EP2474040A2 - Aluminum paste for a back electrode of solar cell - Google Patents
Aluminum paste for a back electrode of solar cellInfo
- Publication number
- EP2474040A2 EP2474040A2 EP10813967A EP10813967A EP2474040A2 EP 2474040 A2 EP2474040 A2 EP 2474040A2 EP 10813967 A EP10813967 A EP 10813967A EP 10813967 A EP10813967 A EP 10813967A EP 2474040 A2 EP2474040 A2 EP 2474040A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- aluminum
- aluminum paste
- solar cell
- paste
- glass frit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 title claims abstract description 130
- 229910052782 aluminium Inorganic materials 0.000 title claims abstract description 103
- 239000011521 glass Substances 0.000 claims abstract description 27
- 239000002245 particle Substances 0.000 claims abstract description 25
- 238000000034 method Methods 0.000 claims abstract description 19
- 238000009826 distribution Methods 0.000 claims description 15
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 9
- 238000004519 manufacturing process Methods 0.000 claims description 8
- WMWLMWRWZQELOS-UHFFFAOYSA-N bismuth(iii) oxide Chemical compound O=[Bi]O[Bi]=O WMWLMWRWZQELOS-UHFFFAOYSA-N 0.000 claims description 7
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 4
- 229910052681 coesite Inorganic materials 0.000 claims description 4
- 229910052593 corundum Inorganic materials 0.000 claims description 4
- 229910052906 cristobalite Inorganic materials 0.000 claims description 4
- 239000000377 silicon dioxide Substances 0.000 claims description 4
- 229910052682 stishovite Inorganic materials 0.000 claims description 4
- 229910052905 tridymite Inorganic materials 0.000 claims description 4
- 229910001845 yogo sapphire Inorganic materials 0.000 claims description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract description 30
- 229910052710 silicon Inorganic materials 0.000 abstract description 30
- 239000010703 silicon Substances 0.000 abstract description 30
- 238000010344 co-firing Methods 0.000 abstract description 13
- 238000002845 discoloration Methods 0.000 abstract description 4
- 230000015572 biosynthetic process Effects 0.000 abstract description 3
- 230000003247 decreasing effect Effects 0.000 description 10
- -1 glycol ethers Chemical class 0.000 description 10
- 238000002360 preparation method Methods 0.000 description 7
- 239000000654 additive Substances 0.000 description 5
- 230000000052 comparative effect Effects 0.000 description 5
- 230000007423 decrease Effects 0.000 description 5
- 239000000203 mixture Substances 0.000 description 5
- 229940051841 polyoxyethylene ether Drugs 0.000 description 5
- 229920000056 polyoxyethylene ether Polymers 0.000 description 5
- 239000004094 surface-active agent Substances 0.000 description 5
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 4
- LYCAIKOWRPUZTN-UHFFFAOYSA-N ethylene glycol Natural products OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 4
- 239000003960 organic solvent Substances 0.000 description 4
- 239000002952 polymeric resin Substances 0.000 description 4
- 229910052709 silver Inorganic materials 0.000 description 4
- 239000004332 silver Substances 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 229920003002 synthetic resin Polymers 0.000 description 4
- 239000013008 thixotropic agent Substances 0.000 description 4
- 239000000080 wetting agent Substances 0.000 description 4
- 230000000996 additive effect Effects 0.000 description 3
- 235000014113 dietary fatty acids Nutrition 0.000 description 3
- 239000002270 dispersing agent Substances 0.000 description 3
- 239000000194 fatty acid Substances 0.000 description 3
- 229930195729 fatty acid Natural products 0.000 description 3
- 238000010304 firing Methods 0.000 description 3
- 238000007650 screen-printing Methods 0.000 description 3
- 229910021364 Al-Si alloy Inorganic materials 0.000 description 2
- 239000001856 Ethyl cellulose Substances 0.000 description 2
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 2
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerol Natural products OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 2
- 229920003171 Poly (ethylene oxide) Polymers 0.000 description 2
- 239000002202 Polyethylene glycol Substances 0.000 description 2
- 239000004372 Polyvinyl alcohol Substances 0.000 description 2
- 229910004205 SiNX Inorganic materials 0.000 description 2
- 125000000217 alkyl group Chemical group 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 150000002148 esters Chemical class 0.000 description 2
- 229920001249 ethyl cellulose Polymers 0.000 description 2
- 235000019325 ethyl cellulose Nutrition 0.000 description 2
- 150000004665 fatty acids Chemical class 0.000 description 2
- 235000011187 glycerol Nutrition 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000004615 ingredient Substances 0.000 description 2
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 2
- DNIAPMSPPWPWGF-UHFFFAOYSA-N monopropylene glycol Natural products CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 2
- 229920001223 polyethylene glycol Polymers 0.000 description 2
- 229920002451 polyvinyl alcohol Polymers 0.000 description 2
- 235000019422 polyvinyl alcohol Nutrition 0.000 description 2
- 229920000036 polyvinylpyrrolidone Polymers 0.000 description 2
- 239000001267 polyvinylpyrrolidone Substances 0.000 description 2
- 235000013855 polyvinylpyrrolidone Nutrition 0.000 description 2
- 239000011148 porous material Substances 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- DAFHKNAQFPVRKR-UHFFFAOYSA-N (3-hydroxy-2,2,4-trimethylpentyl) 2-methylpropanoate Chemical compound CC(C)C(O)C(C)(C)COC(=O)C(C)C DAFHKNAQFPVRKR-UHFFFAOYSA-N 0.000 description 1
- IBLKWZIFZMJLFL-UHFFFAOYSA-N 1-phenoxypropan-2-ol Chemical compound CC(O)COC1=CC=CC=C1 IBLKWZIFZMJLFL-UHFFFAOYSA-N 0.000 description 1
- ULQISTXYYBZJSJ-UHFFFAOYSA-N 12-hydroxyoctadecanoic acid Chemical compound CCCCCCC(O)CCCCCCCCCCC(O)=O ULQISTXYYBZJSJ-UHFFFAOYSA-N 0.000 description 1
- 229940114072 12-hydroxystearic acid Drugs 0.000 description 1
- OAYXUHPQHDHDDZ-UHFFFAOYSA-N 2-(2-butoxyethoxy)ethanol Chemical compound CCCCOCCOCCO OAYXUHPQHDHDDZ-UHFFFAOYSA-N 0.000 description 1
- WMDZKDKPYCNCDZ-UHFFFAOYSA-N 2-(2-butoxypropoxy)propan-1-ol Chemical compound CCCCOC(C)COC(C)CO WMDZKDKPYCNCDZ-UHFFFAOYSA-N 0.000 description 1
- GZMAAYIALGURDQ-UHFFFAOYSA-N 2-(2-hexoxyethoxy)ethanol Chemical compound CCCCCCOCCOCCO GZMAAYIALGURDQ-UHFFFAOYSA-N 0.000 description 1
- XYVAYAJYLWYJJN-UHFFFAOYSA-N 2-(2-propoxypropoxy)propan-1-ol Chemical compound CCCOC(C)COC(C)CO XYVAYAJYLWYJJN-UHFFFAOYSA-N 0.000 description 1
- COBPKKZHLDDMTB-UHFFFAOYSA-N 2-[2-(2-butoxyethoxy)ethoxy]ethanol Chemical compound CCCCOCCOCCOCCO COBPKKZHLDDMTB-UHFFFAOYSA-N 0.000 description 1
