EP2516321A2 - Sensor comprising a preferably multilayered ceramic substrate and method for producing it - Google Patents
Sensor comprising a preferably multilayered ceramic substrate and method for producing itInfo
- Publication number
- EP2516321A2 EP2516321A2 EP11817213A EP11817213A EP2516321A2 EP 2516321 A2 EP2516321 A2 EP 2516321A2 EP 11817213 A EP11817213 A EP 11817213A EP 11817213 A EP11817213 A EP 11817213A EP 2516321 A2 EP2516321 A2 EP 2516321A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- ceramic substrate
- contact
- sensor
- sensor element
- metallic contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000919 ceramic Substances 0.000 title claims abstract description 98
- 239000000758 substrate Substances 0.000 title claims abstract description 72
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 9
- 238000005476 soldering Methods 0.000 claims abstract description 36
- 238000000034 method Methods 0.000 claims abstract description 12
- 229910000679 solder Inorganic materials 0.000 claims description 31
- 238000005245 sintering Methods 0.000 claims description 13
- 239000000463 material Substances 0.000 claims description 9
- 238000005516 engineering process Methods 0.000 claims description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 2
- 230000001939 inductive effect Effects 0.000 claims description 2
- 238000005259 measurement Methods 0.000 claims description 2
- 229910052710 silicon Inorganic materials 0.000 claims description 2
- 239000010703 silicon Substances 0.000 claims description 2
- 238000006073 displacement reaction Methods 0.000 claims 1
- 229910052751 metal Inorganic materials 0.000 description 23
- 239000002184 metal Substances 0.000 description 23
- 239000010410 layer Substances 0.000 description 21
- 238000005219 brazing Methods 0.000 description 5
- 239000004020 conductor Substances 0.000 description 5
- 230000007613 environmental effect Effects 0.000 description 4
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 238000003780 insertion Methods 0.000 description 3
- 230000037431 insertion Effects 0.000 description 3
- 230000035939 shock Effects 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 229910052719 titanium Inorganic materials 0.000 description 3
- 239000010936 titanium Substances 0.000 description 3
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 2
- 238000004873 anchoring Methods 0.000 description 2
- 230000000712 assembly Effects 0.000 description 2
- 238000000429 assembly Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000007654 immersion Methods 0.000 description 2
- 229910000833 kovar Inorganic materials 0.000 description 2
- 238000007639 printing Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 229910052726 zirconium Inorganic materials 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 239000002318 adhesion promoter Substances 0.000 description 1
- 238000004026 adhesive bonding Methods 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 238000005275 alloying Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000002788 crimping Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 229910001092 metal group alloy Inorganic materials 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 230000001988 toxicity Effects 0.000 description 1
- 231100000419 toxicity Toxicity 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/181—Printed circuits structurally associated with non-printed electric components associated with surface mounted components
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B7/00—Microstructural systems; Auxiliary parts of microstructural devices or systems
- B81B7/0006—Interconnects
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00015—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
- B81C1/00261—Processes for packaging MEMS devices
- B81C1/00301—Connecting electric signal lines from the MEMS device with external electrical signal lines, e.g. through vias
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/4038—Through-connections; Vertical interconnect access [VIA] connections
- H05K3/4046—Through-connections; Vertical interconnect access [VIA] connections using auxiliary conductive elements, e.g. metallic spheres, eyelets, pieces of wire
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2207/00—Microstructural systems or auxiliary parts thereof
- B81B2207/09—Packages
- B81B2207/091—Arrangements for connecting external electrical signals to mechanical structures inside the package
- B81B2207/092—Buried interconnects in the substrate or in the lid
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2207/00—Microstructural systems or auxiliary parts thereof
- B81B2207/09—Packages
- B81B2207/091—Arrangements for connecting external electrical signals to mechanical structures inside the package
- B81B2207/094—Feed-through, via
- B81B2207/096—Feed-through, via through the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0306—Inorganic insulating substrates, e.g. ceramic, glass
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/16—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor
- H05K1/162—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor incorporating printed capacitors
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/16—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor
- H05K1/165—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor incorporating printed inductors
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/182—Printed circuits structurally associated with non-printed electric components associated with components mounted in the printed circuit board, e.g. insert mounted components [IMC]
- H05K1/185—Components encapsulated in the insulating substrate of the printed circuit or incorporated in internal layers of a multilayer circuit
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10007—Types of components
- H05K2201/10151—Sensor
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10227—Other objects, e.g. metallic pieces
- H05K2201/10287—Metal wires as connectors or conductors
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10227—Other objects, e.g. metallic pieces
- H05K2201/10295—Metallic connector elements partly mounted in a hole of the PCB
- H05K2201/10303—Pin-in-hole mounted pins
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10227—Other objects, e.g. metallic pieces
- H05K2201/1031—Surface mounted metallic connector elements
- H05K2201/10318—Surface mounted metallic pins
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10227—Other objects, e.g. metallic pieces
- H05K2201/10356—Cables
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3447—Lead-in-hole components
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
- H05K3/4611—Manufacturing multilayer circuits by laminating two or more circuit boards
- H05K3/4626—Manufacturing multilayer circuits by laminating two or more circuit boards characterised by the insulating layers or materials
- H05K3/4629—Manufacturing multilayer circuits by laminating two or more circuit boards characterised by the insulating layers or materials laminating inorganic sheets comprising printed circuits, e.g. green ceramic sheets
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49128—Assembling formed circuit to base
Definitions
- the invention generally relates to a sensor which comprises a preferably multilayer ceramic substrate, wherein at least one sensor element is arranged or formed in, on or on the ceramic substrate. Furthermore, the invention relates to a method for producing such a sensor.
