EP3782204A1 - Solarzelle und photovoltaikmodul - Google Patents
Solarzelle und photovoltaikmodulInfo
- Publication number
- EP3782204A1 EP3782204A1 EP19720511.5A EP19720511A EP3782204A1 EP 3782204 A1 EP3782204 A1 EP 3782204A1 EP 19720511 A EP19720511 A EP 19720511A EP 3782204 A1 EP3782204 A1 EP 3782204A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- sensor
- solar cell
- layer
- metallization
- layer stack
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
- H10P74/27—Structural arrangements therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/16—Measuring force or stress, in general using properties of piezoelectric devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/18—Measuring force or stress, in general using properties of piezo-resistive materials, i.e. materials of which the ohmic resistance varies according to changes in magnitude or direction of force applied to the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
- G01L5/16—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring several components of force
- G01L5/161—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring several components of force using variations in ohmic resistance
- G01L5/162—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring several components of force using variations in ohmic resistance of piezoresistors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
- G01N27/223—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance for determining moisture content, e.g. humidity
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F19/00—Integrated devices, or assemblies of multiple devices, comprising at least one photovoltaic cell covered by group H10F10/00, e.g. photovoltaic modules
- H10F19/80—Encapsulations or containers for integrated devices, or assemblies of multiple devices, having photovoltaic cells
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/20—Electrodes
- H10F77/206—Electrodes for devices having potential barriers
- H10F77/211—Electrodes for devices having potential barriers for photovoltaic cells
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/30—Coatings
- H10F77/306—Coatings for devices having potential barriers
- H10F77/311—Coatings for devices having potential barriers for photovoltaic cells
- H10F77/315—Coatings for devices having potential barriers for photovoltaic cells the coatings being antireflective or having enhancing optical properties
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/93—Interconnections
- H10F77/933—Interconnections for devices having potential barriers
- H10F77/935—Interconnections for devices having potential barriers for photovoltaic devices or modules
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
Definitions
- Embodiments of the present invention relate to a solar cell with a layer stack and to a photovoltaic module with solar cells. Further exemplary embodiments relate to a production method of the solar cell and to a production method for the photovoltaic module. Preferred embodiments relate to a solar cell or a photovoltaic module with integrated sensors.
- Solar cells are the core of a photovoltaic module (PV module), failing this, the electrical performance of the entire module is minimized.
- PV module photovoltaic module
- the mechanical stress of a solar cell can not be measured in situ so far. Since the mechanical stress can lead to fractures in the solar cells and thus to (partial) failure, it is relevant to know the mechanical stress in the solar cells themselves. This is relevant in the development of PV modules, as it allows the design to be better tailored to the mechanical stress. In operation, operators are allowed to detect when a module has experienced critical stresses. This allows operators to carry out targeted inspections.
- the temperature has an influence on the electrical power of the solar cells. Therefore, it is of particular interest in the development of PV modules of the temperature of the solar cell under certain conditions to know exactly. In addition, in the operation of PV modules by increased temperatures relative to adjacent PV modules, or solar cells certain failure mechanisms, such as delamination and hot spots through shaded, broken or electrically mismatched solar cells can be identified.
- Moisture in the PV module can z. B. lead to corrosion of the solar cell and cell connectors or yellowing of the encapsulation. This minimizes the electrical power of the PV module. Therefore, it is desirable to detect prematurely increased moisture in the PV module in order to take countermeasures.
- PV modules have not undergone preventive measurements of stress, temperature or humidity. So far, only the consequences of excessive mechanical stress and moisture are determined.
- z As electroluminescence or infrared images used. To detect the reduction in electrical power, current-voltage characteristics are recorded. For this, the PV modules have to be partially removed in order to be examined in a test laboratory. Even with increased humidity so far only the consequences, such.
- B "hot-spot" formation detected by infrared images.
- strain gauges have hitherto been applied to the solar cell in order to measure the mechanical stress in situ.
- laboratory methods exist, such as synchrotron micro-X-ray diffraction [1, 2] and micro-Raman spectroscopy [3-5].
- synchrotron micro-X-ray diffraction [1, 2]
- micro-Raman spectroscopy [3-5].
- both methods are not suitable for in-situ measurements during operation or in usual degradation tests of the module.
- the temperature can be determined according to the prior art as follows:
- commercially available temperature sensors such as measuring resistors or thermocouples are used. As already described above, however, these can only be placed next to or between the solar cells. Therefore, not the temperature of the solar cell, but the encapsulation is measured.
- the object of the present invention to provide a concept which, during production and / or during operation, enables the determination of environmental parameters which have an influence on the solar cell and the PV module.
- Embodiments of the present invention provide a solar cell with a layer stack.
- the layer stack has at least one substrate, a doped region and a metallization structure.
- a sensor such as a thermocouple, a thermocouple, or a thermocouple, or a thermocouple, or a thermocouple, or a thermocouple, or a thermocouple, or a thermocouple, or a thermocouple, or a thermocoupleg., thermocoupleasonic sensor, or a thermocoupleas, a thermocoupleas, or a sensor for determining the mechanical stress.
- Embodiments of the present invention are based on the recognition that the layers of the layer stack, of which the solar cell essentially consists, are suitable for being provided directly in the manufacturing process with regions or elements which together form a sensor.
- temperature sensors eg resistance thermometer in a metallization
- sensors for determining the mechanical stress strain gauge, sensor partially integrated in the doping layer or generally the substrate and partially integrated into the metallization layer.
- the integration is cost-effective, since no additional manufacturing steps are necessary to the steps anyway applied for the solar cell processing and, as a result, enables a solar cell or, after additional steps, to produce a photovoltaic module having sensors which during operation and / or also during production (eg during processing of the solar cell to the photovoltaic module) can be read out.
- a solar cell with a sensor that forms a strain gauge or a piezoresistive strain gauge.
- the strain gauge sensor or the piezoresistive strain gauge sensor is formed by a (local) doping in a layer stack level of the layer stack. It is also conceivable that even a lateral region of the solar cell itself is used, so that advantageously no solar cell surface is claimed.
- This strain gauge or piezoresistive strain gauge advantageously allows the monitoring of deformations of the solar cell, z. B. during the packaging of the photovoltaic module.
- a particular advantage is that it determines exactly the mechanical stress that acts on the critical area, namely the substrate (and not just a mechanical stress in one of the lamination layers or an adjacent layer).
- such strain gauges or piezoresistive strain gauges change depending on the prevailing mechanical stress, e.g. in the substrate, a resistance of the doped region in the substrate, which can be read by external means.
- a solar cell with a temperature sensor as a sensor.
- the temperature sensor may be integrated into the metallization structure, wherein the temperature sensor is formed, for example, by one or more metallization paths in the plane of the metallization structure.
- This temperature sensor is simple and thus inexpensive to manufacture and allows good monitoring of the solar cell temperature in a relevant for the life or operation range (local area of the solar cell as opposed to a local area in another position of the photovoltaic module).
- a solar cell with a humidity sensor as a sensor.
- this moisture sensor is powered by a capacitor, such.
- a capacitor As a comb capacitor, formed in conjunction with a moisture-sensitive material / polymer.
- the moisture-sensitive polymer has one of the humidity dependent dielectric constant. As a result of a change in the dielectric constant, the capacitance of the capacitor changes, so that based on this, the ambient humidity can be determined.
- the moisture-sensitive polymer may be realized by an encapsulating polymer in the form of a bonding layer to a laminating layer (see making the photovoltaic module) or formed in the form of the laminating layer of the photovoltaic module itself.
- the polymer (encapsulation polymer) is introduced onto and in particular between metallization paths of the capacitor or of the comb capacitor.
- this capacitor is formed in the layer of the metallization structure or by the Metailmaschines Modell itself. This is easily possible, for example, by arranging two metallization tracks laterally opposite one another in the layer of the metallization structure. Analogous to the other sensors, this sensor provides the advantages that it can be produced inexpensively and that the quantity to be measured is determined from a local point of view where the measured variable is relevant for the solar cell, namely at the core of the plurality of layers of a photovoltaic module.
- the above-described sensors or generally integrated into the solar cell sensors can be powered by the solar cell itself with energy.
- the sensor is then connected to the energy-generating structure of the solar cell, which is thus designed to supply the sensor with power.
- the solar cell may also comprise a transmission unit, which is designed to z. B. by radio or via the existing anyway contacting tracks to transmit the sensor signal.
- the sensor signal is coupled out via a radio module additionally integrated in the solar cell or the PV module, or the sensor signal is modulated onto a power signal of the solar cell and / or of the photovoltaic module.
- This variant further increases the autonomy of the sensors, so that no additional read-out contacts are provided.
- the doped region can, for example, have the function of an emitter layer.
- the metallization structure is then arranged on the doped region in accordance with exemplary embodiments and forms the electrode.
- the doped region in turn rests on the substrate or is formed in the substrate.
- the substrate likewise has a doping that differs from the doped emitter region according to exemplary embodiments.
- additional layers such as z. B. on the opposite side a further doped region and a further metallization be easilybiidet.
- the layer stack has an antireflection layer.
- an insulation layer to be provided in the region of the metallization paths between the doped region and the metallization paths, which isolates the metallization path from the doped region or from the substrate.
- the insulating layer may comprise, for example, a silicon nitride and / or a silicon oxide. These materials are also suitable for forming the above-described antireflection coating.
- the shaping of the doped region and / or the metallization structure takes place in such a way that a sensor is integrated into the layer stack.
- the doping can be carried out so that a sensor, namely a strain gauge or piezoresistive strain gauge is mitgebge concerns.
- the application of the metallization structure takes place in such a way that the temperature sensor is formed.
- the step of forming the metallization structure is such that a capacitor or comb capacitor is formed in the layer stack or in a plane of the layer stack (lateral capacitor), in which case a polymer or an encapsulation polymer that passes through a connection layer of the laminating layer of a photovoltaic module or a laminating layer of the photovoltaic module itself may be shaped as moisture-sensitive Dielectric is introduced into the condenser to form in combination a moisture sensor.
- Another method relates to the production of a photovoltaic module, in which just the step of applying the encapsulating polymer or the bonding layer is carried out accordingly.
- one of the sensors produced can be read out during the method for producing the photovoltaic module in order to advantageously monitor which environmental influences occur in the packaging.
- Fig. 1 is a schematic representation of a solar cell according to a basic embodiment
- 2a-2c are schematic representations and tables illustrating an integrated
- Fig. 4a is a schematic representation of an integrated humidity sensor as
- Fig. 5a-5d are schematic representations of solar cells for explaining individual
- Fig. 6 is a schematic representation of a solar cell with integrated sensor according to extended embodiments.
- PV module photovoltaic module
- the term solar cell is understood to mean a component for photovoltaic energy conversion, ie a component which converts photons into electrons, which can be used as electrical energy.
- a solar cell may consist of different materials, e.g. monocrystalline, polycrystalline or amorphous silicon, a combination of elements of the 3rd and 5th group of the periodic table, e.g. GaAs, InPJnGaP, so-called III-V solar cells, organic substances, perovskites or other thin film materials such as CIGS, CIS and CdTe, as well as any combination of two or more of these materials, e.g. crystalline and amorphous silicon, crystalline silicon with perovskites, crystalline silicon with III-V solar cells or crystalline silicon with organic substances. It is assumed that a rectangular or square shape, but it is also any other form conceivable.
- PV module is understood as meaning any interconnection of any desired number of solar cells of any shape, which are encapsulated with any desired material.
- crystalline silicon solar cells is thereby of a series connection of at least one solar cell, which are connected by an encapsulation on the front and the back with protective layers.
- the front-side protective layer is a glass and the back is a film, but other layers are also conceivable, e.g. a glass sheet on the back, or a transparent polymer film on the front.
- the layer stack comprises the substrate 22, a doped region, which here is arranged as a type of layer in the upper region of the substrate 22 and has been provided with the reference numeral 24.
- the layer stack also comprises a metallization structure 26, which, for example, forms an electrode and is therefore arranged on the doped region 24.
- the layer stack can also have a further doped region of the substrate opposite to the doped region 24, namely the doped region 24 '. In this area 24 'is then optionally also an additional electrode 26' is provided.
- the finding of the invention is based on the fact that in a simple manner in the layer stack, a sensor can be integrated directly into the layer stack 20 during manufacture.
- the sensor can be integrated, for example, in the doped region 24 or the metallization layer 26.
- the sensor which is provided with the reference numeral 30, is integrated in the metallization layer 26.
- An example of such a sensor that can be integrated into the metallization structure is a temperature sensor. This temperature sensor may be formed, for example, by a conductive portion that changes its resistance depending on the prevailing temperature.
- the senor such.
- a mechanical stress sensor is integrated into the layer 24, namely in the form of a piezoresistive element which changes a resistance value as a function of a prevailing deformation / mechanical stress.
- a sensor is also contacted via the layer with the metallization structures 26, but is arranged essentially in the doped region or else formed by a doping.
- a moisture sensor as a sensor.
- This may be shaped, for example, as a capacitance (formed in the plane of the metallization structure 26) in combination with a moisture-sensitive polymer.
- Fig. 2a shows a sectional view and a plan view of a mechanical stress sensor, which is provided with reference numeral 40.
- the mechanical voltage sensor 40 is assumed to be essentially integrated into the substrate 22 or into the doped region of the substrate 24, wherein a contacting takes place via the plane of the metallization structures 26.
- the voltage sensor essentially consists of a piezoresistive resistor, which is formed as a doped region 41. The resistor is contacted via the contacts 43. These contacts 43 are found in the plane of the metallization structures 26.
- the metallization may be made of silver or other conductive material such as aluminum.
- a grounding ring 42 is provided, which may also be formed by a region with a high doping. This grounding ring 42 is contacted via the contacts 45, which are electrically connected to a metallization of the grounding ring 44.
- the metallization 44 extends along the entire grounding ring 42, not only in the plane of the grounding ring 24, but in the plane of the metallization 26.
- the mechanical stress sensor 40 enables the in-situ measurement of the stress in the solar cell within a PV module. This makes it possible to measure the mechanical stress during the entire life of a PV module.
- the following application areas are conceivable according to exemplary embodiments, inter alia: in the module production process, during climatic chamber testing, load tests, transport to the construction site or assembly and operation.
- the piezoresistivity of silicon or another semiconductor is used to measure the mechanical stress.
- a resistor 41 is introduced into the solar cell by high local doping. This results in two possible variants:
- An n-doped resistor in a p-doped solar cell 2 A p-doped resistor in an n-doped solar cell, wherein the different doping of the solar cell relates in particular to the doping of the substrate 22.
- a voltage can be determined which allows a conclusion on the prevailing in the substrate 22 mechanical stress / deformation.
- the electrical contacting takes place, for example, via the (silver) metallizations 43 typically used in solar cells. a cable / strand are soldered (not shown).
- the sensor is shielded from the remainder of the solar cell by an optional ground ring 42 and 44, i. isolated so that the sensor experiences a defined current / voltage. This is likewise realized by local doping (compare region 42) and by metallization structures 44 arranged on the local doping 42. In each case, the dopant of the solar cell is used in higher concentration. In this respect, the doping 41 differs from the doping 22 and 42.
- the sensors can be realized in two versions, namely as a single sensor or in the form of a Wheatstone bridge, d. H. through the interconnection of four identical sensors.
- This variant has the advantage that a temperature influence can be neglected.
- Piezoresistive mechanical stress sensors are known in the field of microelectronics [7-9]. We transfer the process to p-type silicon solar cells and limit the technologies used to solar cell production technologies. More specifically, the mechanical stress sensor is realized by a rectangular piezoresistive resistor using local n-type doping by ion implantation and subsequent silver metallization.
- the sensor resistance R a , o depends on the sheet resistance R a , its length / and width w:
- the resistance change AR a can be expressed by the piezoresistive tensor p [7], which also reflects the anisotropy of silicon. Tensors are marked in bold.
- variants or the sensors were produced, for example, on industrial p-type solar wafers.
- the wafers are divided into individual strips of 10x100 mm 2 .
- Each strip contains four different variants, two of which can be used to measure the current-voltage characteristic with a four-point probe.
- the test range is limited to 65 MPa and divided into 13 load steps.
- the current is measured at an applied voltage of 1V by a four-point probe. From this we calculate the resistance change DH s relative to 0 MPa.
- the sensitivity S of the sensor is evaluated by the following equation:
- Variation 1 shows a sensitivity of (-0.067 ⁇ 0.008)% / MPa.
- the large error is mainly due to the deviation of two samples with a sensitivity of (-0.05657 ⁇ 0.00015)% / MPa (light and dark red). Without these two samples, the sensitivity is -0.0729 ⁇ 0.0006% / MPa.
- the sensitivity of variant 2 (-0.0696 ⁇ 0.0004)% / MPa is in the same range as variant 1.
- Variants 4 and 5 with a higher carrier concentration of 5 ⁇ 10 19 cm 3 show lower sensitivities of (- 0.0546 ⁇ 0.001 1)% / MPa or (-0.0527 ⁇ 0.0003)% / MPa. These values are also in the same range. Since the sensitivity is a relative value, the influence of the aspect ratio a disappears theoretically. Practically, it seems a little influence too probably due to deviations in the production process. However, this must be confirmed by the ongoing measurements.
- Fig. 2c These preliminary results for changing the relative resistance as a function of axial stress are shown in Fig. 2c.
- the upper diagram assumes a charge carrier concentration of 5 ⁇ 10 19 cm -3
- the lower variant assumes 1 ⁇ 10 19 cm 3 .
- Squares are sensors with an aspect ratio of 10, while sensors with an aspect ratio of 5 are marked with circles.
- the lines show linear adjustments to each sensor.
- the wafer strips break at about 90 MPa, which is a very low breaking stress. This is most likely due to the splitting process, in which the wafer is sawn with a chip saw. This process creates many defects in silicon that increase the probability of failure at low loads.
- the temperature sensor is modeled on a Pt100 sensor.
- the temperature sensor is preferably introduced into the layer stack so that it can directly measure the temperature of the solar cell.
- the cell metallization used in the photovoltaic cell is used as a resistor.
- the temperature is determined from the change in resistance.
- the implementation is carried out according to embodiments by means of a meander-shaped resistor, as shown in Fig. 3a.
- FIG. 3a shows a temperature sensor 32 which has a meandering section 32m.
- This meandering section 32m connects the two contact points 32k with each other.
- Both the contact points 32k and the meandering region 32m are arranged in one plane, namely in the plane of the metallization path and at the same time as the metallization structures introduced anyway for the solar cell production.
- the sensor is electrically isolated from the solar cell. This can be realized, for example, as follows.
- a contact field 32k which is also made of silver and is applied to the e.g. a cable / strand can be soldered.
- a sensor was developed, for example, a commercially available Pt sensor, such. B. corresponds to a Pt100 sensor. Accordingly, the structure was designed so that the resistance Rr, o at 0 ° C corresponds to 100W. Depending on which Pt or Nt sensor is to be simulated, the resistance value can be chosen differently.
- the resistor RT. O depends on the resistivity p, the length l, the width w and the height h:
- the temperature dependence is expressed by the coefficient at.
- the length of the sensor must be long according to equation (7) to achieve a resistance of 100 W. That's why we design the sensor in a meandering way.
- the sensor is produced in-house using physical vapor deposition and calibrated in a climate chamber.
- the resistance change is measured by a four-point probe in three temperature cycles in the range of -40 ... + 160 ° C.
- the temperature is measured via an external Pt100 temperature sensor.
- FIG. 3b shows the temperature-dependent resistance Rr of an exemplary temperature sensor.
- the data represent three temperature cycles in use, with the lines corresponding to a linear fit.
- the low variance of the characterized temperature sensors shows that the designed sensor is suitable for measuring the temperature of a solar cell.
- the moisture sensor 34 can essentially be determined as a capacitor with a dielectric dependent on the ambient humidity.
- the capacitor may be described as a comb capacitor having the two combs 34k 1 and 34k2.
- the two combs 34k 1 and 34k2 engage each other and are both formed in the plane of the metallization layer.
- Each of the capacitor banks 34k1 and 34k2 has a pad 34ko. Between the combs 34k 1 and 34k2, the moisture-sensitive dielectric 34p is provided.
- the dielectric 34p is applied during the production of the solar cell as a single polymer or else during the completion of the photovoltaic module by a encapsulation or bonding layer.
- the humidity sensor is designed to measure the moisture of the encapsulation.
- the humidity sensor should measure the humidity of the encapsulation.
- the dependence of the dielectric constant of the encapsulating polymers is utilized, wherein the measurement is capacitive.
- a capacitor is applied to the solar cell. From the change in capacity, the water content of the encapsulation can be determined.
- One possible embodiment of the capacitor is a comb capacitor. The capacitor must be electrically isolated from the solar cell. This results in the same design variants as in the temperature sensors.
- insulating varnish For the electrical contacting there is a contact field 34ko, which also consists of silver and on which a cable / strand can be soldered.
- Fig. 5a shows an intermediate step in the manufacture of a solar cell.
- a p-type Si wafer 50w is assumed on which potted layers or doped regions n-type emitter 50e are applied.
- the p-type fundamental doping may be provided, for example, by boron, while the n-type doping is achieved by phosphorus. Other dopants are of course possible.
- the emitters 50e are provided both on the top and on the bottom, ie on both main surfaces.
- an electrode is provided on this layer 50i.
- This electrode can be provided, for example, like a grid, which can be described by individual fingers 50f. These fingers are through tracks, z. B. via metallizations 50s (also referred to as busbar) connected to each other.
- the contact on the opposite side can be realized, for example, by a full-surface aluminum layer 50rc into which contact pads (eg AgAl) 50c are embedded.
- the Al-BSF back surface field, corresponding to a highly doped p + ' zone
- This stage illustrated in FIG. 5b can be described as a solar cell consisting of the layer stack of layers 50f, 50e, 50w, 50c, 50rc.
- the layer 50e is to be equated with the doping layer or with the doped region, while the layer 50f coincides with the metallization structures.
- a photovoltaic module is then assembled during lamination or encapsulation, which is illustrated by way of example with reference to FIG. 5 c.
- FIG. 5c shows a plurality of solar cells composed of a matrix (eg 6 ⁇ 10 matrix), which are provided with the reference numeral 60.
- This solar cell matrix 60s is laminated onto a glass pane 60g, with an encapsulation layer 60v also being used between the glass pane 60g and the solar cell matrix 60s.
- This encapsulation layer has already been used in connection with the moisture sensor in the above exemplary embodiments, since this encapsulation layer can, for example, form the moisture-sensitive polymer.
- the module After applying the solar cells 60s using the encapsulation layer 60v to the glass pane 60g, another encapsulation layer 60v is applied to then finalize the photovoltaic module with the backsheet 60rf.
- the module has a frame, which is provided with the reference numeral 60r. This frame can also include, for example, the electrical contact, here junction box 60a.
- FIG. 5d shows the solar cells 60s, which are laminated to the front glass 60g by means of the encapsulation 60v and sealed by means of the backsheet 60rf.
- electrically conductive connectors such. B. silver connector 60e
- the cells can be interconnected by soldering (eg SnPb Ag-coated Cu flat wires). This connection usually takes place before or during the lamination process, so that the contacts can be led outwards to the frame 60r.
- soldering eg SnPb Ag-coated Cu flat wires
- the metallization structures shown here as fingers in connection with the webs may vary.
- the contact on the back, which is typically executed over the entire surface, may also be formed as a finger structure or as a full-surface structure.
- doped layer 50e does not actually constitute a layer in the actual sense, but is produced by doping the substrate 50w.
- FIG. 6 shows the layer stack with the layers 50f which are connected to one another via the conductor tracks 50s and together form the metallization structure.
- This metallization structure is arranged on the insulating layer 50i, which in turn lies on the emitter 50e.
- the layer 50i serves on the one hand the isolation and on the other hand the improvement of the optical properties, namely as an antireflection layer.
