EP4012740B1 - Überwachung des verschlechterung einer vakuumröhre - Google Patents
Überwachung des verschlechterung einer vakuumröhre Download PDFInfo
- Publication number
- EP4012740B1 EP4012740B1 EP21212595.9A EP21212595A EP4012740B1 EP 4012740 B1 EP4012740 B1 EP 4012740B1 EP 21212595 A EP21212595 A EP 21212595A EP 4012740 B1 EP4012740 B1 EP 4012740B1
- Authority
- EP
- European Patent Office
- Prior art keywords
- capacitor
- circuit
- value
- monitoring
- electrical parameter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012544 monitoring process Methods 0.000 title claims description 14
- 230000006866 deterioration Effects 0.000 title 1
- 239000003990 capacitor Substances 0.000 claims description 47
- 230000015556 catabolic process Effects 0.000 claims description 19
- 238000006731 degradation reaction Methods 0.000 claims description 19
- 238000005259 measurement Methods 0.000 claims description 19
- 238000012806 monitoring device Methods 0.000 claims description 9
- 239000002184 metal Substances 0.000 claims description 8
- 229910052751 metal Inorganic materials 0.000 claims description 8
- 238000000034 method Methods 0.000 claims description 6
- 238000007599 discharging Methods 0.000 claims description 4
- 239000003708 ampul Substances 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- 230000008021 deposition Effects 0.000 description 3
- 230000032683 aging Effects 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000005294 ferromagnetic effect Effects 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 230000005291 magnetic effect Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 230000007425 progressive decline Effects 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H33/00—High-tension or heavy-current switches with arc-extinguishing or arc-preventing means
- H01H33/60—Switches wherein the means for extinguishing or preventing the arc do not include separate means for obtaining or increasing flow of arc-extinguishing fluid
- H01H33/66—Vacuum switches
- H01H33/668—Means for obtaining or monitoring the vacuum
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H71/00—Details of the protective switches or relays covered by groups H01H73/00 - H01H83/00
- H01H71/04—Means for indicating condition of the switching device
- H01H2071/044—Monitoring, detection or measuring systems to establish the end of life of the switching device, can also contain other on-line monitoring systems, e.g. for detecting mechanical failures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H9/00—Details of switching devices, not covered by groups H01H1/00 - H01H7/00
- H01H9/54—Circuit arrangements not adapted to a particular application of the switching device and for which no provision exists elsewhere
Definitions
- the present invention relates to monitoring the degradation of a vacuum interrupter, in particular the vacuum interrupter of a medium and/or high voltage switching device.
- EP2463883 relates to a device for detecting the loss of vacuum in a vacuum cutting device.
- Loss of vacuum is not the only problem that can affect a vacuum bulb, however.
- the inventors have thus identified that as electrical cuts are made by a vacuum interrupter, a metallic deposit appears on the internal wall of the vacuum interrupter. This metallic deposit degrades the dielectric performance of the vacuum interrupter.
- Capacitive measurement makes it possible to monitor the level of degradation of the vacuum interrupter, because the measured capacitance value changes as a metal deposit appears on the internal wall of the vacuum interrupter. So the dielectric performance of the vacuum interrupter is monitored over its period of use.
- the invention provides a predictive maintenance means intended to be on board the vacuum interrupter.
- the electrodes forming a capacitor comprise two portions of metal ribbon each having a width of between 2 and 20 millimeters, each end of one of the portions of metal ribbon being spaced from one of the ends of the other portions of metal tape with a distance greater than 8 millimeters.
- the invention also relates to a vacuum interrupter of a cutting device, equipped with a degradation monitoring device as previously presented.
- the vacuum interrupter and the process have advantages similar to those previously presented.
- FIG. 1 represents a preferred embodiment of a device for monitoring the degradation of a vacuum interrupter 1.
- the vacuum interrupter 1 is intended to be used in a cutting device for cutting an electric current in an electrical circuit, in particular medium and/or high voltage.
- intermediate voltage means a voltage which is greater than 1,000 volts alternating current and 1,500 volts direct current but which does not exceed 52,000 volts alternating current and 75,000 volts direct current.
