EP2128981A1 - Dispositif de filtre d'onde élastique - Google Patents

Dispositif de filtre d'onde élastique Download PDF

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Publication number
EP2128981A1
EP2128981A1 EP07860149A EP07860149A EP2128981A1 EP 2128981 A1 EP2128981 A1 EP 2128981A1 EP 07860149 A EP07860149 A EP 07860149A EP 07860149 A EP07860149 A EP 07860149A EP 2128981 A1 EP2128981 A1 EP 2128981A1
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EP
European Patent Office
Prior art keywords
acoustic wave
wave filter
surface acoustic
coupled
balanced
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Granted
Application number
EP07860149A
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German (de)
English (en)
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EP2128981A4 (fr
EP2128981B1 (fr
Inventor
Tetsuro Okuda
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Murata Manufacturing Co Ltd
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Murata Manufacturing Co Ltd
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Publication of EP2128981A4 publication Critical patent/EP2128981A4/fr
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/0023—Balance-unbalance or balance-balance networks
    • H03H9/0028—Balance-unbalance or balance-balance networks using surface acoustic wave devices
    • H03H9/0085—Balance-unbalance or balance-balance networks using surface acoustic wave devices having four acoustic tracks
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H2250/00—Indexing scheme relating to dual- or multi-band filters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/0023—Balance-unbalance or balance-balance networks
    • H03H9/0028—Balance-unbalance or balance-balance networks using surface acoustic wave devices
    • H03H9/0047—Balance-unbalance or balance-balance networks using surface acoustic wave devices having two acoustic tracks
    • H03H9/0066—Balance-unbalance or balance-balance networks using surface acoustic wave devices having two acoustic tracks being electrically parallel
    • H03H9/0071—Balance-unbalance or balance-balance networks using surface acoustic wave devices having two acoustic tracks being electrically parallel the balanced terminals being on the same side of the tracks

Definitions

  • the present invention relates to an acoustic wave filter apparatus having a balance-unbalance conversion function. More specifically, the invention relates to an acoustic wave filter apparatus having a structure where first and second acoustic wave filter sections are formed on one piezoelectric substrate, first balanced terminals of the first and second acoustic wave filter sections are commonly coupled to each other, and second balanced terminals thereof are commonly coupled to each other.
  • Patent Document 1 discloses a surface acoustic wave filter apparatus shown in Fig. 16 .
  • unbalanced input terminals of first and second surface acoustic wave filter sections 1003 and 1004 are coupled to an unbalanced terminal 1002.
  • the surface acoustic wave filter sections 1003 and 1004 are surface acoustic wave filters each having an unbalanced input terminal and first and second balanced output terminals and having a balance-unbalance conversion function.
  • First balanced output terminals of the first and second surface acoustic wave filter sections 1003 and 1004 are commonly coupled to each other and then coupled to a first balanced terminal 1005.
  • second balanced output terminals thereof are commonly coupled to each other and then coupled to a second balanced terminal 1006.
  • Patent Document 2 discloses a surface acoustic wave filter apparatus shown in Fig. 17 .
  • an illustrated electrode structure is formed on a piezoelectric substrate 1102.
  • a first surface acoustic wave filter section 1101 is coupled between an unbalanced input terminal 1103 and first and second balanced terminals 1104 and 1105.
  • the first surface acoustic wave filter section 1101 includes three-IDT-type, longitudinally coupled resonator-type surface acoustic wave filter elements 1107 and 1108.
  • Input terminals of the longitudinally coupled resonator-type surface acoustic wave filter elements 1107 and 1108 are commonly coupled to each other and then coupled to an unbalanced terminal 1103 via a surface acoustic wave resonator 1106.
  • An output terminal of the longitudinally coupled resonator-type surface acoustic wave filter element 1107 is coupled to the first balanced terminal 1104 via a surface acoustic wave resonator 1109.
  • an output terminal of the longitudinally coupled resonator-type second surface acoustic wave filter element 1108 is coupled to the second balanced terminal 1105 via a surface acoustic wave resonator 1110.
  • a surface acoustic wave filter section 1101A which is another surface acoustic wave filter section, is formed on the piezoelectric substrate 1102.
  • the second surface acoustic wave filter section 1101A has the same configuration as that of the first surface acoustic wave filter section 1101. Therefore, corresponding portions of the second surface acoustic wave filter section 1101A are shown using reference numerals where A is added to each of the reference numerals of corresponding portions of the first surface acoustic wave filter section 1101. Thus, the description of the first surface acoustic wave filter section 1101 is used.
  • the first balanced output terminals of the first and second surface acoustic wave filter sections 1003 and 1004 are commonly coupled to each other and the second balanced output terminals thereof are commonly coupled to each other.
  • a wiring line for commonly coupling the first balanced output terminals and one for commonly coupling the second balanced output terminals tend to be longer. This has caused a problem that the surface acoustic wave filter apparatus is affected by parasitic capacitances, inductances, or resistances of the wiring lines and thus the insertion loss is increased or the balancing is deteriorated.
  • the surface acoustic wave filter apparatus described in Patent Document 2 is deformed and the first balanced output terminals are commonly coupled to each other and the second balanced output terminals are commonly coupled to each other as in the surface acoustic wave filter apparatus 1001 described in Patent Document 1, the surface acoustic wave filter apparatus is easily affected by parasitic capacitances, inductances, or resistances of the wiring lines as well. For this reason, the insertion loss may be increased or the balancing may be deteriorated as well.
  • an object of the present invention is to provide an acoustic wave filter apparatus that has multiple acoustic wave filter sections each having a balance-unbalance conversion function and where an increase in the insertion loss is small and the balancing is difficult to deteriorate even if first balanced input/output terminals of these surface acoustic wave filter sections are commonly coupled to each other and second balanced input/output terminals thereof are commonly coupled to each other.
  • an acoustic wave filter apparatus including first and second acoustic wave filter sections having different passbands and each having a balance-unbalance conversion function.
