EP3186823A1 - Exfoliation process for removal of deposited materials from masks carriers, and deposition tool components - Google Patents

Exfoliation process for removal of deposited materials from masks carriers, and deposition tool components

Info

Publication number
EP3186823A1
EP3186823A1 EP15835701.2A EP15835701A EP3186823A1 EP 3186823 A1 EP3186823 A1 EP 3186823A1 EP 15835701 A EP15835701 A EP 15835701A EP 3186823 A1 EP3186823 A1 EP 3186823A1
Authority
EP
European Patent Office
Prior art keywords
work piece
deposited material
layer
fluid
exfoliation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP15835701.2A
Other languages
German (de)
French (fr)
Other versions
EP3186823A4 (en
Inventor
Daoying SONG
Byung Sung Leo Kwak
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Materials Inc
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Publication of EP3186823A1 publication Critical patent/EP3186823A1/en
Publication of EP3186823A4 publication Critical patent/EP3186823A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B7/00Cleaning by methods not provided for in a single other subclass or a single group in this subclass
    • B08B7/04Cleaning by methods not provided for in a single other subclass or a single group in this subclass by a combination of operations
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04Cleaning involving contact with liquid
    • B08B3/045Cleaning involving contact with liquid using perforated containers, e.g. baskets, or racks immersed and agitated in a liquid bath
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04Cleaning involving contact with liquid
    • B08B3/10Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
    • B08B3/12Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration by sonic or ultrasonic vibrations
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B7/00Cleaning by methods not provided for in a single other subclass or a single group in this subclass
    • B08B7/02Cleaning by methods not provided for in a single other subclass or a single group in this subclass by distortion, beating, or vibration of the surface to be cleaned
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B7/00Cleaning by methods not provided for in a single other subclass or a single group in this subclass
    • B08B7/02Cleaning by methods not provided for in a single other subclass or a single group in this subclass by distortion, beating, or vibration of the surface to be cleaned
    • B08B7/026Using sound waves
    • B08B7/028Using ultrasounds
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/564Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4401Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
    • C23C16/4404Coatings or surface treatment on the inside of the reaction chamber or on parts thereof
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4401Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
    • C23C16/4407Cleaning of reactor or reactor parts by using wet or mechanical methods
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4412Details relating to the exhausts, e.g. pumps, filters, scrubbers, particle traps
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23GCLEANING OR DE-GREASING OF METALLIC MATERIAL BY CHEMICAL METHODS OTHER THAN ELECTROLYSIS
    • C23G5/00Cleaning or de-greasing metallic material by other methods; Apparatus for cleaning or de-greasing metallic material with organic solvents

