EP2300791A1 - Multispektraler sensor - Google Patents
Multispektraler sensorInfo
- Publication number
- EP2300791A1 EP2300791A1 EP09757467A EP09757467A EP2300791A1 EP 2300791 A1 EP2300791 A1 EP 2300791A1 EP 09757467 A EP09757467 A EP 09757467A EP 09757467 A EP09757467 A EP 09757467A EP 2300791 A1 EP2300791 A1 EP 2300791A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- sensor
- antenna
- radiation
- detecting
- devices
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 230000005855 radiation Effects 0.000 claims abstract description 109
- 239000000758 substrate Substances 0.000 claims abstract description 26
- 239000004065 semiconductor Substances 0.000 claims abstract description 12
- 238000000034 method Methods 0.000 claims abstract description 8
- 238000004611 spectroscopical analysis Methods 0.000 claims abstract description 7
- 230000000295 complement effect Effects 0.000 claims abstract description 6
- 239000000463 material Substances 0.000 claims abstract description 5
- 238000000701 chemical imaging Methods 0.000 claims abstract description 4
- 229910044991 metal oxide Inorganic materials 0.000 claims abstract description 4
- 150000004706 metal oxides Chemical class 0.000 claims abstract description 4
- 238000001514 detection method Methods 0.000 claims description 62
- 238000013461 design Methods 0.000 claims description 8
- 229910052751 metal Inorganic materials 0.000 claims description 7
- 239000002184 metal Substances 0.000 claims description 7
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 4
- 239000002041 carbon nanotube Substances 0.000 claims description 4
- 229910021393 carbon nanotube Inorganic materials 0.000 claims description 4
- 241001465754 Metazoa Species 0.000 claims description 3
- 229920001940 conductive polymer Polymers 0.000 claims description 3
- 238000011156 evaluation Methods 0.000 claims description 3
- 239000004020 conductor Substances 0.000 claims 1
- 230000008901 benefit Effects 0.000 description 6
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 4
- 238000001816 cooling Methods 0.000 description 4
- 230000005670 electromagnetic radiation Effects 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 229910002601 GaN Inorganic materials 0.000 description 2
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 2
- XHCLAFWTIXFWPH-UHFFFAOYSA-N [O-2].[O-2].[O-2].[O-2].[O-2].[V+5].[V+5] Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[V+5].[V+5] XHCLAFWTIXFWPH-UHFFFAOYSA-N 0.000 description 2
- 229910021417 amorphous silicon Inorganic materials 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 2
- 239000002360 explosive Substances 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000009659 non-destructive testing Methods 0.000 description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 229910001935 vanadium oxide Inorganic materials 0.000 description 2
- 239000011787 zinc oxide Substances 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 230000036541 health Effects 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 239000012811 non-conductive material Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 238000011897 real-time detection Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
- G01J3/36—Investigating two or more bands of a spectrum by separate detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
- H10F39/184—Infrared image sensors
- H10F39/1847—Multispectral infrared image sensors having a stacked structure, e.g. NPN, NPNPN or multiple quantum well [MQW] structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/191—Photoconductor image sensors
- H10F39/193—Infrared image sensors
Definitions
- FIG. 1 shows a plan view of an embodiment of a multispectral sensor according to the invention.
- the sensor 1 according to the invention comprises a complementary metal-oxide-semiconductor substrate 2 with a circuit (not shown).
- Such substrates are also commonly referred to as CMOS (complementary metal oxide semiconductor) substrates
- at least one antenna-3 receiver means-4 combination devices for detecting terahertz radiation at least one device 5 for detecting arranged medium infrared radiation and at least one diode 6 for detecting radiation of the visible to near infrared range.
- the detection interval of the sensor 1 according to the invention in the middle infrared range can be both> 20 terahertz to ⁇ 300 terahertz and> 21.4 terahertz to
- the senor 1 according to the invention has at least two different antenna-3 receiver means-4.
- the senor 1 according to the invention can have at least two different devices 5 for detecting medium infrared radiation with different detection frequency bands spaced apart from one another or adjoining one another or overlapping.
