ES2069013T3 - Tecnica de fabricacion de un sistema experto para el diagnostico de fallos en sistemas. - Google Patents

Tecnica de fabricacion de un sistema experto para el diagnostico de fallos en sistemas.

Info

Publication number
ES2069013T3
ES2069013T3 ES90307845T ES90307845T ES2069013T3 ES 2069013 T3 ES2069013 T3 ES 2069013T3 ES 90307845 T ES90307845 T ES 90307845T ES 90307845 T ES90307845 T ES 90307845T ES 2069013 T3 ES2069013 T3 ES 2069013T3
Authority
ES
Spain
Prior art keywords
rules
hierarchy
level
node
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES90307845T
Other languages
English (en)
Inventor
Yuval V Lirov
On-Ching Yue
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
AT&T Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by AT&T Corp filed Critical AT&T Corp
Application granted granted Critical
Publication of ES2069013T3 publication Critical patent/ES2069013T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2257—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using expert systems
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S706/00—Data processing: artificial intelligence
    • Y10S706/902—Application using ai with detail of the ai system
    • Y10S706/911—Nonmedical diagnostics

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Devices For Executing Special Programs (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

EL INVENTO SE REFIERE A UN TECNICA PARA FUNCIONAR EN UN ORDENADOR Y DESARROLLAR UNA BASE DE CONOCIMIENTO (10) PARA LUEGO OFRECER SISTEMAS DE DIAGNOSTICO DE FALLOS MUY RAPIDOS Y DE BUEN COSTE. LA PRESENTE TECNICA UTILIZA UNA JERARQUIA EFECTIVA DE REGLAS QUE EN UN PRIMER NIVEL SON REGLAS QUE PERMITEN QUE LA DISPOSICION DEL SISTEMA SOMETIDO A PRUEBA SE DESCOMPONGA EN UNA JERARQUIA DE SUBSISTEMAS PARALELOS Y SECUENCIALES. EN UN SEGUNDO NIVEL, SON REGLAS QUE GENERAN REGLAS DE COMPROBACION EFICIENTE PARA CADA SUBSISTEMA. LAS REGLAS DE SEGUNDO NIVEL SE PUEDEN COMPARAR CON UNA FUNCION DE EVALUACION DE NODOS EN UN PROBLEMA TIPICO DE BUSQUEDA DE UN GRAFICO PARA SELECCIONAR EL MEJOR NODO PARA EXPANSION DE UNA LISTA ACTUAL DE NODOS CANDIDATOS, DE MODO QUE EL MEJOR TRAYECTO A LA CORRECTA DIAGNOSIS DEL SISTEMA SE ENCUENTRA EN EL PERIODO DE TIEMPO MAS BREVE UTILIZANDO UN MINIMO DE ENTRADA DE USUARIO. DOS REGLAS HEURISTICAS SE APLICAN PARA ACELERAR EL PROCESO DE SELECCION DEL NODO COMO MEJOR CANDIDATO PARALA EXPANSION. LA JERARQUIA DE REGLAS RESULTANTES PERMITE QUE SE GENEREN LA BASE DE CONOCIMIENTO DE COSTE EFICAZ Y EL PROCEDIMIENTO DE ARBOL DE PRUEBA DE SALIDA RESULTANTE PARA OBTENER UN SISTEMA DE DIAGNOSTICO DE FALLOS QUE SE APLICA PARA COMPROBAR UN SISTEMA O DISPOSITIVO ASOCIADO.
ES90307845T 1989-07-28 1990-07-18 Tecnica de fabricacion de un sistema experto para el diagnostico de fallos en sistemas. Expired - Lifetime ES2069013T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/386,325 US5107497A (en) 1989-07-28 1989-07-28 Technique for producing an expert system for system fault diagnosis

Publications (1)

Publication Number Publication Date
ES2069013T3 true ES2069013T3 (es) 1995-05-01

Family

ID=23525130

Family Applications (1)

Application Number Title Priority Date Filing Date
ES90307845T Expired - Lifetime ES2069013T3 (es) 1989-07-28 1990-07-18 Tecnica de fabricacion de un sistema experto para el diagnostico de fallos en sistemas.

Country Status (7)

Country Link
US (1) US5107497A (es)
EP (1) EP0410632B1 (es)
JP (1) JPH0370035A (es)
KR (1) KR930004437B1 (es)
CA (1) CA2017970C (es)
DE (1) DE69017785T2 (es)
ES (1) ES2069013T3 (es)

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CN111090558B (zh) * 2020-03-22 2020-07-07 武汉精立电子技术有限公司 一种面板检测系统
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Also Published As

Publication number Publication date
CA2017970C (en) 1994-05-24
DE69017785T2 (de) 1995-11-23
CA2017970A1 (en) 1991-01-28
US5107497A (en) 1992-04-21
JPH0370035A (ja) 1991-03-26
DE69017785D1 (de) 1995-04-20
EP0410632B1 (en) 1995-03-15
KR910003517A (ko) 1991-02-27
KR930004437B1 (ko) 1993-05-27
EP0410632A1 (en) 1991-01-30

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