EP3372991A4 - COLLIMATOR AND RADIUS INSPECTION DEVICE - Google Patents

COLLIMATOR AND RADIUS INSPECTION DEVICE Download PDF

Info

Publication number
EP3372991A4
EP3372991A4 EP16861236.4A EP16861236A EP3372991A4 EP 3372991 A4 EP3372991 A4 EP 3372991A4 EP 16861236 A EP16861236 A EP 16861236A EP 3372991 A4 EP3372991 A4 EP 3372991A4
Authority
EP
European Patent Office
Prior art keywords
inspection apparatus
ray inspection
collimating device
collimating
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP16861236.4A
Other languages
German (de)
English (en)
French (fr)
Other versions
EP3372991A1 (en
Inventor
Zhiqiang Chen
Wanlong Wu
Ziran Zhao
Guangwei Ding
Ming Ruan
Xilei Luo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nuctech Jiangsu Co Ltd
Nuctech Co Ltd
Original Assignee
Nuctech Jiangsu Co Ltd
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuctech Jiangsu Co Ltd, Nuctech Co Ltd filed Critical Nuctech Jiangsu Co Ltd
Publication of EP3372991A1 publication Critical patent/EP3372991A1/en
Publication of EP3372991A4 publication Critical patent/EP3372991A4/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G01C15/002Active optical surveying means
    • G01C15/004Reference lines, planes or sectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/316Accessories, mechanical or electrical features collimators

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
EP16861236.4A 2015-11-06 2016-05-19 COLLIMATOR AND RADIUS INSPECTION DEVICE Pending EP3372991A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201510751623.7A CN105223211A (zh) 2015-11-06 2015-11-06 准直装置以及射线检查装置
PCT/CN2016/082600 WO2017075963A1 (zh) 2015-11-06 2016-05-19 准直装置以及射线检查装置

Publications (2)

Publication Number Publication Date
EP3372991A1 EP3372991A1 (en) 2018-09-12
EP3372991A4 true EP3372991A4 (en) 2019-07-03

Family

ID=54992285

Family Applications (1)

Application Number Title Priority Date Filing Date
EP16861236.4A Pending EP3372991A4 (en) 2015-11-06 2016-05-19 COLLIMATOR AND RADIUS INSPECTION DEVICE

Country Status (6)

Country Link
US (1) US10458928B2 (zh)
EP (1) EP3372991A4 (zh)
CN (2) CN105223211A (zh)
BR (1) BR202016022225U2 (zh)
SG (1) SG11201709881SA (zh)
WO (1) WO2017075963A1 (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105223625A (zh) * 2015-11-06 2016-01-06 同方威视技术股份有限公司 导束装置以及包括该导束装置的辐射检查设备
CN105223211A (zh) * 2015-11-06 2016-01-06 同方威视技术股份有限公司 准直装置以及射线检查装置
US11471117B2 (en) * 2017-03-20 2022-10-18 Dentsply Sirona Inc. Multiposition collimation device and x-ray imaging systems
EP3992619A1 (en) * 2020-10-27 2022-05-04 Due2Lab S.R.L. X-ray collimator and related x-ray inspection apparatus

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2831977A (en) * 1954-03-11 1958-04-22 California Inst Of Techn Low angle x-ray diffraction
US3327114A (en) * 1964-06-23 1967-06-20 Alfred F Diorio Low-angle x-ray diffraction camera comprising releasably connected sections and adjustable beam apertures and stops
US20110235778A1 (en) * 2010-03-29 2011-09-29 The Boeing Company Small diameter x-ray tube
KR101242731B1 (ko) * 2012-09-10 2013-03-13 주식회사 지.티.에스 방사선 차폐판이 구비된 방사선원 전송관

