EP3044571B1 - Verfahren und vorrichtung zur überprüfung eines inspektionssystems zur erkennung von oberflächendefekten - Google Patents

Verfahren und vorrichtung zur überprüfung eines inspektionssystems zur erkennung von oberflächendefekten Download PDF

Info

Publication number
EP3044571B1
EP3044571B1 EP14758522.8A EP14758522A EP3044571B1 EP 3044571 B1 EP3044571 B1 EP 3044571B1 EP 14758522 A EP14758522 A EP 14758522A EP 3044571 B1 EP3044571 B1 EP 3044571B1
Authority
EP
European Patent Office
Prior art keywords
surface defect
digitized
detected
digitized representation
image processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
EP14758522.8A
Other languages
German (de)
English (en)
French (fr)
Other versions
EP3044571A1 (de
Inventor
Harald Henkemeyer
Wolf Missmahl
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ThyssenKrupp Steel Europe AG
Original Assignee
ThyssenKrupp Steel Europe AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ThyssenKrupp Steel Europe AG filed Critical ThyssenKrupp Steel Europe AG
Publication of EP3044571A1 publication Critical patent/EP3044571A1/de
Application granted granted Critical
Publication of EP3044571B1 publication Critical patent/EP3044571B1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/217—Validation; Performance evaluation; Active pattern learning techniques
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/77—Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
    • G06V10/776—Validation; Performance evaluation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30136—Metal

