ES2076414T3 - Sistema de fotodiodos. - Google Patents
Sistema de fotodiodos.Info
- Publication number
- ES2076414T3 ES2076414T3 ES91110156T ES91110156T ES2076414T3 ES 2076414 T3 ES2076414 T3 ES 2076414T3 ES 91110156 T ES91110156 T ES 91110156T ES 91110156 T ES91110156 T ES 91110156T ES 2076414 T3 ES2076414 T3 ES 2076414T3
- Authority
- ES
- Spain
- Prior art keywords
- current
- photodiode
- output signal
- converter
- integrator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005259 measurement Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J1/46—Electric circuits using a capacitor
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/57—Control of the dynamic range
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4446—Type of detector
- G01J2001/446—Photodiode
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Light Receiving Elements (AREA)
- Spectrometry And Color Measurement (AREA)
- Facsimile Heads (AREA)
- Analogue/Digital Conversion (AREA)
Abstract
UNA RED FOTODIODICA QUE CONSTA DE UNA PLURALIDAD DE CANALES N, CADA UNO DE LOS CUALES TIENE UN FOTODIODO (1) QUE SE POLARIZA INVERSAMENTE DE TAL MODO QUE ACTUA COMO UNA FUENTE DE CORRIENTE (2). CADA CANAL CONSTA TAMBIEN DE UN CONVERTIDOR DE A/D PARA PROPORCIONAR UNA SEÑAL DE SALIDA DIGITAL (DATA) REPRESENTATIVA DE LA FOTOCORRIENTE (LPH) PROPORCIONADA POR EL FOTODIODO (1) Y, POR TANTO, DE LA INTENSIDAD DE LA LUZ QUE INCIDE SOBRE EL FOTODIODO (1). EL CONVERTIDOR DE A/D CONSTA DE UNA FUENTE DE CORRIENTE CONTROLABLE (5), UN CIRCUITO INTEGRADOR (3,4), UN COMPARADOR (7) PARA COMPARAR LA SEÑAL DE SALIDA (VOUT) DEL INTEGRADOR CON UNA SEÑAL PREDETERMINADA (VTHRESHOLD), UN CIRCUITO LOGICO (6) PARA CONTROLAR LA FUENTE DE CORRIENTE (5) EN RESPUESTA A LA SEÑAL DE SALIDA (VCOMP) DEL COMPARADOR (7) DE MODO QUE LA VOUT SE MANTIENE DENTRO DE UN CIERTO LIMITE. PREFERENTEMENTE, LA FUENTE DE CORRIENTE (5) PROPORCIONA UNA CORRIENTE A MODO DE VACIADOS DE CARGA A Y/O DESDE EL INTEGRADOR (3,4). EL NUMERO DE VACIADOS EN UN SENTIDO LO CUENTA UN CONTADOR (8) Y ES UNA MEDIDA DIGITAL DE LA FOTOCORRIENTE (LPH). LA RED FOTODIODICA ES PARTICULARMENTE UTIL PARA ESPECTROFOTOMETROS PUESTO QUE EL HECHO DE QUE HAYA UN CONVERTIDOR DE A/D INDEPENDIENTE PARA CADA CANAL PERMITE EL PROCESAMIENTO SIMULTANEO DE TODAS LAS FOTOSEÑALES DE LA RED DE MODO QUE SE EVITAN LAS DISTORSIONES DE LOS ESPECTROS QUE TIENE LUGAR DEBIDO A LOS RETARDOS DE TIEMPO DURANTE EL PROCESAMIENTO DE LAS FOTOSEÑALES.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP91110156A EP0519105B1 (en) | 1991-06-20 | 1991-06-20 | Photodiode array |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2076414T3 true ES2076414T3 (es) | 1995-11-01 |
Family
ID=8206853
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES91110156T Expired - Lifetime ES2076414T3 (es) | 1991-06-20 | 1991-06-20 | Sistema de fotodiodos. |
Country Status (5)
Country | Link |
---|---|
US (1) | US5303027A (es) |
EP (1) | EP0519105B1 (es) |
JP (1) | JPH05215607A (es) |
DE (1) | DE69111800T2 (es) |
ES (1) | ES2076414T3 (es) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8803064B2 (en) | 2009-02-03 | 2014-08-12 | Hamamatsu Photonics K.K. | Signal processing device, including charge injection circuit, and photodetection device |
Families Citing this family (48)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3215175B2 (ja) * | 1992-08-10 | 2001-10-02 | シスメックス株式会社 | 粒子分析装置 |
JPH06205767A (ja) * | 1992-11-25 | 1994-07-26 | Xerox Corp | 放射線画像形成システム |
FR2707394B1 (fr) * | 1993-07-05 | 1995-09-08 | Aerospatiale | Elément et détecteur photosensibles pour la détection d'éclats lumineux. |
US5717608A (en) * | 1994-09-26 | 1998-02-10 | Luxtron Corporation | Electro-optical board assembly for measuring the temperature of an object surface from infra-red emissions thereof, including an automatic gain control therefore |
US5799204A (en) * | 1995-05-01 | 1998-08-25 | Intergraph Corporation | System utilizing BIOS-compatible high performance video controller being default controller at boot-up and capable of switching to another graphics controller after boot-up |