  • the acoustic wave filter apparatus includes: a piezoelectric substrate; a first acoustic wave filter section formed on the piezoelectric substrate, the first acoustic wave filter section having an unbalanced input/output terminal and first and second balanced input/output terminals, the first acoustic wave filter section having a balance-unbalance conversion function; and a second acoustic wave filter section formed on the piezoelectric substrate, the second acoustic wave filter section having an unbalanced input/output terminal and first and second balanced input/output terminals, the second acoustic wave filter section having a balance-unbalance conversion function.
  • the unbalanced input/output terminals of the first and second acoustic wave filter sections are coupled to first and second unbalanced terminals, respectively.
  • the first balanced input/output terminals of the first acoustic wave filter section and the first balanced input/output terminal of the second acoustic wave filter section are commonly coupled to each other and then coupled to a first balanced terminal.
  • the second balanced input/output terminals of the first and second are commonly coupled to each other and then coupled to a second balanced terminal.
  • the first and second acoustic wave filter sections are configured so that a signal flowing to the first balanced terminal and a signal flowing to the second balanced terminal have opposite phases.
  • the acoustic wave filter apparatus further includes: a first acoustic wave resonator coupled between the first balanced input/output terminal of the first acoustic wave filter section and the first balanced terminal; a second acoustic wave resonator coupled between the first balanced input/output terminal of the second acoustic wave filter section and the first balanced terminal, the second acoustic wave resonator having a resonant frequency different from a resonant frequency of the first acoustic wave resonator; a third acoustic wave resonator coupled between the second balanced input/output terminal of the first acoustic wave filter section and the second balanced terminal; a fourth acoustic wave resonator coupled between the second balanced input/output terminal of the second acoustic wave filter section and the second balanced terminal, the fourth acoustic wave resonator having a resonant frequency different from a resonant frequency of the third acoustic wave
  • the second wiring line coupling the second acoustic wave resonator to the first balanced input/output terminal of the second acoustic wave filter section and the third wiring line coupling the third acoustic wave resonator to the second balanced input/output terminal of the first acoustic wave filter section cross each other on the piezoelectric substrate.
  • the first to fourth acoustic wave resonators are preferably disposed along a direction on the piezoelectric substrate in the order presented.
  • the first to fourth acoustic wave resonators can be smoothly disposed on the piezoelectric substrate.
  • the influence of capacitances, inductances, or resistances attributable to the installation of the wiring lines on the piezoelectric substrate can be reduced. Thus, an increase in insertion loss and deterioration of the balancing can be restrained.
  • a passband of the second acoustic wave filter section is preferably located in a higher band than a bandpass of the first acoustic wave filter section.
  • the acoustic wave filter apparatus preferably further includes fifth and sixth acoustic wave resonators for impedance adjustment coupled to the second and fourth acoustic wave resonators in series.
  • the impedance in the first acoustic wave filter section passband, of the second acoustic wave filter section seen from the balanced terminal can be increased. Therefore, the insertion loss in the first acoustic wave filter section can be reduced.
  • the first acoustic wave filter section preferably includes a longitudinally coupled resonator-type first acoustic wave filter element including at least three IDTs and a longitudinally coupled resonator-type second acoustic wave filter element including at least three IDTs. Also, ends of the first and second acoustic wave filter elements are preferably coupled to the first unbalanced terminal. The other end of the first acoustic wave filter element is preferably coupled to the first balanced terminal. The other end of the second acoustic wave filter element is preferably coupled to the second balanced terminal.
  • the first acoustic wave filter section has a configuration where the longitudinally coupled resonator-type first and second filter elements each including at least three IDTs are coupled commonly to the first unbalanced terminal. Therefore, by only adjusting the polarity of the IDTs, a balance-unbalance conversion function can be easily realized.
  • the second acoustic wave filter section preferably includes a longitudinally coupled resonator-type first acoustic wave filter element including at least three IDTs and a longitudinally coupled resonator-type second acoustic wave filter element including at least three IDTs.
  • ends of the first and second acoustic wave filter elements are preferably commonly coupled to each other and then coupled to the second unbalanced terminal.
  • the other end of the first acoustic wave filter element is preferably coupled to the first balanced terminal.
  • the other end of the second acoustic wave filter element is preferably coupled to the second balanced terminal.
  • the second acoustic wave filter section includes the longitudinally coupled resonator-type first and second acoustic wave filter elements each including at least three IDTs. Therefore, by only making contrivance in designing the IDTs, a balance-unbalance conversion function can be easily realized.
  • a surface acoustic wave may be used as an acoustic wave.
  • a surface acoustic wave filter apparatus according to the present invention is provided.
  • an acoustic boundary wave may be used as an acoustic wave.
  • an acoustic boundary wave filter apparatus that further includes a dielectric material laminated on the piezoelectric substrate and uses an acoustic boundary wave propagating over an interface between the piezoelectric substrate and dielectric material is provided.
  • the unbalanced input/output terminal of the first acoustic wave filter section is coupled to the first unbalanced terminal
  • the unbalance input/output terminal of the second acoustic wave filter section is coupled to the second unbalanced terminal.
  • the first balanced input/output terminals of the first and second acoustic wave filter sections are commonly coupled to the first balanced terminal.
  • the second balanced input/output terminals thereof are commonly coupled to the second balanced terminal.
  • the first to fourth acoustic wave resonators are coupled between the first and second acoustic wave filter sections and first and second balanced terminals.
  • the second wiring line coupling the second acoustic wave resonator to the first balanced input/output terminal of the second acoustic wave filter section and the third wiring line coupling the third acoustic wave resonator to the second balanced input/output terminal of the first acoustic wave filter section cross each other on the piezoelectric substrate.
  • the wiring lines coupling the first and second acoustic wave filter sections to the first and second balanced terminals can be shortened so that the wiring patterns can be simplified. Therefore, the differences in stray capacitance, inductance, and resistance between the balance signal lines can be reduced so that the deterioration of the balancing can be restrained. Also, since the wiring lines through which balance signals pass can be shortened, a loss due to the resistance can be reduced so that the insertion loss can be reduced.