- a sensor 1 preferably has a multiplicity, for example the same and / or different (not shown), antenna 3.
- Receiver means 4 combination devices, means 5 for detecting medium infrared radiation and diodes 6 for detecting radiation of the visible to near infrared range.
- the devices 5 for detection of medium infrared radiation and the diodes 6 for the detection of visible to near infrared radiation are preferably designed and arranged in the context of the present invention such that the antenna-3 receiver-4 combination devices, the Devices 5 for the detection of medium infrared radiation and the diodes 6 for the detection of radiation of the visible to near infrared range, in particular independently of each other, can be connected and / or read.
- the sensor 1 according to the invention preferably has an electronic evaluation system.
- the sensor preferably has a multispectral optics, for example a reflective optic based on mirrors. Such a multispectral optic is expediently arranged on the radiation side with respect to the components 3, 4, 5, 6 arranged on the CMOS substrate 2.
- the evaluation electronics and multispectral optics can, but need not, be integrated into the monolithic part of the sensor 1.
- Figure 1 shows that the antenna-3 receiver means-4 combination devices, the medium-infrared radiation detection devices 5, and the visible-to-near infrared radiation detection diodes 6 may be arranged in a grid pattern. Accordingly, the antenna-3 receiver-4 combination devices, the medium-infrared radiation detection devices 5, and the visible-to-near infrared radiation detection diodes 6 may also be referred to as "pixels.” In one embodiment of the present invention Invention are the antenna-3
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102008002270A DE102008002270A1 (de) | 2008-06-06 | 2008-06-06 | Multispektraler Sensor |
| PCT/EP2009/056603 WO2009147085A1 (de) | 2008-06-06 | 2009-05-29 | Multispektraler sensor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP2300791A1 true EP2300791A1 (de) | 2011-03-30 |
Family
ID=41066480
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP09757467A Ceased EP2300791A1 (de) | 2008-06-06 | 2009-05-29 | Multispektraler sensor |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8816282B2 (de) |
| EP (1) | EP2300791A1 (de) |
| DE (1) | DE102008002270A1 (de) |
| RU (1) | RU2532650C2 (de) |
| WO (1) | WO2009147085A1 (de) |
Families Citing this family (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7442629B2 (en) | 2004-09-24 | 2008-10-28 | President & Fellows Of Harvard College | Femtosecond laser-induced formation of submicrometer spikes on a semiconductor substrate |
| US7057256B2 (en) | 2001-05-25 | 2006-06-06 | President & Fellows Of Harvard College | Silicon-based visible and near-infrared optoelectric devices |
| US9472699B2 (en) | 2007-11-13 | 2016-10-18 | Battelle Energy Alliance, Llc | Energy harvesting devices, systems, and related methods |
| US8149170B2 (en) * | 2007-12-17 | 2012-04-03 | The Regents Of The University Of California | Carbon nanotube based variable frequency patch-antenna |
| US9673243B2 (en) | 2009-09-17 | 2017-06-06 | Sionyx, Llc | Photosensitive imaging devices and associated methods |
| US9911781B2 (en) | 2009-09-17 | 2018-03-06 | Sionyx, Llc | Photosensitive imaging devices and associated methods |
| CN102128841B (zh) * | 2010-01-13 | 2015-04-08 | 东南大学 | 一种太赫兹成像系统的探测装置 |
| US8692198B2 (en) | 2010-04-21 | 2014-04-08 | Sionyx, Inc. | Photosensitive imaging devices and associated methods |
| CN103081128B (zh) | 2010-06-18 | 2016-11-02 | 西奥尼克斯公司 | 高速光敏设备及相关方法 |