Definitions

  • Embodiments of the present disclosure relate generally to processes and systems for exfoliation of deposited layers of material off work pieces such as masks, carriers, and other deposition system components, and more specifically, although not exclusively, to processes and systems for exfoliation of deposited layers off the surfaces of work pieces comprising application of ultrasonic energy to the pieces in a temperature controlled liquid, the temperature being controlled to increase stress at the interface between the deposited layers and the work piece due to a CTE (coefficient of thermal expansion) mismatch between the materials of the deposited layer(s) and the work piece.
  • CTE coefficient of thermal expansion
  • Deposition systems for depositing thin films of materials on a substrate are widely used in many industries, such as the semiconductor industry, thin film battery industry, electrochromics industry, flat panel display industry, etc. These deposition systems may utilize a variety of work pieces such as masks, substrate carriers and sub- carriers, other deposition system components, etc, These work pieces need to be cleaned on a frequent basis to remove deposited material that has built up on the surfaces of the work pieces.
  • the deposited materials may include a wide range of materials such as metals, semiconductors, insulators, electrolytes, etc.
  • aggressive chemical processes often using hazardous or toxic chemicals
  • mechanical processes that may negatively affect the dimensions and integrity of the work pieces are used to clean these work pieces.
  • Embodiments of the processes described herein may include applying ultrasonic energy to the coated work pieces in a temperature controlled liquid for removal of the built up deposited material. These processes are based on inducing interfacial stress due to CTE mismatch between the deposited layer(s) and the work piece to promote exfoliation of the deposited material during exposure to ultrasonic energy. As such, a temperature, or range of temperatures, within the operating range of the exfoliation equipment may be determined for assisting in developing bond breaking levels of interfacial stress and thus better exfoliation/delamination of the deposited layer(s) - leaving very clean, dimension-unaffected work pieces for reuse.
  • a process for exfoliation of deposited material off one or more work pieces may comprise; providing a work piece with a layer of deposited material coating the surface of the work piece; immersing the work piece in an ultrasonic bath and applying ultrasonic energy to the work piece, wherein the ultrasonic bath contains a fluid and the fluid is held at a constant temperature within the range from greater than room temperature to less than the fluid boiling point, wherein the constant temperature is chosen to provide a significant CTE (coefficient of thermal expansion) mismatch between the layer of deposited material and the work piece in order to promote exfoliation of the layer of deposited material off the work piece, and wherein process time in the ultrasonic bath is within a range from several seconds up to 120 minutes for loosening the layer of deposited material; cleaning the work piece by rinsing with liquids; and drying the work piece.
  • the ultrasonic bath contains a fluid and the fluid is held at a constant temperature within the range from greater than room temperature to less than the fluid boiling point, wherein the constant temperature is chosen to provide
  • a process for exfoliation of deposited material off one or more work pieces may comprise: providing a work piece with a layer of deposited material coating the surface of the work piece; immersing the work piece in an ultrasonic bath and applying ultrasonic energy to the work piece, wherein the ultrasonic bath contains a fluid and the water is cycled over a ⁇ chosen within the range between room temperature and less than the fluid boiling point, wherein the work piece is subject to a multiplicity of cycles over ⁇ during immersion in the ultrasonic bath, wherein the ⁇ is chosen to provide excursions through temperatures at which there is a significant CTE (coefficient of thermal expansion) mismatch between the layer of deposited material and the work piece in order to promote exfoliation of the layer of deposited material off the work piece, and wherein process time in the ultrasonic bath is within a range from several seconds up to 120 minutes for loosening the layer of deposited material; cleaning the work piece by r
  • a system for exfoliation of deposited material off one or more work pieces may comprise: a first apparatus for automated mechanical abrading of a work piece coated with a layer of deposited material; a second apparatus for applying ultrasonic energy to the work piece in a temperature controlled fluid; a third apparatus for scrubbing the layer of deposited material on the work piece with abrasive materials; a fourth apparatus for acid treatment of any residual coating on the work piece; a fifth apparatus for cleaning the work piece using liquid rinses; and a sixth apparatus for drying the work piece.
  • FIG. 1 is a first process flow for removal of deposited material from work pieces such as masks, carriers, and other deposition system components, according to some embodiments;
  • FIG. 2 is a second process flow for removal of deposited material from work pieces, according to some embodiments.
  • FIG. 3 is a schematic representation of an ultrasonic exfoliation apparatus, according to some embodiments.
  • FIG. 4 is a representation of a system for the removal process, according to some embodiments.
  • the processes disclosed herein may be of benefit to a wide range of industries, including the semiconductor industry, thin film battery industry, electrochromics industry, flat panel display industry, etc.
  • the inventors have found that the methods and equipment described herein are particularly effective for removing materials used in the TFB (thin film battery) industry - for example, LiPON and Li are readily removed from mask/subcarrier workpieces by an ultrasonic process, with the fluid in the ultrasonic bath at room temperature for Li and approximately 70 °C for LiPON, as described herein, in some cases even without the need for temperature cycling of the fluid in the ultrasonic bath or mechanical processing, and LiCo0 2 is readily removed by the hot ultrasonic process in combination with mechanical processing and temperature cycling of the fluid in the ultrasonic bath over a temperature range from room temperature to just below the boiling point of the fluid.
  • TFB thin film battery
  • Embodiments of the processes described herein may include applying ultrasonic energy to work pieces coated with a deposited material in a temperature controlled liquid for removal of the built up deposited material from the work pieces. These processes are based on inducing interfacial stress due to CTE mismatch between the deposited layer(s) and the work piece to promote exfoliation of the deposited material during exposure to ultrasonic energy. As such, a temperature, or range of temperatures, within the operating range of the exfoliation equipment may be determined for assisting in developing bond breaking levels of interfacial stress and thus better exfoliation/delamination of the deposited layer(s) - leaving very clean, dimension-unaffected work pieces for reuse.
  • Work pieces may be made of materials such as: ferromagnetic materials like Invar (an Fe-Ni alloy with a very low CTE, which is commonly used as a mask material), other metals like stainless steel, ceramics such as AI2O3 and A1N, etc.
  • Invar an Fe-Ni alloy with a very low CTE, which is commonly used as a mask material
  • other metals like stainless steel
  • ceramics such as AI2O3 and A1N, etc.
  • a cathode layer is a LiCoC>2 layer
  • an anode layer is a Li metal layer
  • of an electrolyte layer is a UPON layer.
  • cathode materials such as LiMn 2 04 and LiNiCoA10 2 , V2O5, LiMn0 2 , Li 5 Fe0 4 , NMC (NiMnCo oxide), NCA (NiCoAl oxide), LMO (Li x Mn0 2 ), LFP (Li x FeP0 4 ), LiMn spinel, etc.
  • anode materials such as Si, C, silicon- lithium alloys, lithium silicon sulfide, Al, Sn, etc.
  • lithium-conducting electrolyte materials such as solid polymer electrolytes, Lil/Al 2 03 mixtures, LLZO (LiLaZr oxide), LiSiCON, etc.
  • Various electrically conducting materials may also be deposited, for example as anode or cathode current collector layers, including one or more of Ag, Al, Au, Ca, Cu, Co, Sn, Pd, Zn and Pt which may be alloyed and/or present in multiple layers of different materials and/or include Ti adhesion layers, etc.
  • deposition systems such as: PVD systems such as sputtering and evaporation systems, CVD systems, electroplating systems, sol-gel systems, etc.
  • vacuum deposition systems include PECVD, reactive sputtering, non-reactive sputtering, RF (radio frequency) sputtering, multi-frequency sputtering, electron beam evaporation, ion beam evaporation, thermal evaporation, ALD, etc.
  • RF radio frequency
  • non-vacuum based deposition include plasma spray, spray pyrolysis, slot die coating, screen printing, etc.
  • FIG. 1 provides a first example of a process flow for exfoliation of deposited material off work pieces such as masks, carriers, and other deposition system components, according to some embodiments.