  • the second acoustic wave resonator coupled to the second acoustic wave filter section is disposed between the first and third acoustic wave resonators coupled to the first acoustic wave filter section, in other words, since the first and third acoustic wave resonators coupled to the first acoustic wave filter section and the second and fourth acoustic wave resonators coupled to the second acoustic wave filter section are alternately disposed in a direction on the piezoelectric substrate, the intervals between the acoustic wave resonators can be expanded. Therefore, the coupling capacitances between the acoustic wave resonators can be reduced so that the insertion loss can be further reduced.
  • the deterioration of the balancing can be prevented and the insertion loss can be reduced. Also, since the wiring patterns can be shortened, the sizes of chips of the acoustic wave filter apparatus can be reduced.
  • Fig. 1 is a schematic plan view showing a surface acoustic wave filter apparatus 1 serving as an acoustic wave apparatus according to a first embodiment of the present invention.
  • the surface acoustic wave filter apparatus 1 includes a piezoelectric substrate 2.
  • the piezoelectric substrate 2 is made of 38.5° Y-cut X propagation LiTaO 3 .
  • the piezoelectric substrate 2 may be made of different piezoelectric monocrystal or piezoelectric ceramic.
  • the surface acoustic wave filter apparatus 1 is a reception filter apparatus to be used in a cell phone.
  • the surface acoustic wave filter apparatus 1 includes first and second surface acoustic wave filter sections 3 and 4.
  • the first and second surface acoustic wave filter sections 3 and 4 each have a balance-unbalance conversion function.
  • the first surface acoustic wave filter section 3 is a DCS reception filter section.
  • the second surface acoustic wave filter section 4 is a PCS reception filter section. That is, the surface acoustic wave filter apparatus 1 is a one-chip, dual-band filter where the first and second surface acoustic wave filter sections 3 and 4 are formed on the single piezoelectric substrate 2.
  • the surface acoustic wave filter apparatus 1 includes two unbalanced terminals and a pair of balanced terminals, that is, first and second unbalanced terminals 5 and 6 and first and second balanced terminals 7 and 8.
  • An unbalanced input terminal of the first surface acoustic wave filter section 3 is coupled to the first unbalanced terminal 5 via a one-port-type surface acoustic wave resonator 11.
  • a first balanced output terminal of the first surface acoustic wave filter section 3 is coupled to the first balanced terminal 7 via a one-port-type surface acoustic wave resonator 12.
  • a second balanced output terminal of the first surface acoustic wave filter section 3 is coupled to the second balanced terminal 8 via a one-port-type surface acoustic wave resonator 13.
  • an unbalanced input terminal of the second surface acoustic wave filter section 4 is coupled to the second unbalanced terminal 6 via a one-port-type surface acoustic wave resonator 14.
  • a first balanced output terminal of the second surface acoustic wave filter section 4 is coupled to the first balanced terminal 7 via one-port-type surface acoustic wave resonators 15 and 16.
  • a second balanced output terminal of the second surface acoustic wave filter section 4 is coupled to the second balanced terminal 8 via one-port-type surface acoustic wave resonators 17 and 18.
  • the first surface acoustic wave filter section 3 includes first and second surface acoustic wave filter elements 21 and 22.
  • the first surface acoustic wave filter element 21 is a three-IDT-type, longitudinally coupled resonator-type surface acoustic wave filter element including a first IDT 21a and second and third IDTs 21b and 21c disposed on both sides of the first IDT 21a in the surface acoustic wave propagation direction.
  • One end of the centrally disposed first IDT 21a of the first surface acoustic wave filter element 21 is coupled to the first unbalanced terminal 5 via the one-port-type surface acoustic wave resonator 11.
  • the other end of the IDT 21a is coupled to a ground potential.
  • Ends of the second and third IDTs 21b and 21c are commonly coupled to each other and then coupled to a ground potential.
  • the other ends thereof are commonly coupled to each other and then coupled to the first balanced terminal 7 via the surface acoustic wave resonator 12.
  • the second surface acoustic wave filter section 22 is a three-IDT-type, longitudinally connected resonator-type surface acoustic wave filter element including IDTs 22a to 22c.
  • One end of the centrally disposed first IDT 22a is coupled to the first unbalanced terminal 5 via the surface acoustic wave resonator 11, and the other end thereof is coupled to the ground potential.
  • Ends of the second and third IDTs 22b and 22c disposed on both sides are commonly coupled to each other and then coupled to the ground potential. The other ends thereof are commonly coupled to each other and then coupled to the second balanced terminal 8 via the one-port-type surface acoustic wave resonator 13.
  • the IDTs 21a to 21c and IDTs 22a to 22c are formed so that, as for signals inputted from the first unbalanced terminal 5, a signal flowing through the first and second surface acoustic wave filter elements 21 and 22 and the one-port-type surface acoustic wave resonator 12 into the first balanced terminal 7 is 180° out of phase with a signal flowing through the second surface acoustic wave filter element 22 and one-port-type surface acoustic wave resonator 13 into the second balanced terminal 8.
  • the first surface acoustic wave filter section 3 has a balance-unbalance conversion function.
  • the second surface acoustic wave filter section 4 has approximately the same configuration as that of the first surface acoustic wave filter section 3. Specifically, the second surface acoustic wave filter section 4 is provided with first and second surface acoustic wave filter elements 23 and 24. As with the first surface acoustic wave filter element 21, the first surface acoustic wave filter element 23 includes first to third IDTs 23a to 23c. As with the second surface acoustic wave filter element 22, the second surface acoustic wave filter element 24 includes first to third IDTs 24a to 24c.
