EP3186823A1 - Exfoliation process for removal of deposited materials from masks carriers, and deposition tool components - Google Patents
Exfoliation process for removal of deposited materials from masks carriers, and deposition tool componentsInfo
- Publication number
- EP3186823A1 EP3186823A1 EP15835701.2A EP15835701A EP3186823A1 EP 3186823 A1 EP3186823 A1 EP 3186823A1 EP 15835701 A EP15835701 A EP 15835701A EP 3186823 A1 EP3186823 A1 EP 3186823A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- work piece
- deposited material
- layer
- fluid
- exfoliation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
- B08B7/04—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by a combination of operations
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/045—Cleaning involving contact with liquid using perforated containers, e.g. baskets, or racks immersed and agitated in a liquid bath
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/10—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
- B08B3/12—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration by sonic or ultrasonic vibrations
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
- B08B7/02—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by distortion, beating, or vibration of the surface to be cleaned
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
- B08B7/02—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by distortion, beating, or vibration of the surface to be cleaned
- B08B7/026—Using sound waves
- B08B7/028—Using ultrasounds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4404—Coatings or surface treatment on the inside of the reaction chamber or on parts thereof
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4407—Cleaning of reactor or reactor parts by using wet or mechanical methods
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4412—Details relating to the exhausts, e.g. pumps, filters, scrubbers, particle traps
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23G—CLEANING OR DE-GREASING OF METALLIC MATERIAL BY CHEMICAL METHODS OTHER THAN ELECTROLYSIS
- C23G5/00—Cleaning or de-greasing metallic material by other methods; Apparatus for cleaning or de-greasing metallic material with organic solvents
Definitions
- Embodiments of the present disclosure relate generally to processes and systems for exfoliation of deposited layers of material off work pieces such as masks, carriers, and other deposition system components, and more specifically, although not exclusively, to processes and systems for exfoliation of deposited layers off the surfaces of work pieces comprising application of ultrasonic energy to the pieces in a temperature controlled liquid, the temperature being controlled to increase stress at the interface between the deposited layers and the work piece due to a CTE (coefficient of thermal expansion) mismatch between the materials of the deposited layer(s) and the work piece.
- CTE coefficient of thermal expansion
- Deposition systems for depositing thin films of materials on a substrate are widely used in many industries, such as the semiconductor industry, thin film battery industry, electrochromics industry, flat panel display industry, etc. These deposition systems may utilize a variety of work pieces such as masks, substrate carriers and sub- carriers, other deposition system components, etc, These work pieces need to be cleaned on a frequent basis to remove deposited material that has built up on the surfaces of the work pieces.
- the deposited materials may include a wide range of materials such as metals, semiconductors, insulators, electrolytes, etc.
- aggressive chemical processes often using hazardous or toxic chemicals
- mechanical processes that may negatively affect the dimensions and integrity of the work pieces are used to clean these work pieces.
- Embodiments of the processes described herein may include applying ultrasonic energy to the coated work pieces in a temperature controlled liquid for removal of the built up deposited material. These processes are based on inducing interfacial stress due to CTE mismatch between the deposited layer(s) and the work piece to promote exfoliation of the deposited material during exposure to ultrasonic energy. As such, a temperature, or range of temperatures, within the operating range of the exfoliation equipment may be determined for assisting in developing bond breaking levels of interfacial stress and thus better exfoliation/delamination of the deposited layer(s) - leaving very clean, dimension-unaffected work pieces for reuse.
- a process for exfoliation of deposited material off one or more work pieces may comprise; providing a work piece with a layer of deposited material coating the surface of the work piece; immersing the work piece in an ultrasonic bath and applying ultrasonic energy to the work piece, wherein the ultrasonic bath contains a fluid and the fluid is held at a constant temperature within the range from greater than room temperature to less than the fluid boiling point, wherein the constant temperature is chosen to provide a significant CTE (coefficient of thermal expansion) mismatch between the layer of deposited material and the work piece in order to promote exfoliation of the layer of deposited material off the work piece, and wherein process time in the ultrasonic bath is within a range from several seconds up to 120 minutes for loosening the layer of deposited material; cleaning the work piece by rinsing with liquids; and drying the work piece.
