ES2191197T3 - Procedimiento y dispositivo para medir placas de ensayo lacadas. - Google Patents
Procedimiento y dispositivo para medir placas de ensayo lacadas.Info
- Publication number
- ES2191197T3 ES2191197T3 ES97942027T ES97942027T ES2191197T3 ES 2191197 T3 ES2191197 T3 ES 2191197T3 ES 97942027 T ES97942027 T ES 97942027T ES 97942027 T ES97942027 T ES 97942027T ES 2191197 T3 ES2191197 T3 ES 2191197T3
- Authority
- ES
- Spain
- Prior art keywords
- procedure
- tables
- measuring
- place
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 title abstract 2
- 238000005259 measurement Methods 0.000 abstract 3
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/26—Oils; Viscous liquids; Paints; Inks
- G01N33/32—Paints; Inks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/57—Measuring gloss
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/0099—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor comprising robots or similar manipulators
Landscapes
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Pathology (AREA)
- Medicinal Chemistry (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Immunology (AREA)
- Food Science & Technology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
- Spectrometry And Color Measurement (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
Abstract
APARATO Y PROCEDIMIENTO PARA MEDIR MESAS DE CONTROL QUE ESTAN PINTADAS, ESTANDO SUJETAS LAS MESAS (2) MEDIANTE UN DISPOSITIVO DE SUJECION Y MOVIMIENTO, P. E. UN ROBOT DE LABORATORIO, ESTAS MESAS PROCEDEN DE UNA CORREA DE DISTRIBUCION (1), SE COLOCAN EN UN LUGAR DE MEDIDA (9) Y DESPUES SE TRANSPORTAN A UN LUGAR DE ALMACENAMIENTO (5). EN EL LUGAR DE MEDIDA (9), EL ROBOT DE LABORATORIO (3) MIDE LAS DIFERENTES CARACTERISTICAS DEL RECUBRIMIENTO UTILIZANDO DIFERENTES EQUIPOS DE MEDIDA (4). ESTO SE PUEDE REALIZAR CON UNA RESOLUCION LOCAL Y POR MEDIOS ELECTRONICOS. ADEMAS LAS MESAS DE CONTROL SE PUEDEN MARCAR CON UN SISTEMA DE CODIGO DE BARRAS QUE SE DETECTA Y SE EVALUA ELECTRONICAMENTE.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19640376 | 1996-09-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2191197T3 true ES2191197T3 (es) | 2003-09-01 |
Family
ID=7807494
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES97942027T Expired - Lifetime ES2191197T3 (es) | 1996-09-30 | 1997-09-12 | Procedimiento y dispositivo para medir placas de ensayo lacadas. |
Country Status (10)
Country | Link |
---|---|
US (1) | US6459477B1 (es) |
EP (1) | EP0929807B1 (es) |
JP (1) | JP3751980B2 (es) |
KR (1) | KR20000048785A (es) |
CN (1) | CN1232544A (es) |
AT (1) | ATE231613T1 (es) |
BR (1) | BR9714346A (es) |
DE (2) | DE19709406A1 (es) |
ES (1) | ES2191197T3 (es) |
WO (1) | WO1998014778A1 (es) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19830745C1 (de) * | 1998-07-09 | 2000-03-16 | Basf Coatings Ag | Verfahren zur Bestimmung richtungsabhängiger Eigenschaften von Lackierungen |
DE19833859C1 (de) * | 1998-07-28 | 2000-03-30 | Basf Coatings Ag | Verfahren zur Ermittlung der Farbtonstabilität von Lacken |
DE10010140A1 (de) * | 2000-03-03 | 2001-09-13 | Leica Microsystems | Vorrichtung zur vorzugsweise automatischen Handhabung und/oder Bearbeitung von Objekten |
DE10036741A1 (de) * | 2000-07-27 | 2002-02-07 | Duerr Systems Gmbh | Verfahren und Kontrollsystem zur Kontrolle der Beschichtungsqualität von Werkstücken |
DE10163596C1 (de) * | 2001-12-21 | 2003-09-18 | Rehau Ag & Co | Verfahren zur mobilen On- und Offlinekontrolle farbiger und hochglänzender Automobilteiloberflächen |
DE10233314B4 (de) * | 2002-07-22 | 2007-09-06 | Sirona Dental Systems Gmbh | Vermessungseinrichtung für eine Vorlage und damit versehene Bearbeitungsmaschine |
DE10329964A1 (de) * | 2003-07-03 | 2005-01-27 | Basf Coatings Ag | Verfahren zur Bestimmung der Stabilitätsgrenze von Schichten aus Beschichtungsstoffen auf geneigten Oberflächen |
US7430485B2 (en) * | 2003-08-22 | 2008-09-30 | Rohm And Haas Company | Method and system for analyzing coatings undergoing exposure testing |
