EP1971875A1 - Procédé secum-trahenz destiné notamment à un analyseur de réseau - Google Patents

Procédé secum-trahenz destiné notamment à un analyseur de réseau

Info

Publication number
EP1971875A1
EP1971875A1 EP07702606A EP07702606A EP1971875A1 EP 1971875 A1 EP1971875 A1 EP 1971875A1 EP 07702606 A EP07702606 A EP 07702606A EP 07702606 A EP07702606 A EP 07702606A EP 1971875 A1 EP1971875 A1 EP 1971875A1
Authority
EP
European Patent Office
Prior art keywords
frequency
signal
local oscillator
signal generator
dut
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP07702606A
Other languages
German (de)
English (en)
Inventor
Georg Ortler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohde and Schwarz GmbH and Co KG
Original Assignee
Rohde and Schwarz GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohde and Schwarz GmbH and Co KG filed Critical Rohde and Schwarz GmbH and Co KG
Publication of EP1971875A1 publication Critical patent/EP1971875A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
    • G01R23/14—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by heterodyning; by beat-frequency comparison
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/173—Wobbulating devices similar to swept panoramic receivers

Definitions

  • the invention relates to a method with which a phase-true frequency change of the signal generators and the local oscillator, e.g. of a network analyzer. This method is referred to in this application as Secum-Trahenz method.
  • network analyzers with more than two measuring ports usually have a plurality of signal generators.
  • the network analyzer with three test ports two signal generators are present, with one of the two signal generators between two of the three
  • Test gates can be switched.
  • a mixer is present, which communicates with a directional coupler, over which the output via the tester shaft or the incoming via the tester shaft is coupled and fed into the mixer.
  • the other input of the mixer is in communication with the local oscillator.
  • the signal generators there is the problem that a frequency change of the signal generators is to be carried out in phase, ie in the frequency change should not occur phase shift.
  • the signal generators typically have synthesizers with multiple PLL (Phase Locked Loop) stages with fractional dividers.
  • the dividers are divided by a fractional rational division factor. If the division factor is changed not only with respect to its integer part, it leads this usually leads to a phase jump. Even if only the integer division factor is changed, there may be phase jumps around n / n, where n is an integer.
  • the necessity of carrying out a phase-true frequency change arises in particular when measuring at frequency-converting measurement objects, such as mixers.
  • the invention is therefore based on the object of specifying a method for measuring objects to be measured, in which no phase jump occurs during the frequency change or the phase jump is at least detected.
  • Signal generator can be compensated or can be included in the later evaluation of the measurement.
  • Division factor is changed, since this causes no phase shift. As a result, a rough frequency change in the vicinity of the new target frequency can already be achieved.
  • the then still necessary fine frequency tuning can now be made by varying the Nachko ⁇ unaanteils the division factor, then according to the invention only either the frequency of the oscillator or the signal generator but not both frequencies are adjusted simultaneously, so that the phase change of the oscillator and the signal generator can be detected separately.
  • the method according to the invention can be used particularly advantageously in frequency-converting measuring objects, for example in the measurement of mixers.
  • one input of the mixer is to occupy, for example, a frequency in the high-frequency input bandwidth, while the other input, a signal must be supplied, which serves as a local oscillator signal for the mixer to be measured.
  • a signal At the output of the mixer appears the sum or difference frequency of the two
  • Fig. 1 is a block diagram of one in the context of
  • Fig. 2 shows an embodiment of the internal structure of the local oscillator shown in Fig. 1 and the signal generators shown in Fig. 1.
  • a frequency-converting measurement object DUT for example a mixer
  • a vectorial network analyzer for example a vectorial network analyzer
  • the first input port El of the mixer DUT to be measured is a high-frequency input to which the high-frequency signal
  • the second input port E2 is an input port at which the local oscillator signal LO_DUT is received.
  • the first input port El of the frequency-converting measuring object DUT designed as a mixer is connected to the first measuring port Pl of the network analyzer NA.
  • the second input port E2 of the measurement object DUT is connected to the third measurement port P3 of the network analyzer NA.
  • At the exit gate A of the to be measured Mischers DUT is the down mixed intermediate frequency signal ZF_DUT.
  • the output port A of the measurement object DUT is connected to the second measurement port P2 of the network analyzer NA.
  • the S-parameters S 11 ie the reflection of the measurement object DUT at the measurement port Pl, S 33 , ie the reflection of the measurement object DUT at the measurement port P 3, S 21 , ie the transmission through the measurement object DUT from the measurement port Pl to the measurement port P2, are of interest. and S 23 , ie the transmission through the measuring object DUT from the measuring port P3 to the measuring port P2.
  • the network analyzer NA shown in FIG. 1 is designed as a conventional vector multi-port network analyzer. In Fig. 1, only three test ports Pl to P3 are shown. Of course, the network analyzer NA can also have more than three test ports. It is also possible to connect several two-port network analyzers in cascade, as shown in the priority document DE 10 2006 001 284.
