Classifications

• • B—PERFORMING OPERATIONS; TRANSPORTING
  • B31—MAKING ARTICLES OF PAPER, CARDBOARD OR MATERIAL WORKED IN A MANNER ANALOGOUS TO PAPER; WORKING PAPER, CARDBOARD OR MATERIAL WORKED IN A MANNER ANALOGOUS TO PAPER
  • B31B—MAKING CONTAINERS OF PAPER, CARDBOARD OR MATERIAL WORKED IN A MANNER ANALOGOUS TO PAPER
  • B31B50/00—Making rigid or semi-rigid containers, e.g. boxes or cartons
  • B31B50/74—Auxiliary operations
• • B—PERFORMING OPERATIONS; TRANSPORTING
  • B31—MAKING ARTICLES OF PAPER, CARDBOARD OR MATERIAL WORKED IN A MANNER ANALOGOUS TO PAPER; WORKING PAPER, CARDBOARD OR MATERIAL WORKED IN A MANNER ANALOGOUS TO PAPER
  • B31B—MAKING CONTAINERS OF PAPER, CARDBOARD OR MATERIAL WORKED IN A MANNER ANALOGOUS TO PAPER
  • B31B50/00—Making rigid or semi-rigid containers, e.g. boxes or cartons
  • B31B50/006—Controlling; Regulating; Measuring; Improving safety
• • B—PERFORMING OPERATIONS; TRANSPORTING
  • B31—MAKING ARTICLES OF PAPER, CARDBOARD OR MATERIAL WORKED IN A MANNER ANALOGOUS TO PAPER; WORKING PAPER, CARDBOARD OR MATERIAL WORKED IN A MANNER ANALOGOUS TO PAPER
  • B31B—MAKING CONTAINERS OF PAPER, CARDBOARD OR MATERIAL WORKED IN A MANNER ANALOGOUS TO PAPER
  • B31B50/00—Making rigid or semi-rigid containers, e.g. boxes or cartons
  • B31B50/74—Auxiliary operations
  • B31B50/88—Printing; Embossing
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
  • G01B11/00—Measuring arrangements characterised by the use of optical techniques
  • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
  • G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry

Definitions

• the present invention relates to a topography device of a surface of a substrate used for the manufacture of packaging.
• the invention also relates to a method for implementing the topography device according to the invention.
• the invention finally relates to a folder-gluer machine comprising a topography device according to the invention.
• a box of drugs it is known to transform an element into a low specific mass plate by passing it through different machines.
• a sheet of cardboard is an example of a low specific mass plate element.
• a first known transformation is the printing of a sheet of
• This operation consists of depositing or projecting on one side of the sheet drops of ink.
• a second known transformation is the cutting of a sheet of cardboard. This operation consists of cutting shapes in said sheet. Cut shapes are called poses or cutouts. It is also carried out in the cuts to delimit panels and facilitate their subsequent folding. These operations are generally performed in a cutting press.
• a third known transformation is the stamping of a blank.
• This operation involves stamping a cutout to reveal bumps (or protuberances) on a face of said cut, for example, to form Braille characters.
• An example of stamping is disclosed by the Applicant in the patent application EP-A-1932657 whose contents are incorporated by reference in the present description.
• a fourth known transformation is the gluing of a cut.
• This operation consists of depositing or projecting drops of glue on one side of the cut.
• An example of sizing is disclosed in EP-A-1070548, the content of which is also incorporated by reference in the present description.
• a first object of the invention is to overcome the aforementioned drawbacks by providing a device for controlling the correct formation of reliefs on the surface of a substrate traveling at high speed, reliably and compatible with the requirements of detection, identification and dimensional characterization of the reliefs under conditions
• the invention relates to a topography device of a
• a second object of the present invention is to provide a method for implementing a topography device according to the invention.
• the subject of the invention is a method according to claim 7.
• a third object of the present invention is to provide a folder-gluer machine equipped with a topography device according to the invention.
• the invention relates to a folder-gluer machine according to claim 8.
• the topography device defined in claim 1 it is possible to determine the topography of a surface of a substrate which makes it possible to detect, locate and characterize reliefs on the surface of the substrate.
• Figure 1 is a perspective view of a topography device
• Figures 2a and 2c are views of the angles 'b', 'c', 'e' and 'f';
• Figure 3 is an enlarged sectional view of a plate element having a relief
• Figure 4 is a representation of the image seen by the linear camera of the device
• FIG. 5 is a representation of the electrical signal, corresponding to the image of FIG. 3, delivered by the photosensitive elements of the linear camera.
• FIG. 1 there is shown schematically the topography device implemented for measuring three-dimensional characteristics of reliefs present on the surface 2 of a cardboard substrate 1 traveling in a substantially planar path of X axis.
• Reference plane is the plane in which the flat portion of the surface 2 of the substrate 1, that is to say the portion devoid of any relief, is inscribed.
• Y and Z axes define with the X axis an orthonormal reference of the space in which the reference plane is parallel to the XY plane.
• the device comprises a light source 10 capable of projecting
• the light source 10 comprises a coherent light source, typically a laser.
• the structured lighting is obtained by
• the angle of incidence 'a' under which the substrate is illuminated is mean angle that forms the two plane waves with the normal to the substrate.
• the structured lighting is constituted by a network of interference fringes, that is to say a periodic modulation of light intensity at the surface 2 of the substrate 1.
• the interference fringes are rectilinear lines parallel and equidistant in the reference plane, alternately bright and dark.
• the structured lighting can be obtained by projecting the image of a backlit mask by LEDs or by any other means known to those skilled in the art.
• a plurality 'n' of rectilinear straight lines S1, S2, ... Sn parallel and equidistant forms the structured illumination profile.
• the use of structured illumination obtained by laser interferometry makes it possible to project a light beam F with a large depth of field and makes it possible to obtain luminous streaks of constant sharpness and constant pitch throughout the illuminated area of the substrate, despite the fact that oblique illumination.
• the shortest distance between two successive striations formed in the reference plane is called 'p1'.
• the distance 'p1' is between 0.01 mm and 0.3 mm, in the example illustrated, the distance 'p1' is equal to 0.2 mm.
• each streak S extends over a width L at the surface 2 of the substrate 1.
• the width L is between 0.1 mm and 3 mm, in the example shown, the width L is equal to 3 mm.
• the light beam F is projected in a mean direction 12 oblique with respect to the substrate 2 at an angle of incidence 'a'.
• each luminous strip S is a linear segment forming an angle 'b' with the axis X.
• the angle 'b' is between -45 ° and + 45 °, preferably, b is equal to 0 °.
• Sn formed on the surface 2 of the substrate 1 is substantially delimited by a rectangle of length L1 and of width L where L1 is equal to p1 x n.
• This rectangle defines a lighting zone 3 for an observation zone 23.
• the length L1 is between 10 mm and 100 mm, in the example shown, the length L1 is equal to 42 mm.
• the light streaks S1, S2,... Sn are made visible by the well-known phenomenon of diffusion at the impact of the light beam F coming from the light source 10, on the surface 2, also called backscatter or diffuse reflection.
• the device according to the invention also comprises means for measuring the illumination of the surface 2 by said striations S 1 means constituted by a linear camera 20 comprising a linear sensor and an objective (not shown).
• the linear sensor is of CCD or CMOS type.
• the linear camera 20 is a high dynamic camera in order to be able to measure the illumination of any surface, whatever its reflectivity in the observation zone.
• the camera is reduced to a narrow observation band of length L2 and width L3 (not shown), also called measuring line.
• This measurement line is imaged on the linear sensor of the camera 20 thanks to the lens of the latter.
• the width L3 is between 0.01 mm and 0.1 mm.
• the mean direction of observation of the camera 20 is represented by a dotted line 21 forming an angle T with the axis Z (see Figure 2c), the line 21 belongs to the plane XZ and passes through a point A in the middle of the measuring line.