Definitions

  • the invention relates to a method for checking an inspection system for detecting surface defects of a product, preferably a flat steel product. Furthermore, the invention relates to an inspectable by such a method inspection system, with at least one camera, preferably digital camera, for generating at least one recording of at least one surface of at least one product and with a digitizing unit for digitizing the recording.
  • Steel strips are produced in long lengths and at high speeds, winding the finished steel strip into a coil. If the surface quality of steel strips or comparable products is to be recorded inline and non-destructively, the quality inspection of the surface must be carried out very quickly and reliably.
  • At least one camera generates images of the surface of the product and passes them in digitized form to an image processing device. This then checks the images for surface defects and classifies them in terms of the nature of the surface defects. Based on the number and type of surface defects on a given section of the surface of the product, it is automatically possible to decide whether that area meets the quality requirements or, if necessary, discards the corresponding area of the product or the entire product.
  • the inspection system will be provided with various digitized images of defective product surfaces in an introductory training phase.
  • the inspection system is calibrated for fault detection and fault classification.
  • the inspection system can be used for quality assurance.
  • it must be checked at regular intervals whether the inspection system continues to operate satisfactorily or whether an adjustment or recalibration is necessary. In this way, it should be prevented that relevant surface defects remain undetected or non-relevant surface defects are inadvertently classified as relevant surface defects.
  • the surface to be inspected is purposefully provided with surface defects at regular time intervals, whereby it is checked whether these surface defects are recognized as defects by the inspection system.
  • images of surface defects are added at regular intervals glued inspecting surface. Then it is examined whether the surface defects are detected.
  • the surface to be inspected is not damaged because the pasted images can be removed again from the inspected surface.
  • the production process for the product must be interrupted in order to stick a picture of a surface defect on the surface to be inspected.
  • the image processing device inspects the reference image of a reference surface, it can not inspect the real surface of the product for defects. Surface defects can therefore go undetected.
  • a calibration performed on the basis of the reference images does not always lead to satisfactory accuracies of the inspection system.
  • the present invention is therefore based on the object of designing and developing a method for checking an inspection system for detecting surface defects of a product and a verifiable inspection system of the type mentioned above and described above in such a way that quality assurance with very high quality can be achieved. without the Significantly affect the production process of the product with the surface to be inspected.
  • At least one camera preferably a digital camera
  • an integration unit for integrating a digitized representation of a surface defect in the digitized image is provided, that an image processing device for error detection based on the digitized image, including the digitized representation of a Surface defect, is provided and that a determination unit for determining whether the digitized representation of a surface defect is recognized as an error of the inspected surface by the image processing device, is provided.
  • the invention is thus based on the fact that first a recording of a surface of a product to be inspected is produced by means of a camera and then transferred in digital form to an image processing device, wherein a digitized representation of a surface defect in the sense of a test defect or reference defect is integrated into the recording so to speak.
  • the image processing device treats the corresponding image as if it were a digitized image of the surface to be examined, ie as if the Surface would also have the corresponding surface defect physically or real.
  • the image processing device recognizes the surface defect as such.
  • the surface defect is preferably selected such that it should be recognized by the image processing device as a surface defect.
  • the quality of the quality assurance can be obtained, for example, depends on the nature and / or intensity of the surface defects.
  • the intensity can be determined, for example, by the height or depth of the defect, as well as by its size and / or extent.
  • At least one camera is basically any type of camera in question. However, it will preferably be a digital camera because it generates directly digitized images and a separate step of converting the image into a digitized image can be dispensed with. Then the digitizing unit is already integrated in the camera. In addition, several cameras may be provided to produce a picture of the surface to be inspected with satisfactory quality. In this case, the image of a camera or several cameras can be provided with at least one digitized representation of a surface defect and examined in parallel or successively. However, it can also be provided that initially a single digitized image is generated from a plurality of images, for example by superposition of the images, into which a digitized representation of a surface defect is then integrated.
  • the digitized representation of a surface defect by means of the integration unit can be integrated into the digitized image of the surface to be inspected by superimposing the digitized representation of the surface defect at one location with the digitized image of the real surface.
  • the digital representation of a surface defect in the area of the display it will be preferable for the digital representation of a surface defect in the area of the display to replace the digitized image of the actual surface.
  • the pixels of the representation of the surface defect at the corresponding position in the image of the real surface can replace the pixels of the image of the surface to be inspected.
  • the inspection system and the corresponding verification method may also provide a plurality of cameras which produce images of different surfaces, different products and / or different sections of a surface. If required, these images can be examined in parallel by an image processing device or by several image processing devices for surface defects.
