EP3824300A1 - Measuring circuit for capturing and processing signals, and measuring device for using said measuring circuit - Google Patents
Measuring circuit for capturing and processing signals, and measuring device for using said measuring circuitInfo
- Publication number
- EP3824300A1 EP3824300A1 EP19735318.8A EP19735318A EP3824300A1 EP 3824300 A1 EP3824300 A1 EP 3824300A1 EP 19735318 A EP19735318 A EP 19735318A EP 3824300 A1 EP3824300 A1 EP 3824300A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- signal
- signals
- measuring circuit
- sum
- interference
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000004020 conductor Substances 0.000 claims description 17
- 238000000034 method Methods 0.000 claims description 5
- 238000001514 detection method Methods 0.000 claims description 4
- 230000001133 acceleration Effects 0.000 claims description 3
- 238000005259 measurement Methods 0.000 claims description 3
- 239000000654 additive Substances 0.000 claims 2
- 230000000996 additive effect Effects 0.000 claims 2
- 238000007792 addition Methods 0.000 description 12
- 230000007257 malfunction Effects 0.000 description 3
- 238000013500 data storage Methods 0.000 description 2
- 230000005672 electromagnetic field Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004870 electrical engineering Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
- G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
- G01D3/032—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure affecting incoming signal, e.g. by averaging; gating undesired signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
- G01L5/16—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring several components of force
- G01L5/167—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring several components of force using piezoelectric means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
- G01R19/0053—Noise discrimination; Analog sampling; Measuring transients
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/24—Arrangements for measuring quantities of charge
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
Definitions
- Measuring circuit for the acquisition and processing of signals and measuring device for using said measuring circuit
- the invention relates to a measuring circuit for the detection and processing of signals and a Messeinrich device consisting of a measuring circuit and a transducer and a measuring circuit and transducer connecting cable according to the definition of the preambles of the independent claims.
- Measuring circuits for the detection of signals and processing of differential signals are known in particular in the field of measurement. Such a measuring circuit detects the signals of a sensor.
- a transducer takes up at least any physical variable, which is referred to as the input variable, and outputs at least one physical variable, which is referred to as the output variable.
- An output variable is, for example, a voltage, a current, or a charge.
- This output variable is passed via a cable to a measuring circuit, the cable for this purpose having at least two conductors, each of which carries a signal.
- the difference in the signals of the two conductors is usually of interest, such as the electrical potential difference between two conductors, which is then determined as a voltage.
- the electrical, magnetic or electromagnetic fields can cause the signals to malfunction.
- Transducers which take up a physical size, such as the Kistler 1-component force sensor type 9001A, which can be found in the data sheet 9001a_000-105d-05.18.
- transducers that take up several physical quantities, such as the Kistler Type 9047C, which absorbs three forces and is described in data sheet 9047C_000-592d-04.07.
- transducers that take up far more physical quantities, such as the Kistler multi-component dynamometer type 9139AA, which is described in data sheet 9139AA_003-198d-06.15.
- EP098755B1 discloses a measuring circuit with a transducer connected to a measuring circuit via a transmission line, the transducer being connected symmetrically and the measuring circuit forming the sum of the values of the signals at the connections of the transducer to provide an error signal and the difference of the values of the signals at the connections of the converter.
- EP0987551B1 with which an artificial disturbance in the form of an auxiliary signal can be fed to the connections of the converter, who can be used to detect errors and interference effects of the converter and / or other parts of the circuit.
- a first object of the invention is to reduce costs for a measuring circuit for the detection of signals and processing for differential signals, in that the number of signal inputs is reduced so that there are fewer than two signal inputs per sensor element of the sensor, the sensor at least has two transducer elements.
- Another object of the present invention is to detect the signals of the pickup elements and to minimize the influence of external interference on the signals.
- the invention relates to a measuring circuit for detecting and processing signals; a number of first signals and an equal number of second signals being provided, the measuring circuit being suitable for generating at least one difference signal from a first signal and a second signal; wherein a first signal corresponds to a negated second signal; wherein the number of first signals is at least two; wherein the measuring circuit has a number of signal inputs which corresponds to the number of first signals; wherein the measuring circuit has a further signal input; wherein the first signals are recorded individually by the measuring circuit and wherein the sum of the second signals, called the second signal sum, is recorded.