- JDSQBDGCMUXRBM-UHFFFAOYSA-N 2-[2-(2-butoxypropoxy)propoxy]propan-1-ol Chemical compound CCCCOC(C)COC(C)COC(C)CO JDSQBDGCMUXRBM-UHFFFAOYSA-N 0.000 description 1
- WFSMVVDJSNMRAR-UHFFFAOYSA-N 2-[2-(2-ethoxyethoxy)ethoxy]ethanol Chemical compound CCOCCOCCOCCO WFSMVVDJSNMRAR-UHFFFAOYSA-N 0.000 description 1
- WAEVWDZKMBQDEJ-UHFFFAOYSA-N 2-[2-(2-methoxypropoxy)propoxy]propan-1-ol Chemical compound COC(C)COC(C)COC(C)CO WAEVWDZKMBQDEJ-UHFFFAOYSA-N 0.000 description 1
- UPGSWASWQBLSKZ-UHFFFAOYSA-N 2-hexoxyethanol Chemical compound CCCCCCOCCO UPGSWASWQBLSKZ-UHFFFAOYSA-N 0.000 description 1
- QCDWFXQBSFUVSP-UHFFFAOYSA-N 2-phenoxyethanol Chemical compound OCCOC1=CC=CC=C1 QCDWFXQBSFUVSP-UHFFFAOYSA-N 0.000 description 1
- RSWGJHLUYNHPMX-UHFFFAOYSA-N Abietic-Saeure Natural products C12CCC(C(C)C)=CC2=CCC2C1(C)CCCC2(C)C(O)=O RSWGJHLUYNHPMX-UHFFFAOYSA-N 0.000 description 1
- 239000004925 Acrylic resin Substances 0.000 description 1
- FBPFZTCFMRRESA-FSIIMWSLSA-N D-Glucitol Natural products OC[C@H](O)[C@H](O)[C@@H](O)[C@H](O)CO FBPFZTCFMRRESA-FSIIMWSLSA-N 0.000 description 1
- KHPCPRHQVVSZAH-HUOMCSJISA-N Rosin Natural products O(C/C=C/c1ccccc1)[C@H]1[C@H](O)[C@@H](O)[C@@H](O)[C@@H](CO)O1 KHPCPRHQVVSZAH-HUOMCSJISA-N 0.000 description 1
- 229920002125 Sokalan® Polymers 0.000 description 1
- 238000007792 addition Methods 0.000 description 1
- 150000004703 alkoxides Chemical class 0.000 description 1
- 150000003973 alkyl amines Chemical class 0.000 description 1
- 125000002877 alkyl aryl group Chemical group 0.000 description 1
- WUOACPNHFRMFPN-UHFFFAOYSA-N alpha-terpineol Chemical compound CC1=CCC(C(C)(C)O)CC1 WUOACPNHFRMFPN-UHFFFAOYSA-N 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- SQIFACVGCPWBQZ-UHFFFAOYSA-N delta-terpineol Natural products CC(C)(O)C1CCC(=C)CC1 SQIFACVGCPWBQZ-UHFFFAOYSA-N 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 1
- XXJWXESWEXIICW-UHFFFAOYSA-N diethylene glycol monoethyl ether Chemical compound CCOCCOCCO XXJWXESWEXIICW-UHFFFAOYSA-N 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- 229940093476 ethylene glycol Drugs 0.000 description 1
- 229910021485 fumed silica Inorganic materials 0.000 description 1
- 238000007646 gravure printing Methods 0.000 description 1
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 239000011976 maleic acid Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910000000 metal hydroxide Inorganic materials 0.000 description 1
- 150000004692 metal hydroxides Chemical class 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 239000002736 nonionic surfactant Substances 0.000 description 1
- 238000007645 offset printing Methods 0.000 description 1
- 239000005416 organic matter Substances 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
- 239000004584 polyacrylic acid Substances 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 229920002503 polyoxyethylene-polyoxypropylene Polymers 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 229960004063 propylene glycol Drugs 0.000 description 1
- 235000013772 propylene glycol Nutrition 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000600 sorbitol Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 229940116411 terpineol Drugs 0.000 description 1
- JMXKSZRRTHPKDL-UHFFFAOYSA-N titanium ethoxide Chemical compound [Ti+4].CC[O-].CC[O-].CC[O-].CC[O-] JMXKSZRRTHPKDL-UHFFFAOYSA-N 0.000 description 1
- KHPCPRHQVVSZAH-UHFFFAOYSA-N trans-cinnamyl beta-D-glucopyranoside Natural products OC1C(O)C(O)C(CO)OC1OCC=CC1=CC=CC=C1 KHPCPRHQVVSZAH-UHFFFAOYSA-N 0.000 description 1
- AJSTXXYNEIHPMD-UHFFFAOYSA-N triethyl borate Chemical compound CCOB(OCC)OCC AJSTXXYNEIHPMD-UHFFFAOYSA-N 0.000 description 1
- JLGLQAWTXXGVEM-UHFFFAOYSA-N triethylene glycol monomethyl ether Chemical compound COCCOCCOCCO JLGLQAWTXXGVEM-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/20—Conductive material dispersed in non-conductive organic material
- H01B1/22—Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C3/00—Glass compositions
- C03C3/04—Glass compositions containing silica
- C03C3/062—Glass compositions containing silica with less than 40% silica by weight
- C03C3/064—Glass compositions containing silica with less than 40% silica by weight containing boron
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/02—Frit compositions, i.e. in a powdered or comminuted form
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/14—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions
- C03C8/18—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions containing free metals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/03—Manufacturing methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L24/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01023—Vanadium [V]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01038—Strontium [Sr]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01047—Silver [Ag]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01074—Tungsten [W]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Definitions
- the present invention relates to aluminum paste for a back electrode of a solar cell.
- crystalline silicon solar cells use a P-type silicon substrate having a thickness of 180 ⁇ 220 ⁇ m.
- An N-type impurity layer having a thickness of 0.2 ⁇ 0.6 ⁇ m is formed on the front surface of the P-type silicon substrate, and a SiNx layer for antireflection and a front electrode are sequentially formed on the N-type impurity layer.
- an aluminum electrode is formed on the back surface of the P-type silicon substrate. This aluminum electrode is formed by applying aluminum paste using screen printing or the like, drying the applied aluminum paste and then two-stage-firing the dried aluminum paste at low temperature (about 600°C) and at high temperature (800 ⁇ 950°C).
- an Al-Si alloy layer is formed while aluminum diffuses into the P-type silicon substrate.
- This Al-Si alloy layer forms a back surface field (BSF) layer preventing the recoupling of electrons generated from a solar cell and improving the collection efficiency of carriers generated from the solar cell.
- the efficiency of the solar cell is influenced by the thickness and uniformity of the BSF layer. That is, when the thickness of the BSF layer is decreased, the efficiency of the solar cell is decreased, and when the thickness thereof is increased, the efficiency thereof is increased.
- the thickness of a silicon wafer has been recently decreased in order to reduce the cost of solar cells.
- the silicon wafer bows due to the difference in the expansion coefficient between the silicon wafer and aluminum, and thus the silicon wafer cracks.
- the thickness of an aluminum electrode that functions as a back electrode it is required to decrease the thickness of an aluminum electrode that functions as a back electrode, and this purpose can be accomplished by decreasing the amount of aluminum paste applied.