- connection to the solder pad is an exclusively electrical connection.
- Mechanically, such a connection is extremely unstable. Accordingly, the solder joint must hardly be mechanically stressed. In case of shock, vibration or other mechanical stress, such solder joints break or break frequently. Consequently, a separate mechanical fixation, for example by gluing, joining, etc. is required.
- An alternative to conventional soft soldering is the brazing process, where the brazing temperature is above 450 ° C.
- a special form of brazing is active soldering. Commercially available active solders have a melting point of approx. 850 ° C. In addition, it is advantageous that by means of active soldering metal can be soldered directly on the ceramic.
- a customary in conventional soldering or brazing metallization of the ceramic is not required in active soldering, since the solder enters into a direct connection with the ceramic surface due to its chemical composition.
- active soldering produces a reaction at the interface, namely between the metal or the metal alloy of the solder and the ceramic surface, so that the materials bond directly to one another without the use of an adhesion promoter.
- the particular advantage of active soldering is therefore the high mechanical strength and high temperature resistance of the compound. Consequently, by active soldering, a high temperature suitable metal-ceramic compound can be produced.
- Sensors of the generic type are known from practice. Such sensors are already available in multilayer ceramics. For example, reference is made to DE 10 2008 016 829 A1 and DE 103 14 875 A1.
- connection between metal and ceramic is also a particular problem in the case of the sensors in question. Since the actual sensor element is usually arranged on, on or in the ceramic or the ceramic substrate and, for example, at least one measuring electrode or at least one measuring coil are electrically contacted must, there is the fundamental problem of how to produce such an electrical connection with simultaneous generation of a sufficiently good mechanical connection error-free and sustainable.
- the present invention is therefore based on the object to provide a sensor or sensor structure in which the sensor element is arranged on or on a preferably multi-layer ceramic substrate or generated accordingly and in which a secure contacting of the sensor element is realized with the simplest technology.
- the sensor should be simple and therefore inexpensive to produce.
- the generic sensor includes the actual sensor element in, on or on a ceramic substrate and an electrical contact in the form of a metallic contact generated by soldering, wherein the solder joint is designed such that it electrically contacts the metallic contact on the one hand with the sensor element and on the other hand a secure forms mechanical connection between the metallic contact and the ceramic substrate. Consequently, in the inventive manner by a surprisingly simple construction, a secure both in electrical and mechanical terms, solid solder joint created.
- the present invention is achieved by the features of the independent claim 9, which relates to the manufacture of the sensor according to the invention.
- the sensor element may comprise one or more coils.
- one or more electrode surfaces as integral components would be conceivable.
- force or Pressure sensors could contain the sensor element expansion elements of any design.
- the sensor element consists of resistance layers.
- magnetoresistive sensors the sensor element could be contained as a silicon component in the substrate. Other other sensor elements are conceivable. In that regard, it should be noted that this is the basic sensor structure, but not the realization of a specific sensor element.
- the ceramic substrate is in the simplest case of a single layer of a ceramic.
- the sensor element is mounted on the surface of the substrate.
- the contacting of the sensor element takes place in the usual way by conductor tracks, which are applied for example in a known printing technique on the substrate.
- Particularly advantageous is the use of multi-layer ceramic substrates, which are firmly connected by sintering.
- the sensor elements may be applied, for example, the coil of a distance sensor by printing a conductor track layer. After the stacking of the individual layers and the sintering, a solid ceramic block is formed, which contains the sensor elements in its interior. These are protected against environmental influences and mechanically stable.