  • the first IDTs 23a and 24a are commonly coupled to each other and then coupled to the second unbalanced terminal 6 via the one-port-type surface acoustic wave resonator 14. The other ends thereof are commonly coupled to each other and then coupled to a ground potential. Ends of the second and third IDTs 23b and 23c are commonly coupled to each other and then coupled to a ground potential, and ends of the second and third IDTs 24b and 24c are commonly coupled to each other and then coupled to the ground potential. The other ends of the IDTs 23b and 23c are commonly coupled to each other and then coupled to the first balanced terminal 7 via the one-port-type surface acoustic wave resonators 15 and 16. The other ends of the second and third IDTs 24b and 24c are commonly coupled to each other and then coupled to the second balanced terminal 8 via the one-port-type surface acoustic wave resonators 17 and 18.
  • the polarity of the IDTs 23a to 23c and the IDTs 24a to 24c is adjusted to realize a balance-unbalance conversion function.
  • a feature of the surface acoustic wave filter apparatus 1 is that the one-port-type surface acoustic wave resonators 12, 13, 16, and 18 are coupled in the above-mentioned manner.
  • the one-port-type surface acoustic wave resonator 12 coupled to the first balanced terminal 7 will be referred to as a first surface acoustic wave resonator
  • the surface acoustic wave resonator 16 coupled thereto will be referred to as a second surface acoustic wave resonator
  • the one-port-type surface acoustic wave resonator 13 coupled to the second balanced terminal 8 will be referred to as a third surface acoustic wave resonator
  • the one-port-type surface acoustic wave resonator 18 will be referred to as a fourth acoustic wave resonator.
  • the first surface acoustic wave resonator 12 is coupled to the first surface acoustic wave filter element 21 of the first surface acoustic wave filter section 3 via a first wiring line 31.
  • the second surface acoustic wave resonator 16 is coupled to the first surface acoustic wave filter element 23 of the second surface acoustic wave filter section 4 via a second wiring line 32.
  • the third acoustic wave resonator 13 is coupled to the second surface acoustic wave filter element 22 of the first surface acoustic wave filter section 3 via a third wiring line 33.
  • the fourth acoustic wave resonator 18 is coupled to the second surface acoustic wave filter element 24 of the second surface acoustic wave filter section 4 via a fourth wiring line 34.
  • the second wiring line 32 and third wiring line 33 cross each other on the piezoelectric substrate 2 as shown in the drawing.
  • the first balanced output terminals of the first and second surface acoustic wave filter sections 3 and 4 are commonly coupled to each other and the second balanced output terminals thereof are also commonly coupled to each other.
  • the second surface acoustic wave resonator 16 and third surface acoustic wave resonator 13 are disposed so that the second wiring line 32 and third wiring line 33 cross each other.
  • the portion where the second wiring line 32 and third wiring line 33 cross each other has a three-dimensional cross structure where an insulating layer is interposed between the two wiring lines. This can prevents a short circuit between the second wiring line 32 and third wiring line 33.
  • the first surface acoustic wave resonator 12, second surface acoustic wave resonator 16, third surface acoustic wave resonator 13, and fourth surface acoustic wave resonator 18 are disposed along one direction in the presented order on the piezoelectric substrate 2. Also, the second wiring line 32 and third wiring line 33 cross each other. Therefore, the balancing of a signal between the first and second balanced terminals 7 and 8 can be improved and the insertion loss can be reduced. Further, the surface acoustic wave filter apparatus can be downsized. This will be described on the basis of a specific experimental example.
  • the surface acoustic wave filter apparatus 1 was manufactured in accordance with the following specification.
  • the passband of the first surface acoustic wave filter section 3 1805 to 1880 MHz
  • the passband of the second surface acoustic wave filter section 4 1930 to 1990 MHz
  • the numbers of the electrode fingers of the IDT 21b, IDT 21a, and IDT 21c 23, 35, and 23, respectively The numbers of the electrode fingers of the IDT 22b, IDT 22a, and IDT 22c: 23, 35, and 23, respectively The cross width of the electrode fingers: 74 ⁇ m
  • the number of the electrode fingers of a reflector: 120 (The second surface acoustic wave filter section 4)
  • the numbers of the electrode fingers of the IDT 23b, IDT 23a, and IDT 23c 31, 61, and 31, respectively The numbers of the electrode fingers of the IDT 24b, IDT 24a, and IDT 24c: 31, 61, the 31, respectively The number of the electrode fingers of a reflector: 120
  • the number of the electrode fingers of a reflector: 15 The numbers of the electrode fingers of the IDTs of the surface acoustic wave resonators 16 and 18: 240 each The cross width of the electrode fingers: 60 ⁇ m
  • the number of the electrode fingers of a reflector: 15 The numbers of the electrode fingers of the IDTs of the surface acoustic wave resonators 15 and 17: 109 each The number of the electrode fingers of a reflector: 15
  • the cross widths of the electrode fingers of the surface acoustic wave resonators 11 and 14 100 ⁇ m, 61 ⁇ m, respectively
  • the reflectors of the surface acoustic wave resonators 12, 13, 15, and 17 are apodized.
  • a surface acoustic wave filter apparatus 1201 configured as described above except that the surface acoustic wave filter apparatus 1201 has an electrode structure shown in Fig. 2 was manufactured.
  • the surface acoustic wave filter apparatus 1201 has the same configuration as that of the surface acoustic wave filter apparatus 1 except that the surface acoustic wave resonator 13 and the surface acoustic wave resonators 15 and 16 are disposed so that the second wiring line 32 and third wiring line 33 do not cross each other.
  • the surface acoustic wave resonator 13 coupled between the second surface acoustic wave filter element 22 of the first surface acoustic wave filter section 3 and the second balanced terminal 8, and the second surface acoustic wave filter element 22 are coupled to each other via a third wiring line 1023.
  • the second surface acoustic wave filter section 4 and the surface acoustic wave resonator 16 are coupled to each other via a second wiring line 1022.
  • the second wiring line 1022 and third wiring line 1023 do not cross each other.
  • Fig. 3 shows amplitude balance characteristics of the first surface acoustic wave filter sections of the surface acoustic wave filter apparatus according to the above-mentioned embodiment and the surface acoustic wave filter apparatus according to the comparative example.
  • Fig. 4 shows amplitude balance characteristics of the second surface acoustic wave filter sections of these surface acoustic wave filter apparatuses.