- the ultrasonic bath contains a fluid and the fluid is held at a constant temperature within the range from greater than room temperature to less than the fluid boiling point, wherein the constant temperature is chosen to provide
- a process for exfoliation of deposited material off one or more work pieces may comprise: providing a work piece with a layer of deposited material coating the surface of the work piece; immersing the work piece in an ultrasonic bath and applying ultrasonic energy to the work piece, wherein the ultrasonic bath contains a fluid and the water is cycled over a ⁇ chosen within the range between room temperature and less than the fluid boiling point, wherein the work piece is subject to a multiplicity of cycles over ⁇ during immersion in the ultrasonic bath, wherein the ⁇ is chosen to provide excursions through temperatures at which there is a significant CTE (coefficient of thermal expansion) mismatch between the layer of deposited material and the work piece in order to promote exfoliation of the layer of deposited material off the work piece, and wherein process time in the ultrasonic bath is within a range from several seconds up to 120 minutes for loosening the layer of deposited material; cleaning the work piece by r
- a system for exfoliation of deposited material off one or more work pieces may comprise: a first apparatus for automated mechanical abrading of a work piece coated with a layer of deposited material; a second apparatus for applying ultrasonic energy to the work piece in a temperature controlled fluid; a third apparatus for scrubbing the layer of deposited material on the work piece with abrasive materials; a fourth apparatus for acid treatment of any residual coating on the work piece; a fifth apparatus for cleaning the work piece using liquid rinses; and a sixth apparatus for drying the work piece.
- FIG. 1 is a first process flow for removal of deposited material from work pieces such as masks, carriers, and other deposition system components, according to some embodiments;
- FIG. 2 is a second process flow for removal of deposited material from work pieces, according to some embodiments.
- FIG. 3 is a schematic representation of an ultrasonic exfoliation apparatus, according to some embodiments.
- FIG. 4 is a representation of a system for the removal process, according to some embodiments.
- the processes disclosed herein may be of benefit to a wide range of industries, including the semiconductor industry, thin film battery industry, electrochromics industry, flat panel display industry, etc.
- the inventors have found that the methods and equipment described herein are particularly effective for removing materials used in the TFB (thin film battery) industry - for example, LiPON and Li are readily removed from mask/subcarrier workpieces by an ultrasonic process, with the fluid in the ultrasonic bath at room temperature for Li and approximately 70 °C for LiPON, as described herein, in some cases even without the need for temperature cycling of the fluid in the ultrasonic bath or mechanical processing, and LiCo0 2 is readily removed by the hot ultrasonic process in combination with mechanical processing and temperature cycling of the fluid in the ultrasonic bath over a temperature range from room temperature to just below the boiling point of the fluid.
- TFB thin film battery
- Embodiments of the processes described herein may include applying ultrasonic energy to work pieces coated with a deposited material in a temperature controlled liquid for removal of the built up deposited material from the work pieces. These processes are based on inducing interfacial stress due to CTE mismatch between the deposited layer(s) and the work piece to promote exfoliation of the deposited material during exposure to ultrasonic energy. As such, a temperature, or range of temperatures, within the operating range of the exfoliation equipment may be determined for assisting in developing bond breaking levels of interfacial stress and thus better exfoliation/delamination of the deposited layer(s) - leaving very clean, dimension-unaffected work pieces for reuse.
- Work pieces may be made of materials such as: ferromagnetic materials like Invar (an Fe-Ni alloy with a very low CTE, which is commonly used as a mask material), other metals like stainless steel, ceramics such as AI2O3 and A1N, etc.
- Invar an Fe-Ni alloy with a very low CTE, which is commonly used as a mask material
- other metals like stainless steel
- ceramics such as AI2O3 and A1N, etc.
- a cathode layer is a LiCoC>2 layer
- an anode layer is a Li metal layer
- of an electrolyte layer is a UPON layer.
- cathode materials such as LiMn 2 04 and LiNiCoA10 2 , V2O5, LiMn0 2 , Li 5 Fe0 4 , NMC (NiMnCo oxide), NCA (NiCoAl oxide), LMO (Li x Mn0 2 ), LFP (Li x FeP0 4 ), LiMn spinel, etc.
- anode materials such as Si, C, silicon- lithium alloys, lithium silicon sulfide, Al, Sn, etc.
- lithium-conducting electrolyte materials such as solid polymer electrolytes, Lil/Al 2 03 mixtures, LLZO (LiLaZr oxide), LiSiCON, etc.
- Various electrically conducting materials may also be deposited, for example as anode or cathode current collector layers, including one or more of Ag, Al, Au, Ca, Cu, Co, Sn, Pd, Zn and Pt which may be alloyed and/or present in multiple layers of different materials and/or include Ti adhesion layers, etc.
- deposition systems such as: PVD systems such as sputtering and evaporation systems, CVD systems, electroplating systems, sol-gel systems, etc.