- Transducers generally record at least one input variable, to which input variable a transducer element arranged in the transducer has sensitivity.
- the pickup element generally has two contacts, each of which has a signal. This is known to the person skilled in the art as symmetrical signal transmission.
- the output variable can be determined by determining the two signals.
- the output quantity of electrical voltage is determined by determining the difference in the electrical potentials of the contacts. Methods for determining the output quantity of electrical charge or the output quantity of electrical current are known to the person skilled in the art.
- the output variable is therefore also called the differential signal.
- the contacts are usually electrically connected to a connector which is arranged on the sensor.
- a cable with the corresponding counterpart of the connector leads the signals to the measuring circuit.
- a cable arranged on the transducer can also be connected directly to the contacts.
- a transducer element is connected symmetrically if there is a reference variable by which the two signals of the transducer element are negated against each other.
- a change in the input variable results in a change in phase between the first signal and the second signal.
- the reference variable is independent of a change in the absolute values of the signals of the input variable.
- the reference variable can change over time.
- the reference variable is often a reference potential.
- the reference quantity is assumed to be zero for the sake of clarity.
- the reference potential is therefore equal to the earth potential.
- a reference variable that is different from zero is also possible.
- a transducer which is suitable to provide signals for the measuring circuit according to the invention, at least two transducer elements are arranged, each having a first contact and a second contact with the corresponding first signal and second signal.
- the two contacts of the pickup elements are combined in such a way that their signals add up.
- This sum of the two th signals is referred to as the second signal sum and is transmitted to a signal input of the measuring circuit.
- the signals corresponding to the first contacts are transmitted to separate signal inputs of the measuring circuit.
- the measuring circuit is cheaper to manufacture. By reducing the number of components required, the measuring circuit is also more robust. In addition, the cable that transmits the signals to the measuring circuit is less expensive to manufacture because fewer conductors are required.
- Provision of a signal or a signal provided is understood to mean that the signal provided is made available for further use, for example for electronic processing. Provision of a signal also includes the possibility of storing the signal on an electronic data storage device and loading the signal from this data storage device. Provision of a signal also includes displaying the signal on a display. In the following, a signal that is provided is usually an analog signal. However, the expert can Realize the following description with digital signals.
- the difference signal of the first and the second signal of a transducer element can be formed by the measuring circuit from the signals provided at the signal inputs by means of an arithmetic element, which signals are the second signal sum and the individual first signals.
- An arithmetic element is suitable for linking several signals together by means of addition, subtraction, division or multiplication and to provide the result.
- a fault signal can also be formed by the measuring circuit.
- a fault signal is a change in the signal that is not caused by a change in the determined input size but is caused by a fault.
- a disturbance is, for example, an occurring electrical or magnetic field or an electromagnetic field. If there is a sensor or a cable in the spatial area in which a fault exists, a fault signal occurs in the electrically conductive components of the sensor, such as the first contact and the second contact of a sensor element, or in the conductors of the cable, which essentially has the same phase position having. This is known to the person skilled in the art under common mode interference.
- the disturbance usually originates from an external source.
- the level of the interference signal corresponds to an entry of the interference in a cable or in a sensor.
- the interference signal is determined by the measuring circuit by first adding the sum of the ready posed first signals forms the first signal sum.
- An adder is an element which is suitable for forming the sum of two signals and providing the sum. And then an adder forms the sum of the first signal sum and the second signal sum provided, which results in the interference signal. If there is no fault, the fault signal is zero. If the fault signal deviates from zero, then there is a fault that can be quantified by the fault signal determined.
- the fault signal is also not equal to zero if there is no fault.
- the interference signal is equal to the interference potential multiplied by the number of signals detected.
- the reference potential is assumed to be zero and is therefore equal to the earth potential. _However, a reference potential that is different from zero is also possible in the application. Since the reference potenti al is known, the formulas mentioned can simply be adapted accordingly.
- the interference influences the input signals of the measuring circuit essentially to the same extent, the interference from the provided first signals and the provided second signal sum can be largely removed by means of an arithmetic element.