- high voltage designates a voltage which is strictly greater than 52,000 volts in alternating current and 75,000 volts in direct current.
- cutting device is used to designate an electrical device for cutting current, such as a contactor, a switch, a fuse switch or a recloser.
- an electrical device for cutting current such as a contactor, a switch, a fuse switch or a recloser.
- Other types of switching devices using a vacuum interrupter are also possible.
- the vacuum interrupter 1 comprises, in a manner known per se, an envelope 11 of substantially cylindrical shape along an axis of elongation X, closed by two end covers.
- the envelope 11 contains an electrode 4 fixed relative to said envelope and an electrode 5 movable relative to said envelope.
- the two electrodes 4 and 5 each support at their free end respectively a fixed contact 6 and a movable contact 7.
- the movable electrode 5 is movable between a contact position of the two contacts 6 and 7 and a separation position of the two contacts.
- the envelope 11 thus forms an enclosure made of ceramic closed by the two end covers, crossed respectively by the two electrodes 4 and 5.
- the bulb 1 also includes one or more dielectric screens 8, in particular metallic, generally placed around the fixed contact 6 and the movable contact 7. Other screens or other screen positions not shown are also possible.
- the degradation of the vacuum interrupter is characterized by the appearance of a metallic deposit on the internal wall of the vacuum interrupter in deposition zones 9, in particular zones of the internal wall not protected by a dielectric screen. This metallic deposit degrades the dielectric performance of the bulb.
- the device for monitoring the degradation of the vacuum interrupter 1 comprises two electrodes 21 and 22 forming a capacitor 2, arranged on the exterior surface of the vacuum interrupter.
- the two electrodes are identical and formed by two portions of metal ribbon, for example copper, each having for example a width of between 2 and 40 millimeters, or even between 2 and 20 millimeters. According to one embodiment, the width of the electrodes is for example 12 millimeters.
- the two electrodes are placed on the exterior surface of the bulb, being arranged on the same ring perpendicular to the elongation axis X of the envelope 11.
- the position of the two electrodes is chosen to be opposite the deposition zones 9 which are most exposed to metal deposition. These deposition zones 9 are in particular those of the internal wall not protected by the dielectric screen 8. However, the two electrodes can also be opposite, partially or completely, to a portion of the internal wall protected by the dielectric screen 8.
- Each electrode has a length less than half the perimeter of the cylinder of the enclosure 11 so that the ends of the electrodes 21 and 22 are opposite each other and spaced for example at least 8 millimeters, for example a distance between 10 and 15 millimeters.
- the device for monitoring the degradation of the vacuum interrupter 1 also includes a capacitive measuring circuit 3 to which the two electrodes 21 and 22 are connected.
- the capacitive measuring circuit 3 is adapted to measure a value representative of the capacitance of the capacitor 2 formed by the two electrodes 21 and 22.
- the capacitive measuring circuit 3 is supplied with energy, for example by a power supply circuit which recovers energy from the switching device.
- a magnetic field created by the current in the medium or high voltage circuit of the switching device is concentrated by a ferromagnetic core and an induction coil generates the supply voltage of circuit 3.
- a voltage between two armatures placed at different potentials can be recovered directly. This energy recovery avoids the use of an external source of energy such as a battery which would require replacement in the event of failure. The use of such an external source of energy can, however, be considered, particularly for short-term monitoring (for example in an accelerated aging process).
- the device for monitoring the degradation of the vacuum interrupter 1 is preferably embedded on the vacuum interrupter within the cutting device.
- the capacitive measurement circuit 3 comprises a first circuit comprising either an inductance, or a resistance, or an inductance and a resistance, connected to the capacitor 2.
- the capacitive measuring circuit 3 comprises a second circuit adapted to measure a value of an electrical parameter characteristic of the first circuit. This electrical parameter is correlated to the capacitance of capacitor 2.
- a first variant of capacitive measurement circuit 3 comprises a first circuit comprising an inductance 31 of predetermined value and connected in parallel to the capacitor 2.
- the capacitive measurement circuit 3 also comprises a second circuit 32 for measuring a resonance frequency d an oscillator formed by capacitor 2 and inductor 31.