- the thickness of the BSF layer which is a back electric field layer, is decreased, so that the efficiency of the solar cell is deteriorated, and aluminum balls and/or bumps are increasingly formed in an electrode layer during a co-firing process.
- the aluminum balls and/or bumps formed in the electrode layer decrease the flatness of the back surface of the silicon wafer, and stress is focused on these aluminum balls and/or bumps, thereby causing the solar cell to break during the solar cell manufacturing process or solar cell module manufacturing process.
- Korean Patent Registration No. 10-0825580 discloses aluminum paste including aluminum powder having a particle size of 0.5 ⁇ 10 ⁇ m, an organic vehicle and a metal alkoxide
- Korean Unexamined Patent Application Publication No. 10-2008-0068638 discloses aluminum paste including aluminum powder having a particle size of 2 ⁇ 20 ⁇ m, glass frit, an organic vehicle and a metal hydroxide
- Korean Unexamined Patent Application Publication No. 10-2008-0057230 discloses aluminum paste including aluminum powder having a particle size of 2 ⁇ 20 ⁇ m, glass frit, an organic vehicle and a plasticizer
- Korean Unexamined Patent Application Publication No. 10-2008-0104179 discloses aluminum paste including aluminum powder having a particle size of 4 ⁇ 10 ⁇ m, alkaline glass frit, boron ethoxide, titanium ethoxide, and fumed silica.
- All of the aluminum pastes disclosed in the above patent documents include organic or inorganic additives in addition to aluminum powder, glass frit and an organic vehicle.
- these additives are problematic because they exist as residues or include pores during a process of co-firing aluminum paste, so that the resistance and uniformity of the aluminum paste is decreased, thereby badly influencing the efficiency of a solar cell.
- the above aluminum pastes are problematic because aluminum powder has a maximum particle size of 10 ⁇ 20 ⁇ m, so that it is difficult for aluminum paste to uniformly come into contact with the textured back surface of a solar cell, with the result that aluminum bumps can be probably formed by pores formed therein.
- an object of the present invention is to provide aluminum paste for a back electrode of a solar cell, which can prevent the bowing of a solar cell and minimize the formation of aluminum balls and/or bumps and the occurrence of yellow discoloration during a co-firing process, which can greatly increase the values of short circuit current (Isc) and open circuit voltage (Voc), and which can remarkably improve the efficiency of a solar cell.
- Isc short circuit current
- Voc open circuit voltage
- an aspect of the present invention provides aluminum paste for a back electrode of a solar cell, including, based on the total amount thereof: 65 ⁇ 75 wt% of aluminum powder having an average particle size distribution of 0.01 ⁇ 5 ⁇ m; 0.01 ⁇ 5 wt% of glass frit; and 20 ⁇ 34.90 wt% of an organic vehicle solution.
- Another aspect of the present invention provides a method of manufacturing a solar cell, including a process of forming a back electrode using the aluminum paste.
- the contact between aluminum paste and a textured silicon wafer has improved, the bowing of a solar cell can be prevented and the formation of aluminum balls and/or bumps and the occurrence of yellow discoloration can be minimized during the co-firing process, the values of short circuit current (Isc) and open circuit voltage (Voc) can be greatly increased, and the efficiency of a solar cell can be remarkably improved.
- the present invention provides aluminum paste for a back electrode of a solar cell, including, based on the total amount thereof: 65 ⁇ 75 wt% of aluminum powder having an average particle size distribution of 0.01 ⁇ 5 ⁇ m; 0.01 ⁇ 5 wt% of glass frit; and 20 ⁇ 34.90 wt% of an organic vehicle solution.
- the aluminum powder used in the aluminum paste of the present invention may have an average particle size distribution of 0.01 ⁇ 5 ⁇ m.
- the surfaces of silicon solar cells are textured in order to enlarge the area that receives the solar light.
- a monocrystalline silicon wafer is textured in the form of a pyramid, and the pyramid has a height of 2 ⁇ 15 ⁇ m and a width of 2 ⁇ 20 ⁇ m.
- a polycrystalline silicon wafer is textured in the form of an irregular maze.
- the textured silicon wafer is coated on the back surface thereof with aluminum paste by screen printing, gravure printing or offset printing, dried, and then co-fired to form an aluminum electrode.
- the average particle size distribution of aluminum powder included in the aluminum paste be 0.01 ⁇ 5 ⁇ m.
- the average particle size of aluminum powder is smaller than 0.01 ⁇ m, there is a problem in that aluminum bumps occur during the co-firing process conducted after the printing process, and the silicon wafer becomes increasingly bowed. Further, when the average particle size thereof is greater than 5 ⁇ m, the packing factor of aluminum particles decreases, thus decreasing the efficiency of the solar cell.
- the solar cell manufactured in this way is advantageous in that yellow discoloration occurring in the aluminum electrode after the co-firing process can be prevented.
- aluminum powder having an particle size distribution of 0.01 ⁇ 5 ⁇ m may be used.
- the aluminum powder may be included in an amount of 65 ⁇ 75 wt%.
- the amount of the aluminum powder included in the aluminum paste is below 65 wt%, there is a problem in that the aluminum layer printed after the calicination process becomes thin, so that a back surface field (BSF) layer is not sufficiently formed, thereby decreasing the efficiency of a solar cell.
- BSF back surface field
- the amount of the aluminum powder included therein is greater than 75 wt%, there is a problem in that the printed aluminum layer becomes excessively thick, thereby causing the silicon wafer to bow.
- the glass frit may be included in an amount of 0.01 ⁇ 5 wt%, preferably 0.05 ⁇ 3 wt%, more preferably 0.1 ⁇ 1 wt%.
- the glass frit may be Bi 2 O 3 -SiO 2 -Al 2 O 3 -B 2 O 3 -SrO.
- the glass frit may include, but is not limited to, 20 ⁇ 30 mol% of Bi 2 O 3 , 5 ⁇ 15 mol% of Al 2 O 3 , 25 ⁇ 35 mol% of SiO 2 , 1 ⁇ 10 mol% of SrO, and 20 ⁇ 40 mol% of B 2 O 3 .
- the softening point of the glass frit is increased, so that the aluminum paste is not softened enough during the co-firing process, with the result that the adhesion between the aluminum paste and the silicon wafer decreases, thereby decreasing the efficiency of the solar cell.
- the glass frit includes an excessive amount of SrO, the softening point of the glass frit is excessively lowered, resulting in bumps in the aluminum electrode.
- the glass frit used in the present invention may have a softening point of 400 ⁇ 600°C.
- the softening point of the glass frit When the softening point of the glass frit is below 400°C, the thermal expansion coefficient of the glass frit is relatively increased, and thus the silicon wafer co-fired during the solar cell manufacturing process easily bows. Further, when the softening point thereof is above 600°C, the glass frit does not sufficiently melt in the co-firing process to such a degree that the adhesion is provided between the aluminum layer and the silicon wafer layer, thus deteriorating the adhesion therebetween.
- the aluminum paste of the present invention may include, based on the total amount thereof, 20 ⁇ 34.90 wt% of an organic vehicle solution.
- the organic vehicle solution is prepared by dissolving a polymer resin in an organic solvent, and, if necessary, may include a thixotropic agent, a wetting agent, an additive and the like.
- the organic vehicle solution used in the present invention may include, based on the total amount thereof, 75 wt% or more of an organic solvent, 1 ⁇ 30 wt% of a polymer resin, 5 wt% or less of a wetting agent and a thixotropic agent, and 1 ⁇ 10 wt% of an additive.