  • the process flow for the particular example of exfoliation of a material, such as LiCo0 2 , off a shadow mask used for patterning electrochemical devices such as TFBs and electrochromic devices may include: providing a work piece, in this example a mask, coated with a thin film of TFB material, such as LiCo0 2 (101); if needed, mechanically abrading the coating on the mask (102) - this may be carried out in a wet environment (herein the term "wet environment” refers to either the work piece soaking in a fluid-filled container or the work piece is maintained with a film of fluid on the surface, not allowing it to dry) to reduce the generation of airborne particulates, and steel wool, sand paper, etc.
  • wet environment refers to either the work piece soaking in a fluid-filled container or the work piece is
  • the abrading may be used for the abrading; immersing the mask in an ultrasonic bath and applying ultrasonic energy to the mask (103), wherein the bath contains a fluid (such as water) and is held at a constant temperature within the range from greater than room temperature to less than the fluid boiling point (100 °C for water), and in embodiments in the range from 60 °C to 80 °C, wherein the temperature is chosen to provide a CTE mismatch between the layer of deposited material and the mask sufficient to promote exfoliation of the deposited material off the mask, and wherein the process time in the ultrasonic bath may be varied from several seconds up to 120 minutes if needed to loosen the deposited material; after the ultrasonic treatment, if needed, scrubbing the mask with an abrasive material - such as steel wool, sand paper, etc.
  • an abrasive material - such as steel wool, sand paper, etc.
  • a dilute acid such as dilute hydrochloric acid (between 5% and 25% by weight) or dilute hydrofluoric acid (less than 1 % by weight), for example, in order to assist in removing any remaining deposited material on the surface of the mask - the specific acid treatment will depend on the mask material and the treatment may be designed to avoid affecting the integrity and dimensions of the mask; cleaning the mask using water (e.g. distilled water or deionized water) rinses and/or organic solvent rinses (106); and drying the mask (107) - the mask drying may be by the application of a stream of air and/or heat to the mask, for example.
  • a dilute acid such as dilute hydrochloric acid (between 5% and 25% by weight) or dilute hydrofluoric acid (less than 1 % by weight
  • the stress between a deposited layer of a first material on a substrate of a second material will depend on the thickness of the first layer, consequently the CTE mismatch that may be sufficient to promote exfoliation in the ultrasonic bath will also depend on the thickness of the first layer - the thicker the first layer, the smaller the CTE mismatch can be in order to be able to exfoliate the first layer using methods according to embodiments as disclosed herein.
  • one or more of the mechanically abrading (102), scrubbing (104) and acid treatment (105) may not necessarily need to be used as part of the exfoliation process, but are available to assist in the exfoliation of deposited layers off the work piece that otherwise may not easily be removed.
  • Li or UPON layers coating masks/sub-carriers will typically exfoliate easily and completely without any additional mechanical treatment.
  • sand paper may be used for further cleaning after ultrasonic treatment.
  • each cathode deposition typically generates more than a 10 ⁇ thick layer of LiCo0 2 on masks/subcarriers, so cleaning of LiCo0 2 masks/sub-carriers may be necessary after each deposition to ensure good particle performance (lack of particle generation during subsequent use of the work piece).
  • IJC0O 2 films may start to delaminate from masks/sub-carriers after the hot ultrasonic process at about 70 °C, after which a light sand paper treatment is enough to remove any LiCo0 2 residuals from the masks/sub-carriers.
  • the mechanical abrading may be manual or in embodiments automated, and the scrubbing may be manual or in embodiments automated.
  • a jet or spray of temperature controlled water provided with ultrasonic energy may be applied to the work piece, where the mask and the jet/spray may be moved relative to each other if needed for the jet/spray to reach all portions of the work piece that are covered by deposited material.
  • ultrasonic energy may be applied to the work piece in water with additional chemicals.
  • the additional chemicals may be chosen to bring about the combined effects of exfoliation and chemical based cleaning - for example: (1) water plus organic solvents, particularly organic solvents with a hydroxide functional group, (2) water plus an acid, or (3) water plus hydrogen peroxide.
  • the ultrasonic energy may be pulsed or varied otherwise, the ultrasonic frequency may be varied, and multiple ultrasonic frequencies may be used simultaneously.
  • FIG. 2 provides a second example of a process flow for exfoliation of deposited material off work pieces such as masks, carriers, and other deposition system components, according to some embodiments.
  • the second process flow for exfoliation is the same as the first process flow, but includes immersing the work piece in an ultrasonic bath and applying ultrasonic energy to the work piece, wherein the bath contains a fluid (such as water) and the temperature of the fluid is cycled over a ⁇ within the range of room temperature to less than the fluid boiling point (less than 100 °C for water), wherein in embodiments ⁇ may be up to 80 °C, and in other embodiments ⁇ is between 30 °C and 50 °C, wherein the work piece is subject to a multiplicity of cycles during immersion in the ultrasonic bath, in embodiments the multiplicity may be between 2 and 5, in other embodiments the multiplicity is greater than 5, wherein the temperature is chosen to provide a CTE mismatch between the deposited material and the work piece sufficient to promote exfoliation of the deposited material
  • cycling of the temperature may induce more effective removal of deposited layers in certain cases due to "movement at the interface” that will likely further enhance exfoliation of deposited layers where exfoliation has already begun; furthermore, note that cycling the temperature may increase the likelihood of passing through a temperature at which the CTE mismatch is higher - this is due to the nonlinear nature of CTE values as a function of temperature in combination with the different CTE functions for the deposited material and the work piece.
  • FIG. 3 shows a schematic representation of an ultrasonic exfoliation system 300, according to some embodiments.
  • the system 300 includes a bath 301 filled with a cleaning fluid 302, such as water, in which the work piece 310 is immersed,
  • a cleaning fluid 302 such as water
  • An ultrasonic transducer 303 for providing ultrasonic energy to the fluid 302 surrounding the work piece 310 may be built into the bath, as shown, or in embodiments the transducer may be suspended in the fluid 302, or in other embodiments the transducer may be incorporated into the fluid circulation loop 304 just before the fluid reenters the bath.
  • Fluid 302 is circulated through the bath 301 and the fluid circulation loop 304 by pump 305 and the temperature of the fluid may be increased/decreased as needed by heater/cooler 306.
  • Fluid temperature may also be adjusted by the addition and/or removal of fluid from the bath - for example, the addition of cold water to the bath may be used for rapid cooling.
  • a controller 307 is used to control fluid circulation, fluid temperature, and energy input into the fluid by the ultrasonic transducer,
  • the apparatus 300 may be configured to provide rapid temperature cycling and variable ultrasonic functions (pulsing, frequency variation, etc), For example, in embodiments rapid temperature cycling may be decreasing the bath temperature from 80 °C to room temperature in less than 2 minutes, by the addition of sufficient cold water to the bath.
  • FIG. 4 shows a representation of an in-line exfoliation system 400, according to some embodiments.
  • the system 400 may comprise: an apparatus 402 for automated mechanical abrading of a work piece; an apparatus 403 for applying ultrasonic energy to the work piece in a temperature controlled fluid - for example the ultrasonic exfoliation apparatus 300; an apparatus 404 for scrubbing the coating on the work piece with abrasive materials, in embodiments in a wet environment; an apparatus 405 for acid treatment of any residual coating on the work piece; an apparatus 406 for cleaning using water (deionized (DI) or distilled, for example) and/or organic solvent rinses; and an apparatus 407 for drying the work piece.
  • DI deionized
  • the system 400 may have a conveyor 410, or in embodiments an overhead gantry, for moving the work piece from apparatus to apparatus,
  • the system 400 may be configured with more or less apparatus, as needed for the particular exfoliation processes that are to be run.
  • the functions of several of the apparatus may be combined into one apparatus, and in further embodiments some apparatus may be stand alone,