- the measuring circuit forms the differential signals of the transducer elements while removing the determined interference to largely interference-free differential signals.
- An arrangement of transducer, cable and measuring circuit is a measuring device.
- 1 is a schematic partial view of an embodiment of the measuring circuit for a number N of first signals
- FIG. 2 shows a schematic partial view of an embodiment of a measuring device with measuring circuit from FIG. 1, cable and sensor,
- FIG. 3 shows a schematic partial view of an embodiment of the measuring circuit for 2 first signals
- FIG. 5 shows a schematic partial view of an embodiment of a measuring device with a measuring circuit from FIG. 1, cable and sensor,
- FIG. 6 shows a schematic partial view of an embodiment of a measuring device with a measuring circuit from FIG. 1, cable and sensor,
- FIG. 7 shows a schematic partial view of an embodiment of a measuring device with a measuring circuit from FIG. 1, cable and sensor,
- Fig. 8 shows a schematic illustration using the example of three first signals of the first signals and of the second signal. nominal sum, each with a superimposed interference signal as provided at the signal inputs,
- 9 is a schematic illustration using the example of three first signals of the first signals and the second signal sum, each with a superimposed fault signal, the first signal sum and the fault signal determined within the measuring circuit,
- Fig. 10 is a schematic representation of the example of three first signals of the first signals and the second signal sum, each with a superimposed interference signal, the first signal sum, the determined interference signal, egg nem difference signal and a interference-corrected Dif difference signal.
- Fig. 1 shows a schematic partial view of the measuring circuit 3 with a number N signal inputs 36 and an additional signal input 36.
- the signal inputs 36 are designed to detect and provide a number N of first signals Sl.l to Sl.N and one Sum S2 of second signals S2.1 to S2.N to be recorded and provided, the number N being a natural number greater than one.
- a change in the first signal Sl.l to Sl.N is accompanied by an equally large but opposite change in the second signal S2.1 to S2.N.
- the reference potential around which a first signal and a second signal are inclined to one another, is equal to zero. If the reference potential is not equal to zero, the above and the following formulas must be adjusted accordingly.
- the first signals Sl.l to Sl.N and the sum S2 of the second signals S2.1 to S2.N each pass through a conductor 21 to a signal input 36 of the measuring circuit 3.
- FIG. 3 shows a measuring circuit, which has three signal inputs and which is therefore suitable for detecting two first signals S1 and S1.2 and the second signal sum S2.
- FIG. 4 shows a measuring circuit, which has four signal inputs and which is therefore suitable for detecting three first signals S1 to S1.3 and the second signal sum S2.
- the disturbance influences the provided first signals Sl.l to Sl.N and the provided second signal sum S2 each with an equally large proportion, the disturbance being in phase.
- a portion of a signal caused by the interference is fenes interference signal St additively superimposed, as shown in Fig. 8 schematically.
- the proportion 1 / (N + 1) of the superimposed interference signal St is given by the number of signal inputs 36 of the measuring circuit 3.
- the first signals Sl.l to Sl.N with superimposed proportional interference signal St / (N + 1) are added within the measuring circuit 3 and the result is provided as the first signal sum S1, as shown in Fig. 9.
- the interference signal St can be determined by adding the first signal sum S1 and the second signal sum S2, the second signal sum S2 additionally being superimposed by the proportional interference signal St / (N + 1). Second signal sum S2 is therefore given by the ideal undisturbed second signal sum S2 'and the interference signal St / (N + l).
- the disturbance signal St is therefore determined by:
- the entire interference signal St is thus from the first signals Sl.l provided at the signal inputs 36 to Sl.N and second signal sum S2 can be determined with the respective superimposed proportional fault signal St / (N + 1).
- the fault signal is shown as an example in FIG.
- the interference signal can now simply be deducted proportionally from the first signals Sl.l to Sl.N and the second signal sum S2 provided at the signal inputs 36 in an arithmetic element.
- the resulting interference-corrected first signals Sbl. 1 to Sbl.N and the interference-corrected second signal sum Sb2 are shown in FIGS. 1 to 7.
- the addition of the first signals Sl.l to Sl.N to a first signal sum S1 takes place by means of an addition element 31.
