AR008866A1 - Programa de aplicacion almacendo en una memoria y ejecutado en una computadora para determinar el tamano de muestra ''w'' que se requiere paraensayo acelerado de un producto, disposicion de computacion y memoria legible en computadora - Google Patents

Programa de aplicacion almacendo en una memoria y ejecutado en una computadora para determinar el tamano de muestra ''w'' que se requiere paraensayo acelerado de un producto, disposicion de computacion y memoria legible en computadora

Info

Publication number
AR008866A1
AR008866A1 ARP970104507A ARP970104507A AR008866A1 AR 008866 A1 AR008866 A1 AR 008866A1 AR P970104507 A ARP970104507 A AR P970104507A AR P970104507 A ARP970104507 A AR P970104507A AR 008866 A1 AR008866 A1 AR 008866A1
Authority
AR
Argentina
Prior art keywords
test
computer
product
accelerated
cycles
Prior art date
Application number
ARP970104507A
Other languages
English (en)
Original Assignee
Ford Global Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ford Global Tech Inc filed Critical Ford Global Tech Inc
Publication of AR008866A1 publication Critical patent/AR008866A1/es

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00—Administration; Management
    • G06Q10/04—Forecasting or optimisation specially adapted for administrative or management purposes, e.g. linear programming or "cutting stock problem"
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/008—Reliability or availability analysis

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Business, Economics & Management (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Strategic Management (AREA)
  • General Engineering & Computer Science (AREA)
  • Human Resources & Organizations (AREA)
  • Economics (AREA)
  • Game Theory and Decision Science (AREA)
  • Development Economics (AREA)
  • Entrepreneurship & Innovation (AREA)
  • Marketing (AREA)
  • Operations Research (AREA)
  • Tourism & Hospitality (AREA)
  • General Business, Economics & Management (AREA)
  • Computer Hardware Design (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

Un programa de aplicacion, una disposicion de computacion y una memoria de computacion para determinar el tamano de una muestra W que se requiere paraensayo acelerado de un producto incluye las etapas del programa de aplicacion de seleccionar unameta de confiabilidad R apropiada para el producto,seleccionar un nivel de confianza CL apropiado para la presicion que se requiere de los resultados del ensayo acelerado, seleccionar la cantidad deciclos de ensayo Nt que definen el períodod e ensayo acelerado, calcular el tamano de la muestra W para el ensayo acelerado como formula (I) y despuésensayar las muestras W de producto durante los Nt ciclos de ensayo para validar la confiabilidad que se requiere cuando no se observanfalla s en el ensayodurante los Nt ciclos de ensayo. También se describe un método para determinar la cantidad de ciclos Nt que se requieren para ensayo acelerado de un productoque tenga un tiempo de vida de servicio. En cualquiera de los métodosarriba indicados si se observa cualquier falla en los Nt ciclos de ensayo/tiempo,entonces la cantidad de ciclos de ensayo/tiempo puede ser aumentada a por lo menos 2Nt y se calcula nuevo nivel de confianza como. La confiabilidad R parael disenodel pro ducto se valida si el nuevo nivel de confianza CL nuevo es mayor que un valor de CLmin especificado como un nivel de confianza mínimo quese requiere para el método de ensayo acelerado.
ARP970104507A 1996-09-30 1997-09-30 Programa de aplicacion almacendo en una memoria y ejecutado en una computadora para determinar el tamano de muestra ''w'' que se requiere paraensayo acelerado de un producto, disposicion de computacion y memoria legible en computadora AR008866A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/723,385 US5717607A (en) 1995-10-16 1996-09-30 Computer program, system and method to reduce sample size in accelerated reliability verification tests

Publications (1)

Publication Number Publication Date
AR008866A1 true AR008866A1 (es) 2000-02-23

Family

ID=24906023

Family Applications (1)

Application Number Title Priority Date Filing Date
ARP970104507A AR008866A1 (es) 1996-09-30 1997-09-30 Programa de aplicacion almacendo en una memoria y ejecutado en una computadora para determinar el tamano de muestra ''w'' que se requiere paraensayo acelerado de un producto, disposicion de computacion y memoria legible en computadora

Country Status (7)

Country Link
US (1) US5717607A (es)
EP (1) EP0929865A2 (es)
JP (1) JP2001503137A (es)
KR (1) KR20000048784A (es)
AR (1) AR008866A1 (es)
TW (1) TW397954B (es)
WO (1) WO1998014874A2 (es)

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US20050288918A1 (en) * 2004-06-24 2005-12-29 Chen Thomas W System and method to facilitate simulation
JP5223506B2 (ja) * 2008-07-08 2013-06-26 株式会社Ｉｈｉ 粉砕ミルの寿命評価方法
US9031990B2 (en) * 2009-08-11 2015-05-12 Q2 Management Inc. Data processing system for manufacturing quality inspection management system
JP2011191121A (ja) * 2010-03-12 2011-09-29 Ntn Corp 転動疲労寿命打切り試験の設計・解釈方法，装置，プログラム
JP5506470B2 (ja) * 2010-03-12 2014-05-28 Ｎｔｎ株式会社 打切り寿命または打切り強度の試験における試験の設計・解釈方法，装置，プログラム
CN102495302B (zh) * 2011-11-15 2013-09-18 上海卫星工程研究所 元器件分类检测法
CN102539136B (zh) * 2012-01-05 2014-11-05 北京航空航天大学 一种电真空器件加速贮存寿命试验方法
CN102621350B (zh) * 2012-04-16 2013-09-18 中北大学 高g值微加速度计在不同环境下环境因子的确定方法
CN102937520A (zh) * 2012-11-12 2013-02-20 上海理工大学 一种变幅载荷下的机械零构件疲劳寿命预测方法
EP3526574B1 (en) 2016-10-17 2021-08-25 Vestas Wind Systems A/S Method for reliability testing of a driven component
WO2018072795A1 (en) 2016-10-17 2018-04-26 Vestas Wind Systems A/S Method for reliability testing of a driven component
CN113468475A (zh) * 2020-03-30 2021-10-01 华龙国际核电技术有限公司 一种设备鉴定方法及装置
CN112986733B (zh) * 2021-02-18 2022-11-15 航天科工防御技术研究试验中心 电子产品的贮存可靠度评估方法
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CN116296199A (zh) * 2023-05-11 2023-06-23 宁德时代新能源科技股份有限公司 电池包振动测试方法、设备和可读存储介质

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Also Published As

Publication number Publication date
KR20000048784A (ko) 2000-07-25
TW397954B (en) 2000-07-11
JP2001503137A (ja) 2001-03-06
WO1998014874A3 (en) 1998-06-18
EP0929865A2 (en) 1999-07-21
WO1998014874A2 (en) 1998-04-09
US5717607A (en) 1998-02-10

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