EP2912512A4 - Quantitative phasenmikroskopie für markierungsfreie zellenbildgebung mit hohem kontrast - Google Patents

Quantitative phasenmikroskopie für markierungsfreie zellenbildgebung mit hohem kontrast

Info

Publication number
EP2912512A4
EP2912512A4 EP13851247.0A EP13851247A EP2912512A4 EP 2912512 A4 EP2912512 A4 EP 2912512A4 EP 13851247 A EP13851247 A EP 13851247A EP 2912512 A4 EP2912512 A4 EP 2912512A4
Authority
EP
European Patent Office
Prior art keywords
label
cell imaging
free high
quantitative phase
phase microscopy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP13851247.0A
Other languages
English (en)
French (fr)
Other versions
EP2912512A1 (de
Inventor
Evgenia Mikhailovna Kim
Siavash Yazdanfar
Dmitry Vladimirovich Dylov
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US13/663,069 external-priority patent/US8934103B2/en
Application filed by General Electric Co filed Critical General Electric Co
Publication of EP2912512A1 publication Critical patent/EP2912512A1/de
Publication of EP2912512A4 publication Critical patent/EP2912512A4/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
EP13851247.0A 2012-10-29 2013-10-29 Quantitative phasenmikroskopie für markierungsfreie zellenbildgebung mit hohem kontrast Withdrawn EP2912512A4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/663,069 US8934103B2 (en) 2011-12-22 2012-10-29 Quantitative phase microscopy for label-free high-contrast cell imaging
PCT/SE2013/051257 WO2014070082A1 (en) 2012-10-29 2013-10-29 Quantitative phase microscopy for label-free high-contrast cell imaging

Publications (2)

Publication Number Publication Date
EP2912512A1 EP2912512A1 (de) 2015-09-02
EP2912512A4 true EP2912512A4 (de) 2016-07-13

Family

ID=50627810

Family Applications (1)

Application Number Title Priority Date Filing Date
EP13851247.0A Withdrawn EP2912512A4 (de) 2012-10-29 2013-10-29 Quantitative phasenmikroskopie für markierungsfreie zellenbildgebung mit hohem kontrast

Country Status (3)

Country Link
EP (1) EP2912512A4 (de)
JP (1) JP2015534134A (de)
WO (1) WO2014070082A1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3050038B1 (fr) * 2016-04-06 2018-05-18 Lltech Management Procede et dispositif de microscopie interferentielle plein champ en lumiere incoherente
JP2018139532A (ja) * 2017-02-28 2018-09-13 株式会社島津製作所 細胞観察装置
WO2018191392A1 (en) * 2017-04-11 2018-10-18 Calico Life Sciences Llc Fluorescence microscopy system and methods based on stimulated emission
JP7080718B2 (ja) * 2018-05-08 2022-06-06 株式会社ミツトヨ 光学装置及び形状測定方法
CN109375358B (zh) * 2018-11-28 2020-07-24 南京理工大学 一种基于最优照明模式设计下的差分相衬定量相位显微成像方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001025721A1 (en) * 1999-10-06 2001-04-12 Metrolaser, Inc. Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry
WO2003002972A2 (fr) * 2001-06-29 2003-01-09 Universite Libre De Bruxelles Procede et dispositif destines a l'obtention par microscopie d'images en trois dimensions d'un echantillon
US20080285048A1 (en) * 2007-05-18 2008-11-20 National Taipei University Of Technology Method and apparatus for simultaneously acquiring interferograms and method for solving the phase information
US20100231896A1 (en) * 2009-03-16 2010-09-16 Mann Christopher J Quantitative phase-contrast and excitation-emission systems
WO2012103233A1 (en) * 2011-01-25 2012-08-02 Massachusetts Institute Of Technology Single-shot full-field reflection phase microscopy

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5241364A (en) * 1990-10-19 1993-08-31 Fuji Photo Film Co., Ltd. Confocal scanning type of phase contrast microscope and scanning microscope
JPH1123372A (ja) * 1997-07-02 1999-01-29 Res Dev Corp Of Japan 光波コヒーレンス映像方法及びその装置
DE50005933D1 (de) * 1999-11-24 2004-05-06 Haag Streit Ag Koeniz Verfahren und vorrichtung zur messung optischer eigenschaften wenigstens zweier voneinander distanzierter bereiche in einem transparenten und/oder diffusiven gegenstand
JP4409331B2 (ja) * 2004-03-30 2010-02-03 株式会社トプコン 光画像計測装置
EP1767923A4 (de) * 2004-06-30 2009-10-28 Nikon Corp Mikroskopisches beobachtungsverfahren, mikroskop, differenz-interferenzmikroskop, phasendifferenzmikroskop, interferenzmikroskop, bildbearbeitungsverfahren und -vorrichtung
CN101147052B (zh) * 2005-03-25 2012-01-11 麻省理工学院 用于希耳伯特相位成像的系统和方法
US8537461B2 (en) * 2007-11-26 2013-09-17 Carl Zeiss Microimaging Gmbh Method and configuration for the optical detection of an illuminated specimen
US7884997B2 (en) * 2007-11-27 2011-02-08 Northrop Grumman Systems Corporation System and method for coherent beam combination
US8693000B2 (en) * 2011-12-22 2014-04-08 General Electric Company Quantitative phase microscopy for label-free high-contrast cell imaging
US9097900B2 (en) * 2012-06-14 2015-08-04 General Electric Company Quantitative phase microscopy for high-contrast cell imaging using frequency domain phase shift

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001025721A1 (en) * 1999-10-06 2001-04-12 Metrolaser, Inc. Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry
WO2003002972A2 (fr) * 2001-06-29 2003-01-09 Universite Libre De Bruxelles Procede et dispositif destines a l'obtention par microscopie d'images en trois dimensions d'un echantillon
US20080285048A1 (en) * 2007-05-18 2008-11-20 National Taipei University Of Technology Method and apparatus for simultaneously acquiring interferograms and method for solving the phase information
US20100231896A1 (en) * 2009-03-16 2010-09-16 Mann Christopher J Quantitative phase-contrast and excitation-emission systems
WO2012103233A1 (en) * 2011-01-25 2012-08-02 Massachusetts Institute Of Technology Single-shot full-field reflection phase microscopy

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
DUBOIS F ET AL: "Improved three-dimensional imaging with a digital holography microscope with a source of partial spatial coherence", APPLIED OPTICS, OPTICAL SOCIETY OF AMERICA, WASHINGTON, DC; US, vol. 38, no. 34, 1 December 1999 (1999-12-01), pages 7085 - 7094, XP002232391, ISSN: 0003-6935, DOI: 10.1364/AO.38.007085 *
See also references of WO2014070082A1 *
ZHUO WANG ET AL: "Spatial light interference microscopy (SLIM)", OPTICS EXPRESS, vol. 19, no. 2, 17 January 2011 (2011-01-17), pages 1016, XP055145500, ISSN: 1094-4087, DOI: 10.1364/OE.19.001016 *

Also Published As

Publication number Publication date
JP2015534134A (ja) 2015-11-26
EP2912512A1 (de) 2015-09-02
WO2014070082A1 (en) 2014-05-08

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