  • each measuring port Pl, P2 or P3 has its own signal generator GN1, GN2 or GN3.
  • a common local oscillator LO for all test ports Pl to P3 is present. Again, this need not necessarily be the case.
  • a separate local oscillator can be present for each test port Pl to P3, or a local oscillator can supply two test ports in pairs.
  • the frequency of the signal generators GN1, GN2 and GN3 and of the local oscillator LO is in each case via dividers T 01 , T G2 , T G3 and T 10 , which form part of a closed phase-locked loop according to the PLL principle and those in FIG are schematically drawn and based on Fig. 2 will be described in more detail, changeable.
  • the divided-down signal of the signal generators GN1, GN2 and GN3 is supplied to the associated measuring ports P1, P2 and P3, respectively.
  • each a directional coupler Rl, R2 and R3 which generates the signal generated by the signal generators GNL, GN2 and GN3 to the test ports Pl, P2 and P3 leading wave al, a2 or a3 decouples and in each case an associated mixer Ml, M2 or M3 supplies.
  • the returning waves b1, b2 and b3 received via the measuring ports P1, P2 and P3 are likewise coupled out via the directional couplers R1, R2 and R3 and fed to the associated mixer M1, M2 and M3, respectively.
  • the mixers M1, M2 and M3 in each case also receive the signal of the local oscillator LO which may have been divided down in the divider T 1x .
  • the signal of the leading and returning waves mixed down into the intermediate frequency ranges ZF1, ZF2 or ZF3 is respectively fed to an analog / digital converter A1, A2 or A3 and the digitized signal is respectively measured in a detector D1, D2 or D3 with respect to amplitude and Phase recorded.
  • a control device or controller C receives the signals received by the detectors D1 to D3 and simultaneously serves to drive the signal generators GN1 to GN3, the local oscillator LO and the associated dividers T 01 , T 02 , T 03 and T ⁇ 5 . From the leading and returning waves, for example, the S-parameters are calculated in the control device C and displayed on a display DS as a function of the measuring frequency.
  • the exact structure of the signal generators GN1 to GN3 of the local oscillator LO is shown as an exemplary embodiment in Fig. 2, wherein it can be seen that the signal generators GNL to GN3 and the local oscillator LO with multiple PLL stages with multiple dividers 64, 67 and 77th are constructed.
  • the reference signal REF is transmitted to the local oscillator LO and the signal generators GN1-GN3 via the connection line 31, respectively.
  • the frequency of the reference signal REF in a frequency doubler 60 is first doubled in the local oscillator LO or in the signal generators GN1-GN3 and supplied to a first comparison input of a first phase detector 61 within the local oscillator LO or signal generator.
  • the output of the first phase detector 61 is connected to the control input 63 of a first oscillator 62.
  • the output of the first oscillator 62 is connected via a first fractional divider 64 to the second comparison input of the first phase detector 61. Consequently, the first oscillator 62 forms with the divider 64 and the first
  • Phase detector 61 Phase detector 61, a first PLL control loop, which is synchronized with the reference signal REF.
  • This first PLL loop in section 65 is also called Child_PLL.
  • the divider 64 divides the frequency by the fractional rational division factor (N, F) CH with the integer component N and the non-integer decimal component F.
  • the adjoining section 66 is called Sweep_PLL.
  • a synchronous module 68 ensures the selection of the fractional-rational division factor (N, F) SY of the divider 67.
  • the output of the second divider 67 is connected to a first comparison input of a second phase detector 69. Its output is in turn connected to the control input 70 of a second oscillator 71 in connection.
  • the output of the second oscillator 71 is connected to a first input of a mixer 72.
  • a second input of the mixer 72 receives that from the
  • Frequency doubler 60 doubled reference signal REF The output of the mixer 72 is connected to the second comparison input of the second phase detector 69 in connection. In this way, by the second Oscillator 71, the mixer 72 and the phase detector 69, a second PLL control loop is formed, which is also synchronized via the reference signal REF.
  • a third section 73 which is referred to as MAIN_PLL, there is a third oscillator 74 whose control input 75 is connected to a third phase detector 76.
  • a first comparison input of the third phase detector 76 is connected to the output of the second oscillator 71, while a second
  • Comparative input of the third phase detector 76 is connected via a third divider 77 to the output of the third oscillator 74.
  • the output of the third oscillator 74 which may also be referred to as a main oscillator, is the local oscillator signal or
  • the frequency f ⁇ is tunable over several octaves.
  • the divider 77 also divides the frequency by a fractional rational division factor (N, F) m .
  • the measurement on the mixer DUT according to the exemplary embodiment according to FIG. 1 preferably takes place according to the invention as follows:
  • Waves al and a3 as well as the reflected waves at these test ports bl and b3 can only be measured at the same measurable receiver intermediate frequency when the network analyzer NA is set because of the local oscillator LO which is simply present in the exemplary embodiment, if the frequency in the signal generators GN1 and GN3 within the bandwidth of the intermediate frequency range ZFl or ZF3 are the same.
  • the intermediate frequency of the mixer to be measured, or generally of the frequency-converting measuring object DUT only to be analyzed when the local oscillator LO is set for this receiving frequency.
  • the frequency of the two signal generators GN1 and GN3 at the measuring ports P1 and P3 is set to the same frequency, for example 1 GHz. Possible phase differences of the generators GN1 and GN3 are known from calibration with calibration standards and can be taken into account accordingly. If the
