EP1790076A2 - Device and method for comparing two supply voltages - Google Patents

Device and method for comparing two supply voltages

Info

Publication number
EP1790076A2
EP1790076A2 EP05781727A EP05781727A EP1790076A2 EP 1790076 A2 EP1790076 A2 EP 1790076A2 EP 05781727 A EP05781727 A EP 05781727A EP 05781727 A EP05781727 A EP 05781727A EP 1790076 A2 EP1790076 A2 EP 1790076A2
Authority
EP
European Patent Office
Prior art keywords
current
supply voltages
output
currents
reflected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP05781727A
Other languages
German (de)
French (fr)
Inventor
Martin c/o Philips IP & Standards GmbH KADNER
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP BV
Original Assignee
Philips Intellectual Property and Standards GmbH
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Intellectual Property and Standards GmbH, Koninklijke Philips Electronics NV filed Critical Philips Intellectual Property and Standards GmbH
Priority to EP05781727A priority Critical patent/EP1790076A2/en
Publication of EP1790076A2 publication Critical patent/EP1790076A2/en
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K5/00Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/22Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
    • H03K5/24Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
    • H03K5/2472Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G01R19/16552Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies

Definitions

  • the invention relates to a device for comparing two supply voltages, comprising two inputs for the supply voltages and one output for outputting a signal, and also relates to a corresponding method.
  • Microelectronic components in the form of integrated circuits are used in a wide range of technical fields. For power supply purposes, one or more supply voltages are applied to these components. Suitable devices are used to select and check the correct supply voltage. Devices for comparing supply voltages of electrical equipment are known in which the magnitudes of the voltages are compared with one another by means of an operational amplifier. The disadvantage arises here that such operational amplifiers can only be used to ascertain whether a first supply voltage is greater than a second supply voltage. These devices do not give satisfactory results when it comes to comparing a second supply voltage with a first supply voltage.
  • US 2003/0128054 Al discloses a device for comparing two electrical voltages in which the voltages are compared by means of a differential amplifier and a current mirror.
  • the voltages applied to the device are in each case converted into currents by means of transistors and reflected at current mirrors in the form of diodes in order to compare the magnitudes of the currents with one another.
  • the output signal used is either one of the currents flowing through the diodes or a voltage applied to the diodes or the difference between these.
  • US 2004/0032243 Al describes a device for comparing two supply voltages which are each applied to an input of the device.
  • PMOS and optionally NMOS transistors are used as current mirrors in the device, with one voltage being passed to each of the transistors. Depending on which of the two voltages is greater, the signal zero or one is output at a digital output of the device.
  • This device is of relatively complex design and requires a large number of transistors and further components which have to be connected to one another. It is an object of the invention to provide a device for comparing two supply voltages, which device can be used to reliably ascertain which of the two voltages is greater, the device being of simple design. A corresponding method will furthermore be specified.
  • the core concept of the invention consists in that the device essentially consists of three assemblies, namely two voltage/current converters which are tuned to one another, each having a downstream current mirror, a current comparator for the reflected currents and an inverter for generating two digital signals, which inverter is arranged downstream of the output.
  • the two supply voltages are each converted into a current in the voltage/current converters in a manner known to the person skilled in the art, and these currents are then reflected via current mirrors which are also known to the person skilled in the art.
  • the two converters are tuned to one another such that they generate a current in the same manner.
  • the supply voltages are in this case converted synchronously into currents.
  • These reflected currents are then passed to a current comparator which compares the current intensities in order to deduce therefrom the ratio of the magnitudes of the supply voltages.
  • the current comparator may be designed in any manner known per se or preferably as described below.
  • An output signal is present at the output of the current comparator, which output signal could already be used to deduce the ratio of the magnitudes of the currents or supply voltages. According to the invention, however, an inverter is connected downstream of this output since this output itself does not have a sufficient driver capability to be able to read signals.
  • the inverter Depending on the potential at the node, the inverter generates in a manner known per se two digital output signals at two outputs, wherein when these two outputs are each occupied by zero or one the information is deduced as to which of the two supply voltages is greater.
