CN1204774A - Electronic measuring method for offset interference using comparing interference source and received interfering signal - Google Patents

Electronic measuring method for offset interference using comparing interference source and received interfering signal Download PDF

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Publication number
CN1204774A
CN1204774A CN 98113277 CN98113277A CN1204774A CN 1204774 A CN1204774 A CN 1204774A CN 98113277 CN98113277 CN 98113277 CN 98113277 A CN98113277 A CN 98113277A CN 1204774 A CN1204774 A CN 1204774A
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China
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signal
interference
amplifier
source
undesired
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CN 98113277
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Chinese (zh)
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黄育强
周照耀
刘宾
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South China University of Technology SCUT
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South China University of Technology SCUT
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Priority to CN 98113277 priority Critical patent/CN1204774A/en
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Abstract

An electronic measurement method able to cancel interference by comparing interference source with interfered signal features that all the interferences are treated as one interference signal source. The interference signal source is obtained by the circuit with similar or same power supply, other conditions and work parameters. The interference signal is compared with interfered measured signal to obtain approximately non-interference signal. In the practice, proper circuits are used to induce two basically same interferences. Its advantages are elimination of all interferences in electronic measurement, wider measurement frequency range, low requirement to circuit elements in stability and precision and low cost.

Description

Adopt interference source and be subjected to undesired signal relatively to offset the electronic measuring method of interference
The present invention a kind ofly adopts interference source and is subjected to undesired signal relatively to offset the electronic measuring method of interference, belongs to electronic measuring technology field.
In general, the interference in the electronic surveying mainly comprises the interference of electromagnetic field, power-supply fluctuation, temperature variation etc.Prior art generally adopts methods such as shielding, filtering to eliminate interference to the interference of electromagnetic field, and the interference that general shielding can not the block electromagnetic field, and some occasion is difficult to implement shielding; Filtering then may filter useful signal, especially when strain signal and undesired signal frequency and big or small when close, at all can not be with the method for filtering: and some are claimed and utilize symmetrical sensor can offset the measuring method of interference, on the one hand range of application is very narrow and be difficult to produce the very sensor of symmetry, do not consider that on the other hand factors such as power-supply fluctuation and temperature variation are to the particularly influence of amplifying circuit of whole measuring system, and the zero shift that this influence produced, the major defect of current measuring circuit just.
Purpose of the present invention is exactly to adopt methods such as shielding, filtering to be difficult to implement in order to overcome and to solve prior art, can't eliminate the interference of electromagnetic field and power-supply fluctuation, temperature variation etc. produce influences such as zero shift to electronic measurement system shortcoming and problem, research is created and a kind ofly be need not shielding, filtering just can fundamentally be eliminated interference such as the interference of electromagnetic field and zero shift, and the frequency range of the strain signal of surveying only is subjected to the employing interference source that the amplifier band width influences and is subjected to undesired signal relatively to offset the electronic measuring method of interference.
The present invention realizes by following technical proposals: the inventive method is interference source to be regarded as all disturbing factors metering circuit is produced the additional signal after disturbing and is designated as E, with the desirable output signal V superposition of metering circuit together and be designated as E+V, adopt one closely similar and close (in the same finite space) and use same power supply and have the also same or analogous linear circuit of other condition, running parameter, then its suffered interference is approximately E, and its output signal then is E+ ideal static signal V 0, make two signal subtractions, i.e. (E+V)-(E+V 0)=V-V 0, and desirable stationary singnal V 0Be a constant, the gained result just is an approximate glitch-free signal.Concrete with reference to principle of work block scheme shown in Figure 1, when work in the working signal source, its output signal includes strain signal and multiple undesired signal, is designated as e 1+ U 1, wherein: e 1Be undesired signal, U 1Be strain signal, after amplifying through amplifier, add the undesired signal that amplifier produces owing to interference sources