- the addition element 31 is arranged within the measuring circuit 3.
- the first signal sum S1 is also added to the second signal sum S2 by means of an adder 31.
- Components which add two or more signals are known to the person skilled in the art of electrical engineering. For example, digital signals are added using microprocessors. In the simplest case, for example for charges or currents, analog signals are added via a conductive connection between two conductors.
- a difference signal Dl to DN of a first signal Sl.l to Sl.N and a second signal S2.1 to S2.N is formed from the provided first signals Sl.l to Sl.N and the second signal sum S2.
- all the first signals apart from the first signal S1.k, k between and including 1 to N, for which the difference signal D1 to DN is to be formed are added to the second signal sum S2.
- the first signals Sl.l to Sl.N and the second Sig- Nalsum S2 are still superimposed with the proportional interference signal St / (N + 1).
- the difference signal Dl to DN consists of a known portion (N-1) / (N + 1) from the interference signal St. Since the portion is known and the interference signal St is already averaged, the difference signal Dl to DN can be corrected by removing the disturbance St proportionately from the difference signal Dl to DN.
- D.k St Db. k, k between and including 1 to N
- the interference-corrected difference signal Db .1 to Db.N is free of the interference signal St, which influenced the signals. Disturbance-corrected difference signals Db .1 to Db.N can be determined for all first signals Sl.l to Sl.N.
- the difference signal Dl to DN and the interference-corrected difference signal Db .1 to Db.N are shown by way of example in FIG. 10.
- 3 analog-to-digital converters are arranged in the measuring circuit, which digitalize each first signal Sl.l to Sl.N and the sum S2 of the second signals.
- the designation of the first signal Sl.l to Sl.N or the second signal S2.1 to S2.N is independent of whether a signal is present in the measuring circuit 3 in analog form or digital form.
- Processes within the measuring circuit 3 are possible either with digital signal processing or with analog signal processing.
- the addition member 31 for adding two signals is carried out either by a microprocessor or by a suitable analog circuit.
- the arithmetic element 33 which combines a plurality of signals by means of addition, subtraction, division or multiplication, is correspondingly implemented either by a microprocessor or by a suitable analog circuit.
- each signal input 36 is electrically conductively connected to an amplifier 32, which amplifier 32 is arranged within the measuring circuit 3, as shown in FIGS. 1 to 4.
- An amplifier 32 has at least two signal inputs, one of which is electrically conductively connected to the signal input 36 of the measuring circuit 3.
- a second signal input of the amplifier 32 is connected to a reference potential 34.
- the amplifier 32 may also include an analog-to-digital converter in one embodiment. An arrangement of the amplifier 32 near a signal input 36 is advantageous for the other Signal processing within the measuring circuit 3, which is less susceptible to interference for an amplified signal.
- the amplifier 32 converts the physical variable, in which a first signal Sl.l to Sl.N and the second signal sum S2 are present, into a different physical variable. For example, if there is a first signal Sl.l to Sl.N and the second signal sum S2 as a charge, the amplifier preferably converts the charge into a voltage or a current. The voltage or the current is still referred to as the first signal Sl.l to Sl.N or second signal sum S2, regardless of the physical size.
- the designation of the first signal Sl.l to Sl.N or second signal sum S2 is independent of the physical size by which the first signal or the second signal sum is given or the physical size of the first signal Sl.l to Sl.N or the second signal sum S2 can be converted within the measuring circuit 3.
- no amplifier 32 is necessary within the measuring circuit 3, as shown in FIGS. 5 to 7.
- the measuring circuit 3 is advantageously used together with a suitable sensor 1 and a cable 2 connecting a sensor 1 and measuring circuit 3.
- Such an arrangement of transducer 1, cable 2 and measuring circuit 3 is referred to as a measuring device 123.
- a Messein direction 123 is shown as an example in Fig. 2.
- a transducer 1 detects at least one physical variable.
- at least one Merelement 10 arranged, which detects the physical size and on which a first contact 12 and a second contact 13 are arranged.
- the pickup element 10 provides a first signal S1 at the first contact 12. Up to Sl.N ready and at the second contact 13 a second signal S2.1 to S2.N ready.