  • Center frequency of the intermediate frequency ranges ZFl, ZF2 and ZF3 of the network analyzer NA for example, 20 MHz, so is the frequency of the local oscillator LO first in this example to 1.020 GHz.
  • the frequency of the signal generator GN3 at the measuring port P3 must be brought to the target frequency of the measuring signal LO_DUT by the phase-true frequency change according to the invention, which the mixer DUT to be measured expects at its second input E2.
  • the intermediate frequency ZF_DUT generated by the mixer DUT 30 MHz
  • the frequency offset between the signal RF_DUT and the signal LO_DUT must be 30 MHz and thus the frequency of the signal generator GN3 increased from 1 GHz to 1.030 GHz. According to the invention, only the
  • Frequency of the local oscillator LO changed without frequency change of the signal generator GN3 and then subsequently changed only the frequency of the signal generator GN3 but not the frequency of the local oscillator LO.
  • the step size is to be chosen so small that the bandwidth of the intermediate frequency range ZF3 is not left. This process must be repeated as often as necessary until finally the target frequency in the example of 1.030 GHz is reached.
  • the frequency of the local oscillator LO is first increased by 5 MHz from the original 1.020 GHz to now 1.025 GHz.
  • the intermediate frequency of the intermediate frequency stage ZF3 is thus instead of originally 20 MHz now 25 MHz.
  • Step is now measured, stored in a memory and taken into account in the later evaluation.
  • the phase change caused thereby A ⁇ a32 on the leading measurement port P3 shaft a3 is again measured and stored.
  • the frequency of the local oscillator LO is again set higher by a further 10 MHz to 1.035 GHz.
  • the frequency of the intermediate frequency signal in Intermediate frequency range ZF3 is now again 25 MHz.
  • the associated phase change ⁇ a33 is again detected and stored.
  • the frequency of the signal generator GN3 at the measuring port P3 is retraced by another 10 MHz to 1.020 GHz, so that again a
  • Intermediate frequency of 15 MHz results.
  • the ⁇ a ⁇ t phase change associated with this step is also detected and stored. It should be emphasized that the bandwidth of the intermediate frequency range ZF3 as well as all other intermediate frequency ranges ZF1 and ZF2 is significantly wider than 5 MHz, that both the resulting intermediate frequency of 15 MHz and 25 MHz are within the bandwidth extending around the center frequency of 20 MHz lie.
  • the process is repeated until the frequency of the signal generator GN3 at 1.030 GHz and the associated frequency of the local oscillator at 1.050 GHz.
  • a step size of 5 MHz is selected as the last increment, so that the frequency of the signal resulting from the last step is
  • Intermediate frequency signal in the intermediate frequency range ZF3 is again 20 MHz.
  • Signal generator GN3 are started and the last step with the frequency increase of the local oscillator LO are completed.
  • the properties of the measurement object DUT to be measured have no influence on the phase position, since only the leading waves a1 and a3, but not the returning waves b1 and b3 reflected by the measurement object DUT, are used.
  • Secum-Trahenz method The method described above is referred to in this application as Secum-Trahenz method.
  • the frequency of the local oscillator LO has to be adjusted so that the intermediate frequency which occurs at the measuring port P2 at the output of the mixer M2 falls within the bandwidth of the intermediate frequency range ZF2.
  • the mixer DUT to be measured At its output port A, the mixer DUT to be measured generates a signal ZF_DUT whose frequency corresponds to the difference between the frequencies of the signals RF_DUT and LO_DUT.
  • a frequency of the signal LO_DUT of 1.030 GHz and a frequency of the signal RF_DUT of 1.000 GHz results in a difference frequency of 30 MHz, which is to be analyzed at the measuring port P2 with respect to amplitude and phase.
  • the frequency of the local oscillator LO has to be adjusted in phase from now 1,050 GHz to 50 MHz, so that the expected frequency of 30 MHz of the signal ZF_DUT is shifted to the middle of the bandwidth of the intermediate frequency Range ZF2 of 20 MHz falls.
  • this can be done with the Secum-Trahenz method described above.
  • the Adjustment from 1.050 GHz to 50 MHz requires a 1GHz adjustment, which would require 202 increments of steps of 10MHz to adjust the local oscillator LO and signal generator GN2.
  • the adjustment with the Secum-Trahenz method would therefore be relatively time-consuming without further measures.
  • the fine tuning according to the Secum-Trahenz method may also be omitted.
  • a network analyzer can be used, which instead of three signal generators only has two signal generators GNL and GN3 available, which are required for the signals at the test ports Pl and P3, so that the Secum-Trahenz method can not be applied to the test port P2 due to the missing signal generator GN2.
  • a third possibility of coping with the large frequency jump of, for example, 1.050 GHz after about 50 MHz, is the measurement at harmonics or subharmonics of the fundamental frequency f 1, of the local oscillator LO.
  • the frequency of the local oscillator LO is left at Setting in which the phase relationship was determined by the Secum-Trahenz method, but measures at a receiver frequency of, for example, f ⁇ / 9 minus the device intermediate frequency of 20 MHz in the example above.
  • the invention is not limited to the embodiment described above.
  • the inventive method is also in network analyzers with more than three Messtoren and less than one
  • Signal generator applicable per test gate is also not limited to network analyzers and can also be used in other devices, for example in signal generators, use, wherein the application is not limited to the measurement of frequency-converting DUTs.

