ES2105729T3 - Aparato para probar circuitos integrados incluyendo una estructura de condensador de paso. - Google Patents

Aparato para probar circuitos integrados incluyendo una estructura de condensador de paso.

Info

Publication number
ES2105729T3
ES2105729T3 ES94919442T ES94919442T ES2105729T3 ES 2105729 T3 ES2105729 T3 ES 2105729T3 ES 94919442 T ES94919442 T ES 94919442T ES 94919442 T ES94919442 T ES 94919442T ES 2105729 T3 ES2105729 T3 ES 2105729T3
Authority
ES
Spain
Prior art keywords
probes
probe
point
sheet
dimensions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES94919442T
Other languages
English (en)
Inventor
Gregory George Boll
Harry Joseph Boll
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GGB Industries Inc
Original Assignee
GGB Industries Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GGB Industries Inc filed Critical GGB Industries Inc
Application granted granted Critical
Publication of ES2105729T3 publication Critical patent/ES2105729T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

UN DISPOSITIVO PARA EXPLORAR EL FUNCIONAMIENTO DE CIRCUITOS INTEGRADOS DE ALTA VELOCIDAD (CI) POR ALGUN TIEMPO EN FORMA DE CHAPA O SEPARADO DE LA CHAPA QUE INCLUYE UNA PRIMERA (14, 92) Y SEGUNDA (12) SONDAS SEPARADAS MONTADAS DE FORMA FIJA EN UN ELEMENTO DE SOPORTE (16) PARA SITUAR DE FORMA PRECISA LA PRIMERA Y SEGUNDA SONDAS EN TRES DIMENSIONES PARA PONER EN CONTACTO AL MENOS UN PRIMER PUNTO (32, 34) Y UN SEGUNDO PUNTO (28), RESPECTIVAMENTE, EN UN CI EN PRUEBA. LA PRIMERA Y SEGUNDA SONDAS ESTAN INTERCONECTADAS EN UNA PARTE PREDETERMINADA DE SU LONGITUD POR UN ELEMENTO CONDENSADOR (38) QUE PROPORCIONA FLEXIBILIDAD SUFICIENTE PARA FACILITAR UN MOVIMIENTO INDEPENDIENTE DE LA PRIMERA Y SEGUNDA SONDAS Y EVITAR PARAMETROS DE INTRODUCCION (POR EJEMPLO, INDUCTANCIA) QUE INTERFIERAN CON LA COMPROBACION A ALTA VELOCIDAD DEL CI. EN UNA REALIZACION, LA PRIMERA SONDA ES UNA SONDA DE LINEA DE TRANSMISION (POR EJEMPLO, UNA LINEA COAXIAL) Y LA SEGUNDA SONDA ES UNA SONDA DE CABLE PARA SUMINISTRAR ALIMENTACION AL SEGUNDO PUNTO DEL CI. EN OTRA REALIZACION, LA PRIMERA Y SEGUNDA SONDAS SON SONDAS DE CABLE PARA PROPORCIONAR UN POTENCIAL DE REFERENCIA Y ALIMENTACION, RESPECTIVAMENTE, AL PRIMER Y SEGUNDO PUNTOS RESPECTIVOS DEL CI. EL ELEMENTO CONDENSADOR PUEDE CONSTAR DE SOLO UN CONDENSADOR DE TIPO DE HOJAS METALICAS (80), O UN CONDENSADOR (24) EN SERIE CON UNA BANDA DE METAL FLEXIBLE (27) QUE TIENE DIMENSIONES PARA MINIMIZAR LA INDUCTANCIA PARA INTERCONECTAR ELECTRICAMENTE LA PRIMERA Y SEGUNDA SONDAS. EL CONDENSADOR FUNCIONA PARA BLOQUEAR LA CORRIENTE CONTINUA Y PASAR SEÑALES DE C.A CUANDO SEAN NECESARIAS.
ES94919442T 1993-06-10 1994-06-08 Aparato para probar circuitos integrados incluyendo una estructura de condensador de paso. Expired - Lifetime ES2105729T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/075,139 US5373231A (en) 1993-06-10 1993-06-10 Integrated circuit probing apparatus including a capacitor bypass structure

Publications (1)

Publication Number Publication Date
ES2105729T3 true ES2105729T3 (es) 1997-10-16

Family

ID=22123814

Family Applications (1)

Application Number Title Priority Date Filing Date
ES94919442T Expired - Lifetime ES2105729T3 (es) 1993-06-10 1994-06-08 Aparato para probar circuitos integrados incluyendo una estructura de condensador de paso.

Country Status (7)

Country Link
US (1) US5373231A (es)
EP (1) EP0702797B1 (es)
JP (1) JPH08510553A (es)
KR (1) KR100190540B1 (es)
DE (1) DE69403335T2 (es)
ES (1) ES2105729T3 (es)
WO (1) WO1994029732A1 (es)

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Also Published As

Publication number Publication date
JPH08510553A (ja) 1996-11-05
EP0702797A1 (en) 1996-03-27
WO1994029732A1 (en) 1994-12-22
KR960702908A (ko) 1996-05-23
DE69403335T2 (de) 1998-01-22
EP0702797B1 (en) 1997-05-21
US5373231A (en) 1994-12-13
KR100190540B1 (ko) 1999-06-01
DE69403335D1 (de) 1997-06-26

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