 367221A1
Authority
ES
Spain
Prior art keywords
plasma
target
generated
electrodes
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES367221A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of ES367221A1 publication Critical patent/ES367221A1/es
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Electron Sources, Ion Sources (AREA)
ES367221A 1968-05-15 1969-05-14 Procedimiento y dispositivo para la produccion de iones. Expired ES367221A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR151943 1968-05-15

Publications (1)

Publication Number Publication Date
ES367221A1 true ES367221A1 (es) 1971-05-01

Family

ID=8650281

Family Applications (1)

Application Number Title Priority Date Filing Date
ES367221A Expired ES367221A1 (es) 1968-05-15 1969-05-14 Procedimiento y dispositivo para la produccion de iones.

Country Status (8)

Country Link
US (1) US3644731A (es)
BE (1) BE732190A (es)
CH (1) CH510369A (es)
DE (1) DE1922871B2 (es)
ES (1) ES367221A1 (es)
FR (1) FR1580234A (es)
GB (1) GB1268813A (es)
LU (1) LU58541A1 (es)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3748475A (en) * 1972-02-17 1973-07-24 T Roberts Neutron generator axially assisted by laser
US3944826A (en) * 1973-07-19 1976-03-16 Applied Research Laboratories Limited Methods and apparatus for analyzing mixtures
DE2540505A1 (de) * 1975-09-11 1977-03-24 Leybold Heraeus Gmbh & Co Kg Flugzeit-massenspektrometer fuer ionen mit unterschiedlichen energien
DE2739829C2 (de) * 1977-09-03 1986-04-10 Gesellschaft für Strahlen- und Umweltforschung mbH, 8000 München Anordnung zur Analyse einer Probenschicht durch Beschuß mit elektromagnetischer Strahlung
DE2740183A1 (de) * 1977-09-07 1979-03-08 Leybold Heraeus Gmbh & Co Kg Einrichtung zur fokussierung elektromagnetischer strahlung auf eine probe
JPS57205953A (en) * 1981-06-12 1982-12-17 Jeol Ltd Ion source
DE3201264A1 (de) * 1982-01-16 1983-07-28 Leybold-Heraeus GmbH, 5000 Köln Lasermikrosonde
GB2177507B (en) * 1985-06-13 1989-02-15 Mitsubishi Electric Corp Laser mass spectroscopic analyzer
GB8703012D0 (en) * 1987-02-10 1987-03-18 Vg Instr Group Secondary ion mass spectrometer
JP2564404B2 (ja) * 1989-09-20 1996-12-18 株式会社日立製作所 質量分析方法
US5204530A (en) * 1991-12-27 1993-04-20 Philippe Chastagner Noise reduction in negative-ion quadrupole mass spectrometry
DE19637480C2 (de) * 1996-09-13 2001-02-08 Thorald Bergmann Vorrichtung zur massenspektrometrischen Analyse von Oberflächen
GB0021902D0 (en) * 2000-09-06 2000-10-25 Kratos Analytical Ltd Ion optics system for TOF mass spectrometer
GB2400976B (en) * 2000-09-06 2005-02-09 Kratos Analytical Ltd Ion optics system for TOF mass spectrometer
US20090202692A1 (en) * 2008-02-11 2009-08-13 Sang Hoon Chun Seasoning dispenser
JP5801144B2 (ja) * 2011-08-30 2015-10-28 株式会社東芝 イオン源
CN110828281B (zh) * 2019-11-15 2020-10-09 中国科学院大连化学物理研究所 一种离子富集离子迁移管

Also Published As

Publication number Publication date
BE732190A (es) 1969-10-01
LU58541A1 (es) 1969-07-29
DE1922871B2 (de) 1972-02-17
US3644731A (en) 1972-02-22
FR1580234A (es) 1969-09-05
GB1268813A (en) 1972-03-29
DE1922871A1 (de) 1969-11-20
CH510369A (fr) 1971-07-15

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