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5367552A (en) * 1991-10-03 1994-11-22 In Vision Technologies, Inc. Automatic concealed object detection system having a pre-scan stage
GB2284612B (en) * 1993-12-03 1998-03-11 Amtico Company Limited The Colourants, coloured articles and methods of making them
CN2489331Y (zh) * 2001-08-10 2002-05-01 清华大学 射线源的带翼屏蔽体
US7085348B2 (en) 2003-12-15 2006-08-01 The University Of Florida Research Foundation, Inc. Leaf sequencing method and system
GB2420683B (en) * 2004-11-26 2009-03-18 Univ Tsinghua A computer tomography method and apparatus for identifying a liquid article based on the density of the liquid article
CN100460852C (zh) * 2005-09-22 2009-02-11 同方威视技术股份有限公司 一种利用射线源对液体物品进行ct安全检查的设备
CN100454039C (zh) * 2005-09-22 2009-01-21 同方威视技术股份有限公司 一种射线发生器、导束盒和前、后准直器一体化结构
CN101114534B (zh) 2006-07-28 2010-05-12 同方威视技术股份有限公司 一种整体式屏蔽准直器
CN101482653B (zh) 2008-01-11 2011-07-27 同方威视技术股份有限公司 准直器调节系统和用于调节准直器系统的方法
CN201142237Y (zh) 2008-01-11 2008-10-29 同方威视技术股份有限公司 准直器调节系统
US8223925B2 (en) * 2010-04-15 2012-07-17 Bruker Axs Handheld, Inc. Compact collimating device
CN201886195U (zh) 2010-12-09 2011-06-29 福州高意通讯有限公司 一种光学器件装配装置
CN103823275B (zh) 2014-03-26 2015-12-09 中国人民解放军国防科学技术大学 基于柔性铰链的自适应光纤准直器
CN206057217U (zh) * 2015-11-06 2017-03-29 同方威视技术股份有限公司 准直装置以及射线检查装置
CN105223211A (zh) 2015-11-06 2016-01-06 同方威视技术股份有限公司 准直装置以及射线检查装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2831977A (en) * 1954-03-11 1958-04-22 California Inst Of Techn Low angle x-ray diffraction
US3327114A (en) * 1964-06-23 1967-06-20 Alfred F Diorio Low-angle x-ray diffraction camera comprising releasably connected sections and adjustable beam apertures and stops
US20110235778A1 (en) * 2010-03-29 2011-09-29 The Boeing Company Small diameter x-ray tube
KR101242731B1 (ko) * 2012-09-10 2013-03-13 주식회사 지.티.에스 방사선 차폐판이 구비된 방사선원 전송관

Also Published As

Publication number Publication date
US20180292333A1 (en) 2018-10-11
BR202016022225U2 (pt) 2017-05-09
CN105223211A (zh) 2016-01-06
SG11201709881SA (en) 2017-12-28
WO2017075963A1 (zh) 2017-05-11
CN105628006B (zh) 2019-03-19
EP3372991A1 (en) 2018-09-12
US10458928B2 (en) 2019-10-29
CN105628006A (zh) 2016-06-01

Similar Documents

Publication Publication Date Title
EP3279636A4 (en) Particle size measuring method and device
EP3190401A4 (en) Inspection device and inspection method
EP3203217A4 (en) Inspection device and inspection method
EP3348997A4 (en) X-RAY INSPECTION METHOD AND X-RAY INSPECTION DEVICE
EP3076366A4 (en) Image inspecting device and image inspecting program
EP3309505A4 (en) Dimension measurement device and dimension measurement method
EP3315068A4 (en) MEASURING DEVICE AND MEASURING METHOD
EP3242506A4 (en) Device and method for measurement
EP3319079A4 (en) Real-time-measurement projection device and three-dimensional-projection measurement device
EP3120763A4 (en) Biometric-information measurement device and biometric-information measurement method
EP3144411A4 (en) Measurement apparatus and coating device
EP3133388A4 (en) Residual-stress measurement device and residual-stress measurement method
EP3273251A4 (en) Inspection device
EP3321671A4 (en) RAIL INSPECTION DEVICE AND RAIL INSPECTION SYSTEM
EP3572833A4 (en) TIME MEASURING DEVICE AND TIME MEASURING DEVICE
GB201522381D0 (en) Display device and apparatus
EP3112847A4 (en) Measurement method and measurement device
EP3324722A4 (en) Inspection device
EP3305172A4 (en) DEVICE FOR TESTING THE VISIBILITY
EP3316003A4 (en) Radiation measuring device and radiation measuring method
EP3337224A4 (en) Measurement method and device
EP3188841A4 (en) Test device and method
EP3306300A4 (en) APPARATUS FOR MEASURING A MOISTURE-BASED MASS AND METHOD FOR MEASURING A MOISTURE-BASED MASS
EP3250020A4 (en) Inspection support device and inspection support method
EP3043415A4 (en) Sheet-like-battery test device and sheet-like-battery test method

Legal Events

Date Code Title Description
STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE

PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: REQUEST FOR EXAMINATION WAS MADE

17P Request for examination filed

Effective date: 20171130

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

AX Request for extension of the european patent

Extension state: BA ME

DAV Request for validation of the european patent (deleted)
DAX Request for extension of the european patent (deleted)
A4 Supplementary search report drawn up and despatched

Effective date: 20190605

RIC1 Information provided on ipc code assigned before grant

Ipc: G01N 23/02 20060101AFI20190529BHEP

Ipc: G21K 1/02 20060101ALI20190529BHEP

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: EXAMINATION IS IN PROGRESS

17Q First examination report despatched

Effective date: 20231009