EP2000767A3 - Système de mesure d'angle - Google Patents

Système de mesure d'angle Download PDF

Info

Publication number
EP2000767A3
EP2000767A3 EP08009491A EP08009491A EP2000767A3 EP 2000767 A3 EP2000767 A3 EP 2000767A3 EP 08009491 A EP08009491 A EP 08009491A EP 08009491 A EP08009491 A EP 08009491A EP 2000767 A3 EP2000767 A3 EP 2000767A3
Authority
EP
European Patent Office
Prior art keywords
laser beam
sensor device
photodetection sensor
radio communication
surveying instrument
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP08009491A
Other languages
German (de)
English (en)
Other versions
EP2000767B1 (fr
EP2000767A2 (fr
Inventor
Fumio Ohtomo
Kaoru Kumagai
Fumihiko Kamizono
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Topcon Corp
Original Assignee
Topcon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Topcon Corp filed Critical Topcon Corp
Publication of EP2000767A2 publication Critical patent/EP2000767A2/fr
Publication of EP2000767A3 publication Critical patent/EP2000767A3/fr
Application granted granted Critical
Publication of EP2000767B1 publication Critical patent/EP2000767B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G01C15/002—Active optical surveying means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/42—Simultaneous measurement of distance and other co-ordinates

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Measurement Of Optical Distance (AREA)
  • Length Measuring Devices By Optical Means (AREA)
EP08009491.5A 2007-06-08 2008-05-23 Système de mesure d'angle Active EP2000767B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007152842A JP5207665B2 (ja) 2007-06-08 2007-06-08 測定システム

Publications (3)

Publication Number Publication Date
EP2000767A2 EP2000767A2 (fr) 2008-12-10
EP2000767A3 true EP2000767A3 (fr) 2010-02-24
EP2000767B1 EP2000767B1 (fr) 2015-06-24

Family

ID=39773172

Family Applications (1)

Application Number Title Priority Date Filing Date
EP08009491.5A Active EP2000767B1 (fr) 2007-06-08 2008-05-23 Système de mesure d'angle

Country Status (4)

Country Link
US (1) US7633609B2 (fr)
EP (1) EP2000767B1 (fr)
JP (1) JP5207665B2 (fr)
CN (1) CN101319898B (fr)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5280258B2 (ja) * 2009-03-16 2013-09-04 株式会社トプコン 測量システム
DE102010011217A1 (de) * 2010-03-11 2011-09-15 Salzgitter Mannesmann Line Pipe Gmbh Verfahren und Vorrichtung zur Messung der Profilgeometrie von sphärisch gekrümmten, insbesondere zylindrischen Körpern
JP5456532B2 (ja) * 2010-03-25 2014-04-02 株式会社トプコン 回転レーザ装置及び回転レーザシステム
JP5456549B2 (ja) 2010-04-15 2014-04-02 株式会社トプコン 測量システム及び測量システムに於けるレーザ基準面平滑化方法
DE102010061726A1 (de) 2010-11-22 2012-05-24 Hilti Aktiengesellschaft Rotationslasergerät und Verfahren zur Steuerung eines Laserstrahls
DE102010061725A1 (de) 2010-11-22 2012-05-24 Hilti Aktiengesellschaft Rotationslasergerät mit einer geneigten Laserebene und Verfahren zur Ausrichtung eines Rotationslasergerätes
CN102346034B (zh) * 2011-09-22 2014-01-22 苏州亿帝电子科技有限公司 静态远距离激光平面仪
US9222771B2 (en) 2011-10-17 2015-12-29 Kla-Tencor Corp. Acquisition of information for a construction site
JP5879420B1 (ja) * 2014-10-27 2016-03-08 東芝電波プロダクツ株式会社 射撃訓練システム及び受光装置
KR101886195B1 (ko) * 2016-11-15 2018-08-08 한국국토정보공사 Gnss 측량 모듈과 연계한 토탈측량시스템, 토탈측량방법 및 이를 기록한 기록매체
CN111795655B (zh) * 2020-08-04 2021-10-08 苏交科集团股份有限公司 一种轮廓标安装角度测量装置及其测量方法

