EP1794574A4 - Surface plasmon resonance and quartz crystal microbalance sensor - Google Patents

Surface plasmon resonance and quartz crystal microbalance sensor

Info

Publication number
EP1794574A4
EP1794574A4 EP04775618A EP04775618A EP1794574A4 EP 1794574 A4 EP1794574 A4 EP 1794574A4 EP 04775618 A EP04775618 A EP 04775618A EP 04775618 A EP04775618 A EP 04775618A EP 1794574 A4 EP1794574 A4 EP 1794574A4
Authority
EP
European Patent Office
Prior art keywords
surface plasmon
plasmon resonance
quartz crystal
crystal microbalance
microbalance sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
EP04775618A
Other languages
German (de)
French (fr)
Other versions
EP1794574A1 (en
Inventor
Guangyu Wang
Xiaodi Su
Wolfgang Knoll
Ying-Ju Wu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Max Planck Gesellschaft zur Foerderung der Wissenschaften eV
Agency for Science Technology and Research Singapore
Original Assignee
Max Planck Gesellschaft zur Foerderung der Wissenschaften eV
Agency for Science Technology and Research Singapore
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Max Planck Gesellschaft zur Foerderung der Wissenschaften eV, Agency for Science Technology and Research Singapore filed Critical Max Planck Gesellschaft zur Foerderung der Wissenschaften eV
Publication of EP1794574A1 publication Critical patent/EP1794574A1/en
Publication of EP1794574A4 publication Critical patent/EP1794574A4/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/02—Analysing fluids
    • G01N29/022—Fluid sensors based on microsensors, e.g. quartz crystal-microbalance [QCM], surface acoustic wave [SAW] devices, tuning forks, cantilevers, flexural plate wave [FPW] devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/025—Change of phase or condition
    • G01N2291/0255—(Bio)chemical reactions, e.g. on biosensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/025—Change of phase or condition
    • G01N2291/0256—Adsorption, desorption, surface mass change, e.g. on biosensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02818—Density, viscosity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/042—Wave modes
    • G01N2291/0421—Longitudinal waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/042—Wave modes
    • G01N2291/0422—Shear waves, transverse waves, horizontally polarised waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N5/00—Analysing materials by weighing, e.g. weighing small particles separated from a gas or liquid
    • G01N5/02—Analysing materials by weighing, e.g. weighing small particles separated from a gas or liquid by absorbing or adsorbing components of a material and determining change of weight of the adsorbent, e.g. determining moisture content
EP04775618A 2004-09-15 2004-09-15 Surface plasmon resonance and quartz crystal microbalance sensor Ceased EP1794574A4 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/SG2004/000296 WO2006031198A1 (en) 2004-09-15 2004-09-15 Surface plasmon resonance and quartz crystal microbalance sensor

Publications (2)

Publication Number Publication Date
EP1794574A1 EP1794574A1 (en) 2007-06-13
EP1794574A4 true EP1794574A4 (en) 2009-09-23

Family

ID=36060320

Family Applications (1)

Application Number Title Priority Date Filing Date
EP04775618A Ceased EP1794574A4 (en) 2004-09-15 2004-09-15 Surface plasmon resonance and quartz crystal microbalance sensor

Country Status (5)

Country Link
US (1) US7869013B2 (en)
EP (1) EP1794574A4 (en)
JP (1) JP2008513772A (en)
CN (1) CN101163957B (en)
WO (1) WO2006031198A1 (en)

Cited By (1)

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CN102980826A (en) * 2011-09-03 2013-03-20 崔学晨 Quartz crystal microbalance detection cell