  • solid lines represent the result of the embodiment and broken lines represent the result of the above-mentioned comparative example.
  • Figs. 5 and 6 show transmission characteristics of the first surface acoustic wave filter section 3 and second surface acoustic wave filter section 4.
  • a solid line represents the result of the above-mentioned embodiment and a heavy broken line represents the result of the above-mentioned comparative example.
  • a heavy solid line represents the result of the above-mentioned embodiment and a heavy broken line represents the result of the above-mentioned comparative example.
  • the amplitude balance represents the deviation from 0 dB.
  • Fig. 5 it is understood that the insertion loss in the first surface acoustic wave filter section 3 decreased from 1.89 dB in the comparative example to 1.69 dB in the embodiment
  • Fig. 6 it is understood that the insertion loss in the second surface acoustic wave filter section 4 serving as a PCS reception filter decreased from 2.36 dB to 2.20 dB in the embodiment.
  • thin solid lines and thin broken lines represent characteristics where a loss due to impedance mismatching has yet to be eliminated, and heavy solid lines and heavy broken lines represent transmission characteristics where a loss due to impedance mismatching has been eliminated.
  • the amplitude balance characteristic improved from that in the comparative example.
  • the balancing improved and the insertion loss decreased. This is conceivably due to the following reasons.
  • the second wiring line 32 and third wiring line 33 cross each other, so the running portions of the second wiring line 32 and third wiring line 33 can be reduced. Therefore, conceivably, the influence of the stray capacitance between the second and third wiring lines 32 and 33 and other portions, the inductance, and the resistance can be reduced and thus the difference between a first balanced signal and a second balanced signal is reduced so that the balancing is enhanced.
  • the lengths of the above-mentioned second and third wiring lines 32 and 33 can be reduced, the loss due to the resistance of the wiring lines can be reduced. Therefore, it can be considered that the insertion loss is reduced.
  • the surface acoustic wave resonator 16 and surface acoustic wave resonator 13 can be distanced from each other.
  • the coupling capacitance between the surface acoustic wave resonators 13 and 16 can be reduced. Conceivably, this also reduces the insertion loss.
  • the chip size can be also reduced.
  • a surface acoustic wave resonator is coupled to a surface acoustic wave filter element in series.
  • the attenuation amount in the stopband in the high band of the passband can be increased and the steepness of the filter characteristics can be increased without deteriorating the insertion loss.
  • the fifth and sixth surface acoustic wave resonators 15 and 17 are coupled to the surface acoustic wave filter elements 23 and 24, respectively, in series so that impedance matching is achieved.
  • the fifth and sixth surface acoustic wave resonators 15 and 17 are coupled between the first surface acoustic wave filter element 23 and first balanced terminal 7 and between the second surface acoustic wave filter element 24 and second balanced terminal 8, respectively.
  • the anti-resonance frequencies of the surface acoustic wave resonators 15 and 17 for impedance adjustment are set so that they are higher than those of the above-mentioned surface acoustic wave resonators 16 and 18.
  • the deterioration of the insertion loss in the passband of the second surface acoustic wave filter section 4 for PCS reception can be further restrained.
  • the insertion loss in the passband of the first surface acoustic wave filter section 3 that is intended to receive DCS and whose passband is relatively low can be reduced.
  • the surface acoustic wave resonators 15 and 17 for impedance adjustment are smaller in size than the surface acoustic wave resonators 16 and 18 to which the resonators 15 and 17 are coupled in series, it is possible to smoothly dispose the surface acoustic wave resonators 15 and 17 by effectively using space on the piezoelectric substrate 2.
  • the input terminals of the three-IDT-type first and second surface acoustic wave filter elements are commonly coupled to each other and then coupled to the first or second unbalanced terminal.
  • the configurations of the first and second surface acoustic wave filter sections are not limited to the above-mentioned embodiment. Other embodiments that are a modification of the above-mentioned configurations of the first and second surface acoustic wave filter sections will be described with reference to Figs. 7 to 14 .
  • IDTs of each surface acoustic wave filter element are schematically shown using rectangular blocks.
  • reflectors are schematically shown using rectangular blocks each containing X.
  • one-port-type surface acoustic wave resonators are schematically shown using circuit symbols indicating resonators.
  • the configuration of the first surface acoustic wave filter section 3 is hatched using multiple dots.
  • Fig. 7 is a schematic plan view showing an electrode structure of a surface acoustic wave filter apparatus 40 according to a second embodiment of the present invention.
  • the surface acoustic wave filter apparatus 40 according to this embodiment is different in the following points from the surface acoustic wave filter apparatus 1 according to the first embodiment.
  • none of the surface acoustic wave resonators 11 and 14 is provided, and the input terminals of the first and second surface acoustic wave filter sections 3 and 4 are directly coupled to the first and second unbalanced terminals 5 and 6, respectively.
  • three-IDT-type, longitudinally coupled resonator-type third and fourth surface acoustic wave filter elements 41 and 42 are longitudinally coupled to the output terminals of the first and second surface acoustic wave filter elements 21 and 22, respectively.
  • three-IDT-type, longitudinally coupled resonator-type third and fourth surface acoustic wave filter elements 43 and 44 are longitudinally coupled to the rear of the first and second surface acoustic wave filter elements 23 and 24, respectively.
  • the third and fourth surface acoustic wave filter elements 41 to 44 are both configured not to have a balance-unbalance conversion function.
  • the surface acoustic wave resonators 15 and 17 for impedance adjustment are omitted.
  • the first and second surface acoustic wave filter sections 3 and 4 according to the present invention may have a two-stage, longitudinally coupled structure where surface acoustic wave filter elements are additionally coupled to the rear of the first and second surface acoustic wave filter elements.
  • Fig. 8 is a schematic plan view showing an electrode structure of a surface acoustic wave filter apparatus 50 according to a third embodiment of the present invention. This embodiment is different in the following points from the first embodiment.
