ES2090735T3 - Procedimiento y dispositivo para medir distancias. - Google Patents

Procedimiento y dispositivo para medir distancias.

Info

Publication number
ES2090735T3
ES2090735T3 ES93103234T ES93103234T ES2090735T3 ES 2090735 T3 ES2090735 T3 ES 2090735T3 ES 93103234 T ES93103234 T ES 93103234T ES 93103234 T ES93103234 T ES 93103234T ES 2090735 T3 ES2090735 T3 ES 2090735T3
Authority
ES
Spain
Prior art keywords
procedure
point
measure distances
light point
distinction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES93103234T
Other languages
English (en)
Inventor
Gerd Prof Dr Hausler
Jurgen Herrmann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
LCTEC LASER und COMPUTERTECHNI
Original Assignee
LCTEC LASER und COMPUTERTECHNI
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by LCTEC LASER und COMPUTERTECHNI filed Critical LCTEC LASER und COMPUTERTECHNI
Application granted granted Critical
Publication of ES2090735T3 publication Critical patent/ES2090735T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/08—Systems determining position data of a target for measuring distance only
    • G01S17/32—Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G01S7/4811—Constructional features, e.g. arrangements of optical elements common to transmitter and receiver

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Measurement Of Optical Distance (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

OBJETO DE LA PRESENTE INVENCION ES UN PROCEDIMIENTO Y UN DISPOSITIVO PARA MEDIR DISTANCIAS ENTRE UN OBJETO Y UN PUNTO DE REFERENCIA. EL OBJETO SE IRRADIA POR MEDIO DE UNA RADIACION ELECTROMAGNETICA, A PARTIR DE UNA FUENTE DE RADIACION EN UN PUNTO LUMINOSO, Y LA IRRADIACION EMERGENTE DEL PUNTO LUMINOSO SE CAPTA POR UN CABEZAL DE MEDICION, Y A PARTIR DE ELLO SE DETERMINA LA DISTANCIA ENTRE EL OBJETO Y EL PUNTO DE REFERENCIA. SEGUN LA INVENCION, EL OBJETO ES EXCITADO EN EL PUNTO LUMINOSO POR LA IRRADIACION ELECTROMAGNETICA PARA LA EMISION DE UNA RADIACION INCOHERENTE ESPACIAL, Y PARA LA DETERMINACION DE LA DISTANCIA SE UTILIZA TAN SOLO SELECTIVAMENTE LA PARTE INCOHERENTE ESPACIAL DE LA RADIACION EMITIDA Y EXCITADA EN EL PUNTO LUMINOSO.
ES93103234T 1992-03-02 1993-03-01 Procedimiento y dispositivo para medir distancias. Expired - Lifetime ES2090735T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE4206499A DE4206499C2 (de) 1992-03-02 1992-03-02 Verfahren und Vorrichtung zur Abstandsmessung

Publications (1)

Publication Number Publication Date
ES2090735T3 true ES2090735T3 (es) 1996-10-16

Family

ID=6453012

Family Applications (1)

Application Number Title Priority Date Filing Date
ES93103234T Expired - Lifetime ES2090735T3 (es) 1992-03-02 1993-03-01 Procedimiento y dispositivo para medir distancias.

Country Status (5)

Country Link
US (1) US5486926A (es)
EP (1) EP0559120B1 (es)
JP (1) JP3547772B2 (es)
DE (2) DE4206499C2 (es)
ES (1) ES2090735T3 (es)