- vacuum deposition systems include PECVD, reactive sputtering, non-reactive sputtering, RF (radio frequency) sputtering, multi-frequency sputtering, electron beam evaporation, ion beam evaporation, thermal evaporation, ALD, etc.
- RF radio frequency
- non-vacuum based deposition include plasma spray, spray pyrolysis, slot die coating, screen printing, etc.
- FIG. 1 provides a first example of a process flow for exfoliation of deposited material off work pieces such as masks, carriers, and other deposition system components, according to some embodiments.
- the process flow for the particular example of exfoliation of a material, such as LiCo0 2 , off a shadow mask used for patterning electrochemical devices such as TFBs and electrochromic devices may include: providing a work piece, in this example a mask, coated with a thin film of TFB material, such as LiCo0 2 (101); if needed, mechanically abrading the coating on the mask (102) - this may be carried out in a wet environment (herein the term "wet environment” refers to either the work piece soaking in a fluid-filled container or the work piece is maintained with a film of fluid on the surface, not allowing it to dry) to reduce the generation of airborne particulates, and steel wool, sand paper, etc.
- wet environment refers to either the work piece soaking in a fluid-filled container or the work piece is
- the abrading may be used for the abrading; immersing the mask in an ultrasonic bath and applying ultrasonic energy to the mask (103), wherein the bath contains a fluid (such as water) and is held at a constant temperature within the range from greater than room temperature to less than the fluid boiling point (100 °C for water), and in embodiments in the range from 60 °C to 80 °C, wherein the temperature is chosen to provide a CTE mismatch between the layer of deposited material and the mask sufficient to promote exfoliation of the deposited material off the mask, and wherein the process time in the ultrasonic bath may be varied from several seconds up to 120 minutes if needed to loosen the deposited material; after the ultrasonic treatment, if needed, scrubbing the mask with an abrasive material - such as steel wool, sand paper, etc.
- an abrasive material - such as steel wool, sand paper, etc.
- a dilute acid such as dilute hydrochloric acid (between 5% and 25% by weight) or dilute hydrofluoric acid (less than 1 % by weight), for example, in order to assist in removing any remaining deposited material on the surface of the mask - the specific acid treatment will depend on the mask material and the treatment may be designed to avoid affecting the integrity and dimensions of the mask; cleaning the mask using water (e.g. distilled water or deionized water) rinses and/or organic solvent rinses (106); and drying the mask (107) - the mask drying may be by the application of a stream of air and/or heat to the mask, for example.
- a dilute acid such as dilute hydrochloric acid (between 5% and 25% by weight) or dilute hydrofluoric acid (less than 1 % by weight
- the stress between a deposited layer of a first material on a substrate of a second material will depend on the thickness of the first layer, consequently the CTE mismatch that may be sufficient to promote exfoliation in the ultrasonic bath will also depend on the thickness of the first layer - the thicker the first layer, the smaller the CTE mismatch can be in order to be able to exfoliate the first layer using methods according to embodiments as disclosed herein.
- one or more of the mechanically abrading (102), scrubbing (104) and acid treatment (105) may not necessarily need to be used as part of the exfoliation process, but are available to assist in the exfoliation of deposited layers off the work piece that otherwise may not easily be removed.
- Li or UPON layers coating masks/sub-carriers will typically exfoliate easily and completely without any additional mechanical treatment.
- sand paper may be used for further cleaning after ultrasonic treatment.
- each cathode deposition typically generates more than a 10 ⁇ thick layer of LiCo0 2 on masks/subcarriers, so cleaning of LiCo0 2 masks/sub-carriers may be necessary after each deposition to ensure good particle performance (lack of particle generation during subsequent use of the work piece).
- IJC0O 2 films may start to delaminate from masks/sub-carriers after the hot ultrasonic process at about 70 °C, after which a light sand paper treatment is enough to remove any LiCo0 2 residuals from the masks/sub-carriers.
- the mechanical abrading may be manual or in embodiments automated, and the scrubbing may be manual or in embodiments automated.
- a jet or spray of temperature controlled water provided with ultrasonic energy may be applied to the work piece, where the mask and the jet/spray may be moved relative to each other if needed for the jet/spray to reach all portions of the work piece that are covered by deposited material.
- ultrasonic energy may be applied to the work piece in water with additional chemicals.
- the additional chemicals may be chosen to bring about the combined effects of exfoliation and chemical based cleaning - for example: (1) water plus organic solvents, particularly organic solvents with a hydroxide functional group, (2) water plus an acid, or (3) water plus hydrogen peroxide.
