ATE205614T1 - Parallele prüfung eines cpu-cachespeichers sowie befehlseinheit - Google Patents

Parallele prüfung eines cpu-cachespeichers sowie befehlseinheit

Info

Publication number
ATE205614T1
ATE205614T1 AT96921674T AT96921674T ATE205614T1 AT E205614 T1 ATE205614 T1 AT E205614T1 AT 96921674 T AT96921674 T AT 96921674T AT 96921674 T AT96921674 T AT 96921674T AT E205614 T1 ATE205614 T1 AT E205614T1
Authority
AT
Austria
Prior art keywords
command unit
cpu cache
internal cache
cache
parallel checking
Prior art date
Application number
AT96921674T
Other languages
English (en)
Inventor
Dan Kikinis
Original Assignee
Elonex Plc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elonex Plc filed Critical Elonex Plc
Application granted granted Critical
Publication of ATE205614T1 publication Critical patent/ATE205614T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Memory System Of A Hierarchy Structure (AREA)
  • Tests Of Electronic Circuits (AREA)
AT96921674T 1995-06-16 1996-06-17 Parallele prüfung eines cpu-cachespeichers sowie befehlseinheit ATE205614T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/491,157 US5539878A (en) 1995-06-16 1995-06-16 Parallel testing of CPU cache and instruction units
PCT/US1996/010516 WO1997000478A1 (en) 1995-06-16 1996-06-17 Parallel testing of cpu cache and instruction units

Publications (1)

Publication Number Publication Date
ATE205614T1 true ATE205614T1 (de) 2001-09-15

Family

ID=23951026

Family Applications (1)

Application Number Title Priority Date Filing Date
AT96921674T ATE205614T1 (de) 1995-06-16 1996-06-17 Parallele prüfung eines cpu-cachespeichers sowie befehlseinheit

Country Status (6)

Country Link
US (2) US5539878A (de)
EP (1) EP0834124B1 (de)
JP (1) JP3165158B2 (de)
AT (1) ATE205614T1 (de)
DE (1) DE69615187T2 (de)
WO (1) WO1997000478A1 (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5539878A (en) * 1995-06-16 1996-07-23 Elonex Technologies, Inc. Parallel testing of CPU cache and instruction units
US5680544A (en) * 1995-09-05 1997-10-21 Digital Equipment Corporation Method for testing an on-chip cache for repair
KR100230454B1 (ko) * 1997-05-28 1999-11-15 윤종용 다중처리 시스템의 캐시메모리 검사방법
US6748492B1 (en) 2000-08-07 2004-06-08 Broadcom Corporation Deterministic setting of replacement policy in a cache through way selection
US6732234B1 (en) * 2000-08-07 2004-05-04 Broadcom Corporation Direct access mode for a cache
US6848024B1 (en) 2000-08-07 2005-01-25 Broadcom Corporation Programmably disabling one or more cache entries
TW591378B (en) * 2001-02-22 2004-06-11 Hitachi Ltd Memory test method, information recording medium and semiconductor integrated circuit
US6748495B2 (en) 2001-05-15 2004-06-08 Broadcom Corporation Random generator
US7266587B2 (en) * 2002-05-15 2007-09-04 Broadcom Corporation System having interfaces, switch, and memory bridge for CC-NUMA operation
DE602007010039D1 (de) * 2007-02-16 2010-12-02 Freescale Semiconductor Inc System und rechnerprogrammprodukt zum testen einer logischen schaltung
US20090055805A1 (en) * 2007-08-24 2009-02-26 International Business Machines Corporation Method and System for Testing Software
JP5293062B2 (ja) * 2008-10-03 2013-09-18 富士通株式会社 コンピュータ装置、メモリ診断方法、及びメモリ診断制御プログラム
JP5509568B2 (ja) * 2008-10-03 2014-06-04 富士通株式会社 コンピュータ装置、プロセッサ診断方法、及びプロセッサ診断制御プログラム
US8136001B2 (en) * 2009-06-05 2012-03-13 Freescale Semiconductor, Inc. Technique for initializing data and instructions for core functional pattern generation in multi-core processor
JP6662566B2 (ja) 2011-06-02 2020-03-11 プレジデント・アンド・フェロウズ・オブ・ハーバード・カレッジ エキソビボ組織培養システムのための方法および使用
US8769355B2 (en) 2011-06-27 2014-07-01 Freescale Semiconductor, Inc. Using built-in self test for preventing side channel security attacks on multi-processor systems
WO2013003112A1 (en) 2011-06-27 2013-01-03 The Jackson Laboratory Methods and compositions for treatment of cancer and autoimmune disease
US9448942B2 (en) 2012-08-20 2016-09-20 Freescale Semiconductor, Inc. Random access of a cache portion using an access module
US9092622B2 (en) 2012-08-20 2015-07-28 Freescale Semiconductor, Inc. Random timeslot controller for enabling built-in self test module
CA2974369A1 (en) 2015-01-20 2016-07-28 The Children's Medical Center Corporation Anti-net compounds for treating and preventing fibrosis and for facilitating wound healing
JP5956040B1 (ja) 2015-09-07 2016-07-20 Dmg森精機株式会社 工作機械
US9542290B1 (en) 2016-01-29 2017-01-10 International Business Machines Corporation Replicating test case data into a cache with non-naturally aligned data boundaries
US10169180B2 (en) 2016-05-11 2019-01-01 International Business Machines Corporation Replicating test code and test data into a cache with non-naturally aligned data boundaries
KR102562067B1 (ko) * 2016-05-23 2023-08-01 주식회사 디엔솔루션즈 롱보링바 매거진 및 이를 포함하는 공작기계
US10055320B2 (en) * 2016-07-12 2018-08-21 International Business Machines Corporation Replicating test case data into a cache and cache inhibited memory
US10223225B2 (en) 2016-11-07 2019-03-05 International Business Machines Corporation Testing speculative instruction execution with test cases placed in memory segments with non-naturally aligned data boundaries
US10261878B2 (en) 2017-03-14 2019-04-16 International Business Machines Corporation Stress testing a processor memory with a link stack

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4553201A (en) * 1983-03-28 1985-11-12 Honeywell Information Systems Inc. Decoupling apparatus for verification of a processor independent from an associated data processing system
US4891811A (en) * 1987-02-13 1990-01-02 International Business Machines Corporation Efficient address test for large memories
WO1989000728A1 (en) * 1987-07-17 1989-01-26 Ivor Catt Integrated circuits
US5155844A (en) * 1990-02-14 1992-10-13 International Business Machines Corporation Background memory test during system start up
US5398325A (en) * 1992-05-07 1995-03-14 Sun Microsystems, Inc. Methods and apparatus for improving cache consistency using a single copy of a cache tag memory in multiple processor computer systems
US5479413A (en) * 1994-06-06 1995-12-26 Digital Equipment Corporation Method for testing large memory arrays during system initialization
US5539878A (en) * 1995-06-16 1996-07-23 Elonex Technologies, Inc. Parallel testing of CPU cache and instruction units

Also Published As

Publication number Publication date
JP3165158B2 (ja) 2001-05-14
DE69615187D1 (de) 2001-10-18
DE69615187T2 (de) 2002-07-04
EP0834124A4 (de) 2000-04-19
EP0834124A1 (de) 1998-04-08
EP0834124B1 (de) 2001-09-12
WO1997000478A1 (en) 1997-01-03
US5539878A (en) 1996-07-23
JPH10511790A (ja) 1998-11-10
US5940588A (en) 1999-08-17

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Legal Events

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UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee