EP3674689A4 - Analyseur de gaz et procédé d'analyse de gaz - Google Patents
Analyseur de gaz et procédé d'analyse de gaz Download PDFInfo
- Publication number
- EP3674689A4 EP3674689A4 EP18847361.5A EP18847361A EP3674689A4 EP 3674689 A4 EP3674689 A4 EP 3674689A4 EP 18847361 A EP18847361 A EP 18847361A EP 3674689 A4 EP3674689 A4 EP 3674689A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- gas
- analyzing method
- analyzer
- gas analyzer
- gas analyzing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
- G01N21/3518—Devices using gas filter correlation techniques; Devices using gas pressure modulation techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/37—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using pneumatic detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
- G01N2021/3545—Disposition for compensating effect of interfering gases
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710720122.1A CN107389585B (zh) | 2017-08-21 | 2017-08-21 | 一种气体分析仪及气体分析方法 |
| PCT/CN2018/100767 WO2019037648A1 (fr) | 2017-08-21 | 2018-08-16 | Analyseur de gaz et procédé d'analyse de gaz |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| EP3674689A1 EP3674689A1 (fr) | 2020-07-01 |
| EP3674689A4 true EP3674689A4 (fr) | 2021-07-28 |
| EP3674689B1 EP3674689B1 (fr) | 2023-12-13 |
Family
ID=60352795
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP18847361.5A Active EP3674689B1 (fr) | 2017-08-21 | 2018-08-16 | Analyseur de gaz et procédé d'analyse de gaz |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US11079322B2 (fr) |
| EP (1) | EP3674689B1 (fr) |
| CN (1) | CN107389585B (fr) |
| WO (1) | WO2019037648A1 (fr) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107389585B (zh) * | 2017-08-21 | 2019-11-15 | 湖北锐意自控系统有限公司 | 一种气体分析仪及气体分析方法 |
| CN107941734A (zh) * | 2017-09-20 | 2018-04-20 | 国网辽宁省电力有限公司检修分公司 | 一种具有多功能sf6检测技术的综合分析平台及方法 |
| CN109507140B (zh) * | 2018-10-16 | 2020-04-10 | 四方光电股份有限公司 | 一种高精度红外气体传感器及气体分析方法 |
| CN109406532B (zh) * | 2018-10-24 | 2021-01-05 | 广州海狮软件科技有限公司 | 一种适用于小管径管材的表面缺陷的低成本视觉检测装置及方法 |
| CN113767274A (zh) * | 2019-08-23 | 2021-12-07 | 西门子股份公司 | 气体分析仪 |
| CN110806403B (zh) * | 2019-11-28 | 2024-05-10 | 北京永安多谱检测科技有限公司 | 一种便携式一体化过氧化物检测装置及其检测方法 |
| CN112666108B (zh) * | 2020-11-27 | 2023-07-25 | 广西电网有限责任公司电力科学研究院 | 一种涉及红外光谱对环保气体热解后混合气体检测方法 |
| CN112816377B (zh) * | 2020-12-30 | 2024-03-15 | 杭州谱育科技发展有限公司 | 基于ftir技术的烟气检测方法 |
| CN113567385A (zh) * | 2021-07-08 | 2021-10-29 | 浙江焜腾红外科技有限公司 | 激光红外气体传感器 |
| CN113612859B (zh) * | 2021-09-18 | 2023-04-18 | 中国科学院长春光学精密机械与物理研究所 | 矿井环境监测系统及其监测方法 |
| CN114136912B (zh) * | 2021-12-01 | 2023-10-20 | 河南森斯科传感技术有限公司 | 一种双光可调式红外气体传感器的校准方法 |
| CN114441717B (zh) * | 2022-02-11 | 2023-04-21 | 华北电力大学（保定） | 一种生物气溶胶快速测量装置及方法 |
| CN116242795B (zh) * | 2023-05-12 | 2023-07-18 | 山东益来环保科技有限公司 | 一种紫外烟气分析仪及其使用方法 |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3770974A (en) * | 1972-06-29 | 1973-11-06 | Mine Safety Appliances Co | Non-dispersive infrared fluid analyzer with compensation for absorptive and mechanical effects of ambient conditions |
| JPS5014139B1 (fr) * | 1969-08-29 | 1975-05-26 | ||
| JPH0480642A (ja) * | 1990-07-23 | 1992-03-13 | Fuji Electric Co Ltd | 赤外線ガス分析計 |
| JP2000002657A (ja) * | 1998-06-12 | 2000-01-07 | Horiba Ltd | 赤外線ガス分析計における水分干渉補正方法 |
| JP2004061207A (ja) * | 2002-07-26 | 2004-02-26 | Shimadzu Corp | 赤外線ガス分析計 |