- the contacting of the sensor element on the ceramic substrate is produced in such a way that a simultaneously electrically conductive and mechanically stable connection is formed by actively soldering a suitable metal connection piece onto the ceramic substrate. This happens because the contact surface of the contact on the ceramic substrate at the same time on the one hand, the electrical contact surface, such as the conductor track or the solder pad, covered and on the other hand, the uncovered Ceramic surface covered. During the soldering process, both the electrical connection between the contact surface and the metallic contact and the mechanical connection with the ceramic surface and the contact are then simultaneously produced by the active solder.
- the metallic contact may be further advantageously directly bonded to / in the ceramic substrate by active soldering.
- the metallic contact can be embodied in the form of a pin inserted into the ceramic substrate, so that a certain positional stability, possibly also due to the realization of a certain fit, is achieved even by the insertion of the contact.
- the metallic contact may advantageously be dimensioned such that it can be operated with at least slight play, i. without implementation of a press fit, is inserted into the ceramic substrate.
- the resulting gap between the contact and the ceramic substrate can be designed such that the active solder or the solder paste is evenly and sufficiently distributed in the gap, with an exact dosage of the solder paste in the gap, preferably before the insertion of the metallic contact, is beneficial.
- the measuring electrode or measuring coil to be contacted by the metallic contact is provided in the interior or on the side of the ceramic substrate opposite the insertion side.
- a material favoring the electrical contact preferably a contact paste, is provided in a further advantageous manner. This is preferably applied before the sintering of the ceramic substrate on the measuring electrode or measuring coil to be contacted, so that in the subsequent active soldering, at a temperature of about 850 ° C, an excellent electrical and mechanical connection with respect to the metallic contact can be produced.
- the inventive method is used to produce the previously discussed sensor and is essentially based on that the ceramic substrate is prepared by sintering technology and the electrical contact for contacting metallic contact introduced after sintering of the ceramic substrate in this and there for both electrical contacting as well as mechanical anchoring means Active solder is soldered.
- a material favoring the electrical contact for example in the form of a contact paste, can already be introduced into the ceramic substrate prior to sintering.
- FIG. 1 is a schematic view, partially in section, of the basic structure of a sensor according to the invention
- Fig. 2 in a schematic view, cut and partially a further embodiment of a sensor according to the invention in the field of contacting and
- Fig. 3 in a schematic view, cut and section of a sensor according to the invention in the contact area.
- FIG. 1 shows a first exemplary embodiment of a sensor according to the invention, in which the metal connecting piece is designed as a pin 6 with an attachment for attachment.
- Position surface is executed.
- the bearing surface forms the contact point to the ceramic substrate 2 by these are connected to each other by means of an active solder 8.
- the bearing surface of the contact is designed such that it simultaneously covers, on the one hand, the electrical contact surface, for example the conductor track or the solder pad, on the ceramic substrate 2 and, on the other hand, the uncovered ceramic surface.
- the active solder both the electrical connection between the contact surface and the metallic contact and the mechanical connection with the ceramic surface and the contact are then simultaneously produced by the active solder.
- the ceramic substrate 2 is covered with the active solder 8. Thereafter, the pin 6 is fixed on the ceramic substrate 2 by means of a suitable device.
- the active solder 8 combines by means of chemical reactions with the metal on the one hand and with the ceramic on the other hand, whereby a firm structural connection between metal and ceramic is produced. Since the active solder 8 is simultaneously electrically conductive, it establishes an electrical connection between the pin 6 and the conductor tracks on the ceramic substrate.
- a cable 9, a wire or other electrical connections This can in turn be done by means of soldering, or at particularly high temperature requirements, by welding or crimping.
- FIG. 2 shows a further embodiment of a sensor according to the invention, in which the metal connection element is introduced in the form of a metal pin 6 into a recess 7 of the ceramic substrate 2.
- the ceramic layers are processed accordingly, so provided with openings, resulting in what are called cavities.
- Such processes are also used in so-called vias (plated-through holes) in multilayer ceramic substrates.
- vias plated-through holes
- small holes are punched into the initially soft substrate. These holes are filled with a conductive contact paste 5.
- the conductive paste 5 connects the top of the layer to the bottom, thereby establishing a via between the interconnect on the upper side of a layer and the interconnect on the underside.
- This via can also extend over several layers. It must be at Just make sure that the layers are aligned exactly one above the other. If breakthroughs extend over several layers to the surface of the sensor substrate, a depression (cavity) in the form of a blind hole is formed on the surface.
- Conventional ceramic layers have a thickness of, for example, about 200 ⁇ after sintering. If the via extends over three layers, a blind hole with a depth of approx. 600 ⁇ is created.