  • the advantage of the invention consists in that, given a suitable design of the transistors of which the voltage/current converters and the current mirrors and the current comparator essentially consist, very precise switching points can be set. This means that even slight differences in the supply voltages can be reliably ascertained. Moreover, the greater or smaller supply voltage can be fed to the device at either of the two inputs, and the method can be carried out regardless of which of the two supply voltages is greater.
  • the current comparator comprises a PMOS transistor and an NMOS transistor.
  • the current comparator comprises a PMOS transistor and an NMOS transistor.
  • the inverter is connected downstream of this output.
  • the currents generated in the voltage/current converters are in each case reflected via the current mirrors connected downstream of the converters in such a way that the current associated with the first supply voltage flows through the PMOS transistor and the current associated with the second supply voltage flows through the NMOS transistor, in order to obtain clear output signals.
  • the mirror ratio of the transistors with which the currents generated in the voltage/current converter are reflected in each case, can be set.
  • the mirror ratio of the transistors can be set from 1:1 to 1 :2. It can thus be ascertained from when for example a second variable supply voltage is greater than half the first supply voltage. It will be understood that in this case a voltage/current converter with a linear characteristic is used, which means that the current generated in the converter is proportional to the supply voltage.
  • the device for comparing two supply voltages is preferably associated with an integrated circuit or even integrated in the latter, in order to compare the magnitudes of supply voltages which are fed into the integrated circuit from outside and to deliver corresponding output signals. It is thus possible to select the supply voltage which is suitable for a desired application, for example to supply power to an electronic component.
  • the device and the method according to the invention may be used inter alia in the increasingly used smartcards which comprise an integrated circuit arranged on a chip, by means of which various functions can be carried out or controlled. For this purpose, these smartcards are inserted into readers and the chip is exposed to various supply voltages from the reader.
  • Fig. 1 shows a schematic diagram of the device.
  • the device 100 for comparing two supply voltages V 1 , V 2 which device is shown in Fig. 1, has two inputs 1, 2 to which the supply voltages V 1 , V 2 are respectively applied.
  • two voltage/current converters 3, 4 which are tuned to one another, currents I 1 , 1 2 are respectively generated from the supply voltages V 1 , V 2 , wherein the converters 3, 4 are preferably linear in order to be able to directly deduce the supply voltages V], V 2 from the magnitude of the currents I 1 , 1 2 .
  • a current mirror 5, 6 is in each case arranged downstream of the converters 3, 4, which current mirrors are formed by means of transistors in a manner known to the person skilled in the art.
  • the reflected currents I 3 , 1 4 are compared with one another with regard to their magnitude in a current comparator 7 in a manner known per se, wherein the current comparator 7 preferably has a PMOS transistor for the first current I 3 or the first supply voltage Vi and an NMOS transistor for the second current I 4 or the second supply voltage V 2 , which are in each case passed through these transistors.
  • the two transistors are connected to one another via a node. Accordingly, the potential of the supply voltage V 2 or ground is present at this node at the output 8 of the current comparator 7, depending on which of the two supply voltages V 1 , V 2 is greater.
  • An inverter 9 is connected downstream of the output 8 or the node, which inverter in each case outputs the value zero or one via two digital outputs 10, 11 depending on the potential at the node.
  • the ratio of the magnitudes of the supply voltages V 1 , V 2 can thus be deduced from the values at these outputs 10, 11.
  • the mirror ratio of the transistors in the current mirrors 5, 6 is set to be variable, the relative ratio of the magnitudes of the supply voltages Vi, V 2 can also be deduced. If, for example, the mirror ratio of the transistor in the first current mirror 5 to the transistor in the second current mirror 6 is set from 1:1 to 1:2, by changing the digital output signals it can be ascertained when the supply voltage V 2 is greater than half the supply voltage Vi. LIST OF REFERENCES:

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Manipulation Of Pulses (AREA)
  • Electronic Switches (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

In order to provide a device (100) for comparing two supply voltages (V1, V2), comprising two inputs (1, 2) for the supply voltages (V1, V2) acid one output (8) for outputting a signal, which device always delivers correct results regardless of the magnitude of the supply voltages (V1 ,V2), it is proposed that the device (100) has two voltage/current converters (3, 4) which are tuned to one another and two respectively associated current mirrors (5, 6), and a current comparator (7) for the reflected currents ( 3,14), and an inverter (9) with two digital outputs (10, 11), which inverter is arranged at the output (8). A corresponding method is also specified.

