ES2174641T3 - Dispositivo perceptor de frente de ondas. - Google Patents

Dispositivo perceptor de frente de ondas.

Info

Publication number
ES2174641T3
ES2174641T3 ES99949148T ES99949148T ES2174641T3 ES 2174641 T3 ES2174641 T3 ES 2174641T3 ES 99949148 T ES99949148 T ES 99949148T ES 99949148 T ES99949148 T ES 99949148T ES 2174641 T3 ES2174641 T3 ES 2174641T3
Authority
ES
Spain
Prior art keywords
light
focus plane
perceptor
detectors
wave front
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES99949148T
Other languages
English (en)
Inventor
Mark Andrew Aquilla Neil
Tony Wilson
Martin James Booth
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oxford University Innovation Ltd
Original Assignee
Oxford University Innovation Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oxford University Innovation Ltd filed Critical Oxford University Innovation Ltd
Application granted granted Critical
Publication of ES2174641T3 publication Critical patent/ES2174641T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Microscoopes, Condenser (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Automatic Focus Adjustment (AREA)

Abstract

Un dispositivo de percepción de frente de onda que comprende un medio de máscara de modulación (10) que aplica aberraciones positiva y negativa iguales a la luz incidente en el medio de máscara (10), uno o más elementos de enfoque jos (11), y uno o más detectores (12), caracterizado porque el medio de máscara de modulación (10) produce, en combinación con el elemento o elementos de enfoque jos (11), un par de puntos de luz en el plano de enfoque, y el detector o detectores (12) están situados en o cerca del plano de enfoque y determinan diferencias en la intensidad entre el par de puntos de luz en o cerca del plano de enfoque, siendo la diferencia representativa de la desviación en la forma del frente de onda de la luz incidente de la forma de frente de onda ideal.
ES99949148T 1998-09-23 1999-09-23 Dispositivo perceptor de frente de ondas. Expired - Lifetime ES2174641T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB9820664.2A GB9820664D0 (en) 1998-09-23 1998-09-23 Wavefront sensing device

Publications (1)

Publication Number Publication Date
ES2174641T3 true ES2174641T3 (es) 2002-11-01

Family

ID=10839291

Family Applications (1)

Application Number Title Priority Date Filing Date
ES99949148T Expired - Lifetime ES2174641T3 (es) 1998-09-23 1999-09-23 Dispositivo perceptor de frente de ondas.

Country Status (7)

Country Link
US (1) US6570143B1 (es)
EP (1) EP1123491B1 (es)
JP (1) JP2002525596A (es)
DE (1) DE69901516T2 (es)
ES (1) ES2174641T3 (es)
GB (1) GB9820664D0 (es)
WO (1) WO2000017612A1 (es)