- the organic solvent may have a boiling point of 150 ⁇ 300°C such that it is possible to prevent the aluminum paste from drying and to control the flowability of the aluminum paste.
- Examples of commonly-used organic solvents may include glycol ethers, such as tripropyleneglycol methyl ether, dipropyleneglycol n-propyl ether, dipropyleneglycol n-butyl ether, tripropyleneglycol n-butyl ether, propyleneglycol phenyl ether, diethyleneglycol ethyl ether, diethyleneglycol n-butyl ether, diethyleneglycol hexyl ether, ethyleneglycol hexyl ether, triethyleneglycol methyl ether, triethyleneglycol ethyl ether, triethyleneglycol n-butyl ether, ethyleneglycol phenyl ether, terpineol, Texanol®, ethyleneglycol,
- the polymer resin may include polyvinylpyrrolidone, polyvinylalcohol, polyethyleneglycol, ethylcellulose, rosin, a phenol resin, an acrylate resin, and the like.
- the amount of the polymer may be 1 ⁇ 30 wt%, preferably, 5 ⁇ 25 wt%, based on the total amount of the organic vehicle solution.
- the amount of the polymer resin is below 1 wt%, the printability and dispersion stability of the aluminum paste are deteriorated. Further, the amount thereof is above 30 wt%, the aluminum paste cannot be printed.
- thixotropic agent and wetting agent thixotropic agents and wetting agents commonly used in the related field may be used without limitation.
- the additive may be a dispersant or the like commonly used in the related field.
- the dispersant commercially available surfactants may be used, and they may be used independently or in combination with each other.
- the surfactants may include: nonionic surfactants, such as ethers including alkyl polyoxyethylene ether, alkylaryl polyoxyethylene ether, polyoxyethylene-polyoxypropylene copolymer and the like, ester-ethers including polyoxyethylene ether of glycerin ester, polyoxyethylene ether of sorbitan ester, polyoxyethylene ether of sorbitol ester and the like, esters including polyethylene glycol fatty acid ester, glycerin ester, sorbitan ester, propylene glycol ester, sugar ester, alkyl polyglucoside and the like, and nitrogen-containing surfactants including fatty acid alkanolamide, polyoxyethylene fatty acid amide, polyoxyethylene alkylamine, amine oxide and the like; and polymeric surfact
- Examples of commercially available surfactant products may include hypermer KD (manufactured by Uniqema Corp.), AKM 0531 (manufactured by NOF Corp.), KP (manufactured by Shinetsu Kagaku Kogyo Corp.), POLYFLOW (manufactured by Kyoei Kagaku Corp.), EFTOP (manufactured by Tokemu Products Corp.), Asahi guard, Surflon (manufactured by Asahi Glass Corp.), SOLSPERSE (manufactured by Geneka Corp.), EFKA (manufactured by EFKA Chemicals Co., Ltd.), PB 821 (manufactured by Ajinomoto Co., Inc.), BYK-184, BYK-185, BYK-2160, Anti-Terra U (manufactured by BYK Corp.), and the like.
- the amount of the dispersant may be 1 ⁇ 10 wt%, preferably, 1 ⁇ 5 wt%, based on the total amount of the organic vehicle solution.
- the aluminum paste according to the present invention can be easily prepared using a planar mixer which simultaneously rotates and revolves. That is, this aluminum paste can be prepared by putting the above-mentioned components into a planar mixer in the corresponding composition ratio and then stirring and then properly mixing and dispersing the solids in an organic vehicle solution.
- the aluminum paste prepared in this way has a viscosity of 20,000 ⁇ 200,000 cps at 5 rpm when its viscosity was measured at 25°C using a Brookfield HBDV-III Ultra Rheometer or a spindle CPE-52.
- the aluminum paste may be prepared such that it has a viscosity of 40,000 ⁇ 100,000 cps.
- the present invention provides a method of manufacturing a solar cell, including the step of forming a back electrode using the aluminum paste.
- the solar cell manufactured in this way is advantageous in that it does not easily bows, and the minimum amount of aluminum balls and/or bumps are formed in the electrode layer, so that the values of short circuit current (Isc) and open circuit voltage (Voc) are greatly increased, and the efficiency thereof is remarkably improved.
- Aluminum paste was prepared in the same manner as in Example 1, except that 65 wt% of aluminum powder having an average particle size distribution of 0.04 ⁇ 5 ⁇ m and 34.5 wt% of an organic vehicle solution were added.
- Aluminum paste was prepared in the same manner as in Example 1, except that 75 wt% of aluminum powder having an average particle size distribution of 0.04 ⁇ 5 ⁇ m and 24.5 wt% of an organic vehicle solution were added.
- Aluminum paste was prepared in the same manner as in Example 1, except that the glass frit was replace by glass frit having the composition ratio given in Table 2 below.
- Aluminum paste was prepared in the same manner as in Example 1, except that 76 wt% of aluminum powder having an average particle size distribution of 0.04 ⁇ 5 ⁇ m and 23.5 wt% of an organic vehicle solution were added.
- Aluminum paste was prepared in the same manner as in Example 1, except that aluminum powder having an average particle size distribution of 2 ⁇ 10 ⁇ m was used instead of the aluminum powder having an average particle size distribution of 0.04 ⁇ 5 ⁇ m.
- Aluminum paste was prepared in the same manner as in Example 1, except that aluminum powder having an average particle size distribution of 5 ⁇ 15 ⁇ m was used instead of the aluminum powder having an average particle size distribution of 0.04 ⁇ 5 ⁇ m.
- Test Example Manufacturing a solar cell and testing characteristics thereof
- a monocrystalline silicon wafer having a size of 156 X 156 mm and a thickness of 200 ⁇ m was surface-textured such that the height of a pyramid is about 4 ⁇ 6 ⁇ m, and then the N-side of the surface-textured silicon wafer was coated with SiNx.
- bus bars were printed on the back surface of the silicon wafer using silver paste and then dried, and then aluminum paste of each of Examples 1 to 3 and Comparative Examples 1 to 4 was applied thereon using a screen printing plate of 250 mesh such that the weight of the aluminum paste was 1.5 ⁇ 0.1 g and then dried. Further, finger lines were printed on the front surface of the silicon wafer using silver paste and then dried.
- the silicon wafer that had undergone the above processes was co-fired in a continuous infrared furnace such that the temperature of a firing zone was 720 ⁇ 900°C, thereby manufacturing a solar cell.
- the front and back surface of the silicon wafer can be simultaneously co-fired while passing through a belt furnace.
- the belt furnace includes a burn-out zone of about 600°C and a firing zone of 800 ⁇ 950°C.
- organic matter was removed from the aluminum paste and the silver paste, and then the aluminum paste and silver paste applied on the back surface and front surface of the silicon wafer were melted to form electrodes.
- the degree of bowing of the manufactured solar cell was evaluated by matching four edges of the solar cell with the bottom and then measuring to what degree the central portion thereof had been lifted. Further, the occurrence of bumps and aluminum balls around an aluminum back electrode was observed with the naked eye, and the number thereof was counted. The results thereof are given in Table 3 below.
- the efficiency of the manufactured solar cell was evaluated using an SCM-1000, which is an apparatus for evaluating the performance of solar cells, manufactured by FitTech Corporation. The results thereof are given in Table 4 below.
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Dispersion Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Sustainable Development (AREA)
- Sustainable Energy (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Photovoltaic Devices (AREA)
- Conductive Materials (AREA)
Abstract
Description
- The present invention relates to aluminum paste for a back electrode of a solar cell.