Description

Device and method for comparing two supply voltages
The invention relates to a device for comparing two supply voltages, comprising two inputs for the supply voltages and one output for outputting a signal, and also relates to a corresponding method.
Microelectronic components in the form of integrated circuits are used in a wide range of technical fields. For power supply purposes, one or more supply voltages are applied to these components. Suitable devices are used to select and check the correct supply voltage. Devices for comparing supply voltages of electrical equipment are known in which the magnitudes of the voltages are compared with one another by means of an operational amplifier. The disadvantage arises here that such operational amplifiers can only be used to ascertain whether a first supply voltage is greater than a second supply voltage. These devices do not give satisfactory results when it comes to comparing a second supply voltage with a first supply voltage.
US 2003/0128054 Al discloses a device for comparing two electrical voltages in which the voltages are compared by means of a differential amplifier and a current mirror. In this case, the voltages applied to the device are in each case converted into currents by means of transistors and reflected at current mirrors in the form of diodes in order to compare the magnitudes of the currents with one another. The output signal used is either one of the currents flowing through the diodes or a voltage applied to the diodes or the difference between these.
US 2004/0032243 Al describes a device for comparing two supply voltages which are each applied to an input of the device. PMOS and optionally NMOS transistors are used as current mirrors in the device, with one voltage being passed to each of the transistors. Depending on which of the two voltages is greater, the signal zero or one is output at a digital output of the device. This device is of relatively complex design and requires a large number of transistors and further components which have to be connected to one another. It is an object of the invention to provide a device for comparing two supply voltages, which device can be used to reliably ascertain which of the two voltages is greater, the device being of simple design. A corresponding method will furthermore be specified.
These objects are achieved by the features specified in Claims 1 and 6. The core concept of the invention consists in that the device essentially consists of three assemblies, namely two voltage/current converters which are tuned to one another, each having a downstream current mirror, a current comparator for the reflected currents and an inverter for generating two digital signals, which inverter is arranged downstream of the output. In this case, the two supply voltages are each converted into a current in the voltage/current converters in a manner known to the person skilled in the art, and these currents are then reflected via current mirrors which are also known to the person skilled in the art. The two converters are tuned to one another such that they generate a current in the same manner. This means that when an identical voltage is applied to each of the converters, the two converters each generate the same current intensity. The supply voltages are in this case converted synchronously into currents. These reflected currents are then passed to a current comparator which compares the current intensities in order to deduce therefrom the ratio of the magnitudes of the supply voltages. The current comparator may be designed in any manner known per se or preferably as described below. An output signal is present at the output of the current comparator, which output signal could already be used to deduce the ratio of the magnitudes of the currents or supply voltages. According to the invention, however, an inverter is connected downstream of this output since this output itself does not have a sufficient driver capability to be able to read signals. Depending on the potential at the node, the inverter generates in a manner known per se two digital output signals at two outputs, wherein when these two outputs are each occupied by zero or one the information is deduced as to which of the two supply voltages is greater.
The advantage of the invention consists in that, given a suitable design of the transistors of which the voltage/current converters and the current mirrors and the current comparator essentially consist, very precise switching points can be set. This means that even slight differences in the supply voltages can be reliably ascertained. Moreover, the greater or smaller supply voltage can be fed to the device at either of the two inputs, and the method can be carried out regardless of which of the two supply voltages is greater.