- the ultrasonic energy may be pulsed or varied otherwise, the ultrasonic frequency may be varied, and multiple ultrasonic frequencies may be used simultaneously.
- FIG. 2 provides a second example of a process flow for exfoliation of deposited material off work pieces such as masks, carriers, and other deposition system components, according to some embodiments.
- the second process flow for exfoliation is the same as the first process flow, but includes immersing the work piece in an ultrasonic bath and applying ultrasonic energy to the work piece, wherein the bath contains a fluid (such as water) and the temperature of the fluid is cycled over a ⁇ within the range of room temperature to less than the fluid boiling point (less than 100 °C for water), wherein in embodiments ⁇ may be up to 80 °C, and in other embodiments ⁇ is between 30 °C and 50 °C, wherein the work piece is subject to a multiplicity of cycles during immersion in the ultrasonic bath, in embodiments the multiplicity may be between 2 and 5, in other embodiments the multiplicity is greater than 5, wherein the temperature is chosen to provide a CTE mismatch between the deposited material and the work piece sufficient to promote exfoliation of the deposited material
- cycling of the temperature may induce more effective removal of deposited layers in certain cases due to "movement at the interface” that will likely further enhance exfoliation of deposited layers where exfoliation has already begun; furthermore, note that cycling the temperature may increase the likelihood of passing through a temperature at which the CTE mismatch is higher - this is due to the nonlinear nature of CTE values as a function of temperature in combination with the different CTE functions for the deposited material and the work piece.
- FIG. 3 shows a schematic representation of an ultrasonic exfoliation system 300, according to some embodiments.
- the system 300 includes a bath 301 filled with a cleaning fluid 302, such as water, in which the work piece 310 is immersed,
- a cleaning fluid 302 such as water
- An ultrasonic transducer 303 for providing ultrasonic energy to the fluid 302 surrounding the work piece 310 may be built into the bath, as shown, or in embodiments the transducer may be suspended in the fluid 302, or in other embodiments the transducer may be incorporated into the fluid circulation loop 304 just before the fluid reenters the bath.
- Fluid 302 is circulated through the bath 301 and the fluid circulation loop 304 by pump 305 and the temperature of the fluid may be increased/decreased as needed by heater/cooler 306.
- Fluid temperature may also be adjusted by the addition and/or removal of fluid from the bath - for example, the addition of cold water to the bath may be used for rapid cooling.
- a controller 307 is used to control fluid circulation, fluid temperature, and energy input into the fluid by the ultrasonic transducer,
- the apparatus 300 may be configured to provide rapid temperature cycling and variable ultrasonic functions (pulsing, frequency variation, etc), For example, in embodiments rapid temperature cycling may be decreasing the bath temperature from 80 °C to room temperature in less than 2 minutes, by the addition of sufficient cold water to the bath.
- FIG. 4 shows a representation of an in-line exfoliation system 400, according to some embodiments.
- the system 400 may comprise: an apparatus 402 for automated mechanical abrading of a work piece; an apparatus 403 for applying ultrasonic energy to the work piece in a temperature controlled fluid - for example the ultrasonic exfoliation apparatus 300; an apparatus 404 for scrubbing the coating on the work piece with abrasive materials, in embodiments in a wet environment; an apparatus 405 for acid treatment of any residual coating on the work piece; an apparatus 406 for cleaning using water (deionized (DI) or distilled, for example) and/or organic solvent rinses; and an apparatus 407 for drying the work piece.
- DI deionized
- the system 400 may have a conveyor 410, or in embodiments an overhead gantry, for moving the work piece from apparatus to apparatus,
- the system 400 may be configured with more or less apparatus, as needed for the particular exfoliation processes that are to be run.