  • the surface acoustic wave resonators 11 and 14 according to the first embodiment are omitted. That is, the first and second surface acoustic wave filter sections 3 and 4 are directly coupled to the first and second unbalanced terminals 5 and 6, respectively.
  • the first surface acoustic wave filter section 3 includes first and second three-IDT-type, longitudinally coupled resonator-type first and second surface acoustic wave filter elements 51 and 52, which are longitudinally coupled in two-stages.
  • the three-IDT-type, longitudinally coupled resonator-type surface acoustic wave filter 51 includes a first IDT 51a, second and third IDTs 51b and 51c disposed on both sides of the IDT 51a in the surface acoustic wave propagation direction, and reflectors 51d and 51e.
  • the surface acoustic wave filter 52 includes a first IDT 52a, second and third IDTs 52b and 52c disposed on both sides of the IDT 52a, and reflectors 52d and 52e.
  • One end of the first IDT 51a of the first surface acoustic wave filter element 51 is coupled to the first unbalanced terminal 5, and the other end thereof is coupled to a ground potential.
  • Ends of the second and third IDTs 51b and 51c are coupled to ground potentials, and the other ends thereof are coupled to ends of the IDTs 52b and 52c, respectively.
  • the other ends of the IDTs 52b and 52c are coupled to ground potentials.
  • One end of the IDT 52a is coupled to the first balanced terminal 7 via the surface acoustic wave resonator 12, and the other end thereof is coupled to the second balanced terminal 8 via the surface acoustic wave resonator 13.
  • the IDT 52a is coupled to the surface acoustic wave resonator 13 via the third wiring line 33.
  • the second surface acoustic wave filter section 4 also includes three-IDT-type, longitudinally coupled resonator-type first and second surface acoustic wave filter elements 53 and 54, which are longitudinally coupled in two-stages.
  • One end of the first IDT 53a of the first surface acoustic wave filter element 53 is coupled to the second unbalanced terminal 6, and the other end thereof is coupled to a ground potential.
  • Ends of the IDTs 53b and 53c are coupled to ground potentials, and the other ends thereof are coupled to ends of IDTs 54b and 54c, respectively.
  • the other ends of the IDTs 54b and 54c are coupled to ground potentials.
  • One end of the IDT 54a is coupled to the surface acoustic wave resonator 16 via the second wiring line 32 and then coupled to the first balanced terminal 7 via the surface acoustic wave resonator 16.
  • the other end of the IDT 54a is coupled to the surface acoustic wave resonator 18 via the fourth wiring line 34 and then coupled to the second balanced terminal 8 via the surface acoustic wave resonator 18.
  • the surface acoustic wave filter elements 53 and 54 include reflectors 53d and 53e and reflectors 54d and 54e, respectively.
  • the surface acoustic wave filter apparatus is configured so that, by taking out signals from the one end and the other end of the first IDT 52a of the second surface acoustic wave filter element 52, the first surface acoustic wave filter section 3 has a balance-unbalance conversion function.
  • the second surface acoustic wave filter section 4 is also configured to have a balance-unbalance conversion function in the same way. With respect to the other points, this embodiment has the same configuration as that of the second embodiment.
  • Fig. 9 is a schematic plan view showing an electrode structure of a surface acoustic wave filter apparatus according to a fourth embodiment of the present invention.
  • a surface acoustic wave filter apparatus 60 according to the fourth embodiment is equivalent to a structure obtained by deforming the surface acoustic wave filter apparatus 50 according to the third embodiment.
  • a second surface acoustic wave filter element 52A is provided instead of the second surface acoustic wave filter element 52 of the first surface acoustic wave filter section 3, as shown in Fig. 9 .
  • a centrally disposed IDT 52g includes first and second division IDT portions 52h and 52i obtained by dividing the IDT 52g in the surface acoustic wave propagation direction.
  • the division IDT portion 52h is coupled to the surface acoustic wave resonator 12 via the first wiring line 31 and then coupled to the first balanced terminal 7 via the surface acoustic wave resonator 12.
  • the division IDT portion 52i is coupled to the surface acoustic wave resonator 13 via the third wiring line 33 and then coupled to the second balanced terminal 8 via the surface acoustic wave resonator 13.
  • a surface acoustic wave filter element 54A is provided instead of the fourth surface acoustic wave filter element 54 of the second surface acoustic wave filter section 4.
  • a centrally disposed first IDT 54g includes first and second division IDT portions 54h and 54i obtained by dividing the first IDT 54g into two portions in the surface acoustic wave propagation direction.
  • the division IDT portion 54h is coupled to the surface acoustic wave resonator 16 via the second wiring line 32 and then coupled to the first balanced terminal 7 via the surface acoustic wave resonator 16.
  • one end of the division IDT portion 54i is coupled to the surface acoustic wave resonator 18 via the fourth wiring line 34 and then coupled to the second balanced terminal 8 via the surface acoustic wave resonator 18.
  • the other components are the same as those of the third embodiment, so the components are given same reference numerals and will not be described.
  • Fig. 10 is a schematic plan view showing an electrode structure of a surface acoustic wave filter apparatus according to a fifth embodiment of the present invention.
  • the first and second surface acoustic wave filter sections 3 and 4 are formed of five-IDT-type, longitudinally coupled resonator-type first and second surface acoustic wave filter elements 72 and 73, respectively.
  • this embodiment is the same as the second to fourth embodiments.
  • the first surface acoustic wave filter element 72 includes a first IDT 72a, second and third IDTs 72b and 72c disposed on both sides of the first IDT 72a in the surface acoustic wave propagation direction, and fourth and fifth IDTs 72d and 72e disposed on both sides in the surface acoustic wave propagation direction, of the area where the IDTs 72a to 72c are provided.
  • the surface acoustic wave filter element 73 also includes first to fifth IDTs 73a to 73e configured in the same way.
  • the surface acoustic wave filter elements 72 and 73 include reflectors 72f and 72g and reflectors 73f and 73g, respectively, provided on both ends thereof in the surface acoustic wave propagation direction.
