EP3549155A4 - Process and manufacture of low-dimensional materials supporting both self-thermalization and self-localization - Google Patents
Process and manufacture of low-dimensional materials supporting both self-thermalization and self-localization Download PDFInfo
- Publication number
- EP3549155A4 EP3549155A4 EP17899703.7A EP17899703A EP3549155A4 EP 3549155 A4 EP3549155 A4 EP 3549155A4 EP 17899703 A EP17899703 A EP 17899703A EP 3549155 A4 EP3549155 A4 EP 3549155A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- self
- thermalization
- localization
- manufacture
- low
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N99/00—Subject matter not provided for in other groups of this subclass
- H10N99/05—Devices based on quantum mechanical effects, e.g. quantum interference devices or metal single-electron transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/26—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, elements provided for in two or more of the groups H01L29/16, H01L29/18, H01L29/20, H01L29/22, H01L29/24, e.g. alloys
- H01L29/267—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, elements provided for in two or more of the groups H01L29/16, H01L29/18, H01L29/20, H01L29/22, H01L29/24, e.g. alloys in different semiconductor regions, e.g. heterojunctions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
- H01L29/861—Diodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
- H10N10/80—Constructional details
- H10N10/85—Thermoelectric active materials
- H10N10/851—Thermoelectric active materials comprising inorganic compositions
- H10N10/855—Thermoelectric active materials comprising inorganic compositions comprising compounds containing boron, carbon, oxygen or nitrogen
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Silicon Compounds (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Particle Accelerators (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Photovoltaic Devices (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Recrystallisation Techniques (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201762471815P | 2017-03-15 | 2017-03-15 | |
US201762591848P | 2017-11-29 | 2017-11-29 | |
PCT/US2017/064020 WO2018164746A2 (en) | 2016-11-29 | 2017-11-30 | Process and manufacture of low-dimensional materials supporting both self-thermalization and self-localization |
Publications (2)
Publication Number | Publication Date |
---|---|
EP3549155A2 EP3549155A2 (en) | 2019-10-09 |
EP3549155A4 true EP3549155A4 (en) | 2020-09-30 |
Family
ID=68407930
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP17899703.7A Pending EP3549155A4 (en) | 2017-03-15 | 2017-11-30 | Process and manufacture of low-dimensional materials supporting both self-thermalization and self-localization |
Country Status (7)
Country | Link |
---|---|
EP (1) | EP3549155A4 (en) |
JP (1) | JP7250340B2 (en) |
KR (1) | KR102373619B1 (en) |
CN (1) | CN110431652B (en) |
CA (1) | CA3045318A1 (en) |
IL (1) | IL266966B2 (en) |
WO (1) | WO2018164746A2 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111470577A (en) * | 2020-04-15 | 2020-07-31 | 苏州正奥水生态技术研究有限公司 | Sewage treatment photon carrier and preparation method and use method thereof |
CN115903279B (en) * | 2022-10-12 | 2023-10-03 | 北京大学 | Method for regulating and controlling spectral emissivity based on isotope engineering and application thereof |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6479919B1 (en) * | 2001-04-09 | 2002-11-12 | Terrence L. Aselage | Beta cell device using icosahedral boride compounds |
US20150206940A1 (en) * | 2012-08-02 | 2015-07-23 | University-Industry Cooperation Group Of Kyung Hee University | Semiconductor device and method for producing same |
US20160351286A1 (en) * | 2015-05-28 | 2016-12-01 | SemiNuclear, Inc. | Composition and method for making picocrystalline artificial carbon atoms |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3432539A (en) * | 1965-06-30 | 1969-03-11 | Du Pont | Icosahedral dodecahydrododecaborane derivatives and their preparation |