Abstract

A method for exfoliation of deposited material off a work piece may comprise: immersing the work piece in an ultrasonic bath and applying ultrasonic energy, wherein the ultrasonic bath contains a fluid either held at a constant temperature within the range from greater than room temperature to less than the fluid boiling point, or the fluid is cycled over a ΔΤ chosen within the range between room temperature and less than the fluid boiling point, wherein the temperature is chosen to provide a significant CTE mismatch between the layer and the work piece in order to promote exfoliation of the layer off the work piece, and wherein process time in the ultrasonic bath is within a range from several seconds up to 120 minutes for loosening the layer; cleaning the work piece by rinsing with liquids; and drying the work piece. A system is described for running the exfoliation process.

Description

EXFOLIATION PROCESS FOR REMOVAL OF DEPOSITED MATERIAL FROM MASKS, CARRIERS, AND DEPOSITION TOOL COMPONENTS
CROSS-REFERENCE TO RELATED APPLICATIONS
[0001] This application claims the benefit of U.S. Provisional Application No, 62/042,922, filed August 28, 2014.
FIELD
[0002] Embodiments of the present disclosure relate generally to processes and systems for exfoliation of deposited layers of material off work pieces such as masks, carriers, and other deposition system components, and more specifically, although not exclusively, to processes and systems for exfoliation of deposited layers off the surfaces of work pieces comprising application of ultrasonic energy to the pieces in a temperature controlled liquid, the temperature being controlled to increase stress at the interface between the deposited layers and the work piece due to a CTE (coefficient of thermal expansion) mismatch between the materials of the deposited layer(s) and the work piece.
BACKGROUND
[0003] Deposition systems for depositing thin films of materials on a substrate are widely used in many industries, such as the semiconductor industry, thin film battery industry, electrochromics industry, flat panel display industry, etc. These deposition systems may utilize a variety of work pieces such as masks, substrate carriers and sub- carriers, other deposition system components, etc, These work pieces need to be cleaned on a frequent basis to remove deposited material that has built up on the surfaces of the work pieces. The deposited materials may include a wide range of materials such as metals, semiconductors, insulators, electrolytes, etc. Generally, aggressive chemical processes (often using hazardous or toxic chemicals) or mechanical processes (that may negatively affect the dimensions and integrity of the work pieces) are used to clean these work pieces.
[0004] Clearly, there is a need for less aggressive processes for cleaning work pieces that do not use hazardous or toxic chemicals and do not significantly affect the dimensions or integrity of the work pieces.
l SUMMARY
[0005] Methods and equipment for removing deposited layers from deposition system work pieces, such as shadow masks, carriers, sub-carriers, other deposition system components, etc. are described herein. Work pieces from a wide variety of deposition systems, including PVD (physical vapor deposition), CVD (chemical vapor deposition), PECVD (plasma enhanced physical vapor deposition), sputtering, HWCVD (hot wire chemical vapor deposition), ALD (atomic layer deposition) systems, etc, may benefit from the processes described herein. It is envisaged that a very wide range of deposited materials, including metals, semiconductors, insulators, electrolytes, etc. may be removed using embodiments of the disclosed methods. Embodiments of the processes described herein may include applying ultrasonic energy to the coated work pieces in a temperature controlled liquid for removal of the built up deposited material. These processes are based on inducing interfacial stress due to CTE mismatch between the deposited layer(s) and the work piece to promote exfoliation of the deposited material during exposure to ultrasonic energy. As such, a temperature, or range of temperatures, within the operating range of the exfoliation equipment may be determined for assisting in developing bond breaking levels of interfacial stress and thus better exfoliation/delamination of the deposited layer(s) - leaving very clean, dimension-unaffected work pieces for reuse.
[0006] According to some embodiments, a process for exfoliation of deposited material off one or more work pieces such as masks, carriers, and other material deposition system components, may comprise; providing a work piece with a layer of deposited material coating the surface of the work piece; immersing the work piece in an ultrasonic bath and applying ultrasonic energy to the work piece, wherein the ultrasonic bath contains a fluid and the fluid is held at a constant temperature within the range from greater than room temperature to less than the fluid boiling point, wherein the constant temperature is chosen to provide a significant CTE (coefficient of thermal expansion) mismatch between the layer of deposited material and the work piece in order to promote exfoliation of the layer of deposited material off the work piece, and wherein process time in the ultrasonic bath is within a range from several seconds up to 120 minutes for loosening the layer of deposited material; cleaning the work piece by rinsing with liquids; and drying the work piece. [0007] Furthermore, according to some embodiments, a process for exfoliation of deposited material off one or more work pieces such as masks, carriers, and other material deposition system components, may comprise: providing a work piece with a layer of deposited material coating the surface of the work piece; immersing the work piece in an ultrasonic bath and applying ultrasonic energy to the work piece, wherein the ultrasonic bath contains a fluid and the water is cycled over a ΔΤ chosen within the range between room temperature and less than the fluid boiling point, wherein the work piece is subject to a multiplicity of cycles over ΔΤ during immersion in the ultrasonic bath, wherein the ΔΤ is chosen to provide excursions through temperatures at which there is a significant CTE (coefficient of thermal expansion) mismatch between the layer of deposited material and the work piece in order to promote exfoliation of the layer of deposited material off the work piece, and wherein process time in the ultrasonic bath is within a range from several seconds up to 120 minutes for loosening the layer of deposited material; cleaning the work piece by rinsing with liquids; and drying the work piece.
[0008] Furthermore, this disclosure describes apparatus and systems configured for carrying out the aforementioned processes. According to some embodiments, a system for exfoliation of deposited material off one or more work pieces such as masks, carriers, and other material deposition system components, may comprise: a first apparatus for automated mechanical abrading of a work piece coated with a layer of deposited material; a second apparatus for applying ultrasonic energy to the work piece in a temperature controlled fluid; a third apparatus for scrubbing the layer of deposited material on the work piece with abrasive materials; a fourth apparatus for acid treatment of any residual coating on the work piece; a fifth apparatus for cleaning the work piece using liquid rinses; and a sixth apparatus for drying the work piece.
BRIEF DESCRIPTION OF THE DRAWINGS
[0009] These and other aspects and features of the present disclosure will become apparent to those ordinarily skilled in the art upon review of the following description specific embodiments in conjunction with the accompanying figures, wherein: [0010] FIG. 1 is a first process flow for removal of deposited material from work pieces such as masks, carriers, and other deposition system components, according to some embodiments;
[0011] FIG. 2 is a second process flow for removal of deposited material from work pieces, according to some embodiments;
[0012] FIG. 3 is a schematic representation of an ultrasonic exfoliation apparatus, according to some embodiments; and