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US6406146B1 (en) * 2000-09-21 2002-06-18 Carl Zeiss, Inc. Wavefront refractor simultaneously recording two hartmann-shack images
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TWI220998B (en) * 2001-02-13 2004-09-11 Nikon Corp Exposure method, exposure apparatus and manufacture method of the same
US20060285100A1 (en) * 2001-02-13 2006-12-21 Nikon Corporation Exposure apparatus and exposure method, and device manufacturing method
JP4467982B2 (ja) * 2001-12-24 2010-05-26 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 画像化システムの収差を確定するための方法およびシステムと、この方法で使用するためのテストオブジェクトおよび検出器
WO2003065428A1 (fr) * 2002-01-29 2003-08-07 Nikon Corporation Systeme de reglage d'etat de formation d'images, procede d'insolation, appareil d'exposition, programme, et support d'enregistrement d'information
WO2003075328A1 (fr) * 2002-03-01 2003-09-12 Nikon Corporation Procede de reglage d'un systeme optique de projection, procede de prediction, procede d'evaluation, procede de reglage, procede d'exposition, dispositif d'exposition, programme et procede de fabrication dudit dispositif
DE10227120A1 (de) 2002-06-15 2004-03-04 Carl Zeiss Jena Gmbh Mikroskop, insbesondere Laserscanningmikroskop mit adaptiver optischer Einrichtung
US6844927B2 (en) * 2002-11-27 2005-01-18 Kla-Tencor Technologies Corporation Apparatus and methods for removing optical abberations during an optical inspection
US7556378B1 (en) 2003-04-10 2009-07-07 Tsontcho Ianchulev Intraoperative estimation of intraocular lens power
US7057806B2 (en) * 2003-05-09 2006-06-06 3M Innovative Properties Company Scanning laser microscope with wavefront sensor
GB0314444D0 (en) * 2003-06-20 2003-07-23 Univ Heriot Watt Novel wavefront sensor
WO2005024488A1 (en) * 2003-09-11 2005-03-17 Koninklijke Philips Electronics, N.V. Adjustment of optical components in optical devices
GB0328904D0 (en) * 2003-12-12 2004-01-14 Swan Thomas & Co Ltd Scarab
US7113268B2 (en) * 2004-01-12 2006-09-26 The Boeing Company Scintillation tolerant optical field sensing system and associated method
ES2665536T3 (es) 2004-04-20 2018-04-26 Alcon Research, Ltd. Microscopio quirúrgico y sensor de frente de onda integrados
ES2243129B1 (es) * 2004-04-23 2006-08-16 Universitat Politecnica De Catalunya Perfilometro optico de tecnologia dual (confocal e interferometrica) para la inspeccion y medicion tridimensional de superficies.
GB0510470D0 (en) * 2005-05-23 2005-06-29 Qinetiq Ltd Coded aperture imaging system
GB2434877A (en) * 2006-02-06 2007-08-08 Qinetiq Ltd MOEMS optical modulator
GB2434937A (en) * 2006-02-06 2007-08-08 Qinetiq Ltd Coded aperture imaging apparatus performing image enhancement
GB2434935A (en) 2006-02-06 2007-08-08 Qinetiq Ltd Coded aperture imager using reference object to form decoding pattern
GB0602380D0 (en) * 2006-02-06 2006-03-15 Qinetiq Ltd Imaging system
GB2434934A (en) 2006-02-06 2007-08-08 Qinetiq Ltd Processing coded aperture image data by applying weightings to aperture functions and data frames
GB2434936A (en) * 2006-02-06 2007-08-08 Qinetiq Ltd Imaging system having plural distinct coded aperture arrays at different mask locations
US7531774B2 (en) * 2006-06-05 2009-05-12 General Dynamics Advanced Information Systems, Inc. Measurement-diverse imaging and wavefront sensing with amplitude and phase estimation
GB0615040D0 (en) * 2006-07-28 2006-09-06 Qinetiq Ltd Processing method for coded apperture sensor
US8118429B2 (en) 2007-10-29 2012-02-21 Amo Wavefront Sciences, Llc. Systems and methods of phase diversity wavefront sensing
US7594729B2 (en) 2007-10-31 2009-09-29 Wf Systems, Llc Wavefront sensor
