Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
  • G01R1/02—General constructional details
  • G01R1/04—Housings; Supporting members; Arrangements of terminals
  • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
  • G01R1/0416—Connectors, terminals
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
  • H01R9/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, e.g. terminal strips or terminal blocks; Terminals or binding posts mounted upon a base or in a case; Bases therefor
  • H01R9/22—Bases, e.g. strip, block, panel
  • H01R9/24—Terminal blocks
  • H01R9/26—Clip-on terminal blocks for side-by-side rail- or strip-mounting
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
  • G01R1/02—General constructional details
  • G01R1/06—Measuring leads; Measuring probes
  • G01R1/067—Measuring probes
  • G01R1/073—Multiple probes
  • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
  • H01R9/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, e.g. terminal strips or terminal blocks; Terminals or binding posts mounted upon a base or in a case; Bases therefor
  • H01R9/22—Bases, e.g. strip, block, panel
  • H01R9/24—Terminal blocks
  • H01R9/26—Clip-on terminal blocks for side-by-side rail- or strip-mounting
  • H01R9/2625—Clip-on terminal blocks for side-by-side rail- or strip-mounting with built-in electrical component
  • H01R9/2666—Clip-on terminal blocks for side-by-side rail- or strip-mounting with built-in electrical component with built-in test-points
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
  • G01R1/02—General constructional details
  • G01R1/04—Housings; Supporting members; Arrangements of terminals

Definitions

• the invention relates to a test device for a test and connection device arrangement according to the preamble of claims 1 and 7.
• the invention also relates to a test and connection device arrangement according to the preamble of claim 12.
• Such an arrangement includes a connector for connecting electrical conductors and a tester connectable to the connector for testing and measuring electrical quantities associated with the connected electrical conductors and associated electrical equipment. In the process, measuring and test procedures are carried out without changing the existing circuits.
• a particular advantage of such an arrangement is that the test device for measuring operationally important variables during operation of the electrical equipment can be plugged onto the connection device. Therefore, the arrangement allows a measurement of the operational variables without interrupting an ongoing production operation.
• the object of the present invention is therefore to provide an improved test apparatus which is compact, easy to handle and very versatile in very complex applications.
• test device with the features of claims 1 and 7.
• the test device is very compact and easy to handle. It also allows a large number of tests, if necessary, simultaneously, so that it can also be used in more complex applications.
• test and connection device arrangement with the features of claim 12.
• the arrangement makes it possible to take advantage of measurement and test operations outside the product in which the connection device is integrated, while at the same time increasing connection possibilities of the test device. It is also easy to handle.
• the testing device according to the invention for a test and Ranvoriquessan- comprising a test unit comprising a connecting unit having a pin member for separating an electrical connection and two first measuring terminals, wherein on the pin member two electrically conductive contact plates are arranged, each electrically conductive are connected to one of the first two Messan- conclusions.
• the measuring terminals are arranged on the opposite side of the pin element of the test unit, and that they are arranged at an angle to each other and / or offset in height to each other. Due to the angular and / or offset arrangement of the first measuring connections to one another, the first measuring connections are very easily accessible and several large measuring heads can be arranged in the first measuring connections at the same time. In addition, the arrangement of the multiple measuring heads is very easy due to the angular and / or vertical offset.
• the first measuring terminals are preferably designed as sockets, in particular for receiving probe heads. Particularly preferred they are provided for receiving conventional probes.
• the first measuring terminals are provided for picking up the voltage applied to the electrically conductive contact plates. They allow the connection of test equipment, in particular measuring meters such as a voltage meter, a current meter, a frequency meter, a power and / or a resistance meter.
• the test device comprises a test device housing for receiving the connection unit, wherein the connection unit is height-adjustable relative to the test device housing.
• the connection unit is height-adjustable relative to the test device housing.
• Such height adjustment is preferably possible in the context of mounting the tester. It has the advantage that the pin element is offset in height with the connection unit.
• the test apparatus is likewise preferred for the test apparatus to comprise a plurality of test units arranged one behind the other, each having a connection unit.
• the connection units of the plurality of test units can be arranged offset in height relative to one another. By displacing the height of the connection units relative to one another, targeted control of the point in time at which the voltage applied to the first contact lugs of different test units is tapped is possible.
• the test apparatus comprises a tester housing for receiving the test units, or that it comprises a tester housing for each test unit.
• the height offset of the measurement terminals can be achieved by height-adjusting the connection units relative to the one tester housing.
• the height offset of the measuring terminals can be achieved by adjusting the height of the connecting units relative to the tester housing of their test unit.
• the tester housings of the test units are height-adjustable relative to each other, so that a height offset can be achieved by height adjustments of the tester housing and / or the connection units.