- Generally, crystalline silicon solar cells use a P-type silicon substrate having a thickness of 180 ~ 220μm. An N-type impurity layer having a thickness of 0.2 ~ 0.6μm is formed on the front surface of the P-type silicon substrate, and a SiNx layer for antireflection and a front electrode are sequentially formed on the N-type impurity layer. Further, an aluminum electrode is formed on the back surface of the P-type silicon substrate. This aluminum electrode is formed by applying aluminum paste using screen printing or the like, drying the applied aluminum paste and then two-stage-firing the dried aluminum paste at low temperature (about 600℃) and at high temperature (800 ~ 950℃). In this co-firing process, an Al-Si alloy layer is formed while aluminum diffuses into the P-type silicon substrate. This Al-Si alloy layer forms a back surface field (BSF) layer preventing the recoupling of electrons generated from a solar cell and improving the collection efficiency of carriers generated from the solar cell. The efficiency of the solar cell is influenced by the thickness and uniformity of the BSF layer. That is, when the thickness of the BSF layer is decreased, the efficiency of the solar cell is decreased, and when the thickness thereof is increased, the efficiency thereof is increased.
- Meanwhile, the thickness of a silicon wafer has been recently decreased in order to reduce the cost of solar cells. However, when the thickness of the silicon wafer is excessively decreased, the silicon wafer bows due to the difference in the expansion coefficient between the silicon wafer and aluminum, and thus the silicon wafer cracks.
- In order to overcome the above problem, it is required to decrease the thickness of an aluminum electrode that functions as a back electrode, and this purpose can be accomplished by decreasing the amount of aluminum paste applied. However, when a smaller amount of aluminum paste is applied, the thickness of the BSF layer, which is a back electric field layer, is decreased, so that the efficiency of the solar cell is deteriorated, and aluminum balls and/or bumps are increasingly formed in an electrode layer during a co-firing process. In this case, the aluminum balls and/or bumps formed in the electrode layer decrease the flatness of the back surface of the silicon wafer, and stress is focused on these aluminum balls and/or bumps, thereby causing the solar cell to break during the solar cell manufacturing process or solar cell module manufacturing process.
- In order to prevent the solar cell from bowing and to form fewer aluminum balls during the co-firing process, conventional technologies are proposed as follows. Korean Patent Registration No. 10-0825580 discloses aluminum paste including aluminum powder having a particle size of 0.5 ~ 10μm, an organic vehicle and a metal alkoxide; Korean Unexamined Patent Application Publication No. 10-2008-0068638 discloses aluminum paste including aluminum powder having a particle size of 2 ~ 20μm, glass frit, an organic vehicle and a metal hydroxide; Korean Unexamined Patent Application Publication No. 10-2008-0057230 discloses aluminum paste including aluminum powder having a particle size of 2 ~ 20μm, glass frit, an organic vehicle and a plasticizer; and Korean Unexamined Patent Application Publication No. 10-2008-0104179 discloses aluminum paste including aluminum powder having a particle size of 4 ~ 10μm, alkaline glass frit, boron ethoxide, titanium ethoxide, and fumed silica.
- All of the aluminum pastes disclosed in the above patent documents include organic or inorganic additives in addition to aluminum powder, glass frit and an organic vehicle. However, these additives are problematic because they exist as residues or include pores during a process of co-firing aluminum paste, so that the resistance and uniformity of the aluminum paste is decreased, thereby badly influencing the efficiency of a solar cell. Further, the above aluminum pastes are problematic because aluminum powder has a maximum particle size of 10 ~ 20μm, so that it is difficult for aluminum paste to uniformly come into contact with the textured back surface of a solar cell, with the result that aluminum bumps can be probably formed by pores formed therein.
- Accordingly, the present invention has been made keeping in mind the above problems occurring in the prior art, and an object of the present invention is to provide aluminum paste for a back electrode of a solar cell, which can prevent the bowing of a solar cell and minimize the formation of aluminum balls and/or bumps and the occurrence of yellow discoloration during a co-firing process, which can greatly increase the values of short circuit current (Isc) and open circuit voltage (Voc), and which can remarkably improve the efficiency of a solar cell.
- In order to accomplish the above object, an aspect of the present invention provides aluminum paste for a back electrode of a solar cell, including, based on the total amount thereof: 65 ~ 75 wt% of aluminum powder having an average particle size distribution of 0.01 ~ 5 μm; 0.01 ~ 5 wt% of glass frit; and 20 ~ 34.90 wt% of an organic vehicle solution.
- Another aspect of the present invention provides a method of manufacturing a solar cell, including a process of forming a back electrode using the aluminum paste.
- According to the aluminum paste of the present invention, since the contact between aluminum paste and a textured silicon wafer has improved, the bowing of a solar cell can be prevented and the formation of aluminum balls and/or bumps and the occurrence of yellow discoloration can be minimized during the co-firing process, the values of short circuit current (Isc) and open circuit voltage (Voc) can be greatly increased, and the efficiency of a solar cell can be remarkably improved.
- The present invention provides aluminum paste for a back electrode of a solar cell, including, based on the total amount thereof: 65 ~ 75 wt% of aluminum powder having an average particle size distribution of 0.01 ~ 5 μm; 0.01 ~ 5 wt% of glass frit; and 20 ~ 34.90 wt% of an organic vehicle solution.
- The aluminum powder used in the aluminum paste of the present invention may have an average particle size distribution of 0.01 ~ 5 μm.
- Generally, the surfaces of silicon solar cells are textured in order to enlarge the area that receives the solar light. Generally, a monocrystalline silicon wafer is textured in the form of a pyramid, and the pyramid has a height of 2 ~15 μm and a width of 2 ~ 20 μm. In contrast, a polycrystalline silicon wafer is textured in the form of an irregular maze. The textured silicon wafer is coated on the back surface thereof with aluminum paste by screen printing, gravure printing or offset printing, dried, and then co-fired to form an aluminum electrode. In this process, when the size of aluminum particles is excessively large, aluminum paste does not easily come into contact with the silicon wafer, and thus a gap is formed between aluminum paste and the textured surface of the silicon wafer after being printed and dried. During the co-firing process, the gab moves to the surface of an aluminum electrode through the aluminum paste layer, being accompanied by the occurrence of aluminum balls and/or bumps. Therefore, it is preferred that the average particle size distribution of aluminum powder included in the aluminum paste be 0.01 ~ 5μm. When the average particle size of aluminum powder is smaller than 0.01μm, there is a problem in that aluminum bumps occur during the co-firing process conducted after the printing process, and the silicon wafer becomes increasingly bowed. Further, when the average particle size thereof is greater than 5μm, the packing factor of aluminum particles decreases, thus decreasing the efficiency of the solar cell.
- When aluminum paste is prepared using aluminum powder having the average particle size distribution, the aluminum paste deeply infiltrates into the textured silicon wafer, and the porosity in the aluminum paste also decreases. For this reason, a back surface field (BSF) layer is uniformly formed on the silicon wafer, the resistance of an aluminum electrode becomes low, and the bowing of the silicon wafer is prevented. Therefore, when a solar cell is manufactured using the aluminum paste prepared using the aluminum powder, the value of the short-circuit current of the solar cell increases, and the efficiency thereof also increases. Further, the solar cell manufactured in this way is advantageous in that yellow discoloration occurring in the aluminum electrode after the co-firing process can be prevented.