  • the at least one camera it is of course preferred if it produces both the image into which a digitized representation of a true and / or synthetic surface defect is integrated, and also produces the images otherwise (unmanipulated) of the image processing device for debugging the current image Quality assurance.
  • the digital representation of the at least one surface defect need not be an illustration of a real surface defect. It may also be an artificially generated, so for example programmed, surface defect. This surface defect does not have to be based on a conceivable surface defect.
  • the surface defect can be constructed as required without consideration of real surface defects. Nevertheless, for the sake of comprehension, in such a case the term "surface defect" will be referred to below, since it will in any case differ from an optimal product surface.
  • the integration of the digitized representation of the surface defect into the digitized image produced by the camera results in an artificial image that deviates from the real image.
  • neither the method nor the inspection system is limited to the fact that the digitized representation of the surface defect represents only the surface defect. It will, if necessary, be such that the corresponding one represents a non-defective surface gating. In this way, a reproducible transition between flawless surface and defect can be achieved in the image supplied to the image processing device. However, this transition can also be dispensed with in favor of the transition of the real surface to the defect of the digitized representation of the surface defect.
  • the digitized representation of the surface defect is preferably integrated into this recording only in a relatively small section of the image produced by the camera, in order thereby to influence the continuous quality assurance as little as possible.
  • the errors detected by the image processing device are classified by means of a classification device.
  • This classification can be carried out on the basis of given parameters concerning the surface defects.
  • the detected surface defects can be classified, for example, according to their type and thus in scratches, dents, elevations, surface cracks, Oxidations, soiling and / or foreign bodies are divided.
  • the detected surface defects can also be classified according to their intensity, which can be determined by the height, depth, size and / or extent. For example, it can be distinguished whether it is a slight, moderate or serious surface defect, such as in the sense of a light, medium or deep scratch.
  • a classification of the surface defects it is preferable to determine whether the classifier classifies the defect detected due to the digitized representation of a surface defect as predetermined. In this way, the calibration can be improved or the quality of the quality assurance can be better assessed.
  • the verification of the classification can be carried out additionally or alternatively to the determination whether or not the surface defect integrated into the receptacle of the surface to be inspected is recognized. If it is checked whether the classification has been carried out correctly, this allows conclusions to be drawn as to whether the surface defect was even recognized as such or not.
  • the inspection system By a suitable choice of the digitized representation of a surface defect or the digitized representation of different surface defects, it is possible to determine whether predetermined tolerance criteria are exceeded by the inspection system based on the knowledge as to whether the surface defects are recognized and / or correctly classified. slight Deviations from the rules for detecting errors can be regularly tolerated. The situation is different if the deviations become too large and thus a tolerance criterion is exceeded. The exceeding of a tolerance criterion can also be indicated, signaled and / or stored as needed. In this way, a supervisor receives feedback on the exceeding of a tolerance range and can intervene accordingly.
  • At least one performance index can be determined which characterizes the quality of the inspection system in the detection of surface defects. In this way, the quality of the inspection system can be better quantified.
  • at least one performance index can be determined on the basis of the classification of the errors attributable to at least one digitized representation of at least one surface defect, as specified or deviating from the specifications. According to which algorithm the performance index is determined is largely freely selectable or adaptable to the purpose.
  • the image processing device and / or the classification device is calibrated if a digitized representation of a surface defect or several digitized representations of at least one surface defect are not recognized as defects and / or not classified as predetermined. This ensures that the inspection system always provides quality assurance of sufficient quality.
  • the calibration can be done manually. However, as far as possible, it will be preferable to perform the calibration automatically based on the data previously obtained by inspection of the inspection system. As an alternative or in addition to a calibration of the inspection system, the inspection of the Inspection system obtained data used for the purpose of auditing quality control through quality control.
  • the defects detected by the image processing device due to real surface defects of the inspected surface can be stored as such and the defects detected by the image processing device due to at least one digitized representation of a surface defect can not be saved or deviated elsewhere, are saved by the errors due to real surface defects.
  • the errors detected by the image processing device due to a digitized representation of a surface defect are stored in such a way that they can be automatically distinguished from errors attributable to real surface defects. Then it can be automatically distinguished according to the type of error.
  • the corresponding data can therefore be used both for the calibration and for the decision on the further use of the product.
  • the errors detected due to real surface defects can be stored together with at least one associated classification information. This makes it easier to decide whether the detected error justifies discarding the product or part of it.