- the resonance frequency measurement circuit 32 comprises for example an electronic circuit dedicated to measuring the resonance frequency of an LC oscillator, such as the LDC1000 component marketed by the company “Texas Instruments”.
- the first circuit of the capacitive measuring circuit 3 comprises a resistor of predetermined value and connected in parallel to the capacitor 2.
- the second circuit 32 of the capacitive measuring circuit 3 is capable of measuring a charging or discharging time of the RC circuit comprising the capacitor 2 and the resistor connected in parallel.
- the first circuit of the capacitive measurement circuit 3 comprises an association of an inductance of predetermined value and of a resistance of predetermined value with the capacitor 2.
- the second circuit 32 of the capacitive measurement circuit 3 is capable of measure the impedance of the circuit comprising the capacitor, the inductor and the resistance at a given frequency, for example greater than 100 Hz.
- the measurement of this impedance can be carried out by any suitable component, for example the AD8302 component marketed by the company “Analog Device”.
- FIG. 3 illustrates the method for monitoring the degradation of a vacuum interrupter of a cutting device.
- the bulb is equipped with the device as previously described.
- the process comprises steps E1 to E3.
- Step E1 is a measurement of a value of an electrical parameter representative of the capacitance of capacitor 2.
- the electrical parameter is a resonance frequency of an oscillator formed by the capacitor 2 and the inductor 31.
- the electrical parameter is a charging or discharging time of the circuit comprising the capacitor 2 and a resistor.
- the electrical parameter is the impedance of the circuit comprising the capacitor 2, an inductance and a resistance at a given frequency, for example greater than 100 Hz.
- step E2 is a comparison of the value of the electrical parameter representative of the capacity of the capacitor 2 to a reference threshold value.
- This comparison can go through a step of calculating the real value of the capacitance of the capacitor 2 from the value of the electrical parameter previously measured, for a comparison with a threshold capacitance value, or be carried out directly in comparing the value of the electrical parameter representative of the capacitance of capacitor 2 to a threshold parameter value.
- the reference threshold value can be determined by carrying out accelerated aging measurements on a set of test vacuum interrupters, by correlating a desired dielectric strength threshold to a value of the electrical parameter representative of the capacity of the capacitor 2 not to cross.
- the reference threshold value can also be determined by a calibration operation at which an initial measurement of the electrical parameter is carried out on the new bulb.
- Steps E1 and E2 are for example carried out periodically or after each opening of the cutting device or each time a predetermined number of openings of the cutting device has occurred.
- the degradation monitoring device is only powered when the circuit including the cutting device is open, that is to say after each evolution of the level of degradation.
- the measured electrical parameter values and/or the calculated capacitance values can be stored as steps E1 and E2 are carried out.
- This evolution is, for example, materialized in the form of a curve.
- the comparison and determination of the curve can be carried out directly within the capacitive measurement circuit or remotely by a dedicated calculation element; in the latter case, a transmission, for example wireless, of the electrical parameter representative of the capacity of the capacitor 2 is carried out to this calculation element.
- FIG 4 represents a resonance frequency measurement curve as a function of the number of cuts made by the cutting device, in the case where the capacitive measuring circuit 3 includes an inductance 31 as illustrated in figure 2 (LC circuit).
- the reference threshold value for the resonance frequency is for example set at a value of the order of 1.6 MHz.
- step E2 is followed by step E3 of issuing an alert when the value of the electrical parameter representative of the capacitance of capacitor 2, or the value of the capacitance of capacitor 2, reaches the predetermined threshold value.
- This alert can trigger an operation to replace the defective bulb.
Landscapes
- Measuring Fluid Pressure (AREA)
Claims (7)
- Vorrichtung zur Überwachung der Verschlechterung einer Vakuumröhre (1) eines Abschaltgeräts, dadurch gekennzeichnet, dass sie beinhaltet:- zwei Elektroden (21, 22), die einen Kondensator (2) bilden, die an der äußeren Oberfläche der Vakuumröhre (1) angeordnet sind,- eine kapazitive Messschaltung (3), die mit den beiden Elektroden verbunden ist, und geeignet ist, einen elektrischen Parameter zu messen, der für die Kapazität des Kondensators (2) repräsentativ ist.