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US7999941B2 (en) * 2006-03-15 2011-08-16 Omron Corporation Surface plasmon resonance sensor chip and surface plasmon resonance sensor
KR20090088916A (en) * 2006-11-24 2009-08-20 에이전시 포 사이언스, 테크놀로지 앤드 리서치 Method for detecting surface plasmon resonance
JP4999493B2 (en) * 2007-02-28 2012-08-15 株式会社ツーデン Leak sensor
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WO2008142689A1 (en) * 2007-05-21 2008-11-27 Bio-Rad Laboratories Inc. Optical resonance analysis using a multi-angle source of illumination
JP5040019B2 (en) * 2007-06-15 2012-10-03 セイコーインスツル株式会社 Microreactor and microreactor system
JP5051638B2 (en) * 2007-06-15 2012-10-17 セイコーインスツル株式会社 Microreactor and microreactor system
JP5224164B2 (en) * 2007-09-03 2013-07-03 日立化成株式会社 Substance adsorption detection method and substance adsorption detection sensor
JP5049081B2 (en) * 2007-09-25 2012-10-17 国立大学法人 名古屋工業大学 Quartz crystal resonator, mass / volume measuring apparatus and mass / volume measuring method using the same
TWI361275B (en) * 2007-10-12 2012-04-01 Ind Tech Res Inst A surface plasmon resonance detecting apparatus and method thereof
JP5487200B2 (en) * 2008-04-23 2014-05-07 ソシエテ ドゥ コメルシャリザシオン デ プロデュイ ドゥ ラ ルシェルシェ アプリケ−ソクプラ−シャーンス エ ジェニ エス．ウー．セー． Surface plasmon resonance sensing device and method integrated with shear vertical surface acoustic wave
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KR101034584B1 (en) 2008-10-10 2011-05-12 세종대학교산학협력단 Measuring method of thin film and measuring apparatus of thin film
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CN101988882B (en) * 2009-08-03 2012-04-25 中国科学院理化技术研究所 Quartz crystal microbalance sensor for detecting hydrogen cyanide (HCN) gas, manufacturing method and application thereof
CN102884415B (en) * 2010-05-12 2015-10-07 松下知识产权经营株式会社 Phasmon sensor and using method thereof and manufacture method
CN101865841B (en) * 2010-06-28 2012-08-29 北京航空航天大学 High-sensitivity surface plasma resonance sensor
JP5799559B2 (en) * 2011-04-12 2015-10-28 セイコーエプソン株式会社 Detection device
US8920748B2 (en) * 2011-05-02 2014-12-30 National Chung Cheng University Biochip with a piezoelectric element for ultrasonic standing wave generation
TWI452270B (en) * 2011-10-21 2014-09-11 Univ Nat Central Detecting apparatus and detecting method thereof
CN104204764B (en) 2012-03-19 2018-07-20 凯米拉公司 It measures the method for corrugation glued membrane feature and changes the method for corrugation glued membrane
WO2014005986A1 (en) * 2012-07-03 2014-01-09 Danmarks Tekniske Universitet An add-on system including a micro-reactor for an atr-ir spectrometer
WO2014005987A1 (en) * 2012-07-03 2014-01-09 Danmarks Tekniske Universitet An add-on system for photochemical atr-ir spectroscopy studies
WO2014005985A1 (en) * 2012-07-03 2014-01-09 Danmarks Tekniske Universitet An add-on cap for atr-ir spectroscopy studies
CN102967522B (en) * 2012-11-15 2014-11-05 电子科技大学 Quartz crystal microbalance (QCM) mass sensor
CN103048210B (en) * 2013-01-11 2014-09-10 东南大学 Quartz crystal microbalance detecting device
US9182376B2 (en) * 2013-02-28 2015-11-10 Halliburton Energy Services, Inc. Determining constituents of a wellbore fluid
US9128010B2 (en) * 2013-03-14 2015-09-08 Ecolab Usa Inc. Device and methods of using a piezoelectric microbalance sensor
EP2783747B1 (en) * 2013-03-27 2018-05-02 Nano Temper Technologies GmbH Method and device for the contactless mixing of liquids
CN103604780B (en) * 2013-09-29 2016-05-04 中国科学院安徽光学精密机械研究所 A kind of device that improves Laser induced plasma spectroscopy detectivity
CN105658682B (en) 2013-10-25 2019-01-11 帝斯曼知识产权资产管理有限公司 The preparation of ultra-high-molecular-weight polyethylene copolymer
CN103991837B (en) * 2014-03-07 2016-10-12 中山大学 A kind of manufacture method of micro-nano ordered through hole array metal thin film sensor based on piezoelectric substrate thin slice
CN104198434B (en) * 2014-08-20 2017-06-13 中山大学 A kind of preparation method and applications of normal transmission type local plasmon resonance index sensor
CN104688241A (en) * 2015-03-19 2015-06-10 苏州康磁医疗科技有限公司 Monitoring circuit used for quartz crystal microbalance blood sugar monitoring system
US10048059B1 (en) * 2015-08-21 2018-08-14 J. A. Woollam Co., Inc Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of material deposited at or etched from a working electrode that preferrably comprises non-normal oriented nanofibers
CN105806730B (en) * 2016-03-08 2018-05-08 成都柏森松传感技术有限公司 The making template of multichannel quartz crystal microbalance chip
US10830738B2 (en) 2016-11-14 2020-11-10 University Of Alberta Ultrasensitive high Q-factor AT-cut-quartz crystal microbalance femtogram mass sensor
CN107504912B (en) * 2017-09-22 2020-04-17 京东方科技集团股份有限公司 Thickness testing method and device
CN107917955B (en) * 2017-12-07 2019-12-03 江苏大学 Novel light auxiliary quartz crystal microbalance and its detection method
JP7150449B2 (en) * 2018-03-09 2022-10-11 株式会社エンプラス Optical receptacles and optical modules
CN109374730B (en) * 2018-11-14 2021-04-06 江苏科技大学 Constant-temperature measuring cell for QCM and LSPR dual-technology biomolecule detection
CN109374731B (en) * 2018-11-14 2021-07-13 江苏科技大学 Quartz crystal microbalance with annular indium tin oxide electrode
CN109668957A (en) * 2018-11-14 2019-04-23 江苏科技大学 QCM and LSPR biosensor with transparent electrode
CN109884063B (en) * 2019-04-24 2021-08-20 杭州翔毅科技有限公司 Acquisition structure for liquid sensor
LU101354B1 (en) 2019-08-19 2021-02-24 Luxembourg Inst Science & Tech List Quartz crystal microbalance with plasmonic sensing capacity
CN111380839B (en) * 2020-04-27 2023-04-28 上海工程技术大学 SPR sensor device based on liquid bag angle adjustment
CN112985549B (en) * 2021-02-22 2023-06-30 史依晨 Quality measurement method based on acoustic resonance
CN113640169A (en) * 2021-06-23 2021-11-12 南方医科大学皮肤病医院（广东省皮肤病医院、广东省皮肤性病防治中心、中国麻风防治研究中心） WO based on doped Sb3Nanocrystalline QCM sensor and application thereof in monitoring of respiration and skin wound humidity
CN114216876B (en) * 2021-08-23 2023-08-11 南开大学 Preparation of surface enhanced infrared substrate and detection method of deflection angle of nano-pillar array

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102980826A (en) * 2011-09-03 2013-03-20 崔学晨 Quartz crystal microbalance detection cell

Also Published As

Publication number Publication date
CN101163957B (en) 2011-07-13
CN101163957A (en) 2008-04-16
JP2008513772A (en) 2008-05-01
EP1794574A1 (en) 2007-06-13
US20080163688A1 (en) 2008-07-10
US7869013B2 (en) 2011-01-11
WO2006031198A1 (en) 2006-03-23

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