  • the area surrounding the site defect can be simply and reliably, automatically, if necessary, removed or discarded. In the case of a steel sheet, this can only take place when the steel strip is unwound from the coil for further use. It is particularly preferred if this information is stored together with at least one classification information. It can then be easily determined whether the surface defect at the appropriate location requires intervention or can be tolerated.
  • a synthetically generated representation can be used as a digitized representation of a surface defect, for example. This can, for example, represent a certain contrast profile.
  • the synthetically generated representation of a surface defect does not have to look like a surface defect that could actually occur. In this way, if necessary, the quality of the defect detection by the inspection system can be determined more precisely and / or at least a particularly expedient surface defect can be "tailored" for checking the inspection system.
  • a digitized representation of a surface defect at least one digitized representation of a real surface defect, preferably in the form of a scratch, a dent, a protrusion, a surface break, an oxidation, an oxidic slag cell, a Pollution and / or a foreign body can be used. In this way, if necessary, the quality of the defect classification by the inspection system can be determined more precisely.
  • the inspection system 1 is shown which is intended to detect surface defects 2, 3 on a surface 4 of a product 5 in the form of a flat steel product.
  • the inspection system 1 comprises a camera 6, at which the surface 4 of the product 5 to be inspected is guided past in the direction of production indicated by the arrow.
  • the camera 6 detects the surface 4 of the product 5 over its entire width.
  • the camera 6 is a digital camera which directly generates a digitized image of the surface 4.
  • the digitized image generated by the camera 6 is transferred to an image processing device 7, which checks the image for possible surface defects 2, 3, which are recognized by the image processing device 7 as an error of the surface 4, if these are sufficient in terms of their contrast in the image delimit from defect-free areas of the surface 4.
  • an image processing device 7 which checks the image for possible surface defects 2, 3, which are recognized by the image processing device 7 as an error of the surface 4, if these are sufficient in terms of their contrast in the image delimit from defect-free areas of the surface 4.
  • the information concerning an error detected by the image processing device 7 is passed on to a classifier 8 which classifies the errors according to predetermined criteria. For example, a subdivision may be made as to whether the defect is a scratch, a dent, a bump, a surface break, an oxidation, an oxidic slag cell, a fouling and / or a foreign body. Alternatively or additionally, a classification can be made as to how serious the respective error is for the further use of the product 5.
  • the information regarding the respective error and the respective classification of the error is stored in a memory 9 together with location information about where the error has appeared on the surface 4.
  • the stored information may then be supplied together with the product 5 for further use of the product 5, so that the errors in this further use can be taken into account. For example, surface sections with intolerable errors may be discarded.
  • Fig. 2 is shown as the inspection system 1 according to Fig. 1 is checked automatically at regular intervals. Schematically, it is shown how a portion of a surface 4 of a product is picked up by the camera, which produces a digitized image 10 of the surface 4.
  • a digitized representation 11 of a synthetic surface defect is integrated by means of an integration unit, not shown.
  • the digitized representation 11 occupies a very small area of the resulting image 10.
  • the digitized representation 11 of the surface defect for the sake of recognizability is shown greatly enlarged relative to the receptacle 10.
  • the digitized representation 11 of the synthetic Surface defect is an area with different gray levels and contrasts.
  • the corresponding surface defect is therefore referred to as synthetic, because the surface defect in this form will not occur in practice.
  • the image 10 resulting from the combination of the real image with the synthetic surface defect is fed to the image processing device 7, which is fused to a classification device 8 in the illustrated preferred embodiment.
  • the image processing device 7 examines the image 10 including the digital representation 11 of the synthetic surface defect for errors. If the digital representation 11 of the synthetic surface defect or a real surface defect is recognized as an error of the surface 4, it is classified by the classifier 8. In parallel, it is checked whether the digital representation 11 of the synthetic surface defect is recognized as an error and correctly classified according to the specifications. In addition, an error found as a result of the digital representation 11 of the synthetic surface defect, including classification information and location information, is rejected.
  • the digital representation 11 of a synthetic surface defect can not be classified, or can only be classified to a limited extent, because this surface defect does not resemble a real surface defect to be expected.
  • recordings 10 of a surface of a product 5 with an integration unit generated by the camera 6 may, if required, additionally comprise one or more digital representations 12 of surface defects that are modeled on real surface defects. In the present case, these surface defects are a dent and a scratch.
  • the resulting image 10 is examined by the image processing device 7 for errors. If errors are found, they are classified by means of the integrated classification device 8. Since the digital representations 12 of surface defects correspond to more or less real surface defects, the quality of the classification may possibly be better assessed than with the synthetic surface defects, which may be investigated in parallel.
  • the inspection of the inspection system 1 takes place at regular time intervals and, if necessary, triggers an automatic calibration of the inspection system 1.
  • a performance index for the quantification of the quality of the inspection system 1 is calculated and also triggered an indication as soon as certain predetermined tolerance criteria are exceeded.