again, the signal that obtains is designated as A (e 1+ U 1)+e 2, wherein: A is an amplifier magnification ratio, e 2Be undesired signal; Comparison signal source output signal includes stationary singnal and multiple undesired signal, is designated as e 3+ U 2, wherein: e 3Be undesired signal, U 2Be stationary singnal, after amplifying through amplifier, also add the undesired signal that amplifier produces owing to interference sources, the signal that obtains is designated as A (e 3+ U 2)+e 4, wherein: A is an amplifier magnification ratio, e 4Be undesired signal; Because two-way circuit closely similar and close (in the same finite space), electromagnetic field etc. disturb basic identical to the interference of two signal sources, i.e. e 1≈ e 3, and the circuit working parameter of amplifier is identical, and its suffered interference is basic identical, and the undesired signal that two signal sources are amplified the back generation is equal substantially, i.e. e 2≈ e 4, make U=A (e 1+ U 1)+e 2-[A (e 3+ U 2)+e 4] ≈ A (U 1-U 2), promptly through comparer relatively after, disturb basic neutralisation, be that the gained signal is that the stationary singnal gained difference that the strain signal in working signal source deducts the comparison signal source multiply by amplifier magnification ratio, its interference component also is the strain signal of gained signal for glitch-free substantially amplification because of small ignoring extremely; If amplifier is non-linear, then answer compared result (relatively back output signal) to revise.Wherein comparison signal source requires can be identical or inequality with the working signal source, in actual applications, can choose suitable circuit according to actual conditions and sense the essentially identical interference of two-way and get final product.
The present invention compared with prior art has following advantage and beneficial effect: (1) the present invention has fundamentally eliminated all interference such as the interference of electromagnetic field, zero shift, the frequency range of the strain signal of surveying only is subjected to the influence of the band width of amplifier, so can reach the level of super dynamic megahertz level survey frequency easily, but widened the frequency range of measuring-signal widely, improved measuring accuracy widely; (2), reduced the requirement of the stability of parts such as power supply to whole metering circuit, amplifier, sensor because the method for adopt to disturb suppress disturbing; (3) owing in specific implementation process, adopt dc bridge circuit, and do not need to adopt shielding measure, thereby greatly reduce the complicacy of circuit, reduced requirement, thereby can reduce cost greatly element precision; (4) the present invention can be widely used in fields such as automatic control, instrument and meter, has good social, economic benefit.
Below Figure of description is described as follows: Fig. 1 is for adopting interference source and being subjected to undesired signal relatively to offset the principle of work block scheme of the electronic measuring method of interference, and Fig. 2 is the circuit theory diagrams of one of embodiment of the invention.Among the figure: Vcc, V+, V-are direct supply.
The circuit theory diagrams of specific embodiments of the invention as shown in Figure 2.1. at first by design shown in Figure 2, draw PCB is screened components and parts then, carries out Installation and Debugging, wherein: select R 1=R 2=R 3=R 4=R, it can be sensors such as resistance strain gage or semiconductor gauge, and they constitute the work electric bridge, when the work of work electric bridge, the strain signal U that band disturbs AbChange, through operational amplifier U 1AAfter the amplification, be output as above earth potential U eSelect R 12=R 13=R 14=R 15=R, it is a conventional, electric-resistance, they constitute comparison bridge.U CdFor band disturbs stationary singnal, through operational amplifier U 1BAfter the amplification, be output as above earth potential U f, then relatively the back measurement result is U Ef=U e-U fAdjust variable resistor R 6And R 17, may command U AbAnd U CdInitial value, thereby make U eAnd U fAlso simultaneously near a certain numerical value, for example 0 is worth, thereby makes U EfInitial value also is about 0, and the working range of entire circuit is decided.Adjust R 7And R 18, can change two bridge resistances, under the alternation interfere with electromagnetic field, so that U AbAnd U CdThe alternation interference component reduces to minimum and makes it very approaching, can be considered as equating; 2. because of U 1AAnd U 1BBe same integration member IC, optional LM324 type operational amplifier, running parameter is very approaching, so temperature variation and mains fluctuations and other external interference are very approximate to the two influence, above earth potential U eWhen fluctuating because of interference, U fAlso fluctuation simultaneously, and size is equal substantially; 3. because U eAnd U fInterference component fairly similar, and U Ef=U e-U f, interference component is cancelled each other.Therefore, for U Ef, can be under various interference and be steady state (SS), output be the strain signal of glitch-free amplification; 4. in implementing, require choosing: R 8=R 9=R 19=R 20, R 10=R 11=R 21=R 22, be precision resister; Enlargement factor A=R 8/ R 10And select C 1=C 2