[0013] FIG. 4 is a representation of a system for the removal process, according to some embodiments.
DETAILED DESCRIPTION
[0014] Embodiments of the present disclosure will now be described in detail with reference to the drawings, which are provided as illustrative examples of the disclosure so as to enable those skilled in the art to practice the disclosure. Notably, the figures and examples below are not meant to limit the scope of the present disclosure to a single embodiment, but other embodiments are possible by way of interchange of some or all of the described or illustrated elements. Moreover, where certain elements of the present disclosure can be partially or fully implemented using known components, only those portions of such known components that are necessary for an understanding of the present disclosure will be described, and detailed descriptions of other portions of such known components will be omitted so as not to obscure the disclosure. In the present specification, an embodiment showing a singular component should not be considered limiting; rather, the disclosure is intended to encompass other embodiments including a plurality of the same component, and vice-versa, unless explicitly stated otherwise herein. Moreover, applicants do not intend for any term in the specification or claims to be ascribed an uncommon or special meaning unless explicitly set forth as such. Further, the present disclosure encompasses present and future known equivalents to the known components referred to herein by way of illustration.
[0015] Methods and equipment for removing deposited layers from deposition system work pieces, such as shadow masks, carriers, sub-carriers, other deposition system components, etc. are described herein, Work pieces from a wide variety of deposition systems, including PVD such as sputtering and evaporation, CVD such as PECVD and HWCVD, electroplating, sol-gel, ALD systems, etc., may benefit from the processes described herein. It is envisaged that a very wide range of deposited materials, including metals, semiconductors, insulators, electrolytes, organic capping layers, etc. may be removed using embodiments of the disclosed methods. The processes disclosed herein may be of benefit to a wide range of industries, including the semiconductor industry, thin film battery industry, electrochromics industry, flat panel display industry, etc. The inventors have found that the methods and equipment described herein are particularly effective for removing materials used in the TFB (thin film battery) industry - for example, LiPON and Li are readily removed from mask/subcarrier workpieces by an ultrasonic process, with the fluid in the ultrasonic bath at room temperature for Li and approximately 70 °C for LiPON, as described herein, in some cases even without the need for temperature cycling of the fluid in the ultrasonic bath or mechanical processing, and LiCo02 is readily removed by the hot ultrasonic process in combination with mechanical processing and temperature cycling of the fluid in the ultrasonic bath over a temperature range from room temperature to just below the boiling point of the fluid.
[0016] Embodiments of the processes described herein may include applying ultrasonic energy to work pieces coated with a deposited material in a temperature controlled liquid for removal of the built up deposited material from the work pieces. These processes are based on inducing interfacial stress due to CTE mismatch between the deposited layer(s) and the work piece to promote exfoliation of the deposited material during exposure to ultrasonic energy. As such, a temperature, or range of temperatures, within the operating range of the exfoliation equipment may be determined for assisting in developing bond breaking levels of interfacial stress and thus better exfoliation/delamination of the deposited layer(s) - leaving very clean, dimension-unaffected work pieces for reuse.
[0017] Work pieces may be made of materials such as: ferromagnetic materials like Invar (an Fe-Ni alloy with a very low CTE, which is commonly used as a mask material), other metals like stainless steel, ceramics such as AI2O3 and A1N, etc.
[0018] For the specific example of work pieces used in the manufacture of electrochemical devices that may benefit from the processes and equipment of the present disclosure, some typical materials that may be deposited on the work pieces and examples of the specific types of deposition systems that may be used for these depositions are provided as follows. An example of a cathode layer is a LiCoC>2 layer, of an anode layer is a Li metal layer, and of an electrolyte layer is a UPON layer. However, it is expected that a wide range of cathode materials such as LiMn204 and LiNiCoA102, V2O5, LiMn02, Li5Fe04, NMC (NiMnCo oxide), NCA (NiCoAl oxide), LMO (LixMn02), LFP (LixFeP04), LiMn spinel, etc. may be used, a wide range of anode materials such as Si, C, silicon- lithium alloys, lithium silicon sulfide, Al, Sn, etc. may be used, and a wide range of lithium-conducting electrolyte materials such as solid polymer electrolytes, Lil/Al203 mixtures, LLZO (LiLaZr oxide), LiSiCON, etc. may be used. Various electrically conducting materials may also be deposited, for example as anode or cathode current collector layers, including one or more of Ag, Al, Au, Ca, Cu, Co, Sn, Pd, Zn and Pt which may be alloyed and/or present in multiple layers of different materials and/or include Ti adhesion layers, etc. These materials may be deposited using deposition systems such as: PVD systems such as sputtering and evaporation systems, CVD systems, electroplating systems, sol-gel systems, etc. Other examples of vacuum deposition systems include PECVD, reactive sputtering, non-reactive sputtering, RF (radio frequency) sputtering, multi-frequency sputtering, electron beam evaporation, ion beam evaporation, thermal evaporation, ALD, etc. Other examples of non-vacuum based deposition include plasma spray, spray pyrolysis, slot die coating, screen printing, etc.
[0019] FIG. 1 provides a first example of a process flow for exfoliation of deposited material off work pieces such as masks, carriers, and other deposition system components, according to some embodiments. The process flow for the particular example of exfoliation of a material, such as LiCo02, off a shadow mask used for patterning electrochemical devices such as TFBs and electrochromic devices may include: providing a work piece, in this example a mask, coated with a thin film of TFB material, such as LiCo02 (101); if needed, mechanically abrading the coating on the mask (102) - this may be carried out in a wet environment (herein the term "wet environment" refers to either the work piece soaking in a fluid-filled container or the work piece is maintained with a film of fluid on the surface, not allowing it to dry) to reduce the generation of airborne particulates, and steel wool, sand paper, etc. may be used for the abrading; immersing the mask in an ultrasonic bath and applying ultrasonic energy to the mask (103), wherein the bath contains a fluid (such as water) and is held at a constant temperature within the range from greater than room temperature to less than the fluid boiling point (100 °C for water), and in embodiments in the range from 60 °C to 80 °C, wherein the temperature is chosen to provide a CTE mismatch between the layer of deposited material and the mask sufficient to promote exfoliation of the deposited material off the mask, and wherein the process time in the ultrasonic bath may be varied from several seconds up to 120 minutes if needed to loosen the deposited material; after the ultrasonic treatment, if needed, scrubbing the mask with an abrasive material - such as steel wool, sand paper, etc. - in order to remove a majority of the remaining deposited material off the surface of the mask (104) - this may be carried out in a wet environment to reduce the generation of airborne particulates; if needed, treating the mask with a dilute acid (105), such as dilute hydrochloric acid (between 5% and 25% by weight) or dilute hydrofluoric acid (less than 1 % by weight), for example, in order to assist in removing any remaining deposited material on the surface of the mask - the specific acid treatment will depend on the mask material and the treatment may be designed to avoid affecting the integrity and dimensions of the mask; cleaning the mask using water (e.g. distilled water or deionized water) rinses and/or organic solvent rinses (106); and drying the mask (107) - the mask drying may be by the application of a stream of air and/or heat to the mask, for example.