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Data Mining & Analysis (AREA)
  • Evolutionary Computation (AREA)
  • Artificial Intelligence (AREA)
  • Textile Engineering (AREA)
  • Quality & Reliability (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • General Engineering & Computer Science (AREA)
  • Evolutionary Biology (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Software Systems (AREA)
  • Multimedia (AREA)
  • Databases & Information Systems (AREA)
  • Medical Informatics (AREA)
  • Computing Systems (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
EP14758522.8A 2013-09-10 2014-08-28 Verfahren und vorrichtung zur überprüfung eines inspektionssystems zur erkennung von oberflächendefekten Active EP3044571B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102013109915.7A DE102013109915B4 (de) 2013-09-10 2013-09-10 Verfahren und Vorrichtung zur Überprüfung eines Inspektionssystems zur Erkennung von Oberflächendefekten
PCT/EP2014/068306 WO2015036261A1 (de) 2013-09-10 2014-08-28 Verfahren und vorrichtung zur überprüfung eines inspektionssystems zur erkennung von oberflächendefekten

Publications (2)

Publication Number Publication Date
EP3044571A1 EP3044571A1 (de) 2016-07-20
EP3044571B1 true EP3044571B1 (de) 2018-10-10

Family

ID=51483399

Family Applications (1)

Application Number Title Priority Date Filing Date
EP14758522.8A Active EP3044571B1 (de) 2013-09-10 2014-08-28 Verfahren und vorrichtung zur überprüfung eines inspektionssystems zur erkennung von oberflächendefekten

Country Status (9)

Country Link
US (1) US20160203593A1 (zh)
EP (1) EP3044571B1 (zh)
JP (1) JP6560220B2 (zh)
KR (1) KR20160054543A (zh)
CN (1) CN105531581B (zh)
DE (1) DE102013109915B4 (zh)
RU (1) RU2665806C2 (zh)
TR (1) TR201820176T4 (zh)
WO (1) WO2015036261A1 (zh)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102016224307A1 (de) * 2015-12-15 2017-06-22 Heidelberger Druckmaschinen Ag Verfahren zur Überprüfung eines Bildinspektionssystems
JP6333871B2 (ja) 2016-02-25 2018-05-30 ファナック株式会社 入力画像から検出した対象物を表示する画像処理装置
CN109196555B (zh) * 2016-05-17 2021-12-31 Abb瑞士股份有限公司 用于卷材制造监督的实时、完整卷材图像处理方法和系统
US10031087B2 (en) 2016-09-22 2018-07-24 SSAB Enterprises, LLC Methods and systems for the quantitative measurement of internal defects in as-cast steel products
DE102017006566B3 (de) 2017-07-12 2018-10-31 Inlevel Gmbh Vorrichtung und Verfahren zur optischen Überwachung von Oberflächen eines Körpers
JP6960997B2 (ja) * 2017-08-09 2021-11-05 富士フイルム株式会社 画像処理システム、サーバ装置、画像処理方法、及び画像処理プログラム
DE102017008383A1 (de) * 2017-09-07 2019-03-07 Heuft Systemtechnik Gmbh Inspektionsvorrichtung mit optischem Wasserzeichen
CN109685756A (zh) * 2017-10-16 2019-04-26 乐达创意科技有限公司 影像特征自动辨识装置、系统及方法
CN108445008A (zh) * 2018-02-27 2018-08-24 首钢京唐钢铁联合有限责任公司 一种带钢表面缺陷的检测方法
CN109692877B (zh) * 2018-12-29 2020-11-10 中冶南方工程技术有限公司 一种冷轧带钢表面质量管理系统及方法
CN109765245B (zh) * 2019-02-25 2021-08-13 武汉精立电子技术有限公司 大尺寸显示屏缺陷检测定位方法
DE102019204346A1 (de) * 2019-03-28 2020-10-01 Volkswagen Aktiengesellschaft Verfahren und System zum Überprüfen einer optischen Beanstandung an einem Kraftfahrzeug
CN110116138B (zh) * 2019-06-13 2020-04-07 沈阳建筑大学 一种轧制过程中热态钢板长度及侧弯测量方法
CN110220730A (zh) * 2019-06-27 2019-09-10 宜兴硅谷电子科技有限公司 一种应用于字符喷印机的质量异常检出方法
EP3767403B1 (de) * 2019-07-16 2022-09-07 Carl Zeiss Industrielle Messtechnik GmbH Machine-learning gestützte form- und oberflächenmessung zur produktionsüberwachung
CN111629205B (zh) * 2020-07-28 2020-11-20 天津美腾科技股份有限公司 一种应用于工业相机模拟测试的系统和方法
JP7501264B2 (ja) * 2020-09-15 2024-06-18 株式会社アイシン 異常検出装置、異常検出プログラム、および異常検出システム
DE102020129040A1 (de) 2020-11-04 2022-05-05 Speira Gmbh Verfahren und Vorrichtung zur Erkennung von Oberflächenstrukturen
CN113032919B (zh) * 2021-03-12 2022-03-04 奥特斯科技(重庆)有限公司 部件承载件制造方法、处理系统、计算机程序和系统架构
CN113281341A (zh) * 2021-04-19 2021-08-20 唐山学院 热镀锌带钢的双传感器表面质量检测系统的检测优化方法
DE102021116868B4 (de) 2021-06-30 2023-06-29 Deutsches Zentrum für Luft- und Raumfahrt e.V. Verfahren und Vorrichtung zum Bestimmen der Sensorgüte eines bildgebenden Sensorsystems sowie Verfahren und Vorrichtung zum Erkennen von Fehlstellen
CN114565314B (zh) * 2022-03-09 2024-06-18 武汉科技大学 一种基于数字孪生的热轧钢卷端面质量管控系统及方法