Advantageous embodiments of the invention are respectively characterized in the dependent claims. Preferably, the current comparator comprises a PMOS transistor and an NMOS transistor. On account of the known characteristics of the respective transistors, this means that in the two different transistors, depending on the different supply voltages or the currents generated therefrom, in each case different output signals are generated which in turn are passed to a node connecting the transistors, which node serves as output. The inverter is connected downstream of this output.
According to one advantageous embodiment, the currents generated in the voltage/current converters are in each case reflected via the current mirrors connected downstream of the converters in such a way that the current associated with the first supply voltage flows through the PMOS transistor and the current associated with the second supply voltage flows through the NMOS transistor, in order to obtain clear output signals.
By means of suitably designed transistors, it is possible for either the potential of the second supply voltage to be present at the node or else for the node to be at ground, depending on which supply voltage is greater. The signals at this output are thus sufficiently different to ensure that the downstream inverter delivers correct digital results.
In order to compare the ratios of the magnitudes of the supply voltages, it is proposed that the mirror ratio of the transistors, with which the currents generated in the voltage/current converter are reflected in each case, can be set. For example, the mirror ratio of the transistors can be set from 1:1 to 1 :2. It can thus be ascertained from when for example a second variable supply voltage is greater than half the first supply voltage. It will be understood that in this case a voltage/current converter with a linear characteristic is used, which means that the current generated in the converter is proportional to the supply voltage. It is obvious to the person skilled in the art that the device for comparing two supply voltages is preferably associated with an integrated circuit or even integrated in the latter, in order to compare the magnitudes of supply voltages which are fed into the integrated circuit from outside and to deliver corresponding output signals. It is thus possible to select the supply voltage which is suitable for a desired application, for example to supply power to an electronic component. The device and the method according to the invention may be used inter alia in the increasingly used smartcards which comprise an integrated circuit arranged on a chip, by means of which various functions can be carried out or controlled. For this purpose, these smartcards are inserted into readers and the chip is exposed to various supply voltages from the reader. The invention will be further described with reference to an example of embodiment shown in the drawing to which, however, the invention is not restricted. Fig. 1 shows a schematic diagram of the device.
The device 100 for comparing two supply voltages V1, V2, which device is shown in Fig. 1, has two inputs 1, 2 to which the supply voltages V1, V2 are respectively applied. In two voltage/current converters 3, 4 which are tuned to one another, currents I1, 12 are respectively generated from the supply voltages V1, V2, wherein the converters 3, 4 are preferably linear in order to be able to directly deduce the supply voltages V], V2 from the magnitude of the currents I1, 12. A current mirror 5, 6 is in each case arranged downstream of the converters 3, 4, which current mirrors are formed by means of transistors in a manner known to the person skilled in the art.
The reflected currents I3, 14 are compared with one another with regard to their magnitude in a current comparator 7 in a manner known per se, wherein the current comparator 7 preferably has a PMOS transistor for the first current I3 or the first supply voltage Vi and an NMOS transistor for the second current I4 or the second supply voltage V2, which are in each case passed through these transistors. The two transistors are connected to one another via a node. Accordingly, the potential of the supply voltage V2 or ground is present at this node at the output 8 of the current comparator 7, depending on which of the two supply voltages V1, V2 is greater.
An inverter 9 is connected downstream of the output 8 or the node, which inverter in each case outputs the value zero or one via two digital outputs 10, 11 depending on the potential at the node. The ratio of the magnitudes of the supply voltages V1, V2 can thus be deduced from the values at these outputs 10, 11.
If the mirror ratio of the transistors in the current mirrors 5, 6 is set to be variable, the relative ratio of the magnitudes of the supply voltages Vi, V2 can also be deduced. If, for example, the mirror ratio of the transistor in the first current mirror 5 to the transistor in the second current mirror 6 is set from 1:1 to 1:2, by changing the digital output signals it can be ascertained when the supply voltage V2 is greater than half the supply voltage Vi. LIST OF REFERENCES:
1 input
2 input
3 voltage/current converter
4 voltage/current converter
5 current mirror
6 current mirror
7 current comparator
8 output
9 inverter
10 output
11 output
100 device
Vi supply voltages
Ii currents