- a temperature sensor 50t can be produced. This temperature sensor 50t is isolated from the emitter 50e by the layer 50i. In addition, the temperature sensor 50t is also insulated according to preferred embodiments with respect to the metallization structure 50f + 50s. Correspondingly illustrated embodiments, however, an electrical connection can also be provided, in particular when the temperature sensor is supplied with power by an evaluation unit for the temperature sensor of the solar cell.
- a moisture sensor may also be formed in the same layer, namely the layer of the metallization structures 50f + 50s. This is, as already explained above, also by a metal structure, namely a capacitor (compared to the temperature sensor not a resistor) is formed, which additionally has a moisture-sensitive dielectric.
- a mechanical voltage sensor 50m is also illustrated. This extends in the illustrated variant over three layers, namely the doping layer / emitter layer 50e, in which a doped region 50dm of the mechanical stress sensor is arranged, the metallization layer 50f + 50s and the insulating layer 10i. This doped region can be contacted via contacts 50 km, which lie in the layer of the metallization layer 50 f + 50 s and also pass through the insulation layer 50 i. Analogous to the temperature sensor 50t, the mechanical voltage sensor is also isolated from the metallization structure 50f + 50s, it being understood that an electrical connection can also be provided by a power supply unit.
- Solar cell-integrated sensors have the advantage that the measured variable is measured directly in or on the surface of the solar cell. Since the implementation of the sensors can be integrated into the solar cell manufacturing process, there is the potential to integrate the above-mentioned sensors on each solar cell and thus achieve extremely low additional costs for the sensors, in comparison to a solar cell without a sensor. This enables continuous monitoring of PV modules. This has the advantage that PV Modui operators can monitor the state of each individual PV module using computer algorithms and only have to carry out targeted on-site checks for critical values. Measures z. For example, if a module is too humid, the PV module operator can preemptively inspect and, if necessary, replace the PV module. Likewise for the mechanical tension: if a high / critical mechanical tension is measured or was measured in individual PV modules, the operator can control these PV modules specifically for solar cell breaks. If solar cell fractures were found, the operator also knows exactly when they were created.
- Silicon-based solar cells with integrated sensors eg. B .: mechanical stress
- PV modules with the above solar cells for in-situ monitoring during operation Production (interconnection, lamination)
- a manufacturing method for manufacturing a solar cell is provided with the steps of integrating the sensors.
- the doping of the doped regions and / or the application of the metallization structures takes place in such a way that the corresponding desired sensors are produced at the same time.
- a further exemplary embodiment relates to a method for producing a photovoltaic module, which includes, for example, the lamination steps and / or the contacting steps.
- a method for producing a photovoltaic module which includes, for example, the lamination steps and / or the contacting steps.
- high temperatures eg. B. 150 ° C for 8 minutes during lamination or 200 ° C for 2 minutes when soldering the individual solar cells, which are chosen so that the semiconductor structure of the solar cell or the layer stack is generally not damaged.
- the already integrated temperature sensor can advantageously be used, so that the production method of the photovoltaic module now also includes the monitoring of process parameters determinable by means of the sensors.
- the mechanical stress z. B.