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3712513A1 (de) * 1987-04-13 1988-11-03 Roth Electric Gmbh Verfahren und vorrichtung zur erkennung von oberflaechenfehlern
JPH07261372A (ja) * 1994-03-18 1995-10-13 Fujitsu Ltd パターン検証方法および検証装置
JPH08136471A (ja) * 1994-11-11 1996-05-31 Nkk Corp 表面欠陥計の自己診断装置
EP0880023A1 (de) * 1997-05-23 1998-11-25 Siemag Transplan Gmbh Verfahren und Vorrichtung zur automatischen Detektion von Oberflächenfehlern beim kontinuierlichen mechanischem Abtragen von Material von Stranggiessprodukten
JPH1114553A (ja) * 1997-06-23 1999-01-22 Omron Corp 視覚欠陥検査装置における欠陥サンプルデータ出力方法および装置
DE10031978A1 (de) * 2000-06-30 2002-01-10 Sms Demag Ag Verfahren und Vorrichtung zur automatischen Zundererkennung aus Oberflächen von metallischem Bandgut, insbesondere von warmgewalztem Stahlband und Edelstahlband
DE10065321A1 (de) * 2000-12-30 2002-07-11 Krones Ag Inspektionsvorrichtung und -verfahren
US7043071B2 (en) * 2002-09-13 2006-05-09 Synopsys, Inc. Soft defect printability simulation and analysis for masks
US7333650B2 (en) * 2003-05-29 2008-02-19 Nidek Co., Ltd. Defect inspection apparatus
CN100371939C (zh) * 2003-08-27 2008-02-27 上海宏力半导体制造有限公司 在缺陷管理系统中使用的方法
EP1677098A4 (en) * 2003-10-21 2010-07-21 Daihatsu Motor Co Ltd DEVICE AND METHOD FOR INSPECTING DEFECTS IN A SURFACE
JP2006220644A (ja) * 2005-01-14 2006-08-24 Hitachi High-Technologies Corp パターン検査方法及びその装置
US7848561B2 (en) * 2005-12-30 2010-12-07 Honeywell International Inc. Determining capability of an on-line sensor
EP1901230A1 (de) * 2006-09-13 2008-03-19 Thyssenkrupp Nirosta GmbH Verfahren zur automatischen Oberflächeninspektion eines bewegten Körpers
JP4982213B2 (ja) * 2007-03-12 2012-07-25 株式会社日立ハイテクノロジーズ 欠陥検査装置及び欠陥検査方法
JP5156452B2 (ja) * 2008-03-27 2013-03-06 東京エレクトロン株式会社 欠陥分類方法、プログラム、コンピュータ記憶媒体及び欠陥分類装置
JP5255953B2 (ja) * 2008-08-28 2013-08-07 株式会社日立ハイテクノロジーズ 欠陥検査方法及び装置
US8175373B2 (en) * 2009-02-16 2012-05-08 Kla-Tencor Corporation Use of design information and defect image information in defect classification
US8406919B1 (en) * 2010-03-12 2013-03-26 Key Technology, Inc. Quality regulating apparatus and method
DE102010043632B4 (de) * 2010-11-09 2017-08-24 Krones Aktiengesellschaft Verfahren zur Funktionskontrolle einer Inspektionsvorrichtung und Vorrichtung zur Inspektion eines Produktsstroms
CN102628814B (zh) * 2012-02-28 2013-12-18 西南交通大学 一种基于数字图像处理的钢轨光带异常自动检测方法
US9858658B2 (en) * 2012-04-19 2018-01-02 Applied Materials Israel Ltd Defect classification using CAD-based context attributes