Abstract

L'invention concerne un procédé de mesure d'objet à mesurer (DUT) à l'aide d'un analyseur de réseau (NA) comportant plusieurs portes de mesure (P1-P3), au moins un générateur de signaux (GNl, GN2, GN3) destiné à l'excitation de l'objet à mesurer (DUT) et au moins un oscillateur local (LO) destiné à la mesure du signal réfléchi ou émis par l'objet à mesurer (DUT) selon le principe de superposition. Lors d'un changement de fréquence selon l'invention, seule la fréquence de l'oscillateur local (LO) ou la fréquence du générateur de signaux (GNl, Gn2 , GN3) est modifiée, la fréquence de l'oscillateur local (LO) et celle du générateur de signaux (GI) n'étant pas modifiées simultanément.
EP07702606A 2006-01-10 2007-01-05 Procédé secum-trahenz destiné notamment à un analyseur de réseau Withdrawn EP1971875A1 (fr)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DE102006001284 2006-01-10
DE102006007042 2006-02-15
DE102006017018A DE102006017018A1 (de) 2006-01-10 2006-04-11 Secum-Trahenz-Verfahren, insbesondere für einen Netzwerkanalysator
PCT/EP2007/000070 WO2007080072A1 (fr) 2006-01-10 2007-01-05 Procédé secum-trahenz destiné notamment à un analyseur de réseau

Publications (1)

Publication Number Publication Date
EP1971875A1 true EP1971875A1 (fr) 2008-09-24

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
EP07702606A Withdrawn EP1971875A1 (fr) 2006-01-10 2007-01-05 Procédé secum-trahenz destiné notamment à un analyseur de réseau

Country Status (4)

Country Link
US (1) US8022687B2 (fr)
EP (1) EP1971875A1 (fr)
DE (1) DE102006017018A1 (fr)
WO (1) WO2007080072A1 (fr)

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DE102013200033B4 (de) * 2012-10-10 2023-06-15 Rohde & Schwarz GmbH & Co. Kommanditgesellschaft Verfahren und System zur Bestimmung von Streuparametern eines frequenzumsetzenden Messobjekts
US10042029B2 (en) 2013-04-16 2018-08-07 Keysight Technologies, Inc. Calibration of test instrument over extended operating range
JP6611441B2 (ja) * 2014-02-28 2019-11-27 地方独立行政法人東京都立産業技術研究センター 周波数変換ユニット、計測システム及び計測方法
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US10693570B2 (en) * 2018-08-20 2020-06-23 Rohde & Schwarz Gmbh & Co. Kg Device and method of analyzing a radio frequency signal
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Also Published As

Publication number Publication date
US8022687B2 (en) 2011-09-20
WO2007080072A1 (fr) 2007-07-19
DE102006017018A1 (de) 2007-07-12
US20100141239A1 (en) 2010-06-10

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