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5000564A (en) * 1990-03-09 1991-03-19 Spectra-Physics, Inc. Laser beam measurement system
WO1992019935A1 (fr) * 1991-05-08 1992-11-12 Geotronics Ab Dispositif de compensation pour niveau de hauteur
WO2000022380A1 (fr) * 1998-10-13 2000-04-20 Arc Second, Inc. Emetteur optique a tete rotative pour systeme de mesure de position
EP1006339A2 (fr) * 1998-12-03 2000-06-07 Kabushiki Kaisha Topcon Système d'illumination rotatif à laser et système de photodétection
US6314650B1 (en) * 1999-02-11 2001-11-13 Laser Alignment, Inc. Laser system for generating a reference plane
US20050254043A1 (en) * 2004-05-14 2005-11-17 Sokkia Co., Ltd. Survey system
US20070024845A1 (en) * 2000-08-01 2007-02-01 Androtec Gmbh Measuring device and measuring method for determining distance and/or position

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2689266B2 (ja) * 1988-09-02 1997-12-10 株式会社小松製作所 三次元位置測量装置
JPH09229686A (ja) * 1996-02-21 1997-09-05 Laser Technol Inc データを決定し伝達する装置及び方法
JPH10246634A (ja) 1997-03-04 1998-09-14 Kubota Corp 無線式伝送装置及び移動体の位置情報検出装置
JP4416925B2 (ja) * 2000-07-19 2010-02-17 株式会社トプコン 位置測定設定システム及びそれに使用する受光センサ装置
US6693706B2 (en) * 2002-01-08 2004-02-17 Trimble Navigation Limited Laser reference system and method of determining grade rake
JP2004212058A (ja) 2002-12-26 2004-07-29 Topcon Corp 作業位置測定装置
JP4328654B2 (ja) * 2004-03-23 2009-09-09 株式会社トプコン レーザ測定方法及びレーザ測定システム
JP4383308B2 (ja) * 2004-10-06 2009-12-16 有限会社コンチェルト 自動測量装置
JP4819403B2 (ja) 2005-06-06 2011-11-24 株式会社トプコン 距離測定装置
JP5020585B2 (ja) 2006-09-27 2012-09-05 株式会社トプコン 測定システム

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5000564A (en) * 1990-03-09 1991-03-19 Spectra-Physics, Inc. Laser beam measurement system
WO1992019935A1 (fr) * 1991-05-08 1992-11-12 Geotronics Ab Dispositif de compensation pour niveau de hauteur
WO2000022380A1 (fr) * 1998-10-13 2000-04-20 Arc Second, Inc. Emetteur optique a tete rotative pour systeme de mesure de position
EP1006339A2 (fr) * 1998-12-03 2000-06-07 Kabushiki Kaisha Topcon Système d'illumination rotatif à laser et système de photodétection
US6314650B1 (en) * 1999-02-11 2001-11-13 Laser Alignment, Inc. Laser system for generating a reference plane
US20070024845A1 (en) * 2000-08-01 2007-02-01 Androtec Gmbh Measuring device and measuring method for determining distance and/or position
US20050254043A1 (en) * 2004-05-14 2005-11-17 Sokkia Co., Ltd. Survey system

Also Published As

Publication number Publication date
EP2000767B1 (fr) 2015-06-24
JP5207665B2 (ja) 2013-06-12
US7633609B2 (en) 2009-12-15
US20080304041A1 (en) 2008-12-11
CN101319898B (zh) 2011-07-06
JP2008304371A (ja) 2008-12-18
CN101319898A (zh) 2008-12-10
EP2000767A2 (fr) 2008-12-10

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