- Further, in the aluminum paste of the present invention, aluminum powder having an particle size distribution of 0.01 ~ 5 μm may be used.
- In the aluminum paste of the present invention, the aluminum powder may be included in an amount of 65 ~ 75 wt%. When the amount of the aluminum powder included in the aluminum paste is below 65 wt%, there is a problem in that the aluminum layer printed after the calicination process becomes thin, so that a back surface field (BSF) layer is not sufficiently formed, thereby decreasing the efficiency of a solar cell. Further, when the amount of the aluminum powder included therein is greater than 75 wt%, there is a problem in that the printed aluminum layer becomes excessively thick, thereby causing the silicon wafer to bow.
- In the aluminum paste of the present invention, the glass frit may be included in an amount of 0.01 ~ 5 wt%, preferably 0.05 ~ 3 wt%, more preferably 0.1 ~ 1 wt%.
- The glass frit may be Bi2O3-SiO2-Al2O3-B2O3-SrO. The glass frit may include, but is not limited to, 20 ~ 30 mol% of Bi2O3, 5 ~ 15 mol% of Al2O3, 25 ~ 35 mol% of SiO2, 1 ~ 10 mol% of SrO, and 20 ~ 40 mol% of B2O3.
- In the glass frit, SrO is effectively used to lower the softening point of the glass frit. When the glass frit does not include SrO, the softening point of the glass frit is increased, so that the aluminum paste is not softened enough during the co-firing process, with the result that the adhesion between the aluminum paste and the silicon wafer decreases, thereby decreasing the efficiency of the solar cell. However, when the glass frit includes an excessive amount of SrO, the softening point of the glass frit is excessively lowered, resulting in bumps in the aluminum electrode.
- Further, the glass frit used in the present invention may have a softening point of 400 ~ 600℃. When the softening point of the glass frit is below 400℃, the thermal expansion coefficient of the glass frit is relatively increased, and thus the silicon wafer co-fired during the solar cell manufacturing process easily bows. Further, when the softening point thereof is above 600℃, the glass frit does not sufficiently melt in the co-firing process to such a degree that the adhesion is provided between the aluminum layer and the silicon wafer layer, thus deteriorating the adhesion therebetween.
- The aluminum paste of the present invention may include, based on the total amount thereof, 20 ~ 34.90 wt% of an organic vehicle solution. The organic vehicle solution is prepared by dissolving a polymer resin in an organic solvent, and, if necessary, may include a thixotropic agent, a wetting agent, an additive and the like.
- The organic vehicle solution used in the present invention may include, based on the total amount thereof, 75 wt% or more of an organic solvent, 1 ~ 30 wt% of a polymer resin, 5 wt% or less of a wetting agent and a thixotropic agent, and 1 ~ 10 wt% of an additive.
- The organic solvent may have a boiling point of 150 ~ 300℃ such that it is possible to prevent the aluminum paste from drying and to control the flowability of the aluminum paste. Examples of commonly-used organic solvents may include glycol ethers, such as tripropyleneglycol methyl ether, dipropyleneglycol n-propyl ether, dipropyleneglycol n-butyl ether, tripropyleneglycol n-butyl ether, propyleneglycol phenyl ether, diethyleneglycol ethyl ether, diethyleneglycol n-butyl ether, diethyleneglycol hexyl ether, ethyleneglycol hexyl ether, triethyleneglycol methyl ether, triethyleneglycol ethyl ether, triethyleneglycol n-butyl ether, ethyleneglycol phenyl ether, terpineol, Texanol®, ethyleneglycol, and the like.
- Examples of the polymer resin may include polyvinylpyrrolidone, polyvinylalcohol, polyethyleneglycol, ethylcellulose, rosin, a phenol resin, an acrylate resin, and the like. The amount of the polymer may be 1 ~ 30 wt%, preferably, 5 ~ 25 wt%, based on the total amount of the organic vehicle solution. When the amount of the polymer resin is below 1 wt%, the printability and dispersion stability of the aluminum paste are deteriorated. Further, the amount thereof is above 30 wt%, the aluminum paste cannot be printed.
- As the thixotropic agent and wetting agent, thixotropic agents and wetting agents commonly used in the related field may be used without limitation.
- The additive may be a dispersant or the like commonly used in the related field. As the dispersant, commercially available surfactants may be used, and they may be used independently or in combination with each other. Examples of the surfactants may include: nonionic surfactants, such as ethers including alkyl polyoxyethylene ether, alkylaryl polyoxyethylene ether, polyoxyethylene-polyoxypropylene copolymer and the like, ester-ethers including polyoxyethylene ether of glycerin ester, polyoxyethylene ether of sorbitan ester, polyoxyethylene ether of sorbitol ester and the like, esters including polyethylene glycol fatty acid ester, glycerin ester, sorbitan ester, propylene glycol ester, sugar ester, alkyl polyglucoside and the like, and nitrogen-containing surfactants including fatty acid alkanolamide, polyoxyethylene fatty acid amide, polyoxyethylene alkylamine, amine oxide and the like; and polymeric surfactants, such as polyvinyl alcohol, polyvinyl pyrrolidone, polyacrylic acid, polyacrylic acid-maleic acid compolymers, poly-12-hydroxystearic acid and the like.
- Examples of commercially available surfactant products may include hypermer KD (manufactured by Uniqema Corp.), AKM 0531 (manufactured by NOF Corp.), KP (manufactured by Shinetsu Kagaku Kogyo Corp.), POLYFLOW (manufactured by Kyoei Kagaku Corp.), EFTOP (manufactured by Tokemu Products Corp.), Asahi guard, Surflon (manufactured by Asahi Glass Corp.), SOLSPERSE (manufactured by Geneka Corp.), EFKA (manufactured by EFKA Chemicals Co., Ltd.), PB 821 (manufactured by Ajinomoto Co., Inc.), BYK-184, BYK-185, BYK-2160, Anti-Terra U (manufactured by BYK Corp.), and the like.
- The amount of the dispersant may be 1 ~ 10 wt%, preferably, 1 ~ 5 wt%, based on the total amount of the organic vehicle solution.
- The aluminum paste according to the present invention can be easily prepared using a planar mixer which simultaneously rotates and revolves. That is, this aluminum paste can be prepared by putting the above-mentioned components into a planar mixer in the corresponding composition ratio and then stirring and then properly mixing and dispersing the solids in an organic vehicle solution. The aluminum paste prepared in this way has a viscosity of 20,000 ~ 200,000 cps at 5 rpm when its viscosity was measured at 25℃ using a Brookfield HBDV-III Ultra Rheometer or a spindle CPE-52. Preferably, the aluminum paste may be prepared such that it has a viscosity of 40,000 ~ 100,000 cps.
- Further, the present invention provides a method of manufacturing a solar cell, including the step of forming a back electrode using the aluminum paste.
- The solar cell manufactured in this way is advantageous in that it does not easily bows, and the minimum amount of aluminum balls and/or bumps are formed in the electrode layer, so that the values of short circuit current (Isc) and open circuit voltage (Voc) are greatly increased, and the efficiency thereof is remarkably improved.
- Hereinafter, the present invention will be described in more detail with reference to the following Examples. However, the following Examples are set forth to illustrate the present invention, and the scope of the present invention is not limited thereto. The following Examples can be properly modified by those skilled in the art without departing from the scope of the invention.