DE69729767T2 (de) * | 1996-04-26 | 2005-07-14 | Hamamatsu Photonics K.K., Hamamatsu | Festkörperbildaufnahmegerät |
US5834765A (en) * | 1997-07-08 | 1998-11-10 | Ledalite Architectural Products, Inc. | Integral ambient light and occupancy sensor having a linear array of sensor element and a segmented slit aperture device |
GB2332270A (en) * | 1997-12-10 | 1999-06-16 | Mars Inc | Charge storage photoelectric measurement |
BE1011866A3 (nl) * | 1998-04-07 | 2000-02-01 | Teejet Technologies Besloten V | Inspectietoestel. |
EP0967793B1 (en) * | 1998-06-26 | 2003-03-26 | Agilent Technologies, Inc. (a Delaware corporation) | Photodiode array |
EP0967794B1 (en) * | 1998-06-26 | 2004-06-09 | Agilent Technologies, Inc. (a Delaware corporation) | Photodiode array |
EP0986250B1 (en) | 1998-09-10 | 2004-03-17 | Agilent Technologies, Inc. (a Delaware corporation) | Photodiode array |
US6424375B1 (en) * | 1999-09-21 | 2002-07-23 | Pixel Devices, International | Low noise active reset readout for image sensors |
JP4550957B2 (ja) * | 1999-11-15 | 2010-09-22 | 浜松ホトニクス株式会社 | 光検出装置 |
US6653706B1 (en) | 2000-05-08 | 2003-11-25 | The Board Of Trustees Of The Leland Stanford Junior University | Low temperature grown optical detector |
US6904784B2 (en) * | 2001-02-27 | 2005-06-14 | Teledyne Isco, Inc. | Liquid chromatographic method and system |
DE10119498C1 (de) * | 2001-04-20 | 2002-01-24 | Mikrotron Gmbh | Bildaufnahme-Auslöseeinrichtung, sowie Verfahren zum Auslösen einer Bildaufnahme |
JP4949573B2 (ja) * | 2001-07-13 | 2012-06-13 | 浜松ホトニクス株式会社 | 光検出装置 |
US20030234365A1 (en) * | 2002-01-10 | 2003-12-25 | Jan Wipenmyr | Optical detector |
WO2003081188A2 (en) * | 2002-03-20 | 2003-10-02 | Ag Leader Technolgy, Inc. | High speed analyzer using near infrared radiation transmitted through thick samples of optically dense material |
US6930300B1 (en) * | 2002-07-30 | 2005-08-16 | Finisar Corporation | Method and apparatus for monitoring a photo-detector in an optical transceiver |
US6977601B1 (en) * | 2004-01-29 | 2005-12-20 | Raytheon Company | Low power current input delta-sigma ADC using injection FET reference |
WO2006029394A2 (en) * | 2004-09-09 | 2006-03-16 | Transchip, Inc. | Imager flicker compensation systems and methods |
US7800672B1 (en) * | 2005-05-09 | 2010-09-21 | Raytheon Company | Unit cell compression circuit and method |
US7952343B2 (en) * | 2005-12-15 | 2011-05-31 | Chimei Innolux Corporation | Current measurement circuit and method |
US7671460B2 (en) * | 2006-01-25 | 2010-03-02 | Teledyne Licensing, Llc | Buried via technology for three dimensional integrated circuits |
US7436342B2 (en) * | 2007-01-30 | 2008-10-14 | Teledyne Licensing, Llc | Numerical full well capacity extension for photo sensors with an integration capacitor in the readout circuit using two and four phase charge subtraction |
US7923763B2 (en) * | 2007-03-08 | 2011-04-12 | Teledyne Licensing, Llc | Two-dimensional time delay integration visible CMOS image sensor |
US7498650B2 (en) * | 2007-03-08 | 2009-03-03 | Teledyne Licensing, Llc | Backside illuminated CMOS image sensor with pinned photodiode |
FR2921154B1 (fr) * | 2007-09-14 | 2009-11-06 | Commissariat Energie Atomique | Dispositif de detection d'un rayonnement electromagnetique a limitation de courant |
US8334495B2 (en) * | 2008-06-25 | 2012-12-18 | Semiconductor Energy Laboratory Co., Ltd. | Photometric device including a photoelectric conversion element for detecting illuminance of light |
US7795650B2 (en) * | 2008-12-09 | 2010-09-14 | Teledyne Scientific & Imaging Llc | Method and apparatus for backside illuminated image sensors using capacitively coupled readout integrated circuits |
US8654416B2 (en) | 2009-07-16 | 2014-02-18 | Konica Minolta Business Technologies, Inc. | Image reader |
FR2950480B1 (fr) * | 2009-09-22 | 2011-11-25 | Soc Fr Detecteurs Infrarouges Sofradir | Circuit de detection avec circuit d'anti-eblouissement ameliore |