- the metal pin 6 can be inserted and connected by means of active soldering 8 with the ceramic substrate 2.
- active soldering 8 By soldering the metal pin 6 within the ceramic substrate 2 and the conductive layer in the via creates a conductive connection, which is mechanically very stable at the same time.
- the mechanical stability is thus produced not only by the interface of the active solder 8, but additionally by the immersion of the pin 6 in the ceramic substrate 2.
- the contact area between the pin 6 and the ceramic is increased without on the surface of the ceramic large contact surfaces required are. This is particularly advantageous when the ceramic substrate 2 itself has a small area.
- the immersion increases the mechanical stability against lateral loads. As a result, the pin 6, for example, when pulling in the lateral direction on the cable welded thereto not break.
- metal fittings for example in the form of a metal pin 6 is titanium, kovar or zirconium.
- the ceramic substrates 2 after sintering have a thermal expansion coefficient of 5-7 ppm / K.
- the coefficient of expansion of titanium is 9 ppm / K, of Kovar 5.3 ppm / and of zirconium 5.9 ppm / K.
- the use of metals with similar or even the same coefficients of expansion as the ceramic is therefore advantageous, so that at high temperatures no or only slight stresses occur at the active soldering point. High temperatures initially occur during the soldering process itself, which takes place at 850 ° C, for example.
- a housing not shown here, may be made of metal or at least include a metallic rim, frame or the like.
- the lowest layer 3 there which comprises the measuring electrode 4 or measuring coil, is covered with a contact paste 5, which is introduced into the ceramic substrate 2 before the sintering.
- the metallic contact in the form of a metal pin 6, is inserted into a bore / recess 7 in the ceramic substrate 2, wherein a perfect electrical contacting by action of the contact paste 5 against the measuring electrode 4 and measuring coil takes place.
- Fig. 3 shows that the metal pin 6 penetrates directly into the multilayer ceramic substrate 2, i. is soldered by active soldering, so that by the active soldering both an electrical contact with the cooperation of the contact paste 5 and a mechanical connection with respect to the ceramic substrate 2 is realized.
- the active solder 8 causes the electrical as well as solid mechanical connection.
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Measuring Fluid Pressure (AREA)
- Ceramic Products (AREA)
Abstract
Description
Claims
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102010053021 | 2010-12-02 | ||
DE102010053760A DE102010053760A1 (en) | 2010-12-02 | 2010-12-08 | Sensor with a preferably multilayer ceramic substrate and method for its production |
PCT/DE2011/050042 WO2012072070A2 (en) | 2010-12-02 | 2011-10-10 | Sensor comprising a preferably multilayered ceramic substrate and method for producing it |
Publications (2)
Publication Number | Publication Date |
---|---|
EP2516321A2 true EP2516321A2 (en) | 2012-10-31 |
EP2516321B1 EP2516321B1 (en) | 2019-03-06 |
Family
ID=46082886
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP11817213.9A Active EP2516321B1 (en) | 2010-12-02 | 2011-10-10 | Sensor comprising a preferably multilayered ceramic substrate and method for producing it |
Country Status (5)
Country | Link |
---|---|
US (1) | US9144155B2 (en) |
EP (1) | EP2516321B1 (en) |
CN (1) | CN103221330B (en) |
DE (1) | DE102010053760A1 (en) |
WO (1) | WO2012072070A2 (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101622090B1 (en) * | 2013-11-08 | 2016-05-18 | 엘지전자 주식회사 | Solar cell |
US9546928B2 (en) * | 2014-05-30 | 2017-01-17 | General Electric Company | Methods for producing strain sensors on turbine components |
US9410868B2 (en) * | 2014-05-30 | 2016-08-09 | General Electric Company | Methods for producing strain sensors on turbine components |
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-
2010
- 2010-12-08 DE DE102010053760A patent/DE102010053760A1/en not_active Withdrawn
-
2011
- 2011-10-10 US US13/880,348 patent/US9144155B2/en active Active
- 2011-10-10 EP EP11817213.9A patent/EP2516321B1/en active Active
- 2011-10-10 CN CN201180055148.XA patent/CN103221330B/en active Active
- 2011-10-10 WO PCT/DE2011/050042 patent/WO2012072070A2/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO2012072070A2 (en) | 2012-06-07 |
EP2516321B1 (en) | 2019-03-06 |
CN103221330B (en) | 2016-08-03 |
WO2012072070A3 (en) | 2012-08-23 |
CN103221330A (en) | 2013-07-24 |
DE102010053760A1 (en) | 2012-06-06 |
US20130223031A1 (en) | 2013-08-29 |
US9144155B2 (en) | 2015-09-22 |
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