• the test apparatus comprises at least two test units, each comprising a connection unit, wherein the connection units each have a pin element for separating an electrical connection and two first measuring terminals, wherein two electrically conductive Contact plates are arranged, which are each electrically conductively connected to one of the two first measuring terminals of the same connection unit
• the test device of this embodiment is characterized in that the measuring terminals are arranged on the tifelement telement opposite the test unit, and that the test units and / or the connection units are arranged offset in height to each other.
• test apparatus In the case of a complex test apparatus with a plurality of test units, a multiplicity of height differences of the first test terminals can thus be achieved. As a result, even with the use of comparatively large probes, it is still possible to easily insert them into the first measuring terminals and release the probes from the first measuring terminals. At the same time, the test apparatus can be made more compact in comparison with a test apparatus in which the first measuring terminals are not arranged at an angle and / or offset in height.
• one of the two electrically conductive contact plates of both connection units are respectively arranged on a first side of the test apparatus and the other of the two electrically conductive contact plates of both connection units respectively on a second side of the test apparatus opposite the first side Side arranged first measuring terminals of the connecting units and / or arranged on the second side of the first measuring terminals of the connecting units at an angle zuei- are arranged one above the other.
• the first measuring terminals arranged on the same side of the test apparatus are arranged at an angle to each other, and the space available for the probes is increased.
• connection units or the test units are arranged mirror-inverted relative to one another.
• the first measuring terminals of the successively arranged test units are in one.
• a first measuring connection always alternates with a first measuring connection arranged at an angle to the latter.
• a probe which is plugged into one of the first measuring terminals, a considerably larger space, preferably twice the space available, compared to a tester in which the first measuring terminals have neither angular offset nor height offset each other.
• the angle at which the first measuring terminals of the same test unit are arranged relative to one another is the same in all test units. In principle, however, an embodiment in which the angles at which the first measuring connections are arranged relative to one another are also preferred. Also preferably, they are provided rotatable. In a particularly preferred embodiment, the first measuring terminals of all test units are the same, in particular the same length. However, it is also conceivable to have a test device in which different first measuring connections are provided for accommodating different measuring heads. As probes, for example, conventional probes of various embodiments are considered here, or banana plugs.
• connection unit prefferably has in each case a second measuring connection, which is arranged transversely to the first measuring connection, for each first measuring connection.
• the second measuring connection is likewise provided for removing the voltage of the contact plates and makes it possible to connect one or more further testing devices.
• the second measuring terminals are preferably designed as screw or clamping bushes for connecting an electrical conductor.
• the object is also achieved with a test and connection device arrangement with such a test device and a connection device into which the test device can be inserted, the test device separating two first electrically contacting contact lugs when they are plugged into the connection device. When plugged into the connection device tester is therefore preferably applied to the contact lugs voltage to the contact plates of the connection units.
• connection device preferably has at least two attachable holders which each have mounting rail holding sections for mounting rail mounting of the connection device and wall holding sections for wall mounting of the connection device.
• the attachable holders may e.g. be provided on the underside of the housing of the connection device in order to fix the connection device both on a mounting rail and on a wall element. This creates a versatile mounting option with the same holders.
• test device can be inserted from an upper side of the connection device and from an underside of the connection device into the connection device. This makes it possible to use the arrangement versatile.
• connection device For two-sided insertion of the test device from an upper side of the connection device and from a lower side of the connection device, the connection device is formed with first and second compression springs.
• connection device for inserting a test device on both sides from an upper side of the connection device and an underside of the connection device is formed with first and second contact lugs. If the second contact lugs with the first electrically contacting tabs are arranged one above the other, there is a greater possibility of mounting the tester, with additional or cumbersome constructions are no longer necessary.
• the second contact lugs and the first electrically contacting contact lugs are electrically connected in parallel. This is possible in a simple manner within the connecting device, whereby it is not increased in volume. It is expedient if the second contact lugs or the first electrically contacting tabs are electrically separated with a removable plug-in element. This removable plug-in element makes it possible to adapt the connection device according to its purpose simply by repositioning, without any other construction is required.
• connection device has at least one protective element which can be adjusted from a first position in which it closes actuating sections for clamping units of the connecting device arranged underneath into a second position in which the actuating sections are accessible. This allows easy and quick protection against manipulation.
• the at least one protective element is held displaceably in a guide of a housing of the connecting device in the longitudinal direction of the connecting device.
• the at least one protective element in each case has a cover panel with a covering opening per clamping unit. In this way, a protective element for a certain number of clamping units can be adjusted by simply cutting to length.