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
None *

Also Published As

Publication number Publication date
RU2665806C2 (ru) 2018-09-04
DE102013109915A1 (de) 2015-03-12
CN105531581B (zh) 2019-07-12
US20160203593A1 (en) 2016-07-14
RU2016113558A (ru) 2017-10-16
JP2016532121A (ja) 2016-10-13
DE102013109915B4 (de) 2015-04-02
KR20160054543A (ko) 2016-05-16
JP6560220B2 (ja) 2019-08-14
CN105531581A (zh) 2016-04-27
EP3044571A1 (de) 2016-07-20
RU2016113558A3 (zh) 2018-05-30
WO2015036261A1 (de) 2015-03-19
TR201820176T4 (tr) 2019-01-21

Similar Documents

Publication Publication Date Title
EP3044571B1 (de) Verfahren und vorrichtung zur überprüfung eines inspektionssystems zur erkennung von oberflächendefekten
EP2150362B1 (de) Verfahren zur erkennung und klassifizierung von oberflächenfehlern auf stranggegossenen brammen
DE102014208768B4 (de) Verfahren und Vorrichtung zur Qualitätssicherung
EP2993541B1 (de) Verfahren zur qualitätsbeurteilung eines mittels eines additiven herstellungsverfahrens hergestellten bauteils
DE102015204800B3 (de) Verfahren und Vorrichtung zur Qualitätsbeurteilung eines mittels eines additiven Herstellungsverfahrens hergestellten Bauteils
DE102013003760A1 (de) Verfahren und Vorrichtung zur Qualitätsbeurteilung eines mittels eines generativen Lasersinter- und/oder Laserschmelzverfahrens hergestellten Bauteils
DE602004007753T2 (de) Verfahren zur Qualitätskontrolle eines industriellen Verfahrens, insbesondere eines Laserschweissverfahrens
EP2498157B1 (de) Steuerungsvorrichtung und Steuerungsverfahren für eine Maschine zur Herstellung stabförmiger Artikel der Tabak verarbeitenden Industrie
DE10011200A1 (de) Verfahren zur Bewertung von Strukturfehlern auf einer Waferoberfläche
DE112017005011T5 (de) Verfahren zum Erzeugen eines eingelernten Modells, Vorrichtung zum Erzeugen eines eingelernten Modells, Verfahren zum Unterscheiden von Signaldaten, Vorrichtung zum Unterscheiden von Signaldaten und Programm zum Unterscheiden von Signaldaten
EP3956736A1 (de) Computer-implementiertes verfahren zur bestimmung von defekten eines mittels eines additiven fertigungsprozesses hergestellten objekts
EP3140101B1 (de) Verfahren zum fügen von mehreren werkstückteilen sowie fügewerkzeug
DE102018214307A1 (de) System und Verfahren zur Qualitätsprüfung bei der Herstellung von Einzelteilen
DE60305748T2 (de) Verfahren zum detektieren von formfehlern eines gewalzten produktes und zugehörige vorrichtung
EP4170448A1 (de) Prozesssignalrekonstruktion und anomalie-detektion bei laserbearbeitungsprozessen
WO2015071018A1 (de) VERFAHREN UND VORRICHTUNG ZUR KONTAKTLOSEN ÜBERPRÜFUNG DER BESCHAFFENHEIT EINES METALLURGISCHEN GIEßPRODUKTES
DE102021120435A1 (de) Verfahren und Vorrichtung zum Ermitteln der Größe von Defekten während eines Oberflächenmodifizierungsverfahrens
DE102019205812A1 (de) Fehleridentifikation in einem Fertigungs- oder Bearbeitungsprozess für ein Bauteil, insbesondere für eine Steuerplatine, mit einem Sensor-Trägerteil
DE102008049859B4 (de) Verfahren und Prüfsystem zur optischen Prüfung einer Kontur eines Prüfobjekts
DE102019220090B3 (de) Verfahren und Vorrichtung zum automatisierten Bewerten eines Kernbruchdefektes in einem Hohlraum in einem Gussbauteil
EP4135924B1 (de) Verfahren und vorrichtung zur qualitätsbeurteilung eines bearbeitungsprozesses
DE102022209327B4 (de) Verfahren zur Schweißnahtoptimierung
DE102019217179A1 (de) Verfahren zur Durchführung einer optischen Qualitätskontrolle eines Reifens
DE102018109816B3 (de) Verfahren zur Gewinnung mindestens eines signifikanten Merkmals in einer Serie von Bauteilen gleichen Typs und Verfahren zur Klassifikation eines Bauteils eienr solchen Serie
DE102005041465B3 (de) Verfahren zur Erkennung von Schweißunregelmäßigkeiten und zur Analyse des Lichtbogenverhaltens