[0020] Note that typically the stress between a deposited layer of a first material on a substrate of a second material will depend on the thickness of the first layer, consequently the CTE mismatch that may be sufficient to promote exfoliation in the ultrasonic bath will also depend on the thickness of the first layer - the thicker the first layer, the smaller the CTE mismatch can be in order to be able to exfoliate the first layer using methods according to embodiments as disclosed herein.
[0021] Note that one or more of the mechanically abrading (102), scrubbing (104) and acid treatment (105) may not necessarily need to be used as part of the exfoliation process, but are available to assist in the exfoliation of deposited layers off the work piece that otherwise may not easily be removed. For example, Li or UPON layers coating masks/sub-carriers will typically exfoliate easily and completely without any additional mechanical treatment. For masks/sub-carriers coated with metals or LiCo02, sand paper may be used for further cleaning after ultrasonic treatment. In addition, for thick cathode TFBs, each cathode deposition typically generates more than a 10 μηι thick layer of LiCo02 on masks/subcarriers, so cleaning of LiCo02 masks/sub-carriers may be necessary after each deposition to ensure good particle performance (lack of particle generation during subsequent use of the work piece). Due to the high stress in thick cathode layers, IJC0O2 films may start to delaminate from masks/sub-carriers after the hot ultrasonic process at about 70 °C, after which a light sand paper treatment is enough to remove any LiCo02 residuals from the masks/sub-carriers.
[0022] Furthermore, with reference to FIG. 1, the mechanical abrading may be manual or in embodiments automated, and the scrubbing may be manual or in embodiments automated. Furthermore, in embodiments, instead of immersing the work piece in an ultrasonic bath, a jet or spray of temperature controlled water provided with ultrasonic energy may be applied to the work piece, where the mask and the jet/spray may be moved relative to each other if needed for the jet/spray to reach all portions of the work piece that are covered by deposited material. Furthermore, in embodiments, ultrasonic energy may be applied to the work piece in water with additional chemicals. The additional chemicals may be chosen to bring about the combined effects of exfoliation and chemical based cleaning - for example: (1) water plus organic solvents, particularly organic solvents with a hydroxide functional group, (2) water plus an acid, or (3) water plus hydrogen peroxide. Furthermore, in embodiments one or more of the following may apply: the ultrasonic energy may be pulsed or varied otherwise, the ultrasonic frequency may be varied, and multiple ultrasonic frequencies may be used simultaneously.
[0023] FIG. 2 provides a second example of a process flow for exfoliation of deposited material off work pieces such as masks, carriers, and other deposition system components, according to some embodiments. The second process flow for exfoliation is the same as the first process flow, but includes immersing the work piece in an ultrasonic bath and applying ultrasonic energy to the work piece, wherein the bath contains a fluid (such as water) and the temperature of the fluid is cycled over a ΔΤ within the range of room temperature to less than the fluid boiling point (less than 100 °C for water), wherein in embodiments ΔΤ may be up to 80 °C, and in other embodiments ΔΤ is between 30 °C and 50 °C, wherein the work piece is subject to a multiplicity of cycles during immersion in the ultrasonic bath, in embodiments the multiplicity may be between 2 and 5, in other embodiments the multiplicity is greater than 5, wherein the temperature is chosen to provide a CTE mismatch between the deposited material and the work piece sufficient to promote exfoliation of the deposited material from the work piece, and wherein the process time in the ultrasonic bath may be varied from several seconds up to 120 minutes if needed to loosen the deposited material (203). Note that it is proposed herein that cycling of the temperature may induce more effective removal of deposited layers in certain cases due to "movement at the interface" that will likely further enhance exfoliation of deposited layers where exfoliation has already begun; furthermore, note that cycling the temperature may increase the likelihood of passing through a temperature at which the CTE mismatch is higher - this is due to the nonlinear nature of CTE values as a function of temperature in combination with the different CTE functions for the deposited material and the work piece.
[0024] FIG. 3 shows a schematic representation of an ultrasonic exfoliation system 300, according to some embodiments. The system 300 includes a bath 301 filled with a cleaning fluid 302, such as water, in which the work piece 310 is immersed, An ultrasonic transducer 303 for providing ultrasonic energy to the fluid 302 surrounding the work piece 310 may be built into the bath, as shown, or in embodiments the transducer may be suspended in the fluid 302, or in other embodiments the transducer may be incorporated into the fluid circulation loop 304 just before the fluid reenters the bath. Fluid 302 is circulated through the bath 301 and the fluid circulation loop 304 by pump 305 and the temperature of the fluid may be increased/decreased as needed by heater/cooler 306. (Fluid temperature may also be adjusted by the addition and/or removal of fluid from the bath - for example, the addition of cold water to the bath may be used for rapid cooling.) A controller 307 is used to control fluid circulation, fluid temperature, and energy input into the fluid by the ultrasonic transducer, Furthermore, the apparatus 300 may be configured to provide rapid temperature cycling and variable ultrasonic functions (pulsing, frequency variation, etc), For example, in embodiments rapid temperature cycling may be decreasing the bath temperature from 80 °C to room temperature in less than 2 minutes, by the addition of sufficient cold water to the bath.
[0025] FIG. 4 shows a representation of an in-line exfoliation system 400, according to some embodiments. The system 400 may comprise: an apparatus 402 for automated mechanical abrading of a work piece; an apparatus 403 for applying ultrasonic energy to the work piece in a temperature controlled fluid - for example the ultrasonic exfoliation apparatus 300; an apparatus 404 for scrubbing the coating on the work piece with abrasive materials, in embodiments in a wet environment; an apparatus 405 for acid treatment of any residual coating on the work piece; an apparatus 406 for cleaning using water (deionized (DI) or distilled, for example) and/or organic solvent rinses; and an apparatus 407 for drying the work piece. The system 400 may have a conveyor 410, or in embodiments an overhead gantry, for moving the work piece from apparatus to apparatus, In embodiments the system 400 may be configured with more or less apparatus, as needed for the particular exfoliation processes that are to be run. Furthermore, in embodiments, the functions of several of the apparatus may be combined into one apparatus, and in further embodiments some apparatus may be stand alone,
[0026] Although embodiments of the present disclosure have been particularly described with reference to certain embodiments thereof, it should be readily apparent to those of ordinary skill in the art that changes and modifications in the form and details may be made without departing from the spirit and scope of the disclosure.