• FIG. 1 shows a schematic sectional view of a first exemplary embodiment of a test and connection device arrangement with a connecting device arranged on a mounting rail
• FIG. 2 shows a schematic sectional view of a second exemplary embodiment of the test and connection device arrangement with a connection device arranged on a wall element
• Figure 3 is a schematic sectional view of another embodiment of a test and connection device arrangement with analogous to Figure 2 arranged on a wall element connection device in which contact lugs are visible; in (a) is a schematic perspective view of an embodiment of a connecting device with a tamper-evident in a first position, and in (b) is a schematic perspective view of another embodiment of a connecting device according to the invention during a mounting state; the embodiment of Figure 4 with the manipulation protection in a second position; a schematic perspective view of an embodiment of the connection device for mounting rail mounting from below; a schematic perspective view of an embodiment of the connecting device for wall mounting from below; different views of an embodiment of a connection device; FIG.
• FIG. 4 a schematically shows a section through one of the test units of the test apparatus, and c - f shows various views of a further embodiment of a test apparatus according to the invention, the view of FIG. 9d schematically showing the test apparatus shows; in a and b each show a further embodiment of a test device according to the invention with test units, each having its own test device housing, and in c and d another test device, which consists of a single test unit; Figures a - c show various views of a further embodiment of a test device according to the invention, which comprises a plurality of test units; FIG. 12 shows schematically in a - c a section through a test unit of a test device according to the invention.
• FIG. 1 shows a schematic sectional view of a first exemplary embodiment of a test and connection device arrangement 1.
• the arrangement 1 is a test and connection device arrangement and comprises a test device 2 and a connection device 3.
• the test device 2 is provided for insertion into the connection device 3 and serves for testing and measuring electrical values of electrical devices connected to the connection device 3, which will not be described in detail.
• the test apparatus 2 has a scholarvoriquessgephase 23 and is not shown in detail. In the housing not described further plug-in and switching devices for testing and / or measuring purposes are arranged. On the underside of the test device 2, pin elements 24 are attached, of which only one is shown here by way of example, for all others. With these pin elements 24 and possibly other plugs, which will not be discussed further, the test device 2 is inserted into the connection device 3.
• connection device 3 is provided for mounting on a mounting rail 25 and fixed with its underside thereon in the longitudinal direction 333 of the connection device 3, e.g. as shown here by means of holder 4b.
• the holders 4b will be described further below.
• the test device 2 is shown inserted from the top of the connection device 3 forth in the connection device 3.
• connection device 3 has seven clamping or connection units 300 arranged side by side, one of which in FIG. 1 and 2 is shown in section with its housing 4 as a representative of the others.
• the connection units 300 are each used to connect electrical lines which are substantially perpendicular to the longitudinal axis of the connecting device 3 (which is perpendicular to the drawing plane in Figures 1 and 2) on both sides in the terminal units 300 inserted and in clamping units 5 and 7 can be fastened.
• the clamping units 5 and 7 are shown in this embodiment as a pair, of course, larger pairs are possible.
• Clamping units 5 and 7 are provided here with screws, which can be reached by a respective operating portion 9, 1 0 from the top of the connecting device 3 ago.
• the clamping unit 5 is connected to a busbar 6, wherein the opposite clamping unit 7 mirror image with a busbar. 8 connected is.
• the busbars 6 and 8 lie in one plane and are electrically isolated from each other in a separating element 22 received.
• a first chamber 1 1 for receiving a first compression spring 1 5 is arranged in the housing 4.
• a further first chamber 12 for receiving a further first compression spring 16 is formed at the same height.
• Each first compression spring 1 5, 16 cooperates with a first contact lug 1 a, 16 a (see FIG. 3), which are arranged between the first compression spring 15, 16.
• the inserted pin element 24 of the test device 2 which will be discussed in greater detail below. Without inserted pin member 24, i.
• the pin element 24 is attached to a connection 24 a on the underside of the scholarvorrich- tion housing 23 or formed integrally therewith. It is representative of more.
• the connection 24a is followed by a pin body 24b with a pin tip 24c.
• the pin element 24 of the test device 2 is inserted through a first opening 1 9a of a first opening portion 1 9 of the housing 4 of the connecting device 3 between the first compression springs 15 and 1 6.
• the first opening portion 19 is located at the top of the housing 4 of the connecting device 3.
• the pen tip 24c is used during insertion for threading and Ausei- nander explain the first contact lugs 1 5a and 1 6a of the first compression springs 15 and 1 6 and is in the inserted state in the Separating member 22 is received, which has a receptacle corresponding to the pen tip 24 c.
• the first contact lugs 1 5a and 1 6a are pressed by the first compression springs 15 and 16 with their contact portions separated by the pin element 24 against the pin body 24b, which is designed to be electrically insulating.
• the pin body 24b When inserting the pin body 24b between the tabs 1 5a, 1 6a, the pin body 24b therefore separates the electrical connection between the tabs 1 5a, 1 6a.
• electrically conductive contact plates 24d are arranged on the pin body 24b, respectively, on the side facing the contact lugs 1a, 1b, which tap a voltage respectively applied to the contact lugs 15a, 16a, so that an over the contact lugs 1 5a, 1 6a flowing circuit is interrupted.