Claims (1)

1, a kind of adopt interference source be subjected to undesired signal relatively to offset the electronic measuring method of interference, it is characterized in that: it is regarded interference source as all disturbing factors metering circuit is produced the additional signal after disturbing and is designated as E, with the desirable output signal V superposition of metering circuit together and be designated as E+V, adopt one closely similar and close (in the same finite space) and use same power supply and have the also same or analogous linear circuit of other condition, running parameter, its suffered interference is approximately E, and its output signal then is E+ ideal static signal V 0, make two signal subtractions, i.e. (E+V)-(E+V 0)=V-V 0, and desirable stationary singnal V 0Be a constant, the gained result just is an approximate glitch-free signal; Specifically, during the work of working signal source, its output signal includes strain signal and multiple undesired signal, is designated as e 1+ U 1, wherein: e 1Be undesired signal, U 1Be strain signal, after amplifying through amplifier, add the undesired signal that amplifier produces owing to interference sources again, the signal that obtains is designated as A (e 1+ U 1)+e 2, wherein: A is an amplifier magnification ratio, e 2Be undesired signal; Comparison signal source output signal includes stationary singnal and multiple undesired signal, is designated as e 3+ U 2, wherein: e 3Be undesired signal, U 2Be stationary singnal, after amplifying through amplifier, also add the undesired signal that amplifier produces owing to interference sources, the signal that obtains is designated as A (e 3+ U 2)+e 4, wherein: A is an amplifier magnification ratio, e 4Be undesired signal; Two circuit closely similar and close (in the same finite space), electromagnetic field etc. disturb basic identical to the interference of two signal sources, i.e. e 1≈ e 3, and the circuit working parameter of amplifier is identical, and its suffered interference is basic identical, and the undesired signal that two signal sources are amplified the back generation is equal substantially, i.e. e 2≈ e 4, make U=A (e 1+ U 1)+e 2-[A (e 3+ U 2)+e 4] ≈ A (U 1-U 2), promptly through comparer relatively after, disturb basic neutralisation, be that the gained signal is that the stationary singnal gained difference that the strain signal in working signal source deducts the comparison signal source multiply by amplifier magnification ratio, its interference component also is the strain signal of gained signal for glitch-free substantially amplification because of small ignoring extremely; If amplifier is non-linear, then answer compared result (relatively back output signal) to revise.Wherein comparison signal source requires can be identical or inequality with the working signal source, in actual applications, can choose suitable circuit according to actual conditions and sense the essentially identical interference of two-way and get final product.
CN 98113277 1998-07-08 1998-07-08 Electronic measuring method for offset interference using comparing interference source and received interfering signal Pending CN1204774A (en)

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CN 98113277 CN1204774A (en) 1998-07-08 1998-07-08 Electronic measuring method for offset interference using comparing interference source and received interfering signal

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Application Number Priority Date Filing Date Title
CN 98113277 CN1204774A (en) 1998-07-08 1998-07-08 Electronic measuring method for offset interference using comparing interference source and received interfering signal

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103684725A (en) * 2013-12-03 2014-03-26 深圳市华星光电技术有限公司 Method for avoiding interference in pulse signal and terminal applicable thereto
CN112470014A (en) * 2018-07-19 2021-03-09 基斯特勒控股公司 Measuring circuit for collecting and processing signals and measuring device using the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103684725A (en) * 2013-12-03 2014-03-26 深圳市华星光电技术有限公司 Method for avoiding interference in pulse signal and terminal applicable thereto
CN112470014A (en) * 2018-07-19 2021-03-09 基斯特勒控股公司 Measuring circuit for collecting and processing signals and measuring device using the same

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