| US9496308B2 (en) | 2011-06-09 | 2016-11-15 | Sionyx, Llc | Process module for increasing the response of backside illuminated photosensitive imagers and associated methods |
| JP2014525091A (ja) * | 2011-07-13 | 2014-09-25 | サイオニクス、インク. | 生体撮像装置および関連方法 |
| US8389939B1 (en) * | 2011-09-26 | 2013-03-05 | Rockwell Collins, Inc. | System and method of dual energy radiation detection |
| EP2618128A1 (de) * | 2012-01-19 | 2013-07-24 | Canon Kabushiki Kaisha | Erkennungsvorrichtung, Detektor und Bilderzeugungsvorrichtung damit |
| US8847824B2 (en) | 2012-03-21 | 2014-09-30 | Battelle Energy Alliance, Llc | Apparatuses and method for converting electromagnetic radiation to direct current |
| US9064764B2 (en) | 2012-03-22 | 2015-06-23 | Sionyx, Inc. | Pixel isolation elements, devices, and associated methods |
| RU2507542C2 (ru) * | 2012-08-27 | 2014-02-20 | Асхат Хайдарович Кутлубаев | Способ визуализации электромагнитных излучений и устройство для его реализации |
| US8975594B2 (en) | 2012-11-09 | 2015-03-10 | Ge Aviation Systems Llc | Mixed-material multispectral staring array sensor |
| WO2014127376A2 (en) | 2013-02-15 | 2014-08-21 | Sionyx, Inc. | High dynamic range cmos image sensor having anti-blooming properties and associated methods |
| US9939251B2 (en) | 2013-03-15 | 2018-04-10 | Sionyx, Llc | Three dimensional imaging utilizing stacked imager devices and associated methods |
| JP2014235146A (ja) * | 2013-06-05 | 2014-12-15 | セイコーエプソン株式会社 | テラヘルツ波検出装置、カメラ、イメージング装置および計測装置 |
| WO2014209421A1 (en) | 2013-06-29 | 2014-12-31 | Sionyx, Inc. | Shallow trench textured regions and associated methods |
| CN103398776A (zh) * | 2013-08-20 | 2013-11-20 | 西北核技术研究所 | 一种过模大功率脉冲太赫兹功率探测器 |
| DE102015204137A1 (de) * | 2015-03-09 | 2016-09-15 | Robert Bosch Gmbh | Halbleitervorrichtung mit einer Trench-Schottky-Barrier-Schottky-Diode |
| US10340459B2 (en) * | 2016-03-22 | 2019-07-02 | International Business Machines Corporation | Terahertz detection and spectroscopy with films of homogeneous carbon nanotubes |
| US11237103B2 (en) * | 2018-05-31 | 2022-02-01 | Socovar Sec | Electronic device testing system, electronic device production system including same and method of testing an electronic device |
| CN112802827B (zh) * | 2019-11-14 | 2024-03-01 | 华为技术有限公司 | 像素结构和图像传感器 |
| US11888233B2 (en) * | 2020-04-07 | 2024-01-30 | Ramot At Tel-Aviv University Ltd | Tailored terahertz radiation |
| CN113418891B (zh) * | 2021-07-14 | 2024-12-27 | 青岛大学 | 一种检测车辆底部安全的太赫兹地面检测系统及其检测方法 |
| WO2025023859A1 (ru) * | 2023-07-24 | 2025-01-30 | Общество с ограниченной ответственностью "Терагерцовая фотоника" | Детектор терагерцового излучения |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050122269A1 (en) * | 2003-12-04 | 2005-06-09 | Frazier Gary A. | Method and apparatus for detecting radiation at one wavelength using a detector for a different wavelength |
| US20070170359A1 (en) * | 2006-01-26 | 2007-07-26 | Syllaios Athanasios J | Systems and methods for integrating focal plane arrays |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DD281104A7 (de) | 1987-12-16 | 1990-08-01 | Univ Dresden Tech | Multispektraler sensor |
| US5446284A (en) * | 1994-01-25 | 1995-08-29 | Loral Infrared & Imaging Systems, Inc. | Monolithic detector array apparatus |
| US6310346B1 (en) * | 1997-05-30 | 2001-10-30 | University Of Central Florida | Wavelength-tunable coupled antenna uncooled infrared (IR) sensor |
| US6465786B1 (en) * | 1999-09-01 | 2002-10-15 | Micron Technology, Inc. | Deep infrared photodiode for a CMOS imager |
| US20020160711A1 (en) * | 2001-04-30 | 2002-10-31 | Carlson Bradley S. | Imager integrated CMOS circuit chip and associated optical code reading systems |
| US20040256561A1 (en) * | 2003-06-17 | 2004-12-23 | Allyson Beuhler | Wide band light sensing pixel array |