• the contact plates 24d can be connected to different measuring meters 33 (see FIG For example, the voltage applied to the contact lugs 15a, 16a, the current flowing through the contact lugs 15a, 16a, a frequency, a power, a resistance or the like can be measured.
• the first compression springs 15 and 16 are inserted in the first chambers 1 1 and 12 under bias, so that a certain contact pressure of the first contact lugs 15 a and 16 a is in their contacting.
• a second chamber 13 is arranged with a second compression spring 17 below the busbar 6 in the housing 4.
• a further second chamber 14 for receiving a further second compression spring 18 is formed at the same height.
• the second compression springs 17 and 18 are assigned second contact lugs 17a and 18a (see FIGS. 3 and 7).
• the second compression springs 17 and 18 are electrically connected in parallel with the first compression springs 15, 16. So that when plugged test device 2 and an electrical contact of the second contact lugs 17a and 18a of the second compression springs 17, 18 is interrupted, between the contact portions of the second contact lugs 17a and 18a of the second compression springs 17, 18, a plug element 21 is inserted.
• the second compression springs 17 and 18 are used in the second chambers 13 and 14 under bias to produce a certain contact pressure in the contacting of the second contact lugs 17 a and 18 a.
• the plug-in element 21 is formed like a nail, has a head 21 a and an adjoining shaft 21 b with a tip 21 c. It is shown as representative of others and inserted through a second opening 20a of a second opening portion 20 of the housing 4 on the underside thereof between the second compression springs 17 and 18.
• the tip 21c serves for threading and pushing apart the second contact lugs 17a and 18a of the second pressure springs 17 and 18 and, in the inserted state, is received in the separating element 22 which analogously to the pin tip 24c of the pin element 24 has a receptacle which with the top 21 c corresponds.
• the second compression springs 17 and 18, with their contact sections separated by the plug-in element 21, rest on the shaft 21b, which is designed to be electrically insulating.
• connection device 3 is not only suitable for use on mounting rails 25, but also for other types of installation, as in Figure 2 in a schematic
• Sectional view of a second embodiment of the test and Randomvorrich- tion device 1 is shown.
• connection device 3 is in this case attached with its underside on one side to a wall element 26 with wall openings 26a and wall cutouts 26b.
• the supports 4a of the housing 4 pass through the wall openings 26a, wherein the second opening portion 20 of the housing 4 on its underside protrudes through the wall cutout 26b.
• the test device 2 is arranged on the other side of the wall element 26, wherein its pin element 24 is inserted through the second opening 20a of the second opening portion 20 between the second contact lugs 17a and 18a of the second compression springs 17 and 18 of the second chambers 13 and 14.
• the test device 2 is thus inserted on the underside of the connection device 3 in this.
• the supports 4a of the connection device 3 rest on the underside of the test device 2, so that the test device 2 and the connection device 3 are defined spaced from each other.
• the plug-in element 21 is inserted in this second embodiment from the top of the connection device 3 through the first opening portion 19 between the first contact lugs 15a and 16a of the first compression springs 15 and 16 for the separation thereof.
• connection device 3 can be plugged together on both sides with the test device 2. If the connection device 3 is provided for mounting rail mounting, it is equipped with the plug-in elements 21 from the bottom. At e.g. a wall mounting, in which the connection device 3 is best accessible from the bottom, the plug-in elements 21 are inserted from the top of the connection device 3.
• Figure 3 shows a schematic sectional view of the second embodiment of Figure 2 with first and second contact lugs 1 5a, 16a, 17a, 18a.
• the first and second contact lugs 15a, 16a and 17a, 18a face each other as pairs between the first compression springs 15 and 16 and the second compression springs 17, 18.
• the second contact lugs 15a and 16a contact, since no plug-in element 21 is inserted yet.
• the first and second contact lugs 15a, 16a and 17a, 18a have spring portions 15b, 16b, 17b, 18b, with which they are each electrically fixed to the busbars 6 and 8.
• FIG. 3 the upper, first contact lugs 15a and 16a are shown without plug-in element 21, wherein the lower, second contact lugs 17a and 18a are pressed apart by the pin element 24.
• FIG. 4 shows a schematic perspective view of an exemplary embodiment of a connecting device 3 with a manipulation protection in a first position
• FIG. 5 shows this manipulation protection in a second position
• the connection device 3 in this exemplary embodiment has seven clamping or connection units 300 arranged next to one another.
• FIGS. 4 and 5 show the first opening sections 19 with the first openings 19a.
• the first compression springs 15, 16 are arranged cooperatively with contact lugs 15a, 16a, of which only the contact lugs 16a cooperating with the first compression springs 16 can be seen.