- the functions of several of the apparatus may be combined into one apparatus, and in further embodiments some apparatus may be stand alone,
Abstract
Description
Claims
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201462042922P | 2014-08-28 | 2014-08-28 | |
PCT/US2015/047403 WO2016033442A1 (en) | 2014-08-28 | 2015-08-28 | Exfoliation process for removal of deposited materials from masks carriers, and deposition tool components |
Publications (2)
Publication Number | Publication Date |
---|---|
EP3186823A1 true EP3186823A1 (en) | 2017-07-05 |
EP3186823A4 EP3186823A4 (en) | 2018-08-22 |
Family
ID=55400646
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP15835701.2A Withdrawn EP3186823A4 (en) | 2014-08-28 | 2015-08-28 | Exfoliation process for removal of deposited materials from masks carriers, and deposition tool components |
Country Status (7)
Country | Link |
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US (1) | US20180216225A1 (en) |
EP (1) | EP3186823A4 (en) |
JP (1) | JP2017528598A (en) |
KR (1) | KR20170049546A (en) |
CN (1) | CN106999995A (en) |
TW (1) | TW201622000A (en) |
WO (1) | WO2016033442A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11959166B2 (en) * | 2018-08-14 | 2024-04-16 | Massachusetts Institute Of Technology | Methods of fabricating thin films comprising lithium-containing materials |
CN114289399B (en) * | 2021-12-30 | 2023-02-07 | 智程半导体设备科技(昆山)有限公司 | Temperature stability control device and method for cleaning machine tank body |
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JPH08229524A (en) * | 1995-02-28 | 1996-09-10 | Nichiden Mach Ltd | Device for washing cassette for liquid crystal |
JPH11350109A (en) * | 1998-06-15 | 1999-12-21 | Ehime General Service Kk | Method for regenerating sputtering jig |
JP2000246198A (en) * | 1999-02-26 | 2000-09-12 | Nec Kansai Ltd | Method of stripping off and washing stuck matter on jig surface |
JP2001135577A (en) * | 1999-11-02 | 2001-05-18 | Sony Corp | Semiconductor film deposition system |
JP4189988B2 (en) * | 2001-09-06 | 2008-12-03 | 花王株式会社 | Cleaning method |
JP3876167B2 (en) * | 2002-02-13 | 2007-01-31 | 川崎マイクロエレクトロニクス株式会社 | Cleaning method and semiconductor device manufacturing method |
JP2004179358A (en) * | 2002-11-27 | 2004-06-24 | Mitsumi Electric Co Ltd | Semiconductor device and its manufacturing method |
JP4038685B2 (en) * | 2003-12-08 | 2008-01-30 | 独立行政法人科学技術振興機構 | Actuator element |
JP2005302748A (en) * | 2004-04-06 | 2005-10-27 | Matsushita Electric Ind Co Ltd | Manufacturing method of semiconductor device |
US20060060991A1 (en) * | 2004-09-21 | 2006-03-23 | Interuniversitair Microelektronica Centrum (Imec) | Method and apparatus for controlled transient cavitation |
US7507670B2 (en) * | 2004-12-23 | 2009-03-24 | Lam Research Corporation | Silicon electrode assembly surface decontamination by acidic solution |
JP4591316B2 (en) * | 2005-11-07 | 2010-12-01 | 株式会社デンソー | Ultrasonic cleaning method and ultrasonic cleaning apparatus |
JP4724547B2 (en) * | 2005-12-08 | 2011-07-13 | 新光電気工業株式会社 | Cleaning method of resin layer surface |
JP2010082591A (en) * | 2008-10-01 | 2010-04-15 | Ntn Corp | Method of and apparatus for cleaning metal component |
JP5395405B2 (en) * | 2008-10-27 | 2014-01-22 | 東京エレクトロン株式会社 | Substrate cleaning method and apparatus |
MY188904A (en) * | 2010-10-05 | 2022-01-13 | Univ Putra Malaysia | A method and apparatus for high intensity ultrasonic treatment of baking materials |
CN103721973B (en) * | 2013-12-31 | 2015-09-30 | 长沙理工大学 | A kind of method of constant-temperaturenumerical-control numerical-control ultrasonic cleaning and device |
-
2015
- 2015-08-28 EP EP15835701.2A patent/EP3186823A4/en not_active Withdrawn
- 2015-08-28 TW TW104128449A patent/TW201622000A/en unknown
- 2015-08-28 WO PCT/US2015/047403 patent/WO2016033442A1/en active Application Filing
- 2015-08-28 US US15/505,570 patent/US20180216225A1/en not_active Abandoned
- 2015-08-28 KR KR1020177008510A patent/KR20170049546A/en unknown
- 2015-08-28 CN CN201580044719.8A patent/CN106999995A/en active Pending
- 2015-08-28 JP JP2017511709A patent/JP2017528598A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
EP3186823A4 (en) | 2018-08-22 |
US20180216225A1 (en) | 2018-08-02 |
WO2016033442A1 (en) | 2016-03-03 |
KR20170049546A (en) | 2017-05-10 |
TW201622000A (en) | 2016-06-16 |
JP2017528598A (en) | 2017-09-28 |
CN106999995A (en) | 2017-08-01 |
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