DE10351412B3 (de) * | 2003-10-31 | 2005-01-20 | Bitzer Wiegetechnik Gmbh | Probenanalyseanordnung und Verfahren zur Durchführung von Probenanalysen |
JP2006292539A (ja) * | 2005-04-11 | 2006-10-26 | Konica Minolta Sensing Inc | 光学特性測定のための支援装置およびコンピュータプログラム |
DE102005035318A1 (de) * | 2005-07-28 | 2007-02-01 | Intelligendt Systems & Services Gmbh & Co Kg | Einrichtung zur zerstörungsfreien Werkstoffprüfung |
DE102008022013A1 (de) | 2008-05-02 | 2009-11-12 | Basf Coatings Ag | Verfahren zur Messung der Wolkigkeit von Lackierungen auf Prüftafeln |
DE102009050075B4 (de) | 2009-10-20 | 2014-10-30 | Basf Coatings Gmbh | Verfahren zur Messung der Wolkigkeit von Lackierungen auf Prüftafeln |
DE102010013765B4 (de) * | 2010-03-31 | 2015-09-10 | Fagus-Grecon Greten Gmbh & Co. Kg | Verfahren zum Prüfen von in hoher Vielzahl in einem fortlaufenden Prozess hergestellten Holzwerkstücken und Vorrichtung vorzugsweise zur Durchführung dieses Verfahrens |
US11028480B2 (en) | 2018-03-19 | 2021-06-08 | Applied Materials, Inc. | Methods of protecting metallic components against corrosion using chromium-containing thin films |
US11009339B2 (en) | 2018-08-23 | 2021-05-18 | Applied Materials, Inc. | Measurement of thickness of thermal barrier coatings using 3D imaging and surface subtraction methods for objects with complex geometries |
EP3959356A4 (en) | 2019-04-26 | 2023-01-18 | Applied Materials, Inc. | METHODS FOR PROTECTING AEROSPACE ELEMENTS AGAINST CORROSION AND OXIDATION |
US20240105476A1 (en) * | 2022-09-23 | 2024-03-28 | Intel Corporation | System for coating method |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4686374A (en) * | 1980-06-26 | 1987-08-11 | Diffracto Ltd. | Surface reflectivity detector with oil mist reflectivity enhancement |
US4561776A (en) * | 1981-03-25 | 1985-12-31 | Diffracto Ltd. | Electro-optical sensors for tool and robotic inspection |
US4920385A (en) * | 1984-02-14 | 1990-04-24 | Diffracto Ltd. | Panel surface flaw inspection |
US4629319A (en) * | 1984-02-14 | 1986-12-16 | Diffracto Ltd. | Panel surface flaw inspection |
US4615902A (en) * | 1985-09-03 | 1986-10-07 | E. I. Du Pont De Nemours And Company | Color panel standards sorting system |
JP2654682B2 (ja) * | 1989-02-17 | 1997-09-17 | 富士写真フイルム株式会社 | 生化学分析装置、生化学分析補正方法及び補正値記録体 |
US5062298A (en) | 1989-12-05 | 1991-11-05 | E. I. Du Pont De Nemours And Company | Non-contact wet or dry film thickness measuring device using eddy current and ultrasonic sensors |
JP2588297B2 (ja) * | 1990-06-20 | 1997-03-05 | 日産自動車株式会社 | 塗装表面の鮮映性評価方法 |
US5452078A (en) * | 1993-06-17 | 1995-09-19 | Ann F. Koo | Method and apparatus for finding wafer index marks and centers |
JPH0755570A (ja) | 1993-08-11 | 1995-03-03 | Tetsuya Muraoka | 標本の色彩と光沢度から再現データまたは評価のデータを取得する装置 |
-
1997
- 1997-03-07 DE DE19709406A patent/DE19709406A1/de not_active Ceased
- 1997-09-12 AT AT97942027T patent/ATE231613T1/de not_active IP Right Cessation
- 1997-09-12 EP EP97942027A patent/EP0929807B1/de not_active Expired - Lifetime
- 1997-09-12 KR KR1019990702773A patent/KR20000048785A/ko not_active Application Discontinuation
- 1997-09-12 DE DE59709205T patent/DE59709205D1/de not_active Expired - Lifetime
- 1997-09-12 BR BR9714346-4A patent/BR9714346A/pt unknown
- 1997-09-12 US US09/269,418 patent/US6459477B1/en not_active Expired - Lifetime
- 1997-09-12 WO PCT/EP1997/005005 patent/WO1998014778A1/de not_active Application Discontinuation
- 1997-09-12 JP JP51616898A patent/JP3751980B2/ja not_active Expired - Lifetime
- 1997-09-12 CN CN97198422A patent/CN1232544A/zh active Pending
- 1997-09-12 ES ES97942027T patent/ES2191197T3/es not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0929807A1 (de) | 1999-07-21 |
CN1232544A (zh) | 1999-10-20 |
JP3751980B2 (ja) | 2006-03-08 |
DE19709406A1 (de) | 1998-04-09 |
WO1998014778A1 (de) | 1998-04-09 |
BR9714346A (pt) | 2000-04-11 |
JP2001501731A (ja) | 2001-02-06 |
EP0929807B1 (de) | 2003-01-22 |
KR20000048785A (ko) | 2000-07-25 |
US6459477B1 (en) | 2002-10-01 |
ATE231613T1 (de) | 2003-02-15 |
DE59709205D1 (de) | 2003-02-27 |
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