• elongated protective elements 27 are arranged on both longitudinal sides on the clamping units 5, 7 (which are not visible), which are held longitudinally displaceable in guides 4c of the housing 4 in the longitudinal direction of the connecting device 3.
• the protective elements 27 are arranged in opposite directions.
• the protective elements 27 are in the first, closed position, ie the actuating portions 9 and 10 of the clamping units 5, 7 are located below the protective elements 27 and are not accessible.
• the operating parts 27a of the protective elements 27 abut against a stop 4d of the housing 4 with an edge.
• the protective elements 27 have per clamping unit 5, 7 in each case a cover panel 27c with a cover opening 27d.
• Clamping units can be made accessible, the protective elements 27 in the arrow directions in opposite directions by means of a tool 28 via its actuating members 27a in the second position slidably.
• the clamping units 5, 7 are designed here as drawbar connections (see Fig. 1).
• the invention is not limited to this training. But those
• Clamping units 5, 7 can also be designed with a different connection technology, for example as tension spring connections.
• the connecting device 3 offers the possibility of electrically connecting a plurality of clamping units 5, 7 via transverse connectors 70.
• the transverse connectors 70 are inserted into the actuation sections 9, 10 in an insertion direction 700 during the assembly process underneath the protective elements 27, so that in each case a plug-in contact 71 of the
• Transverse connector 70 engages in an actuating portion 9, 10 and the cross connector 70, the actuating portions 9, 10, in which the plug contacts 71 are inserted, electrically connected to each other.
• the protective element 27 is pushed into the guides 4 c after insertion of the cross connector 70, so that the cross connector 70 is inaccessible in the delivery state of the connecting device 3.
• the protective elements 27 are displaced so that the cover openings 27d of the cover panels 27c are disposed over the operating sections 9 and 10 of the clamping units 5, 7 and access to the clamping units 5, 7 e.g. with the tool (screwdriver) is possible.
• the actuating parts 27a of the protective elements 27 are arranged at a distance from the stops 4d of the housing 4.
• FIG. 6 shows a schematic perspective view of an exemplary embodiment of the connecting device 3 with mounting rail mounting from below.
• double holders 4b are respectively inserted or latched into the housing 4 in four corner regions on the underside of the housing 4 of the connection device 3.
• Each holder 4b has an inwardly to the support rail 25 facing end with a support rail holding portion 4e in the form of a nose.
• the holders 4b are formed with arm-shaped wall holding portions 4f.
• the holders 4b are optionally coverable with separate covers (not shown).
• the connection device 3 is held on the mounting rail 25 by means of the mounting rail holding section 4e of the holder 4b, in that the mounting rail holding section 4e overlaps a portion of the mounting rail 25.
• the holders 4b can be inserted or latched into corresponding recesses of the housing 4 in the position shown, for example after the connection device 3 has been applied, or pushed towards one another in the direction of the mounting rail 25 in order to create the overlapping of the mounting rail holding section 4e.
• the connection device 3 can also be pushed onto the support rail 25 in the longitudinal direction of the latter.
• Other options are of course conceivable.
• the holders 4b have a further holding function by means of the wall holding sections 4f, which is illustrated in FIG.
• Figure 7 shows a schematic perspective view of an embodiment of the connecting device 3 when mounted from below.
• the connecting device 3 is inserted with its underside in a wall section 26b of the wall element 26 (see also Figure 2).
• the outwardly facing wall holding portions 4f of the holder 4b engage over an edge of the wall section 26b of the wall element 26 and hold and fasten the connecting device 3 to the wall element 26.
• the holder 4b can be inserted, for example, in corresponding openings on the bottom of the housing 4 and be locked.
• FIG. 7 the underside of the connection device 3 with the second opening section 20 and the second openings 20a for insertion of the test device 2 (see FIG. 2) can be clearly seen.
• the ends of the second contact lugs 17a and 18a can be seen.
• the holders 4b thus allow the connection device 3 to be mounted both on a mounting rail 25 and on a wall cutout 26b of a wall element 26.
• the invention is not limited. It is of course modifiable within the scope of the appended claims. It is conceivable that the compression springs 15, 16 and 17, 18 are provided at their contact points with contact portions of special contact material or with the contact lugs 15 a, 16 a, 17 a, 18 a cooperate.
• FIG. 8 shows a further embodiment of a connection device 3 in FIG. 8 a.
• the connection device 3 has the seven connection units 300.
• holding units 302 are arranged, in each of which a holding element 400 is provided for fastening the connecting device 3 to a support rail 25 or a wall bracket 26.
• the holding units 302 are each closed at the front by means of a closure unit 301.
• the end faces are shown here by arrows 303.
• further connection units 300 can also be positioned between the closure units 301 and the holding units 302.
• further holding units 302 can be positioned between the connection units 300.
• Each of the holding elements 400 has in each case two holder pairs 4b, on each of which a nose-shaped carrier rail holding section 4e, and in each case an elongate wall holding section 4f are provided.