-
- Example 1: Preparation of aluminum paste
- 70 wt% of aluminum powder having an average particle size distribution of 0.04 ~ 5μm, 0.5 wt% of glass frit having a composition ratio given in Table 1 below, and 29.5 wt% of an organic vehicle solution in which ethyl cellulose is dissolved in glycol ether were sequentially mixed with each other to form a mixture, and then the mixture was stirred at a rotation speed of 1000 rpm for 3 minutes using a mixer which simultaneously rotates and revolves to prepare aluminum paste.
- Table 1
Ingredient Mol% Al2O3 6.5% SrO 5.5% Bi2O3 26.0% B2O3 30.0% SiO2 32.0% Tg (transition point) 453 Thermal expansion coefficient (10-7/℃) 77 Tdsp 507 -
- Example 2: Preparation of aluminum paste
- Aluminum paste was prepared in the same manner as in Example 1, except that 65 wt% of aluminum powder having an average particle size distribution of 0.04 ~ 5μm and 34.5 wt% of an organic vehicle solution were added.
-
- Example 3: Preparation of aluminum paste
- Aluminum paste was prepared in the same manner as in Example 1, except that 75 wt% of aluminum powder having an average particle size distribution of 0.04 ~ 5μm and 24.5 wt% of an organic vehicle solution were added.
-
- Comparative Example 1: Preparation of aluminum paste
- Aluminum paste was prepared in the same manner as in Example 1, except that the glass frit was replace by glass frit having the composition ratio given in Table 2 below.
- Table 2
Ingredient Mol% Al2O3 10.91% SrO - Bi2O3 12.94% B2O3 46.93% SiO2 28.61% Tg (transition point) 473 Thermal expansion coefficient (10-7/℃) 73 Tdsp 523 -
- Comparative Example 2: Preparation of aluminum paste
- Aluminum paste was prepared in the same manner as in Example 1, except that 76 wt% of aluminum powder having an average particle size distribution of 0.04 ~ 5μm and 23.5 wt% of an organic vehicle solution were added.
-
- Comparative Example 3: Preparation of aluminum paste
- Aluminum paste was prepared in the same manner as in Example 1, except that aluminum powder having an average particle size distribution of 2 ~ 10μm was used instead of the aluminum powder having an average particle size distribution of 0.04 ~ 5μm.
-
- Comparative Example 4: Preparation of aluminum paste
- Aluminum paste was prepared in the same manner as in Example 1, except that aluminum powder having an average particle size distribution of 5 ~ 15μm was used instead of the aluminum powder having an average particle size distribution of 0.04 ~ 5μm.
-
- Test Example: Manufacturing a solar cell and testing characteristics thereof
- A monocrystalline silicon wafer having a size of 156 X 156 mm and a thickness of 200 μm was surface-textured such that the height of a pyramid is about 4 ~ 6 μm, and then the N-side of the surface-textured silicon wafer was coated with SiNx. Subsequently, bus bars were printed on the back surface of the silicon wafer using silver paste and then dried, and then aluminum paste of each of Examples 1 to 3 and Comparative Examples 1 to 4 was applied thereon using a screen printing plate of 250 mesh such that the weight of the aluminum paste was 1.5 ± 0.1 g and then dried. Further, finger lines were printed on the front surface of the silicon wafer using silver paste and then dried.
- Subsequently, the silicon wafer that had undergone the above processes was co-fired in a continuous infrared furnace such that the temperature of a firing zone was 720 ~ 900℃, thereby manufacturing a solar cell.
- In the co-firing process, the front and back surface of the silicon wafer can be simultaneously co-fired while passing through a belt furnace. Here, the belt furnace includes a burn-out zone of about 600℃ and a firing zone of 800 ~ 950℃. In this belt furnace, organic matter was removed from the aluminum paste and the silver paste, and then the aluminum paste and silver paste applied on the back surface and front surface of the silicon wafer were melted to form electrodes.
- The degree of bowing of the manufactured solar cell was evaluated by matching four edges of the solar cell with the bottom and then measuring to what degree the central portion thereof had been lifted. Further, the occurrence of bumps and aluminum balls around an aluminum back electrode was observed with the naked eye, and the number thereof was counted. The results thereof are given in Table 3 below.
- The efficiency of the manufactured solar cell was evaluated using an SCM-1000, which is an apparatus for evaluating the performance of solar cells, manufactured by FitTech Corporation. The results thereof are given in Table 4 below.
- Table 3
Exp. 1 Exp. 2 Exp. 3 Co. Exp. 1 Co. Exp. 2 Co. Exp. 3 Co. Exp. 4 Al powder 0.04-5 μm 0.04-5 μm .04-5 μm 0.04-5μm 0.04-5μm 2-10 μm 5-15μm Al content 70 wt% 65 wt% 75 wt% 70 wt% 76 wt% 72 wt% 72 wt% bowing (mm) 0.3-0.5 0.3-0.5 0.7-1.2 0.2-0.3 1.8-2.5 1.5-2.0 2.5-3.0 Number of Bump 0 1 - 2 0 5 - 8 0 10 - 12 15 - 20 -
- Table 4
Exp. 1 Exp. 2 Exp. 3 Co. Exp. 1 Co. Exp. 2 Co. Exp. 3 Co. Exp. 4 Pmax (W) 4.16 4.077 4.088 3.899 4.059 3.900 3.889 Efficiency (%) 17.419 17.07 17.11 16.32 16.98 16.32 16.275 FF(%) 78.15 78.2 77.59 77.13 77.24 75.91 77.93 Isc 8.52925 8.415 8.478 8.279 8.475 8.341 8.182 Voc 0.62443 0.6197 0.6125 0.6107 0.6200 0.6159 0.6095 Rs 0.00746 0.00688 0.00719 0.00767 0.00749 0.00796 0.00663 - Pmax = maximum power of solar cell
- Isc = short circuit current (A)
- Voc = open circuit voltage (V)
- Rs = Series Resistance
- FF = Fill Factor
-
- Although the preferred embodiments of the present invention have been disclosed for illustrative purposes, those skilled in the art will appreciate that various modifications, additions and substitutions are possible, without departing from the scope and spirit of the invention as disclosed in the accompanying claims.
Claims (5)
- Aluminum paste for a back electrode of a solar cell, comprising, based on the total amount thereof:65 ~ 75 wt% of aluminum powder having an average particle size distribution of 0.01 ~ 5 μm;0.01 ~ 5 wt% of glass frit; and20 ~ 34.90 wt% of an organic vehicle solution.
- The aluminum paste according to claim 1, wherein the glass frit is Bi2O3-SiO2-Al2O3-B2O3-SrO.
- The aluminum paste according to claim 2, wherein the glass frit comprises 20 ~ 30 mol% of Bi2O3, 5 ~ 15 mol% of Al2O3, 25 ~ 35 mol% of SiO2, 1 ~ 10 mol% of SrO, and 20 ~ 40 mol% of B2O3.
- The aluminum paste according to claim 3, wherein the glass frit has a softening point of 400 ~ 600℃.