| US7064328B2 (en) * | 2003-10-22 | 2006-06-20 | Northrop Grumman Corporation | Ultra sensitive silicon sensor millimeter wave passive imager |
| US6987484B2 (en) * | 2003-11-07 | 2006-01-17 | Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V. | Detector for electromagnetic radiation and a method of detecting electromagnetic radiation |
| US7095027B1 (en) * | 2004-02-25 | 2006-08-22 | University Of Central Florida Research Foundation, Inc. | Multispectral multipolarization antenna-coupled infrared focal plane array |
| WO2007070540A2 (en) * | 2005-12-12 | 2007-06-21 | Irina Puscasu | Thin film emitter-absorber apparatus and methods |
| JP4221424B2 (ja) * | 2006-08-09 | 2009-02-12 | 株式会社東芝 | 固体撮像素子及びその製造方法並びに撮像装置 |
| WO2008028512A1 (de) | 2006-09-08 | 2008-03-13 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Bolometer und verfahren zum herstellen eines bolometers |
| RU2325729C1 (ru) * | 2006-10-17 | 2008-05-27 | Государственное образовательное учреждение высшего профессионального образования "Российский университет дружбы народов" (РУДН) | Неохлаждаемый металлический болометр |
| JP4398972B2 (ja) * | 2006-12-11 | 2010-01-13 | 株式会社東芝 | 電磁波センサ、撮像素子及び撮像装置 |
| US7705309B1 (en) * | 2007-02-27 | 2010-04-27 | Agiltron Corporation | Radiation detector with extended dynamic range |
| JP2008241465A (ja) * | 2007-03-27 | 2008-10-09 | Toshiba Corp | 固体撮像装置およびその駆動方法 |
| US7501636B1 (en) * | 2007-09-20 | 2009-03-10 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Nanotunneling junction-based hyperspectal polarimetric photodetector and detection method |
| US7847254B2 (en) * | 2007-12-20 | 2010-12-07 | Ncr Corporation | Photoconductive device |
-
2008
- 2008-06-06 DE DE102008002270A patent/DE102008002270A1/de not_active Withdrawn
-
2009
- 2009-05-29 US US12/989,436 patent/US8816282B2/en not_active Expired - Fee Related
- 2009-05-29 RU RU2010154507/28A patent/RU2532650C2/ru active
- 2009-05-29 EP EP09757467A patent/EP2300791A1/de not_active Ceased
- 2009-05-29 WO PCT/EP2009/056603 patent/WO2009147085A1/de not_active Ceased
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050122269A1 (en) * | 2003-12-04 | 2005-06-09 | Frazier Gary A. | Method and apparatus for detecting radiation at one wavelength using a detector for a different wavelength |
| US20070170359A1 (en) * | 2006-01-26 | 2007-07-26 | Syllaios Athanasios J | Systems and methods for integrating focal plane arrays |
Non-Patent Citations (1)
| Title |
|---|
| See also references of WO2009147085A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| DE102008002270A1 (de) | 2009-12-17 |
| RU2532650C2 (ru) | 2014-11-10 |
| WO2009147085A1 (de) | 2009-12-10 |
| US8816282B2 (en) | 2014-08-26 |
| RU2010154507A (ru) | 2012-07-20 |
| US20110194100A1 (en) | 2011-08-11 |
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Legal Events
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| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
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| AX | Request for extension of the european patent |
Extension state: AL BA RS |
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| RIN1 | Information on inventor provided before grant (corrected) |
Inventor name: MOTTIN, ERIC Inventor name: ARNAUD, AGNES Inventor name: KUNDERMANN, STEFAN Inventor name: KALLMANN, ULRICH Inventor name: THIEL, MICHAEL |
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| RAP1 | Party data changed (applicant data changed or rights of an application transferred) |
Owner name: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES Owner name: ROBERT BOSCH GMBH |
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