• the holding elements 400 are manufactured in one piece as stamped and bent parts and can be arranged in a receiving space 401 of the holding units 400.
• FIG. 8b shows by way of example a holding unit 302 without the holding element 400.
• connection element 440 for the retaining element 400 is shown.
• the connecting element 440 is formed as a molded part and made for example of a plastic, a light metal or a light metal alloy. It is attached to a displacement means 304, which is designed here as a screw.
• the displacement means 304 is arranged rotatably about an axis in the housing 4 of the holding unit 302.
• a nut 305 is arranged in a defined position, which is screwed onto the displacement means 304. Therefore, by rotating the displacement means 304 in and against a displacement direction 31 extending in the direction of the axis, the connection element 440 is displaceable relative to the housing 4 of the holding unit 302.
• FIGS. 8c and 8d show the holding unit 302 with the holding element 400 arranged on the connecting element 440, wherein FIG. 8c shows a perspective view and FIG. 8d shows a front view.
• the holding element 400 is fastened to the connection element 440, for example latched. As a result, it is displaceable with the connection element 440 in and against the displacement direction 31.
• a cutout 401 is left free in the holding element 400, through which the nut 305 arranged on the displacement means 304 is visible.
• FIG. 8 d the holding unit 302 or the holding element 400 is fastened to a wall element 26.
• 8e shows the holding unit 302 fastened to the wall element 26 with the closure unit 301 arranged on the end side.
• FIG. 8f the holding unit 302 closed at the end by means of the closure unit 301 is arranged on a hat-shaped mounting rail 25 instead of on a wall element 26.
• FIGS. 8 g-i show the arrangement of the holding unit 302 on a wall element 26 by way of example.
• the holders 4b arranged on a side I of the holding unit 302 or the connecting device 3 are guided through a wall opening 26a of the wall element 26, so that the wall holding sections 4f engage behind the wall element 26.
• the holders 4b of the other side II are guided by rotation in a rotational direction 4g through the wall opening 26a.
• the holding unit 302 or the connecting device 3 is displaced so that the wall holding portions 4f of the other side engage behind the wall element.
• the holding element 302 or the connection device 3 is displaced relative to the housing 4 by rotating the displacement means 304 until the holding element 302 or the connection device 3 is fixed to the wall element 26.
• FIG. 9a shows a section through a test device 2 according to the invention. Visible is a look into a test unit 200 of the test apparatus 2.
• a connection unit 42 is arranged in the test unit 200.
• the connection unit 42 comprises the pin element 24 and two first measurement connections 29.
• the measurement connections 29 are arranged on the side of the test unit 200 or the connection unit 42 opposite the pin element 24.
• Contact plates 24d (see Fig. 9b) for electrically contacting the contact lugs 15a, 16a of the connection device 3 (see, for example, Fig.
• the contact plates 24d are each electrically conductively connected to one of the two first measuring terminals 29 (see Fig. 9b).
• the contact plates 24d are each provided with a contact lug 15a, 16a, 17a, 18a on the upper side or on the outer side. terseite the connecting device 3 arranged contact lugs pair 15a, 16a or 17a, 18a electrically connected.
• FIG. 9 a shows that the first measuring terminals 29 of the test unit 200 are arranged at an angle 44 to one another.
• the angle 44 in which the measuring ports are arranged to each other, is fixed and not adjustable here. In principle, however, it is also possible to produce a test unit 200 with adjusting means (not shown) which makes it possible to adjust the angle 44 between the first measuring terminals 29 of the same test unit 200 relative to one another.
• the first measuring terminals 29 each have a free measuring terminal end 291, into each of which a measuring head 37 (see Fig. 9d) can be inserted.
• the angle 44 between the first measuring terminals 29 causes a first height offset 46a of their free measuring terminal ends 291 to each other.
• a distance 60 of the first measuring terminal 29 arranged on the first side I of the test unit 200 is not equal to a distance 61 of the second measuring terminal arranged on the second side II of the test unit 200, so that the angle 44 is a distance difference 600 of the measuring terminal ends 291 the same test unit 200 from the center plane 240 causes.
• connection unit 42 is arranged vertically adjustable within the test unit 200.
• the connecting unit 42 has a recess as a fastening means 34 into which a counter-fastening means 35, which is fixedly connected to the housing 23 of the test apparatus 200, is inserted, which is designed here as a pin.
• the recess 34 has three sections 344 that correspond to the cross section of the pin 35 and that are configured such that the connection unit 42 is height-adjustable in a total of three stages 47, 48, 49 relative to the housing 23 of the test unit 200. The three stages 47, 48, 49 are shown here relative to a housing top 231.
• the first measuring connections 29 arranged on the connection unit 42 are height-adjustable.
• the height adjustment of the connection unit 42 is possible during the assembly of the test unit 200.