Claims

WHAT IS CLAIMED IS:
1. A method for exfoliation of deposited material off one or more work pieces such as masks, carriers, and other material deposition system components, comprising:
providing a work piece with a layer of deposited material coating the surface of said work piece; immersing said work piece in an ultrasonic bath and applying ultrasonic energy to said work piece, wherein said ultrasonic bath contains a fluid and said fluid is held at a constant temperature within the range from greater than room temperature to less than the fluid boiling point, wherein said constant temperature is chosen to provide a significant CTE (coefficient of thermal expansion) mismatch between said layer of deposited material and said work piece in order to promote exfoliation of said layer of deposited material off said work piece, and wherein process time in said ultrasonic bath is within a range from several seconds up to 120 minutes for loosening said layer of deposited material; cleaning said work piece by rinsing with liquids; and
drying said work piece.
2. The method of claim 1, further comprising mechanically abrading said layer of deposited material on said work piece.
3. The method of claim 1, wherein said fluid in said bath is held at a temperature in a range from 60 °C to 80 °C.
4. A method for exfoliation of deposited material off one or more work pieces such as masks, carriers, and other material deposition system components, comprising:
providing a work piece with a layer of deposited material coating the surface of said work piece; immersing said work piece in an ultrasonic bath and applying ultrasonic energy to said work piece, wherein said ultrasonic bath contains a fluid and said fluid is cycled over a AT chosen within the range between room temperature and less than the fluid boiling point, wherein said work piece is subject to a multiplicity of cycles over AT during immersion in said ultrasonic bath, wherein said AT is chosen to provide excursions through temperatures at which there is a significant CTE (coefficient of thermal expansion) mismatch between said layer of deposited material and said work piece in order to promote exfoliation of said layer of deposited material off said work piece, and wherein process time in said ultrasonic bath is within a range from several seconds up to 120 minutes for loosening said layer of deposited material; cleaning said work piece by rinsing with liquids; and
drying said work piece.
5. The method of claim 4, wherein said ΔΤ is less than or equal to 80 °C.
6. The method of claim 4, wherein ΔΤ is between 30 °C and 50 °C.
7. The method of claim 4, further comprising mechanically abrading said layer of deposited material on said work piece,
8. The method of claim 1 or 4, further comprising, after said applying ultrasonic energy, scrubbing said work piece with an abrasive material for removing a majority of any remaining deposited material off said surface of said work piece,
9. The method of claim 1 or 4, further comprising, after said applying ultrasonic energy, treating said work piece with a dilute acid for assisting in removing any remaining deposited material on said surface of said work piece,
10. The method of claim 1 or 4, wherein said liquids comprise water.
1 1. The method of claim 1 or 4, wherein said liquids comprise an organic solvent.
12. A system for exfoliation of deposited material off one or more work pieces such as masks, carriers, and other material deposition system components, comprising:
a first apparatus for automated mechanical abrading of a work piece coated with a layer of deposited material;
a second apparatus for applying ultrasonic energy to said work piece in a temperature controlled fluid;
a third apparatus for scrubbing said layer of deposited material on said work piece with abrasive materials;
a fourth apparatus for acid treatment of any residual coating on said work piece;
a fifth apparatus for cleaning said work piece using liquid rinses; and
a sixth apparatus for drying said work piece,
13. The system of claim 12, wherein said system has a conveyor for moving said work piece from system to system.
14. The system of claim 12, wherein said second apparatus is configured for full immersion of said work piece in said temperature controlled fluid.
15. The system of claim 12, wherein said third apparatus is configured for scrubbing said layer of deposited material on said work piece with abrasive materials in a wet environment.
EP15835701.2A 2014-08-28 2015-08-28 Exfoliation process for removal of deposited materials from masks carriers, and deposition tool components Withdrawn EP3186823A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201462042922P 2014-08-28 2014-08-28
PCT/US2015/047403 WO2016033442A1 (en) 2014-08-28 2015-08-28 Exfoliation process for removal of deposited materials from masks carriers, and deposition tool components

Publications (2)

Publication Number Publication Date
EP3186823A1 true EP3186823A1 (en) 2017-07-05
EP3186823A4 EP3186823A4 (en) 2018-08-22

Family

ID=55400646

Family Applications (1)

Application Number Title Priority Date Filing Date
EP15835701.2A Withdrawn EP3186823A4 (en) 2014-08-28 2015-08-28 Exfoliation process for removal of deposited materials from masks carriers, and deposition tool components

Country Status (7)

Country Link
US (1) US20180216225A1 (en)
EP (1) EP3186823A4 (en)
JP (1) JP2017528598A (en)
KR (1) KR20170049546A (en)
CN (1) CN106999995A (en)
TW (1) TW201622000A (en)
WO (1) WO2016033442A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11959166B2 (en) * 2018-08-14 2024-04-16 Massachusetts Institute Of Technology Methods of fabricating thin films comprising lithium-containing materials
CN114289399B (en) * 2021-12-30 2023-02-07 智程半导体设备科技(昆山)有限公司 Temperature stability control device and method for cleaning machine tank body