US4818625A (en) * | 1985-06-24 | 1989-04-04 | Lockheed Missiles & Space Company, Inc. | Boron-silicon-hydrogen alloy films |
US5872368A (en) * | 1995-11-30 | 1999-02-16 | The United States Of America As Represented By The Secretary Of The Navy | Method of controlling a super conductor |
US6025611A (en) * | 1996-09-20 | 2000-02-15 | The Board Of Regents Of The University Of Nebraska | Boron-carbide and boron rich rhobohedral based transistors and tunnel diodes |
JP2004123720A (en) * | 2002-09-11 | 2004-04-22 | Sony Corp | Molecular element, molecular organism, rectifier element, method for rectifying, sensor element, switching element, circuit element, logic circuit element, computing element, and information processing element |
KR100683401B1 (en) * | 2005-08-11 | 2007-02-15 | 동부일렉트로닉스 주식회사 | Semiconductor device using epi-layer and method of forming the same |
US7795735B2 (en) * | 2007-03-21 | 2010-09-14 | Taiwan Semiconductor Manufacturing Co., Ltd. | Methods for forming single dies with multi-layer interconnect structures and structures formed therefrom |
US7915643B2 (en) * | 2007-09-17 | 2011-03-29 | Transphorm Inc. | Enhancement mode gallium nitride power devices |
US8779462B2 (en) * | 2008-05-19 | 2014-07-15 | Infineon Technologies Ag | High-ohmic semiconductor substrate and a method of manufacturing the same |
JP2012523716A (en) * | 2009-06-10 | 2012-10-04 | シンシリコン・コーポレーション | Photovoltaic module and method for producing photovoltaic module having multiple semiconductor layer stacks |
US8344337B2 (en) * | 2010-04-21 | 2013-01-01 | Axcelis Technologies, Inc. | Silaborane implantation processes |
WO2015186625A1 (en) * | 2014-06-03 | 2015-12-10 | 株式会社日本製鋼所 | Method for producing semiconductor having gettering layer, method for manufacturing semiconductor device, and semiconductor device |
US9972489B2 (en) * | 2015-05-28 | 2018-05-15 | SemiNuclear, Inc. | Composition and method for making picocrystalline artificial borane atoms |
-
2017
- 2017-11-30 WO PCT/US2017/064020 patent/WO2018164746A2/en unknown
- 2017-11-30 CA CA3045318A patent/CA3045318A1/en active Pending
- 2017-11-30 EP EP17899703.7A patent/EP3549155A4/en active Pending
- 2017-11-30 KR KR1020197018946A patent/KR102373619B1/en active IP Right Grant
- 2017-11-30 JP JP2019548545A patent/JP7250340B2/en active Active
- 2017-11-30 CN CN201780084888.3A patent/CN110431652B/en active Active
- 2017-11-30 IL IL266966A patent/IL266966B2/en unknown
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6479919B1 (en) * | 2001-04-09 | 2002-11-12 | Terrence L. Aselage | Beta cell device using icosahedral boride compounds |
US20150206940A1 (en) * | 2012-08-02 | 2015-07-23 | University-Industry Cooperation Group Of Kyung Hee University | Semiconductor device and method for producing same |
US20160351286A1 (en) * | 2015-05-28 | 2016-12-01 | SemiNuclear, Inc. | Composition and method for making picocrystalline artificial carbon atoms |
Non-Patent Citations (7)
Title |
---|
COREY MELNICK ET AL: "Phonovoltaic. I. Harvesting hot optical phonons in a nanoscale p - n junction", PHYSICAL REVIEW B, vol. 93, no. 9, 4 March 2016 (2016-03-04), XP055690570, ISSN: 2469-9950, DOI: 10.1103/PhysRevB.93.094302 * |
JING LIU ET AL: "The local structure of transition metal doped semiconducting boron carbides", JOURNAL OF PHYSICS D: APPLIED PHYSICS, INSTITUTE OF PHYSICS PUBLISHING LTD, GB, vol. 43, no. 8, 3 March 2010 (2010-03-03), pages 85403, XP020171369, ISSN: 0022-3727 * |
KUMAR VOBULAPURAM RAMESH ET AL: "Graphene Based On-Chip Interconnects and TSVs : Prospects and Challenges", IEEE NANOTECHNOLOGY MAGAZINE, IEEE, USA, vol. 8, no. 4, 1 December 2014 (2014-12-01), pages 14 - 20, XP011564671, ISSN: 1932-4510, [retrieved on 20141118], DOI: 10.1109/MNANO.2014.2355275 * |