• the adjusting means includes, with which the connection unit 42 and thus also the first measuring terminals 29 after installation of the test unit 200 are still adjustable.
• connection unit 42 causes the measuring terminal ends 29 of different test units 200 of the first measuring terminals 29 arranged at the same side I, I I, which are arranged at the same angle 44, to have a second height offset 46b, 46b 'to one another.
• one of the first measuring terminals 29 of each test unit 200 is always arranged parallel to the center plane 240, so that the other of the two first measuring terminals 29 in FIG the angle 44 is arranged to the center plane 240.
• two are each arranged in the same stage 47, 48, 49 relative to the housing 23, but rotated by an angle of rotation of 1.80.degree. Relative to one another.
• twisting a test unit 200 by the rotation angle of 1 80 ° it is also possible to twist a connection unit 42 in the housing 23 of the test unit 200.
• first measuring connections 29, which are arranged at the angle 44 to the center plane 240 alternate with the first measuring connections 29, which are arranged parallel to the center plane 240, on the same side I, II to the center plane 240 , Since the measuring terminal ends 291 of the first measuring terminals 29, which are arranged parallel to the center plane 240, have a first distance 60 from the center plane 240, and since the measuring terminal ends 291 of the first measuring terminals 29, which are arranged at the angle 44 to the center plane 240, a second distance 61 from the center plane 240, the measuring terminal ends 291 of the various test units 200 likewise have the distance difference 600 from each other.
• the measuring terminal ends 291 of the first measuring terminals 29 of the same stage 47, 48, 49 arranged on the same side I, II of the center plane 240 at the angle 44 have the same first vertical offset 46a that the measuring terminal ends 291 of the first measuring terminals 29 of the same test unit 200 have relative to one another , Since the measuring terminal ends 29 of different test units 200 of the first measuring terminals 29, which are arranged at the same angle 44 on the same side I, II, a second height offset 46b, 46b 'to each other, arranged on the same side I, II measuring terminal ends 291 here a total of four height intervals 451, 452, 453, 454 to the housing top 231 on.
• the same first measuring terminals 29 for each side I, II of the center plane 240 are therefore separated by the one angle 44, the height adjustment in three stages 47, 48, 49, and the rotation of the test units 200 by the angle of rotation of 180 °. 454 of the measuring terminal ends 291 achievable.
• the measuring connection ends 291 can therefore be arranged in a total of six different positions, which differ in their height spacing 451-454 from the housing top side 231 and optionally also at their spacing 60, 61 from the center plane 240.
• a free space between the measuring terminal ends 291 is greater than at measuring terminal ends 291, which are arranged at the same height distance 451-454 to the housing upper side 231 and have the same distance 60, 61 from the center plane 240.
• the test unit 200 is therefore either of compact design, or larger measuring heads 37 can be used.
• each test unit 200 further has a second measuring terminal 30, which is arranged laterally of the test apparatus 2.
• the second measuring connection 30 is connected to the first measuring connection 29 assigned to it in each case in an electrically conductive manner.
• he is here each arranged at right angles to this. Therefore, in each case also the second measuring terminals 30 of a test unit 200 the angle 44 to each other.
• they are height-adjusted during height adjustment of the connection unit 42. As a result, six height distances (not shown) from the upper side of the housing 231 can also be achieved for the second measuring terminals 30.
• FIG. 9b shows a section through a single test unit 200 in a schematic representation. Visible here are above all the contact plates 24d arranged on the pin element 24 and in each case their electrically conductive connection to the first measuring port 29.
• the first measuring ports 29 are connected to a test device 33 via an electrically conductive connection 32.
• the testing means 33 is, for example, a conventional measuring meter such as a voltage meter, current meter, frequency meter, power and / or resistance meter.
• test apparatus 2 differs from the test apparatus of FIG. 9a in the height of the selected connection units 42 of the test units 200. Visible here is above all the distance difference 600 of the first measurement terminals 29 from the center plane 240.
• Fig. 9d shows a schematic view of the test apparatus 2 from the side.
• measuring heads 37 are arranged. Suitable measuring heads 37 are, for example, conventional probes or banana plugs.
• some of the second measuring terminals 30 are electrically connected to cables 36.
• a ring cable lug 36a and a fork cable lug 36b are shown here as connection means by way of example.
• Fig. 9e shows a perspective view of the test apparatus 2 of Fig. 9c.
• the connecting units 42 (see Fig. 9a) arranged one behind the other are each provided rotated by the angle of rotation of 180 ° with respect to one another.
• a first measuring port 29 arranged parallel to the center plane 240 (see FIG. 9a) always alternates with a first measuring port 29 arranged at an angle 44 (see FIG.
• FIG. 9f which also shows the test apparatus 2 of FIG. 9c from above, but with inserted probes 37.