JP5701528B2 (ja) * | 2010-07-16 | 2015-04-15 | オリンパス株式会社 | 生体状態量測定装置 |
JP5270641B2 (ja) * | 2010-11-10 | 2013-08-21 | シャープ株式会社 | 照度センサ、およびこの照度センサを備えた表示装置 |
JP2017522066A (ja) | 2014-06-10 | 2017-08-10 | カール ツァイス メディテック インコーポレイテッドCarl Zeiss Meditec Inc. | 改善された周波数領域干渉法による撮像システムおよび方法 |
JP2018503079A (ja) | 2014-12-18 | 2018-02-01 | メルク パテント ゲゼルシャフト ミット ベシュレンクテル ハフツングMerck Patent Gesellschaft mit beschraenkter Haftung | 分光光度計及び分光光度測定を実行する方法 |
US10128866B2 (en) * | 2015-10-16 | 2018-11-13 | Sony Semiconductor Solutions Corporation | Fast current mode sigma-delta analog-to-digital converter |
WO2017158483A1 (en) | 2016-03-14 | 2017-09-21 | Insightness Ag | A vision sensor, a method of vision sensing, and a depth sensor assembly |
FR3058263B1 (fr) | 2016-11-03 | 2019-08-23 | Lynred | Dispositif de detection multispectrale ameliore. |
US10862391B2 (en) * | 2017-03-31 | 2020-12-08 | Teledyne Dalsa B.V. | Analog-to-digital converter using charge packets |
US11101302B2 (en) | 2017-05-26 | 2021-08-24 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device and electronic device |
EP3428588B1 (en) * | 2017-07-10 | 2019-11-06 | ams AG | Optical sensor arrangement and method for light sensing |
EP3543664B1 (en) | 2018-03-19 | 2022-05-04 | ams International AG | Method for light-to-frequency conversion and light-to-frequency converter arrangement |
DE102020202400A1 (de) | 2020-02-25 | 2021-08-26 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Optoelektronische sensorvorrichtung, detektor und elektronisches gerät sowie verfahren zum betreiben einer derartigen sensorvorrichtung bzw. eines derartigen detektors |
US12120446B2 (en) | 2020-07-24 | 2024-10-15 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device and electronic device |
EP4258573A1 (en) * | 2022-04-08 | 2023-10-11 | Microsoft Technology Licensing, LLC | Photoreceiver circuit, photodetector, photodetector array and optical receiver unit |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4134683A (en) * | 1976-03-05 | 1979-01-16 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Multispectral imaging and analysis system |
DE2655272A1 (de) * | 1976-12-07 | 1978-06-08 | Leybold Heraeus Gmbh & Co Kg | Spektralfotometeranordnung |
US4558301A (en) * | 1982-07-01 | 1985-12-10 | Trofimenkoff Engineering, Ltd. | Voltage-to-frequency and analog-to-digital converter circuit |
US4563089A (en) * | 1983-03-14 | 1986-01-07 | Miles Laboratories, Inc. | Method and apparatus for converting spectral and light intensity values directly to digital data |
US4678917A (en) * | 1985-02-19 | 1987-07-07 | The Perkin-Elmer Corporation | Instantaneous reading multichannel polychromatic spectrophotometer method and apparatus |
US4740080A (en) * | 1985-03-21 | 1988-04-26 | Abbott Laboratories | Analog to digital converter for fluid analyzing apparatus |
EP0266682B1 (en) * | 1986-11-07 | 1993-07-14 | The Perkin-Elmer Corporation | Spectrophotometer with line frequency slaved voltage-to-frequency converter system |
-
1991
- 1991-06-20 DE DE69111800T patent/DE69111800T2/de not_active Expired - Fee Related
- 1991-06-20 ES ES91110156T patent/ES2076414T3/es not_active Expired - Lifetime
- 1991-06-20 EP EP91110156A patent/EP0519105B1/en not_active Expired - Lifetime
-
1992
- 1992-06-18 US US07/900,953 patent/US5303027A/en not_active Expired - Lifetime
- 1992-06-22 JP JP4162656A patent/JPH05215607A/ja not_active Withdrawn
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8803064B2 (en) | 2009-02-03 | 2014-08-12 | Hamamatsu Photonics K.K. | Signal processing device, including charge injection circuit, and photodetection device |
Also Published As
Publication number | Publication date |
---|---|
JPH05215607A (ja) | 1993-08-24 |
EP0519105A1 (en) | 1992-12-23 |
DE69111800D1 (de) | 1995-09-07 |
EP0519105B1 (en) | 1995-08-02 |
DE69111800T2 (de) | 1995-12-14 |
US5303027A (en) | 1994-04-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG2A | Definitive protection |
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