- a signal is, for example, a voltage or a current or a charge.
- a physical quantity is, for example, a force, a pressure, an acceleration, a torque, a voltage, a current, a charge, a temperature, a magnetic flux density, photometric quantities or another physical quantity.
- the transducer 1 is a multi-axis piezoelectric force transducer or a multi-axis piezoelectric acceleration transducer.
- the second signals S2.1 to S2.N of the pickup elements 10 are added to a second sum S2 by means of addition elements 11.
- the structure of an addition element 11 depends on the physical size of the second signals S2.1 to S2.N.
- An adder 11 for a current or a charge can be an electrically conductive connection. However, more complicated circuits are also conceivable which allow the second signals S2.1 to S2.N to be added.
- the addition elements 11 are arranged within a transducer 1, as shown in FIGS. 2, 5 and 6. This has the advantage that a cable 2, which connects transducer 1 and measuring circuit 3 in an electrically conductive manner, requires fewer conductors than if all the first and second signals are passed separately through the cable.
- the addition elements 11 are arranged within the sensor-side connector of the cable 2, as shown in FIG. 7.
- the sensor-side connector of the cable 2 is the connector that connects the cable 2 to the sensor 1. This has the advantage that sensors 1 that do not meet the requirements that the second signals are combined can also be used in a measuring device 123 with the measuring circuit 3.
- the Addi tion elements 11 must be arranged close to the transducer 1, in particular in the transducer-side connector, so that in the case of a malfunction, the malfunction, the provided first signals Sl.l to Sl.N and the provided second signal sum S2 each with the same size Affected proportion, the disturbance is in phase. If the cable 2 is connected to the transducer 1 without a plug, the addition elements 11 are to be inserted into the cable 2 in the immediate vicinity of the transducer 1, so that it is ensured that the disturbance the first signals Sl.l to Sl.N and the second signal sum S2 provided is influenced in each case with an equally large proportion, the interference being in phase. Immediate proximity denotes a distance of less than 10% of the total length of the cable 2 between the sensor 1 and the measuring circuit 3.
- the adders 11 include an amplifier or an analog-to-digital converter or both.
- conductors 21 of the cable 2 and contacts 12, 13 of the transducer 1 are connected in an electrically conductive manner by plug contacts 16, as shown in FIG. 5.
- a plug contact consists of a plug and a socket, one of which is arranged on the cable 2 and one on the sensor and with which a conductor 21 of the cable 2 and a contact of the sensor 1 can be electrically conductively connected to one another.
- the cable 2 is non-detachably connected to the sensor 1, and the first contacts 12 and the second contacts 13 are integrally or non-positively connected to the conductor 21 of the cable 2, as in Fig. 2 and Fig. 6 shown.
- the signal inputs 36 of the measuring circuit 3 are designed as plug contacts, which connect the conductors 21 of the cable 2 and the measuring circuit 3 in an electrically conductive manner, as shown in FIGS. 1 to 5.
- the signal inputs 36 of the measuring circuit 3 are designed in such a way that the cable 2 is permanently connected to the measuring circuit 3, and that the conductors 21 of the cable 2 are integrally or non-positively connected to the signal inputs 36 of the measuring circuit 3 as shown in FIGS. 6 and 7.
- transducers 1 are connected to the measuring circuit 3 in such a way that the second signals S2.1 to S2.N of the transducer elements 10 arranged in different transducers 1 are additively combined.
- This can be an arrangement of several pressure sensors in a fluid system, for example. These pressure sensors can, for example, be connected to a cable 2 via a common plug contact, and the second signals S2.1 to S2.N can be combined in the cable 2 his.