• test units 200 each with two identical first measuring terminals 29 arranged at an angle 44 to one another, are also conceivable, however, testing apparatuses 2 with different first measuring terminals 29, in particular with first measuring terminals 29 of different lengths L (see Fig. 9b)
• the invention is therefore a height offset of the first measuring terminals 29 to each other a height offset 46a, 46b, 46b 'of the free Meßan gleichenden 291 to understand each other.
• the invention also relates to test devices 2, 2', 2" Test units 200, the first measuring terminals 29 have different angles 44 to each other.
• the test device 3 optionally has the option of connecting the first measuring terminals 29 of a test unit 200 or the first measuring terminals 29 of different test units 200 by means of a cross connector 70 electrically connect with each other.
• the cross-connectors 70 are concealed inaccessible by a cover plate 233 (see Fig. 9f).
• FIG. 10 shows a mounting state with some transverse connectors 70 already inserted in the test device 3 and some still to be inserted.
• a further embodiment of a test device 2 'according to the invention is formed by joining, here screwing, individual test units 200 , 10a shows the test units 200 and the test device 2 'from above.
• the test units 200 each have their own housing 23 '. They each have on one side I, II the first measuring connection 29 arranged parallel to the center plane 240 and on the other side I, II the first measuring connection 29 arranged at the angle 44 (see FIG.
• One of the test units 200 is also rotated by the angle of rotation of 180 ° to the other test units 200. Above all, the distance difference 600 of the measuring terminal ends 291 (see Fig. 9a) from the center plane 240 is visible in this Fig. 10a.
• a tester 2 'of the same type as Fig. 10a is shown from the side.
• test device 2 shows a further embodiment of a test device 2 "according to the invention."
• the test device 2 "comprises only one test unit 200.
• the test unit 200 has two housing parts 23a", 23b "detachably connected to one another. For connecting a screw 43a is provided here.
• connection unit 42 is provided, which is height adjustable here in two stages 47, 48.
• the pin element 24 with the two contact plates 24d and the two at the angle 44 to each other arranged first measuring terminals 29 are provided.
• the second measuring terminals 30, which are electrically conductively connected to the first measuring terminals 29 and are each arranged at a right angle to them, are shown.
• FIG. 11 shows a further embodiment of a testing device 2 according to the invention, namely in a in a first side view, in b in a second side view and in c in a perspective view.
• the test apparatus 2 has seven test units 200, which are arranged relative to the housing upper side 231 in two different stages 47, 48, 49 (see Fig. 9a). However, four test units arranged one behind the other or three test units arranged one behind the other are provided without height offset from each other. The test units are rotated by the angle of rotation of 180 ° to each other.
• Fig. 12 shows in each case a section through a test unit 200 with a three-stage height-adjustable connection unit 42.
• connection unit 42 When height adjustment of the connection unit 42 from one stage to the next 47, 48, 49 (see Fig. 9a) not only the first measuring terminals 29 adjusted by the second height offset 46b, 46b ', but also the pin member 24th
• connection device

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• Physics & Mathematics (AREA)
• General Physics & Mathematics (AREA)
• Connections Arranged To Contact A Plurality Of Conductors (AREA)
• Details Of Connecting Devices For Male And Female Coupling (AREA)
• Measuring Leads Or Probes (AREA)
• Testing Electric Properties And Detecting Electric Faults (AREA)
• Connector Housings Or Holding Contact Members (AREA)
• Coupling Device And Connection With Printed Circuit (AREA)
• Tests Of Electronic Circuits (AREA)

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• 2012
  • 2012-05-21 WO PCT/EP2012/059383 patent/WO2012163713A1/de active Application Filing
  • 2012-05-21 US US14/119,968 patent/US9081033B2/en active Active
  • 2012-05-21 DE DE201210104351 patent/DE102012104351A1/de active Pending
  • 2012-05-21 KR KR1020147000134A patent/KR101925385B1/ko active IP Right Grant
  • 2012-05-21 BR BR112013030460A patent/BR112013030460A2/pt not_active Application Discontinuation
  • 2012-05-21 DE DE201220101849 patent/DE202012101849U1/de not_active Expired - Lifetime
  • 2012-05-21 DE DE201210104350 patent/DE102012104350A1/de active Pending
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  • 2012-05-21 US US14/123,212 patent/US9075084B2/en active Active
  • 2012-05-21 KR KR20147000133A patent/KR20140063562A/ko not_active Application Discontinuation
  • 2012-05-21 EP EP12726599.9A patent/EP2715872A1/de not_active Withdrawn
  • 2012-05-21 CN CN201280027223.6A patent/CN103582978B/zh active Active
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  • 2012-05-21 RU RU2013156846/07A patent/RU2599571C2/ru active
  • 2012-05-21 RU RU2013156841/07A patent/RU2594899C2/ru active
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