| US20080011952A1 (en) * | 2004-06-30 | 2008-01-17 | Abb Patent Gmbh | Non-Dispersive Infrared Gas Analyzer |
| EP2551662A1 (fr) * | 2011-07-29 | 2013-01-30 | ABB Technology AG | Installation optique d'analyse de gaz avec des agents destinés à améliorer la sélectivité lors des analyses de mélanges de gaz |
| US20130043391A1 (en) * | 2009-12-22 | 2013-02-21 | Siemens Aktiengesellschaft | Non-Dispersive Infrared (NDIR) Dual Trace Gas Analyzer and Method for Determining a Concentration of a Measurement Gas Component in a Gas Mixture by the Gas Analyzer |
| JP2013096889A (ja) * | 2011-11-02 | 2013-05-20 | Fuji Electric Co Ltd | 赤外線ガス分析計 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2924713A (en) * | 1956-01-18 | 1960-02-09 | Beckman Instruments Inc | Instruments |
| JPS58190743A (ja) | 1982-04-30 | 1983-11-07 | Fuji Electric Co Ltd | 赤外線ガス分析計 |
| JPS6011122A (ja) * | 1983-07-01 | 1985-01-21 | Shimadzu Corp | 非分散型赤外分析法における干渉補償方法 |
| JPS6117654U (ja) * | 1984-07-07 | 1986-02-01 | 株式会社 堀場製作所 | 赤外線ガス分析計 |
| DE19732470C2 (de) * | 1997-07-28 | 1999-11-18 | Siemens Ag | Nichtdispersiver Infrarot-Gasanalysator |
| CN102590126A (zh) * | 2011-12-28 | 2012-07-18 | 武汉四方光电科技有限公司 | 一种长寿命的微流红外so2传感器 |
| CN102809546B (zh) * | 2012-08-21 | 2015-04-22 | 南京埃森环境技术有限公司 | 一种低浓度烟气红外分析仪及检测方法 |
| CN102980870B (zh) * | 2012-12-10 | 2014-10-29 | 武汉四方光电科技有限公司 | 一种高精度微流红外气体传感器及其测量方法 |
| CN104089918A (zh) * | 2014-07-03 | 2014-10-08 | 中国人民解放军后勤工程学院 | 一种基于非分光红外法的油气在线检测装置 |
| CN207147966U (zh) * | 2017-08-21 | 2018-03-27 | 湖北锐意自控系统有限公司 | 气体分析仪 |
| CN107389585B (zh) * | 2017-08-21 | 2019-11-15 | 湖北锐意自控系统有限公司 | 一种气体分析仪及气体分析方法 |
-
2017
- 2017-08-21 CN CN201710720122.1A patent/CN107389585B/zh active Active
-
2018
- 2018-08-16 EP EP18847361.5A patent/EP3674689B1/fr active Active
- 2018-08-16 WO PCT/CN2018/100767 patent/WO2019037648A1/fr unknown
-
2020
- 2020-03-27 US US16/832,020 patent/US11079322B2/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5014139B1 (fr) * | 1969-08-29 | 1975-05-26 | ||
| US3770974A (en) * | 1972-06-29 | 1973-11-06 | Mine Safety Appliances Co | Non-dispersive infrared fluid analyzer with compensation for absorptive and mechanical effects of ambient conditions |
| JPH0480642A (ja) * | 1990-07-23 | 1992-03-13 | Fuji Electric Co Ltd | 赤外線ガス分析計 |
| JP2000002657A (ja) * | 1998-06-12 | 2000-01-07 | Horiba Ltd | 赤外線ガス分析計における水分干渉補正方法 |
| JP2004061207A (ja) * | 2002-07-26 | 2004-02-26 | Shimadzu Corp | 赤外線ガス分析計 |
| US20080011952A1 (en) * | 2004-06-30 | 2008-01-17 | Abb Patent Gmbh | Non-Dispersive Infrared Gas Analyzer |
| US20130043391A1 (en) * | 2009-12-22 | 2013-02-21 | Siemens Aktiengesellschaft | Non-Dispersive Infrared (NDIR) Dual Trace Gas Analyzer and Method for Determining a Concentration of a Measurement Gas Component in a Gas Mixture by the Gas Analyzer |
| EP2551662A1 (fr) * | 2011-07-29 | 2013-01-30 | ABB Technology AG | Installation optique d'analyse de gaz avec des agents destinés à améliorer la sélectivité lors des analyses de mélanges de gaz |
| JP2013096889A (ja) * | 2011-11-02 | 2013-05-20 | Fuji Electric Co Ltd | 赤外線ガス分析計 |
Also Published As
| Publication number | Publication date |
|---|---|
| US11079322B2 (en) | 2021-08-03 |
| EP3674689B1 (fr) | 2023-12-13 |
| CN107389585A (zh) | 2017-11-24 |
| CN107389585B (zh) | 2019-11-15 |
| WO2019037648A1 (fr) | 2019-02-28 |
| US20200225150A1 (en) | 2020-07-16 |
| EP3674689A1 (fr) | 2020-07-01 |
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