• the angle f is zero.
• observation distance are chosen such that the maximum field angle denoted by 'd' is small, taking into account the length L2 of the observation band, so that the observation direction can be almost perpendicular to the Y axis, over the entire length L2.
• a telecentric-type objective will be used to observe the measurement line in an observation direction
• the angle 'd' is virtually zero.
• the observation distance is for example equal to 100 mm.
• the observation direction is not perpendicular to the Y axis over the entire length L2.
• the variation of the angle d along L2 will take into account the variation of the angle d along L2 and will apply an appropriate correction method using, for example, a calibration on the plane of L2. reference.
• the camera 20 with its linear array of photosensitive elements is located in a plane P intersecting the XY plane and the XZ plane.
• the intersection of the plane P with the plane XY forms an angle 'c' with the axis Y (see Figure 2a).
• the intersection of the plane P with the plane XZ forms an angle 'e' with the axis Z (see Figure 2b).
• the angle 'c' is between -30 ° and + 30 °, preferably 'c' is equal to 0 °.
• the angle 'e' is between -45 ° and + 45 °, preferably 'e' is equal to 0 °.
• the straight streaks S1, S2, ... Sn are orthogonal to the plane P.
• the light source 10 and the linear camera 20 are arranged so that the length L1 is at least equal to the length L2.
• the light source 10 emits preferentially in u ⁇ e length
• the power of such a light source is of the order of 1 to 100 mW.
• the camera 20 is for example a linear camera of a single line of 2048 pixels.
• the one-dimensional image acquired by the camera 20 is stored in a memory 26.
• the data of the memory 26 are used by a triangulation algorithm described below.
• an X-axis resolution of 0.2 mm corresponding to the displacement distance of the substrate is obtained. between two successive measurement lines, which is sufficient to reliably deduce the topography of a surface of a substrate passing through the observation zone, such as, for example, the topography of a surface having Braille characters or points glue or other relief on the surface of a substrate, especially a substrate used for the manufacture of packaging.
• the angle of incidence 'a' is advantageously between 30 ° to 70 °, preferably between 45 ° and 60 °. As will be better understood from FIG. 3, this angle is chosen according to the characteristics
• the relief is a hump 4 characterized by a height 'h' of approximately 0.2 mm and a diameter 'D' of approximately 1 , 6 mm at its base (typically a Braille dot).
• a height 'h' of approximately 0.2 mm
• a diameter 'D' of approximately 1 , 6 mm at its base (typically a Braille dot).
• Figure 3 shows the hump 4 at the moment when its vertex passes through the plane
• the streaks S1, S2, ... Sn which are projected on the surface 2 in the mean direction 12 are backscattered in several directions and in particular in the direction of the linear camera 20.
• the backscattered rays observed by the camera 20 are orthogonal to the surface 2 of the cut.
• the orthogonal light rays backscattered by the n 'streaks S1, S2, ... Sn in the plane P are respectively called R1, R2, ... R n following the impact of the light beam F on the surface 2. From even, we call 'p2' the shortest distance between two successive orthogonal light rays backscattered in the plane P. Each orthogonal light ray is represented by an arrow R.
• the surveying device operates on the well known principle of triangulation, principle according to which the angle of incidence 'a' is non-zero, so that a variation in the distance between the camera 20 and the surface 2 results in a lateral shift of the light rays received by the camera 20. It is the measurement of this offset which makes it possible to determine the three-dimensional characteristics of the surface 2 and therefore to check the good formation of the bump 4.
• a calculator 25 applies a triangulation algorithm to each image acquired by the camera 20.
• vertical offset is the offset on the Z axis of the light rays received by the camera 20 and where “lateral offset” is the offset on the Y axis of the light rays received by the camera 20.
• triangulation algorithm is applied line by line, independently of each other. In an alternative embodiment, the triangulation algorithm uses the stored data of several lines
• FIG. 4 an image 30 of the light streaks S1 is shown
• FIG 5 there is shown the periodic electrical signal delivered by the network of photosensitive elements.
• the presence of reliefs on the surface of the cutout in the observation zone causes a spatial shift as explained previously.
• This offset is indicated by a decrease or an increase in the period T of the signal 40.
• the period T decreases, this means that the light source 10 illuminates a region of positive slope of the surface 2, at conversely, when the period T increases, it means that the light source 10 illuminates a negative slope region of the surface 2.
• the period T is substantially constant over the entire length of the network of photosensitive elements.
• the device according to the invention can be implemented in the manner
• a light beam F is projected obliquely onto the surface 2 to form 'n' light streaks S1, S2,... Sn, then the spatial shift of the light streaks S1, S2,. Sn is measured for each image. acquired, and finally we apply a triangulation algorithm to each measured offset.
• the device according to the invention may advantageously be mounted in a folder-gluer machine comprising a carrier for transporting plate elements 1 in a substantially plane path X axis.
• topographied surface is that of a plate element, it goes without saying that the invention also applies to a substrate in the form of a strip of material.

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• Physics & Mathematics (AREA)
• General Physics & Mathematics (AREA)
• Length Measuring Devices By Optical Means (AREA)
• Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

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Publications (1)

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• 2010
  • 2010-07-16 CN CN201080030230.2A patent/CN102470623B/zh not_active Expired - Fee Related
  • 2010-07-16 WO PCT/EP2010/004331 patent/WO2011009566A1/fr active Application Filing
  • 2010-07-16 EP EP10737273A patent/EP2456613A1/de not_active Withdrawn
  • 2010-07-16 KR KR1020127004363A patent/KR20120069667A/ko active Application Filing
  • 2010-07-16 US US13/386,182 patent/US20120127480A1/en not_active Abandoned
  • 2010-07-16 JP JP2012520938A patent/JP2013500462A/ja active Pending
  • 2010-07-16 CA CA2766169A patent/CA2766169A1/en not_active Abandoned
  • 2010-07-16 BR BR112012001475A patent/BR112012001475A2/pt not_active IP Right Cessation

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