- Überwachungsvorrichtung nach Anspruch 1, wobei die Elektroden (21, 22), die einen Kondensator bilden, zwei Metallbandabschnitte beinhalten, die jeweils eine Breite von 2 bis 20 Millimeter aufweisen, wobei jedes Ende eines der Metallbandabschnitte von einem der Enden des anderen Metallbandabschnitts mit einem Abstand von mehr als 8 Millimeter beabstandet ist.
- Überwachungsvorrichtung nach Anspruch 1 oder 2, wobei die kapazitive Messschaltung (3) eine Induktivität (31) beinhaltet, die mit dem Kondensator (2) verbunden ist, und eine Schaltung (32) zum Messen einer Resonanzfrequenz eines Oszillators, die durch den Kondensator und die Induktivität gebildet wird.
- Überwachungsvorrichtung nach Anspruch 1 oder 2, wobei die kapazitive Messschaltung (3) einen Widerstand beinhaltet, der mit dem Kondensator (2) verbunden ist, und eine Schaltung zum Messen einer Lade- oder Entladezeit der Schaltung, die den Kondensator und den Widerstand beinhaltet.
- Überwachungsvorrichtung nach Anspruch 1 oder 2, wobei die kapazitive Messschaltung (3) einen Widerstand und eine Induktivität beinhaltet, die mit dem Kondensator (2) verbunden sind, und eine Schaltung zum Messen der Impedanz der Schaltung, die den Kondensator, die Induktivität und den Widerstand beinhaltet.
- Vakuumröhre (1) eines Abschaltgeräts, die mit einer Vorrichtung zur Überwachung der Verschlechterung nach einem der Ansprüche 1 bis 5 ausgestattet ist.
- Verfahren zur Überwachung der Verschlechterung einer Vakuumröhre (1) eines Abschaltgeräts mittels einer Überwachungsvorrichtung nach einem der Ansprüche 1 bis 5, dadurch gekennzeichnet, dass es die Schritte beinhaltet:- Messung (E1) eines Wertes eines elektrischen Parameters, der für die Kapazität des Kondensators repräsentativ ist,- Vergleich (E2) des Wertes des zuvor gemessenen elektrischen Parameters mit einem Referenzwert, und- Ausgabe (E3) einer Warnung, wenn der Wert des elektrischen Parameters, der für die Kapazität des Kondensators repräsentativ ist, den Referenzschwellenwert erreicht.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR2012836A FR3117263B1 (fr) | 2020-12-08 | 2020-12-08 | Surveillance de dégradation d’une ampoule à vide |
Publications (3)
Publication Number | Publication Date |
---|---|
EP4012740A1 EP4012740A1 (de) | 2022-06-15 |
EP4012740B1 true EP4012740B1 (de) | 2023-11-08 |
EP4012740B8 EP4012740B8 (de) | 2023-12-13 |
Family
ID=74758978
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP21212595.9A Active EP4012740B8 (de) | 2020-12-08 | 2021-12-06 | Überwachung des verschlechterung einer vakuumröhre |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP4012740B8 (de) |
ES (1) | ES2971918T3 (de) |
FR (1) | FR3117263B1 (de) |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2968827B1 (fr) | 2010-12-09 | 2012-12-21 | Schneider Electric Ind Sas | Dispositif de detection de la perte de vide dans un appareil de coupure a vide et appareil de coupure a vide comportant un tel dispositif |
FR3036843A1 (fr) * | 2015-05-28 | 2016-12-02 | Schneider Electric Ind Sas | Dispositif de surveillance de decharges partielles dans un reseau electrique |
-
2020
- 2020-12-08 FR FR2012836A patent/FR3117263B1/fr active Active
-
2021
- 2021-12-06 EP EP21212595.9A patent/EP4012740B8/de active Active
- 2021-12-06 ES ES21212595T patent/ES2971918T3/es active Active
Also Published As
Publication number | Publication date |
---|---|
EP4012740A1 (de) | 2022-06-15 |
ES2971918T3 (es) | 2024-06-10 |
FR3117263A1 (fr) | 2022-06-10 |
FR3117263B1 (fr) | 2022-12-23 |
EP4012740B8 (de) | 2023-12-13 |
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