- These pressure sensors can be piezoelectric or piezoresistive pressure sensors or ionization vacuum meters or heat conduction vacuum meters. Other applications are also conceivable in which transducer elements 10 are arranged in various transducers 1.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
- Transmission And Conversion Of Sensor Element Output (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
- Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP18184555 | 2018-07-19 | ||
PCT/EP2019/067823 WO2020016011A1 (en) | 2018-07-19 | 2019-07-03 | Measuring circuit for capturing and processing signals, and measuring device for using said measuring circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
EP3824300A1 true EP3824300A1 (en) | 2021-05-26 |
Family
ID=63041793
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP19735318.8A Withdrawn EP3824300A1 (en) | 2018-07-19 | 2019-07-03 | Measuring circuit for capturing and processing signals, and measuring device for using said measuring circuit |
Country Status (6)
Country | Link |
---|---|
US (1) | US20210278446A1 (en) |
EP (1) | EP3824300A1 (en) |
JP (1) | JP7089109B2 (en) |
KR (1) | KR102451512B1 (en) |
CN (1) | CN112470014A (en) |
WO (1) | WO2020016011A1 (en) |
Family Cites Families (16)
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US4476546A (en) | 1982-03-19 | 1984-10-09 | Fairchild Camera & Instrument Corp. | Programmable address buffer for partial products |
JPH0645201Y2 (en) * | 1990-03-27 | 1994-11-16 | 豊田工機株式会社 | Dimension measuring device |
JP3123208B2 (en) | 1992-05-01 | 2001-01-09 | 株式会社村田製作所 | Composite electronic components |
JPH10233810A (en) * | 1997-02-21 | 1998-09-02 | Hitachi Ltd | Differential input/output transmitter and its method |
DE19815011A1 (en) * | 1998-04-03 | 1999-10-14 | Temic Semiconductor Gmbh | Process for the transmission of digital transmission signals |
CN1204774A (en) * | 1998-07-08 | 1999-01-13 | 华南理工大学 | Electronic measuring method for offset interference using comparing interference source and received interfering signal |
US6183972B1 (en) | 1998-07-27 | 2001-02-06 | Bayer Corporation | Method for the determination of analyte concentration in a lateral flow sandwich immunoassay exhibiting high-dose hook effect |
EP0987554B1 (en) | 1998-09-15 | 2005-12-28 | Vibro-Meter Sa | Measuring circuit |
KR100790968B1 (en) * | 2005-08-10 | 2008-01-02 | 삼성전자주식회사 | Input and Out driver circuit for differential signal transfer and differential signal transfer apparatus and method |
JP2007193662A (en) * | 2006-01-20 | 2007-08-02 | Nsk Ltd | Bearing apparatus monitoring system |
EP1860410B1 (en) * | 2006-05-22 | 2018-11-21 | Mettler-Toledo GmbH | Method for processing the output signal of a transducer and force measuring device |
JP2009021755A (en) * | 2007-07-11 | 2009-01-29 | Yokogawa Electric Corp | Difference signal transmission circuit |
US8893562B2 (en) * | 2011-11-21 | 2014-11-25 | Methode Electronics, Inc. | System and method for detecting magnetic noise by applying a switching function to magnetic field sensing coils |
EP2767808B9 (en) * | 2013-02-14 | 2021-09-01 | Meggitt SA | Measuring circuit |
DE102014219943B4 (en) * | 2014-10-01 | 2017-03-30 | Siemens Healthcare Gmbh | Circuit arrangement for the suppression of common-mode interference signals in the measurement of bioelectric signals |
DE102015219037B4 (en) * | 2015-10-01 | 2020-09-03 | Siemens Healthcare Gmbh | Method and device for acquiring bioelectrical signals |
-
2019
- 2019-07-03 JP JP2021502869A patent/JP7089109B2/en active Active
- 2019-07-03 CN CN201980048226.XA patent/CN112470014A/en active Pending
- 2019-07-03 US US17/260,784 patent/US20210278446A1/en not_active Abandoned
- 2019-07-03 WO PCT/EP2019/067823 patent/WO2020016011A1/en active Application Filing
- 2019-07-03 EP EP19735318.8A patent/EP3824300A1/en not_active Withdrawn
- 2019-07-03 KR KR1020217001277A patent/KR102451512B1/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
JP2021530706A (en) | 2021-11-11 |
WO2020016011A1 (en) | 2020-01-23 |
US20210278446A1 (en) | 2021-09-09 |
KR102451512B1 (en) | 2022-10-06 |
KR20210020129A (en) | 2021-02-23 |
CN112470014A (en) | 2021-03-09 |
JP7089109B2 (en) | 2022-06-21 |
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