ES2064426T3 - Procedimiento y aparato para comprobar en un objeto la presencia de una composicion de llenado. - Google Patents
Procedimiento y aparato para comprobar en un objeto la presencia de una composicion de llenado.Info
- Publication number
- ES2064426T3 ES2064426T3 ES89202910T ES89202910T ES2064426T3 ES 2064426 T3 ES2064426 T3 ES 2064426T3 ES 89202910 T ES89202910 T ES 89202910T ES 89202910 T ES89202910 T ES 89202910T ES 2064426 T3 ES2064426 T3 ES 2064426T3
- Authority
- ES
- Spain
- Prior art keywords
- stretch
- composition
- filling
- reflection
- filling composition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
- G01N21/909—Investigating the presence of flaws or contamination in a container or its contents in opaque containers or opaque container parts, e.g. cans, tins, caps, labels
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/102—Video camera
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
UNA LAMPARA ESTROBOSCOPICA, A TRAVES DE UN ESPEJO SEMITRANSPARENTE (2),ILUMINA LA ESTRIA (3) DE UNA TAPA (4) EN LA QUE SE HA APLICADO LA COMPOSICIONDE RELLENO. EN LUGARES DONDE NO EXISTE MASA O COMPOSICION (5) DE RELLENO, LA REFLEXION DE LA LUZ MEDIANTE EL FONDO DE LA ESTRIA SERA SUSTANCIALMENTE SUPERIOR QUE EN EL CASO DE UNA COMPOSICION DE RELLENO (5) PRESENTE. UN VIDEOCAMARA (6) DETECTA LA ESTRIA (5) MEDIANTE LA REFLEXION ATRAVES DEL ESPEJO (2) SEMITRANSPARENTE. SI LA ESTRIA (3) ESTA DE ACUERDO CON LA NORMA RELLENA CON COMPOSICION DE RELLENO (5), EL VIDEOCAMARA (6) DETECTA UNA ESTRIA ANULAR OSCURA. LAS ZONAS QUE CARECEN DE COMPOSICION DE RELLENO PUEDEN DETECTARSE COMO PUNTOS BRILLANTES EN ESTE ANILLO, LO QUE FACILMENTE PUEDE DETECTARSE POR MEDIO DE LAS ACTUALES TECNICAS PARA TRATAMIENTO DE IMAGENES.LA DIRECCION DE LA REFLEXION DE LA LUZ DEPENDE DE LA POSICION ANGULAR DE LA SUPERFICIE DE REFLEXION. DEBIDO A QUE LA REFLEXION DE LA LUZ DIRECTAMENTE EMANANTE DE LA LAMPARA (1) DESDE EL LADO INTERNO DE LA ESTRIA (3)SE DIRIGE EN UNA DIRECCION FUERA DEL ANGULO DE VISION DE LA CAMARA, NO SE DETECTA ALLI LA FALTA DE LA COMPOSICION DE RELLENO. MEDIANTE LA ILUMINACION DE LA CITADA SUPERFICIE DESDE OTRA DIRECCION, POR MEDIO DE UN ESPEJO (7)CILINDRICO, EL AREA MENCIONADA, EN ESTE CASO DE FALTA DE COMPOSICION DE RELLENO,(5) SE REFLEJARA TAMBIEN EN LA DIRECCION DE LA CAMARA (6).
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL8802870 | 1988-11-21 |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2064426T3 true ES2064426T3 (es) | 1995-02-01 |
Family
ID=19853263
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES89202910T Expired - Lifetime ES2064426T3 (es) | 1988-11-21 | 1989-11-16 | Procedimiento y aparato para comprobar en un objeto la presencia de una composicion de llenado. |
Country Status (8)
Country | Link |
---|---|
US (1) | US5011289A (es) |
EP (1) | EP0370569B1 (es) |
JP (1) | JPH02184746A (es) |
AU (1) | AU619362B2 (es) |
CA (1) | CA2003336A1 (es) |
DE (1) | DE68913011T2 (es) |
DK (1) | DK585289A (es) |
ES (1) | ES2064426T3 (es) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB0919059D0 (en) * | 2009-10-30 | 2009-12-16 | Sencon Europ Ltd | Application and inspection system |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4037724A (en) * | 1975-05-20 | 1977-07-26 | Firma Up Geratebau-Und Vertriebs Gmbh | Method of and apparatus for measuring defects in sealings |
JPS5243484A (en) * | 1975-10-03 | 1977-04-05 | Toyo Seikan Kaisha Ltd | System for inspecting sealing compound of sealing covers |
JPS5992333A (ja) * | 1982-11-19 | 1984-05-28 | Shinriyou Seikan Kk | 缶蓋シ−リングコンパウンドの塗布自動化装置 |
JPS60201241A (ja) * | 1984-03-26 | 1985-10-11 | Toyo Seikan Kaisha Ltd | 缶蓋のシ−リングコンパウンド検査装置 |
US4868404A (en) * | 1987-04-23 | 1989-09-19 | Hajime Industries, Ltd. | Surface inspection apparatus using a mask system to monitor uneven surfaces |
US4873432A (en) * | 1988-08-25 | 1989-10-10 | American National Can Company | Compound application detector |
JPH05243484A (ja) * | 1992-01-07 | 1993-09-21 | Nec Corp | 半導体装置の容量素子およびその製造方法 |
-
1989
- 1989-11-16 ES ES89202910T patent/ES2064426T3/es not_active Expired - Lifetime
- 1989-11-16 EP EP89202910A patent/EP0370569B1/en not_active Expired - Lifetime
- 1989-11-16 DE DE68913011T patent/DE68913011T2/de not_active Expired - Lifetime
- 1989-11-20 CA CA002003336A patent/CA2003336A1/en not_active Abandoned
- 1989-11-20 US US07/439,543 patent/US5011289A/en not_active Expired - Lifetime
- 1989-11-21 JP JP1303052A patent/JPH02184746A/ja active Pending
- 1989-11-21 AU AU45400/89A patent/AU619362B2/en not_active Ceased
- 1989-11-21 DK DK585289A patent/DK585289A/da not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
US5011289A (en) | 1991-04-30 |
DK585289D0 (da) | 1989-11-21 |
JPH02184746A (ja) | 1990-07-19 |
DK585289A (da) | 1990-05-22 |
AU619362B2 (en) | 1992-01-23 |
DE68913011T2 (de) | 1994-08-25 |
AU4540089A (en) | 1990-05-24 |
EP0370569B1 (en) | 1994-02-09 |
CA2003336A1 (en) | 1990-05-21 |
DE68913011D1 (de) | 1994-03-24 |
EP0370569A1 (en) | 1990-05-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FC2A | Grant refused |
Effective date: 19920729 |
|
FG2A | Definitive protection |
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