  • ends of the first IDT 72a and fourth and fifth IDTs 72d and 72e are commonly coupled to one another and then coupled to the first unbalanced terminal 5, and the other ends thereof are coupled to ground potentials.
  • Ends of the second and third IDTs 72b and 72c are coupled to ground potentials.
  • the other end of the IDT 72b is coupled to the first surface acoustic wave resonator 12 via the first wiring line 31 and then coupled to the first balanced terminal 7 via the surface acoustic wave resonator 12.
  • the other end of the IDT 72c is coupled to the surface acoustic wave resonator 13 via the third wiring line 33 and then coupled to the second balanced terminal 8 via the surface acoustic wave resonator 13.
  • the other ends of the first, fourth, and fifth IDTs 73a, 73d, and 73e are coupled to ground potentials, and ends thereof are commonly coupled to one another and then coupled to the second unbalanced terminal 6.
  • One end of the second IDT 73b is coupled to a ground potential, and the other end thereof is coupled to the surface acoustic wave resonator 16 via the second wiring line 32. That is, the IDT 73b is coupled to the first balanced terminal 7 via the surface acoustic wave resonator 16.
  • one end of the IDT 73c is coupled to a ground potential, and the other end thereof is coupled to the surface acoustic wave resonator 18 via the fourth wiring line 34 and then coupled to the second balanced terminal 8 via the surface acoustic wave resonator 18.
  • the first and second surface acoustic wave filter sections 3 and 4 may be configured using five-IDT-type, longitudinally coupled resonator-type surface acoustic wave filter elements. That is, in the present invention, the surface acoustic wave filter sections 3 and 4 can be configured using longitudinally coupled resonator-type surface acoustic wave filters including three or more IDTs, that is, at least three IDTs, but not limited thereto.
  • Fig. 11 is a schematic plan view showing an electrode structure of a surface acoustic wave filter apparatus according to a sixth embodiment of the present invention.
  • the first and second surface acoustic wave filter section 3 and 4 each have a structure where five-IDT-type, longitudinally coupled resonator-type surface acoustic wave filter elements are longitudinally coupled in two stages.
  • the surface acoustic wave filter section 3 is configured by coupling five-IDT-type, longitudinally coupled resonator-type first and second surface acoustic wave filter elements 82 and 83 longitudinally in two stages. Ends of the second and third IDTs 82b and 82c are commonly coupled to each other and then coupled to the first unbalanced terminal 5, and the other ends thereof are coupled to ground potentials. Ends of first, fourth, and fifth IDTs 82a, 82d, and 82e are coupled to ground potentials. The other ends thereof are coupled to ends of first, fourth, and fifth IDTs 83a, 83d, and 83e, respectively, of a second surface acoustic wave filter element 83.
  • the other ends of the IDTs 83a, 83d, 83e are coupled to ground potentials. Ends of the IDTs 83b and 83c are coupled to ground potentials.
  • the other end of the second IDT 83b is coupled to the surface acoustic wave resonator 12 via the first wiring line 31 and then coupled to the first balanced terminal 7 via the surface acoustic wave resonator 12.
  • the other end of the third IDT 83c is coupled to the third surface acoustic wave resonator 13 via the third wiring line 33 and then coupled to the second balanced terminal 8 via the surface acoustic wave resonator 13.
  • five-IDT-type, longitudinally coupled resonator-type surface acoustic wave filter elements 84 and 85 are longitudinally coupled in two stages. Portions corresponding to those of the surface acoustic wave filter elements 82 and 83, of the surface acoustic wave filter elements 84 and 85 are given corresponding reference numerals. For this reason, the portions will not be described.
  • one end of the second IDT section 85b of the second surface acoustic wave filter element 85 is coupled to the surface acoustic wave resonator 16 via the second wiring line 32 and then coupled to the first balanced terminal 7 via the surface acoustic wave resonator 16.
  • one end of the third IDT section 85c is coupled to the surface acoustic wave resonator 18 via the fourth wiring line 34 and then coupled to the second balanced terminal 8 via the surface acoustic wave resonator 18.
  • the surface acoustic wave filter sections 82 to 85 include reflectors 82f and 82g, reflectors 83f and 83g, reflectors 84f and 84g, and reflectors to 85f and 85g, respectively, disposed on both ends thereof.
  • first and second surface acoustic wave filter sections 3 and 4 may each have a structure where five-IDT-type, longitudinally coupled resonator-type surface acoustic wave filter sections are longitudinally coupled in two stages.
  • Fig. 12 is a schematic plan view showing an electrode structure of a surface acoustic wave filter apparatus according to a seventh embodiment of the present invention.
  • the surface acoustic wave filter apparatus 91 is equivalent to a modification of the surface acoustic wave filter apparatus according to the first embodiment. Specifically, the surface acoustic wave filter apparatus 91 according to this embodiment is different from the surface acoustic wave filter apparatus according to the first embodiment in that the surface acoustic wave filter element 91 includes none of the surface acoustic wave resonators 11, 14, 15, and 17 and uses five-IDT-type, longitudinally coupled resonator-type surface acoustic wave filter elements 92, 93, 94, and 95 instead of the three-IDT-type, longitudinally coupled resonator-type surface acoustic wave filter elements 21, 22, 23, and 24. With respect to the other points, this embodiment is the same as the first embodiment. For this reason, same portions are given same reference numerals and will not be described.
  • ends of the five-IDT-type, longitudinally coupled resonator-type surface acoustic wave filters 92 and 93 are coupled to the first unbalanced terminal 5.
  • the other end of the surface acoustic wave filter element 92 is coupled to the surface acoustic wave resonator 12 via the first wiring line 31.
  • the other end of the surface acoustic wave filter element 93 is coupled to the surface acoustic wave resonator 13 via the third wiring line 33.
  • ends of the surface acoustic wave filter elements 94 and 95 are commonly coupled to each other and then coupled to the second unbalanced terminal 6.
  • the other end of the surface acoustic wave filter element 94 is coupled to the surface acoustic wave resonator 16 via the second wiring line 32.