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Abstract
Description
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Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102018206155.6A DE102018206155A1 (de) | 2018-04-20 | 2018-04-20 | Solarzelle und photovoltaikmodul |
| PCT/EP2019/060184 WO2019202119A1 (de) | 2018-04-20 | 2019-04-18 | Solarzelle und photovoltaikmodul |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP3782204A1 true EP3782204A1 (de) | 2021-02-24 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP19720511.5A Pending EP3782204A1 (de) | 2018-04-20 | 2019-04-18 | Solarzelle und photovoltaikmodul |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US11972988B2 (de) |
| EP (1) | EP3782204A1 (de) |
| DE (1) | DE102018206155A1 (de) |
| WO (1) | WO2019202119A1 (de) |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112466973A (zh) * | 2020-11-02 | 2021-03-09 | 浙江晶科能源有限公司 | 光伏组件 |
| WO2022113101A1 (en) * | 2020-11-26 | 2022-06-02 | Tata Power Solar Systems Ltd. | A system and method for determining real-time temperature of a photovoltaic module using an embedded sensor |
| DE102021122218A1 (de) | 2021-08-27 | 2023-03-02 | Audi Aktiengesellschaft | Funktionsbauteil zur photovoltaischen Energieerzeugung mit integrierter Sensoreinrichtung, Solarmodul, Photovoltaikanlage und Kraftfahrzeug |
| CN118092646A (zh) * | 2024-02-26 | 2024-05-28 | 同济大学 | 脑机接口用多模态柔性薄膜传感器及贴片 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040089058A1 (en) * | 1999-09-09 | 2004-05-13 | De Haan Peter Hillebrand | Sensor for detecting the presence of moisture |
| JP4661433B2 (ja) * | 2005-07-29 | 2011-03-30 | Tdk株式会社 | 無線送受信機 |
| DE102008037821A1 (de) | 2008-08-14 | 2010-02-25 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren zur Herstellung von mechanisch vorgespannten Solarzellenverbunden sowie mechanisch vorgespanntes Solarzellenmodul |
| DE102009051759A1 (de) * | 2009-11-03 | 2011-05-05 | Panasonic Corporation, Kadoma-shi | Flexible Energiesammelvorrichtung |
| US20120060902A1 (en) * | 2010-01-18 | 2012-03-15 | Drake Kenneth C | System and method for frameless laminated solar panels |
| AT12234U1 (de) * | 2010-06-23 | 2012-01-15 | Austria Tech & System Tech | Photovoltaisches modul und verfahren zum herstellen eines photovoltaischen moduls |
| JP6028164B2 (ja) | 2010-12-01 | 2016-11-16 | 株式会社オリンピア | 遊技機 |
| DE102011010077A1 (de) | 2011-02-01 | 2012-08-02 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Photovoltaische Solarzelle sowie Verfahren zu deren Herstellung |
| MY153788A (en) * | 2011-02-23 | 2015-03-31 | Mimos Berhad | A photovoltaic device |
| DE102011012582A1 (de) | 2011-02-28 | 2012-08-30 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Photovoltaisches Modul und Verfahren zu dessen Herstellung |
| US20150000731A1 (en) * | 2011-10-21 | 2015-01-01 | Trina Solar Energy Development Pte Ltd | All-back-contact solar cell and method of fabricating the same |
| FR2998668B1 (fr) * | 2012-11-23 | 2015-04-10 | Apollon Solar | Methode et installation de controle de la pression interne d'un module photovoltaique |
| DE102014200352A1 (de) * | 2014-01-10 | 2015-07-16 | SolarWorld Industries Thüringen GmbH | Strahlungsdetektorvorrichtung und Verfahren zum Betreiben einer Strahlungsdetektorvorrichtung |
-
2018
- 2018-04-20 DE DE102018206155.6A patent/DE102018206155A1/de active Pending
-
2019
- 2019-04-18 WO PCT/EP2019/060184 patent/WO2019202119A1/de not_active Ceased
- 2019-04-18 EP EP19720511.5A patent/EP3782204A1/de active Pending
-
2020
- 2020-10-13 US US17/068,927 patent/US11972988B2/en active Active
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| JEI-LI HOU ET AL: "Self-biased ZnO nanowire humidity sensor vertically integrated on triple junction solar cell", SENSORS AND ACTUATORS B: CHEMICAL, vol. 197, 1 July 2014 (2014-07-01), NL, pages 137 - 141, XP055762030, ISSN: 0925-4005, DOI: 10.1016/j.snb.2014.02.073 * |
| See also references of WO2019202119A1 * |
| WEI-PING CHEN ET AL: "A Capacitive Humidity Sensor Based on Multi-Wall Carbon Nanotubes (MWCNTs)", SENSORS, vol. 9, no. 9, 16 September 2009 (2009-09-16), pages 7431 - 7444, XP055440876, DOI: 10.3390/s90907431 * |
Also Published As
| Publication number | Publication date |
|---|---|
| DE102018206155A1 (de) | 2019-10-24 |
| US11972988B2 (en) | 2024-04-30 |
| WO2019202119A1 (de) | 2019-10-24 |
| US20210028076A1 (en) | 2021-01-28 |
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