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08229524A (en) * 1995-02-28 1996-09-10 Nichiden Mach Ltd Device for washing cassette for liquid crystal
JPH11350109A (en) * 1998-06-15 1999-12-21 Ehime General Service Kk Method for regenerating sputtering jig
JP2000246198A (en) * 1999-02-26 2000-09-12 Nec Kansai Ltd Method of stripping off and washing stuck matter on jig surface
JP2001135577A (en) * 1999-11-02 2001-05-18 Sony Corp Semiconductor film deposition system
JP4189988B2 (en) * 2001-09-06 2008-12-03 花王株式会社 Cleaning method
JP3876167B2 (en) * 2002-02-13 2007-01-31 川崎マイクロエレクトロニクス株式会社 Cleaning method and semiconductor device manufacturing method
JP2004179358A (en) * 2002-11-27 2004-06-24 Mitsumi Electric Co Ltd Semiconductor device and its manufacturing method
JP4038685B2 (en) * 2003-12-08 2008-01-30 独立行政法人科学技術振興機構 Actuator element
JP2005302748A (en) * 2004-04-06 2005-10-27 Matsushita Electric Ind Co Ltd Manufacturing method of semiconductor device
US20060060991A1 (en) * 2004-09-21 2006-03-23 Interuniversitair Microelektronica Centrum (Imec) Method and apparatus for controlled transient cavitation
US7507670B2 (en) * 2004-12-23 2009-03-24 Lam Research Corporation Silicon electrode assembly surface decontamination by acidic solution
JP4591316B2 (en) * 2005-11-07 2010-12-01 株式会社デンソー Ultrasonic cleaning method and ultrasonic cleaning apparatus
JP4724547B2 (en) * 2005-12-08 2011-07-13 新光電気工業株式会社 Cleaning method of resin layer surface
JP2010082591A (en) * 2008-10-01 2010-04-15 Ntn Corp Method of and apparatus for cleaning metal component
JP5395405B2 (en) * 2008-10-27 2014-01-22 東京エレクトロン株式会社 Substrate cleaning method and apparatus
MY188904A (en) * 2010-10-05 2022-01-13 Univ Putra Malaysia A method and apparatus for high intensity ultrasonic treatment of baking materials
CN103721973B (en) * 2013-12-31 2015-09-30 长沙理工大学 A kind of method of constant-temperaturenumerical-control numerical-control ultrasonic cleaning and device

Also Published As

Publication number Publication date
EP3186823A4 (en) 2018-08-22
US20180216225A1 (en) 2018-08-02
WO2016033442A1 (en) 2016-03-03
KR20170049546A (en) 2017-05-10
TW201622000A (en) 2016-06-16
JP2017528598A (en) 2017-09-28
CN106999995A (en) 2017-08-01

Similar Documents

Publication Publication Date Title
JP6976215B2 (en) Multilayer plasma corrosion protection for chamber components
JP4813115B2 (en) Semiconductor manufacturing apparatus member and cleaning method thereof
JP5935174B2 (en) Method and apparatus for cleaning a deposition chamber portion using selective spray etching
TWI600067B (en) Innovative top-coat approach for advanced device on-wafer particle performance
TWI575594B (en) Method of cleaning aluminum plasma chamber parts
CN102010135B (en) Method for preparing metal mask resistant to corrosion of hydrofluoric acid corrosive liquid
US20220336192A1 (en) Metal component and manufacturing method thereof and process chamber having the metal component
KR102590817B1 (en) How to Clean a Lamination Device
US20180216225A1 (en) Exfoliation process for removal of deposited materials from masks carriers, and deposition tool components
CN104241069A (en) Component with yttrium oxide coating layer in plasma device and manufacturing method of component
CN114496710A (en) Method for cleaning yttrium oxide coating of ceramic window of semiconductor equipment
KR102454433B1 (en) Apparatus of forming a film and cleaning method thereof
JP6754976B2 (en) Cleaning method
RU2809508C1 (en) Method for cleaning microwave dielectric substrates made of high-frequency ceramic materials based on barium titanate, aluminum nitride or aluminum oxide
CA2511833A1 (en) Components for a film-forming device and method for cleaning the same
US11710653B2 (en) Method for manufacturing a handle substrate intended for temporary bonding of a substrate
JP5202420B2 (en) Method for removing thin film adhering to vacuum parts
JPS6366917B2 (en)
US20190093214A1 (en) Native or uncontrolled oxide reduction by a cyclic process of plasma treatment and h* radicals
Sakata et al. Cleaning of Gold Interconnection Surface by Low-temperature Hydrogen Annealing for MEMS Device Fabrication
WO2018080476A1 (en) Coating alloy substrates
US20010027017A1 (en) Minimizing metal corrosion during post metal solvent clean
Konyaev et al. Specific features of the formation of optical waveguides, contact pads and electrical interconnections on lithium tantalate substrates
WO2022120063A1 (en) Erosion resistant metal fluoride coated articles, methods of preparation and methods of use thereof
JP2023500488A (en) Adhesion layer for enhanced encapsulation of superconducting devices

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

17P Request for examination filed

Effective date: 20170208

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

AX Request for extension of the european patent

Extension state: BA ME

DAV Request for validation of the european patent (deleted)
DAX Request for extension of the european patent (deleted)
RIC1 Information provided on ipc code assigned before grant

Ipc: C23C 14/56 20060101ALI20180403BHEP

Ipc: B08B 3/12 20060101ALI20180403BHEP

Ipc: C23C 16/44 20060101ALI20180403BHEP

Ipc: H01L 21/78 20060101ALI20180403BHEP

Ipc: H01L 21/301 20060101AFI20180403BHEP

A4 Supplementary search report drawn up and despatched

Effective date: 20180719

RIC1 Information provided on ipc code assigned before grant

Ipc: H01L 21/301 20060101AFI20180713BHEP

Ipc: C23C 16/44 20060101ALI20180713BHEP

Ipc: B08B 3/12 20060101ALI20180713BHEP

Ipc: C23C 14/56 20060101ALI20180713BHEP

Ipc: H01L 21/78 20060101ALI20180713BHEP

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE APPLICATION HAS BEEN WITHDRAWN

18W Application withdrawn

Effective date: 20181105