NAN LIU ET AL: "Large-Area, Transparent, and Flexible Infrared Photodetector Fabricated Using P-N Junctions Formed by N-Doping Chemical Vapor Deposition Grown Graphene", NANO LETTERS, vol. 14, no. 7, 9 July 2014 (2014-07-09), US, pages 3702 - 3708, XP055723189, ISSN: 1530-6984, DOI: 10.1021/nl500443j * |
S. YU. RYBAKOV ET AL: "Oxygen Effect on the Stability of PECVD Boron-Carbon Films", JOURNAL DE PHYSIQUE IV, vol. 05, no. C5, 1 June 1995 (1995-06-01), FR, pages C5 - 921, XP055689624, ISSN: 1155-4339, DOI: 10.1051/jphyscol:19955109 * |
SHIOYA HIROKI ET AL: "Gate tunable non-linear currents in bilayer graphene diodes", APPLIED PHYSICS LETTERS, A I P PUBLISHING LLC, US, vol. 100, no. 3, 16 January 2012 (2012-01-16), pages 33113 - 33113, XP012156888, ISSN: 0003-6951, [retrieved on 20120118], DOI: 10.1063/1.3676441 * |
YI ZHANG: "Epitaxial growth of icosahedral boron arsenide on silicon carbide substrates: Improved process conditions and electrical properties", DISSERTATION, 1 January 2011 (2011-01-01), XP055554015, ISBN: 978-1-267-14614-4, Retrieved from the Internet <URL:http://krex.k-state.edu/dspace/bitstream/handle/2097/13122/YiZhang2011.pdf?sequence=3&isAllowed=y> [retrieved on 20190208] * |
Also Published As
Publication number | Publication date |
---|---|
KR102373619B1 (en) | 2022-03-15 |
IL266966B2 (en) | 2024-03-01 |
JP7250340B2 (en) | 2023-04-03 |
CN110431652B (en) | 2023-12-29 |
IL266966B1 (en) | 2023-11-01 |
CA3045318A1 (en) | 2018-09-13 |
JP2020515057A (en) | 2020-05-21 |
WO2018164746A3 (en) | 2018-12-06 |
KR20190126765A (en) | 2019-11-12 |
IL266966A (en) | 2019-07-31 |
CN110431652A (en) | 2019-11-08 |
WO2018164746A2 (en) | 2018-09-13 |
EP3549155A2 (en) | 2019-10-09 |
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Legal Events
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STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE |
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PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
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STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: REQUEST FOR EXAMINATION WAS MADE |
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17P | Request for examination filed |
Effective date: 20190626 |
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AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR |
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Extension state: BA ME |
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DAV | Request for validation of the european patent (deleted) | ||
DAX | Request for extension of the european patent (deleted) | ||
RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01L 29/861 20060101ALI20200508BHEP Ipc: H01L 21/033 20060101ALI20200508BHEP Ipc: H01L 31/0256 20060101ALI20200508BHEP Ipc: H01L 21/02 20060101AFI20200508BHEP Ipc: H01L 29/267 20060101ALI20200508BHEP Ipc: H01L 31/02 20060101ALI20200508BHEP Ipc: H01L 49/00 20060101ALI20200508BHEP Ipc: H01L 31/0264 20060101ALI20200508BHEP Ipc: H01L 31/04 20140101ALI20200508BHEP Ipc: H01L 35/22 20060101ALN20200508BHEP Ipc: H01L 31/036 20060101ALI20200508BHEP Ipc: H01L 31/0368 20060101ALI20200508BHEP |
|
A4 | Supplementary search report drawn up and despatched |
Effective date: 20200828 |
|
RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01L 31/0256 20060101ALI20200824BHEP Ipc: H01L 21/02 20060101AFI20200824BHEP Ipc: H01L 49/00 20060101ALI20200824BHEP Ipc: H01L 31/0264 20060101ALI20200824BHEP Ipc: H01L 31/02 20060101ALI20200824BHEP Ipc: H01L 31/036 20060101ALI20200824BHEP Ipc: H01L 35/22 20060101ALN20200824BHEP Ipc: H01L 31/0368 20060101ALI20200824BHEP Ipc: H01L 31/04 20140101ALI20200824BHEP Ipc: H01L 29/267 20060101ALI20200824BHEP Ipc: H01L 29/861 20060101ALI20200824BHEP Ipc: H01L 21/033 20060101ALI20200824BHEP |
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STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: EXAMINATION IS IN PROGRESS |
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17Q | First examination report despatched |
Effective date: 20220315 |