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BE1007787A6 (fr) * 1993-12-06 1995-10-24 Centre Rech Metallurgique Procede et dispositif pour mesurer le profil du flanc d'une bobine de bande.
CA2115859C (en) * 1994-02-23 1995-12-26 Brian Dewan Method and apparatus for optimizing sub-pixel resolution in a triangulation based distance measuring device
SE505305C2 (sv) * 1995-10-20 1997-08-04 Optronic Consult Ab Förfarande och anordning för inmätning av en tredimensionell form
IL116717A (en) * 1996-01-09 1999-12-22 Elop Electrooptics Ind Ltd Optical tracing system
DE19747784A1 (de) * 1997-10-29 1999-05-06 Rothe Lutz Dr Ing Habil Objekterkennung mittels Thermosignaturanalyse
AT406423B8 (de) * 1997-12-22 2000-07-25 Forsch Laserbau Und Laserbearb Sensorsystem zur erfassung von temperatur und position des schmelzbades bei der lasermaterialbearbeitung
JP4488142B2 (ja) 1998-09-30 2010-06-23 レーザーテク ゲーエムベーハー レーザ加工装置により形成される凹部の深さ測定および深さ制御または自動深さ制御
JP2000338242A (ja) * 1999-05-24 2000-12-08 Topcon Corp 光源手段と光波距離計
DE10142206A1 (de) * 2001-08-25 2003-03-13 Fraunhofer Ges Forschung Messanordnung und Verfahren zur Bestimmung der Tiefe von in Substratoberflächen ausgebildeten Bohrungen oder nutenförmigen Einschnitten
US7767928B2 (en) 2001-09-05 2010-08-03 Lasertec Gmbh Depth measurement and depth control or automatic depth control for a hollow to be produced by a laser processing device
EP1314954A1 (en) * 2001-11-23 2003-05-28 Agilent Technologies, Inc. (a Delaware corporation) Method and apparatus for locating fluorescent spherical optical components
JP3578214B2 (ja) * 2002-12-09 2004-10-20 オムロン株式会社 回帰反射型光電センサ
DE102005022108A1 (de) 2005-05-12 2006-11-16 Siemens Ag Verfahren zur Überwachung einer Röntgenvorrichtung und Röntgenvorrichtung
DE102005028415A1 (de) * 2005-06-20 2006-12-21 Siemens Ag Verfahren zur Bestimmung einer radiologischen Dicke eines Objekts
CN100356193C (zh) * 2005-09-22 2007-12-19 哈尔滨工程大学 受激布里渊散射激光雷达水下隐身物体探测系统及方法
DE102006005463A1 (de) 2006-02-07 2007-08-09 Leuze Electronic Gmbh & Co Kg Optoelektronische Vorrichtung
DE202006005876U1 (de) * 2006-04-11 2007-08-16 Leuze Electronic Gmbh & Co Kg Optischer Sensor
FR2938908B1 (fr) * 2008-11-24 2011-01-21 Commissariat Energie Atomique Dispositif et procede de mesure de la position d'au moins un objet en mouvement dans un repere a trois dimensions
US20120320364A1 (en) * 2009-12-14 2012-12-20 Volvo Aero Corporation Device and a method for determining a distance to a surface of a workpiece and an arrangement and a method for effecting a workpiece
EP2381269A1 (de) * 2010-04-13 2011-10-26 Leica Geosystems AG Koordinatenmessgerät mit automatischer Zielerfassung
DE102013022085A1 (de) 2013-12-23 2015-06-25 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und Vorrichtung zur Überwachung und Regelung der Bearbeitungsbahn bei einem Laser-Fügeprozess
CN107449364A (zh) * 2016-05-30 2017-12-08 上海砺晟光电技术有限公司 具有参考光束的激光位移传感器
CZ2019414A3 (cs) * 2019-06-25 2020-08-19 ÄŚeskĂ© vysokĂ© uÄŤenĂ­ technickĂ© v Praze Triangulační snímač měření vzdálenosti
DE102020134317A1 (de) 2020-12-18 2022-06-23 Primes GmbH Meßtechnik für die Produktion mit Laserstrahlung Vorrichtung und Verfahren zur Fokuslagen-Bestimmung
CN112985269B (zh) * 2021-02-20 2022-09-13 河北先河环保科技股份有限公司 狭缝宽度均匀性测量系统、方法及图像处理装置
CN113699871B (zh) * 2021-09-09 2022-06-24 中交投资南京有限公司 一种具备防震缓冲抗洪水冲击的装配式桥梁结构

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US3745566A (en) * 1962-06-14 1973-07-10 Us Navy Optical radiation detector
US3589815A (en) * 1968-06-21 1971-06-29 Information Dev Corp Noncontact measuring probe
US3839638A (en) * 1973-05-21 1974-10-01 Us Navy Fluorescent marker
FI63115C (fi) * 1980-06-10 1983-04-11 Valmet Oy Foerfarande foer undersoekning av ytkvaliteten av material i fasttillstaond och anordning foer genomfoerande av foerfarandet
US4453083A (en) * 1981-10-26 1984-06-05 Betriebsforschungsinstitut Vdeh Institut Fur Angewandte Forschung Gmbh Apparatus for the determination of the position of a surface
IL65176A0 (en) * 1982-03-05 1982-05-31 C I Ltd Material testing method and apparatus
DE3342675A1 (de) * 1983-11-25 1985-06-05 Fa. Carl Zeiss, 7920 Heidenheim Verfahren und vorrichtung zur beruehrungslosen vermessung von objekten
US4936676A (en) * 1984-11-28 1990-06-26 Honeywell Inc. Surface position sensor
US4708483A (en) * 1985-06-28 1987-11-24 Rexnord Inc. Optical measuring apparatus and method
JPH07105327B2 (ja) * 1986-06-27 1995-11-13 キヤノン株式会社 面位置検知装置
GB8706388D0 (en) * 1987-03-18 1987-04-23 Meta Machines Ltd Position sensing method
US5026153A (en) * 1989-03-01 1991-06-25 Mitsubishi Denki K.K. Vehicle tracking control for continuously detecting the distance and direction to a preceding vehicle irrespective of background dark/light distribution
US4991966A (en) * 1989-06-23 1991-02-12 United Technologies Corporation Optical positioning method and system

Also Published As

Publication number Publication date
JP3547772B2 (ja) 2004-07-28
EP0559120A1 (de) 1993-09-08
DE4206499C2 (de) 1994-03-10
DE59302962D1 (de) 1996-07-25
EP0559120B1 (de) 1996-06-19
US5486926A (en) 1996-01-23
DE4206499A1 (de) 1993-09-16
JPH07218218A (ja) 1995-08-18

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