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

17P Request for examination filed

Effective date: 20160217

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

AX Request for extension of the european patent

Extension state: BA ME

DAX Request for extension of the european patent (deleted)
GRAP Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOSNIGR1

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: GRANT OF PATENT IS INTENDED

INTG Intention to grant announced

Effective date: 20180531

GRAS Grant fee paid

Free format text: ORIGINAL CODE: EPIDOSNIGR3

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE PATENT HAS BEEN GRANTED

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

REG Reference to a national code

Ref country code: GB

Ref legal event code: FG4D

Free format text: NOT ENGLISH

REG Reference to a national code

Ref country code: AT

Ref legal event code: REF

Ref document number: 1051823

Country of ref document: AT

Kind code of ref document: T

Effective date: 20181015

Ref country code: CH

Ref legal event code: EP

REG Reference to a national code

Ref country code: IE

Ref legal event code: FG4D

Free format text: LANGUAGE OF EP DOCUMENT: GERMAN

REG Reference to a national code

Ref country code: DE

Ref legal event code: R096

Ref document number: 502014009738

Country of ref document: DE

REG Reference to a national code

Ref country code: NL

Ref legal event code: FP

REG Reference to a national code

Ref country code: SE

Ref legal event code: TRGR

REG Reference to a national code

Ref country code: LT

Ref legal event code: MG4D

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: HR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

Ref country code: LV

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

Ref country code: ES

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

Ref country code: IS

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190210

Ref country code: LT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

Ref country code: FI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

Ref country code: PL

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

Ref country code: BG

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190110

Ref country code: NO

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190110

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: PT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190210

Ref country code: GR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20190111

Ref country code: RS

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

Ref country code: AL

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

REG Reference to a national code

Ref country code: DE

Ref legal event code: R097

Ref document number: 502014009738

Country of ref document: DE

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: CZ

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

Ref country code: DK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: SK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

Ref country code: SM

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

Ref country code: RO

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

Ref country code: EE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

26N No opposition filed

Effective date: 20190711

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: SI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 20190828

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: CH

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20190831

Ref country code: LU

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20190828

Ref country code: MC

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

Ref country code: LI

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20190831

REG Reference to a national code

Ref country code: BE

Ref legal event code: MM

Effective date: 20190831

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: IE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20190828

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GB

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20190828

Ref country code: BE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20190831

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: TR

Payment date: 20200826

Year of fee payment: 7

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: IT

Payment date: 20200826

Year of fee payment: 7

Ref country code: SE

Payment date: 20200826

Year of fee payment: 7

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: CY

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: MT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

Ref country code: HU

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT; INVALID AB INITIO

Effective date: 20140828

REG Reference to a national code

Ref country code: SE

Ref legal event code: EUG

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: SE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20210829

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: MK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20181010

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: IT

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20210828

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: NL

Payment date: 20220822

Year of fee payment: 9

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: DE

Payment date: 20220620

Year of fee payment: 9

Ref country code: AT

Payment date: 20220822

Year of fee payment: 9

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: FR

Payment date: 20220823

Year of fee payment: 9

REG Reference to a national code

Ref country code: DE

Ref legal event code: R119

Ref document number: 502014009738

Country of ref document: DE

REG Reference to a national code

Ref country code: NL

Ref legal event code: MM

Effective date: 20230901

REG Reference to a national code

Ref country code: AT

Ref legal event code: MM01

Ref document number: 1051823

Country of ref document: AT

Kind code of ref document: T

Effective date: 20230828

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: AT

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20230828

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: AT

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20230828

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: NL

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20230901

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: NL

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20230901

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: FR

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20230831

Ref country code: DE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20240301