  • the other end of the surface acoustic wave filter element 95 is coupled to the surface acoustic wave resonator 18 via the fourth wiring line 34.
  • Fig. 13 is a schematic plan view showing an electrode structure of a surface acoustic wave filter apparatus according to an eighth embodiment of the present invention.
  • the first and second surface acoustic wave filter section 3 and 4 are each configured using five-IDT-type, longitudinally coupled resonator-type four surface acoustic wave filter elements.
  • the first surface acoustic wave filter section 3 includes five-IDT-type, longitudinally coupled resonator-type surface acoustic wave filter elements 102 and 103 whose input terminals are commonly coupled to the first unbalanced terminal 5.
  • Five-IDT-type, longitudinally coupled resonator-type third and fourth surface acoustic wave filter elements 104 and 105 are coupled to the rear of the longitudinally coupled resonator-type first and second surface acoustic wave filter elements 102 and 103, respectively.
  • ends of five-IDT-type, longitudinally coupled resonator-type first and second surface acoustic wave filter elements 106 and 107 are commonly coupled to each other and then coupled to the second unbalanced terminal 6.
  • Five-IDT-type, longitudinally coupled resonator-type third and fourth surface acoustic wave filter elements 108 and 109 are coupled to the rear of the first and second resonator-type surface acoustic wave filter elements 106 and 107, respectively.
  • first and second surface acoustic wave filter sections 3 and 4 may each be configured to have two structures, in each of which five-IDT-type, longitudinally coupled resonator-type surface acoustic wave filter elements are longitudinally coupled in two stages.
  • Fig. 14 is a schematic plan view showing an electrode structure of a surface acoustic wave filter apparatus according to a ninth embodiment of the present invention.
  • the first surface acoustic wave filter section 3 of the surface acoustic wave filter apparatus 111 includes three-IDT-type, longitudinally coupled resonator-type first and second surface acoustic wave filter elements 21 and 22.
  • the second surface acoustic wave filter section 4 of the above-mentioned surface acoustic wave filter apparatus 71 shown in Fig. 10 the second surface acoustic wave filter section 4 includes a five-IDT-type, longitudinally coupled resonator-type surface acoustic wave filter 73.
  • the surface acoustic wave filter apparatus 111 according to this embodiment has the same configuration as that of the surface acoustic wave filter apparatus 71 shown in Fig. 10 .
  • one of the first and second surface acoustic wave filters 3 and 4 may be configured using a five-IDT-type, longitudinally coupled resonator-type surface acoustic wave filter element, and the other thereof may be configured using a three-IDT-type, longitudinally coupled resonator-type surface acoustic wave filter element. That is, the number of the IDTs of the surface acoustic wave filter element forming the first surface acoustic wave filter section may be equal to or different from the number of the IDTs of the longitudinally coupled resonator-type surface acoustic wave filter element forming the second surface acoustic wave filter section.
  • the number of the surface acoustic wave filter elements of the first surface acoustic wave filter section 3 may be equal to or different from the number of the surface acoustic wave filter elements of the second surface acoustic wave filter section 4.
  • the second wiring line 32 and third wiring line 33 cross each other. Therefore, as with the first embodiment, the balancing can be improved and the insertion loss can be reduced.
  • a feature of the present invention is an electrode structure where the above-mentioned first and second surface acoustic wave filter sections 3 and 4 are coupled to the first to fourth surface acoustic wave resonators.
  • the present invention is also applicable to acoustic boundary wave apparatuses using acoustic boundary waves.
  • a dielectric material is laminated on a piezoelectric substrate 122 made of a piezoelectric material.
  • An electrode structure 124 including IDTs is provided on the interface between the piezoelectric substrate 122 and dielectric material 123.

Landscapes

  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
EP07860149.9A 2007-02-02 2007-12-26 Dispositif de filtre d'onde élastique Active EP2128981B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007023886 2007-02-02
PCT/JP2007/074920 WO2008096514A1 (fr) 2007-02-02 2007-12-26 Dispositif de filtre d'onde élastique

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EP2128981A1 true EP2128981A1 (fr) 2009-12-02
EP2128981A4 EP2128981A4 (fr) 2013-06-05
EP2128981B1 EP2128981B1 (fr) 2014-12-17

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EP (1) EP2128981B1 (fr)
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WO (1) WO2008096514A1 (fr)

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CN102144357A (zh) 2008-09-18 2011-08-03 株式会社村田制作所 双工器模块
JP2011087282A (ja) * 2009-09-15 2011-04-28 Murata Mfg Co Ltd 弾性境界波フィルタ及びそれを備える分波器
DE102010021164B4 (de) * 2010-05-21 2019-02-21 Snaptrack, Inc. Balanced/Unbalanced arbeitendes SAW Filter
WO2012063446A1 (fr) * 2010-11-09 2012-05-18 パナソニック株式会社 Dispositif à onde acoustique
US9048816B2 (en) 2011-02-28 2015-06-02 Kyocera Corporation Acoustic wave filter
WO2012120879A1 (fr) * 2011-03-09 2012-09-13 パナソニック株式会社 Appareil à onde élastique
WO2013118240A1 (fr) * 2012-02-06 2013-08-15 太陽誘電株式会社 Circuit de filtrage et module
KR20160006773A (ko) 2013-06-13 2016-01-19 가부시키가이샤 무라타 세이사쿠쇼 필터장치 및 듀플렉서
WO2020080018A1 (fr) * 2018-10-16 2020-04-23 株式会社村田製作所 Module haute fréquence

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JP4222197B2 (ja) * 2003-02-24 2009-02-12 株式会社村田製作所 弾性表面波フィルタ、通信機
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JPWO2008096514A1 (ja) 2010-05-20
JP4702454B2 (ja) 2011-06-15
US7868716B2 (en) 2011-01-11
US20090273409A1 (en) 2009-11-05
EP2128981A4 (fr) 2013-06-05
WO2008096514A1 (fr) 2008-08-14
EP2128981B1 (fr) 2014-12-17

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