FR2923619B1 (fr) * 2007-11-13 2009-11-20 Thales Sa Dispositif de mesure de defauts d'un instrument d'imagerie a capteur opto-electronique et dispositif de correction le comportant
JP5139832B2 (ja) * 2008-02-14 2013-02-06 浜松ホトニクス株式会社 観察装置
US8551730B2 (en) 2008-10-24 2013-10-08 The Regents Of The University Of California Use of a reference source with adaptive optics in biological microscopy
WO2010054268A2 (en) 2008-11-06 2010-05-14 Wavetec Vision Systems, Inc. Optical angular measurement system for ophthalmic applications and method for positioning of a toric intraocular lens with increased accuracy
GB0822281D0 (en) * 2008-12-06 2009-01-14 Qinetiq Ltd Optically diverse coded aperture imaging
US8876290B2 (en) 2009-07-06 2014-11-04 Wavetec Vision Systems, Inc. Objective quality metric for ocular wavefront measurements
ES2542903T3 (es) 2009-07-14 2015-08-12 Wavetec Vision Systems, Inc. Sistema de medición para cirugía oftálmica
ES2653970T3 (es) 2009-07-14 2018-02-09 Wavetec Vision Systems, Inc. Determinación de la posición efectiva de la lente de una lente intraocular utilizando potencia refractiva afáquica
CN102564611B (zh) * 2012-01-04 2013-06-12 西安电子科技大学 大功率激光波前测量仪及波前测量方法
GB2501117A (en) * 2012-04-13 2013-10-16 Isis Innovation Laser focusing method and apparatus
JP5919100B2 (ja) * 2012-06-04 2016-05-18 浜松ホトニクス株式会社 補償光学システムの調整方法および補償光学システム
US9072462B2 (en) 2012-09-27 2015-07-07 Wavetec Vision Systems, Inc. Geometric optical power measurement device
JP6494205B2 (ja) * 2013-07-31 2019-04-03 キヤノン株式会社 波面計測方法、形状計測方法、光学素子の製造方法、光学機器の製造方法、プログラム、波面計測装置
CN104062877B (zh) * 2014-07-01 2016-11-09 中国科学院长春光学精密机械与物理研究所 基于动态全息图的闭环自适应光学系统
US9305378B1 (en) * 2014-12-17 2016-04-05 The Boeing Company Lenslet, beamwalk and tilt diversity for anisoplanatic imaging by large-aperture telescopes
JP6772442B2 (ja) * 2015-09-14 2020-10-21 株式会社ニコン 顕微鏡装置および観察方法
JPWO2018070206A1 (ja) 2016-10-12 2019-08-29 日本電気株式会社 分光装置及び撮像装置
EP3535554A1 (en) 2016-11-01 2019-09-11 King Abdullah University Of Science And Technology Wavefront sensor and method of reconstructing distorted wavefronts
EP3358321A1 (en) * 2017-02-03 2018-08-08 Wooptix S.L. Method and optical system for acquiring the tomographical distribution of wave fronts of electromagnetic fields
DE102017106143A1 (de) * 2017-03-22 2018-09-27 Carl Zeiss Microscopy Gmbh Wellenfront-Korrektur mit adaptivem optischen Element
EP3964809A1 (en) * 2020-09-02 2022-03-09 Stichting VU Wavefront metrology sensor and mask therefor, method for optimizing a mask and associated apparatuses
CN112629680B (zh) * 2020-12-07 2022-04-08 中国科学院长春光学精密机械与物理研究所 基于夏克-哈特曼波前传感的航空相机检焦装置及方法
EP4264211A1 (en) * 2020-12-15 2023-10-25 Quartus Engineering Incorporated Wavefront sensors with irregular aperture masks, diffusers, and cameras, and methods of making and using the same
US11701077B2 (en) 2021-02-25 2023-07-18 Uchicago Argonne, Llc Coded-mask-based X-ray phase-contrast and dark-field imaging
CN114880953B (zh) * 2022-06-10 2023-08-11 中国科学院光电技术研究所 一种四台阶相位型菲涅尔波带片的快速波前复原方法

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US4725138A (en) * 1985-05-22 1988-02-16 Adaptive Optics Associates Incorporated Optical wavefront sensing system
JP2895150B2 (ja) 1990-03-16 1999-05-24 シチズン時計株式会社 光学装置
US5120128A (en) * 1991-01-14 1992-06-09 Kaman Aerospace Corporation Apparatus for sensing wavefront aberration

Also Published As

Publication number Publication date
GB9820664D0 (en) 1998-11-18
US6570143B1 (en) 2003-05-27
WO2000017612A1 (en) 2000-03-30
JP2002525596A (ja) 2002-08-13
DE69901516T2 (de) 2002-10-10
EP1123491B1 (en) 2002-05-15
EP1123491A1 (en) 2001-08-16
DE69901516D1 (de) 2002-06-20

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