- A method of manufacturing a solar cell, comprising a process of forming a back electrode using the aluminum paste of claim 1.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20090083460 | 2009-09-04 | ||
KR1020100085604A KR20110025614A (en) | 2009-09-04 | 2010-09-01 | Aluminium paste for a back electrode of solar cell |
PCT/KR2010/005998 WO2011028058A2 (en) | 2009-09-04 | 2010-09-03 | Aluminum paste for a back electrode of solar cell |
Publications (2)
Publication Number | Publication Date |
---|---|
EP2474040A2 true EP2474040A2 (en) | 2012-07-11 |
EP2474040A4 EP2474040A4 (en) | 2013-05-22 |
Family
ID=43933110
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP10813967.6A Withdrawn EP2474040A4 (en) | 2009-09-04 | 2010-09-03 | Aluminum paste for a back electrode of solar cell |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP2474040A4 (en) |
JP (1) | JP2013504199A (en) |
KR (1) | KR20110025614A (en) |
CN (1) | CN102549760A (en) |
TW (1) | TW201133508A (en) |
WO (1) | WO2011028058A2 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101276669B1 (en) * | 2011-07-15 | 2013-06-19 | 주식회사 케이씨씨 | Back contact composition for silicon solar cell comprising metal-containing organic additive |
EP2590177B1 (en) * | 2011-11-04 | 2015-08-12 | Heraeus Precious Metals North America Conshohocken LLC | Organic vehicle for electroconductive paste |
CN105051830B (en) * | 2013-03-27 | 2017-03-08 | 第一毛织株式会社 | Form constituent and the electrode with the preparation of described constituent of solar cel electrode |
RU2531519C1 (en) * | 2013-05-27 | 2014-10-20 | Закрытое акционерное общество "Монокристалл" ЗАО "Монокристалл" | Aluminium paste for silicon solar cells |
JP2015115400A (en) * | 2013-12-10 | 2015-06-22 | 東洋アルミニウム株式会社 | Conductive aluminum paste |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1739690A1 (en) * | 2004-07-01 | 2007-01-03 | Toyo Aluminium Kabushiki Kaisha | Paste composition and solar cell element employing same |
WO2007046199A1 (en) * | 2005-10-18 | 2007-04-26 | Toyo Aluminium Kabushiki Kaisha | Aluminum paste composition and solar cell device making use of the same |
EP1939943A1 (en) * | 2005-10-20 | 2008-07-02 | Toyo Aluminium Kabushiki Kaisha | Paste composition and solar battery element using the same |
US20090120490A1 (en) * | 2007-11-14 | 2009-05-14 | Gigastorge Corporation | Solar cell |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8076570B2 (en) * | 2006-03-20 | 2011-12-13 | Ferro Corporation | Aluminum-boron solar cell contacts |
KR101280489B1 (en) * | 2007-05-09 | 2013-07-01 | 주식회사 동진쎄미켐 | A paste for producing electrode of solar cell |
-
2010
- 2010-09-01 KR KR1020100085604A patent/KR20110025614A/en not_active Application Discontinuation
- 2010-09-03 JP JP2012527829A patent/JP2013504199A/en active Pending
- 2010-09-03 TW TW099129884A patent/TW201133508A/en unknown
- 2010-09-03 WO PCT/KR2010/005998 patent/WO2011028058A2/en active Application Filing
- 2010-09-03 CN CN2010800426748A patent/CN102549760A/en active Pending
- 2010-09-03 EP EP10813967.6A patent/EP2474040A4/en not_active Withdrawn
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1739690A1 (en) * | 2004-07-01 | 2007-01-03 | Toyo Aluminium Kabushiki Kaisha | Paste composition and solar cell element employing same |
WO2007046199A1 (en) * | 2005-10-18 | 2007-04-26 | Toyo Aluminium Kabushiki Kaisha | Aluminum paste composition and solar cell device making use of the same |
EP1939943A1 (en) * | 2005-10-20 | 2008-07-02 | Toyo Aluminium Kabushiki Kaisha | Paste composition and solar battery element using the same |
US20090120490A1 (en) * | 2007-11-14 | 2009-05-14 | Gigastorge Corporation | Solar cell |
Non-Patent Citations (1)
Title |
---|
See also references of WO2011028058A2 * |
Also Published As
Publication number | Publication date |
---|---|
TW201133508A (en) | 2011-10-01 |
KR20110025614A (en) | 2011-03-10 |
JP2013504199A (en) | 2013-02-04 |
WO2011028058A2 (en) | 2011-03-10 |
CN102549760A (en) | 2012-07-04 |
EP2474040A4 (en) | 2013-05-22 |
WO2011028058A3 (en) | 2011-07-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2011046360A2 (en) | Aluminum paste for back electrode of solar cell | |
WO2013085112A1 (en) | Paste composition for solar cell electrode and electrode produced therefrom | |
WO2011046365A2 (en) | Silver paste composition and solar cell using same | |
WO2015037933A1 (en) | Composition for forming solar cell electrode and electrode manufactured therefrom | |
WO2012067327A1 (en) | Back contact composition for solar cell | |
KR20140062573A (en) | Electrode paste for solar cell and electrode prepared thereof | |
WO2011078629A2 (en) | Glass frit, paste composition, and solar cell | |
WO2017061764A1 (en) | Paste composition for solar cell front electrode, and solar cell using same | |
EP2474040A2 (en) | Aluminum paste for a back electrode of solar cell | |
WO2018080094A1 (en) | Conductive paste for solar cell electrode and solar cell manufactured by using same | |
KR20120025965A (en) | Zno-based glass frit composition and aluminium paste composition for rear contacts of solar cell using the same | |
WO2016137059A1 (en) | Silver paste composition, front electrode for solar cell formed using it, and solar cell employing it | |
WO2014098351A1 (en) | Composition for forming solar cell electrode and electrode produced from same | |
WO2013100254A1 (en) | Inorganic additives for forming front surface electrode and silicon solar cell manufactured using same | |
WO2011028035A2 (en) | Solar cell and paste composition for the same | |
WO2017183881A1 (en) | Paste composition for rear surface electrode of solar cell | |
WO2012148021A1 (en) | Aluminum paste composition for achieving low bowing and high performance for a silicon solar battery | |
WO2019088520A2 (en) | Conductive paste for solar cell electrode, glass frit contained therein, and solar cell | |
WO2017074150A1 (en) | Electrode paste for solar cell and solar cell prepared by using same | |
WO2017074151A1 (en) | Electrode paste composition for solar cell and solar cell prepared by means of same | |
WO2018097479A1 (en) | Solar cell electrode conductive paste composition, and solar cell comprising electrode manufactured by using same | |
KR101053913B1 (en) | Conductive paste composition and manufacturing method of electrode for solar cell using same | |
KR20140074415A (en) | Manufacturing method for back contact of solar cell and solar cell device using the same | |
KR20110051451A (en) | New glass composition, the glass frit manufactured with the same and aluminium paste for a back electrode of solar cell comprising the glass frit | |
WO2011028036A2 (en) | Paste composition and electrode of solar cell using the same |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 20120404 |
|
AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR |
|
RIN1 | Information on inventor provided before grant (corrected) |
Inventor name: LEE, SEUNG-YONG Inventor name: HONG, SEUNG-KWON Inventor name: CHOI, HYUNG-SUB Inventor name: LEE, CHANG-MO Inventor name: LIM, DAE-SUNG |
|
DAX | Request for extension of the european patent (deleted) | ||
A4 | Supplementary search report drawn up and despatched |
Effective date: 20130423 |
|
RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01L 31/0224 20060101AFI20130417BHEP Ipc: C03C 8/02 20060101ALI20130417BHEP Ipc: C03C 8/18 20060101ALI20130417BHEP Ipc: H01B 1/22 20060101ALI20130417BHEP |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION HAS BEEN WITHDRAWN |
|
18W | Application withdrawn |
Effective date: 20131105 |