Claims

CLAIMS:
1. A device (100) for comparing two supply voltages (V1, V2), comprising two inputs (1, 2) for the supply voltages (V1, V2) and one output (8) for outputting a signal, characterized in that - the device (100) has two voltage/current converters (3, 4) which are tuned to one another and two respectively associated current mirrors (5, 6),
- a current comparator (7) is provided for the reflected currents (I3, 14), and
- an inverter (9) with two digital outputs (10, 11) is arranged at the output (8).
2. A device as claimed in Claim 1, characterized in that the current comparator
(7) comprises a PMOS transistor and an NMOS transistor.
3. A device as claimed in Claim 2, characterized in that one of the reflected currents (I3) can be passed through the PMOS transistor and the other reflected current (I4) can be passed through the NMOS transistor.
4. A device as claimed in any of Claims 1 to 3, characterized in that the potential (V2) or ground potential can be generated at the output (8) of the current comparator (7).
5. A device as claimed in any of Claims 1 to 4, characterized in that a mirror ratio of the current mirrors (5, 6) can be set.
6. A method of comparing two supply voltages (V1, V2), wherein in a device
(100) the supply voltages (Vj, V2) are applied to two inputs (1, 2) and a signal is output at an output (8), characterized in that the supply voltages (Vi, V2) are converted into currents (Ii, I2) in two voltage/current converters (3, 4) which are tuned to one another, and these currents are reflected in two current mirrors (5, 6) to form currents (I3, 14), the reflected currents (I3, I4) are compared in a current comparator (7), and digital output signals are generated at the output (8) in an inverter (9) with two digital outputs (10, 11).
7. A method as claimed in Claim 6, characterized in that in the current comparator (7) the currents (I3, 14) are passed through a PMOS transistor and an NMOS transistor.
8. A method as claimed in Claim 7, characterized in that the first reflected current (I3) is passed through the PMOS transistor and the second reflected current (I4) is passed through the NMOS transistor.
9. A method as claimed in any of Claims 6 to 8, characterized in that the potential of the supply voltage (V2) or ground potential is generated at the output (8) of the current comparator (7).
10. A method as claimed in any of Claims 6 to 9, characterized in that a mirror ratio of the current mirrors (5, 6) is set.
EP05781727A 2004-09-02 2005-08-30 Device and method for comparing two supply voltages Withdrawn EP1790076A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP05781727A EP1790076A2 (en) 2004-09-02 2005-08-30 Device and method for comparing two supply voltages

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP04104217 2004-09-02
PCT/IB2005/052831 WO2006025018A2 (en) 2004-09-02 2005-08-30 Device and method for comparing two supply voltages
EP05781727A EP1790076A2 (en) 2004-09-02 2005-08-30 Device and method for comparing two supply voltages

Publications (1)

Publication Number Publication Date
EP1790076A2 true EP1790076A2 (en) 2007-05-30

Family

ID=36000425

Family Applications (1)

Application Number Title Priority Date Filing Date
EP05781727A Withdrawn EP1790076A2 (en) 2004-09-02 2005-08-30 Device and method for comparing two supply voltages

Country Status (4)

Country Link
EP (1) EP1790076A2 (en)
JP (1) JP2008512026A (en)
CN (1) CN101053155A (en)
WO (1) WO2006025018A2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009239471A (en) * 2008-03-26 2009-10-15 Panasonic Corp Mos integrated circuit and electronic equipment including the same
JP5839593B2 (en) * 2012-12-05 2016-01-06 日本電信電話株式会社 Peak hold circuit
DE102017102499B4 (en) * 2017-02-08 2021-06-17 Infineon Technologies Ag Electrical components, integrated circuits and methods for monitoring voltages

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6146613A (en) * 1984-08-10 1986-03-06 Nec Corp Level detecting circuit
GB2225910A (en) * 1988-12-08 1990-06-13 Philips Electronic Associated Processing sampled analogue electrical signals
JP2586723B2 (en) * 1990-10-12 1997-03-05 日本電気株式会社 Sense amplifier
SE502429C2 (en) * 1994-02-21 1995-10-16 Ellemtel Utvecklings Ab Signal receiving and signal processing circuit
US6037890A (en) * 1997-09-30 2000-03-14 Intel Corporation Ultra high speed, low power, flash A/D converter utilizing a current mode regenerative comparator
JP2000019200A (en) * 1998-07-01 2000-01-21 Mitsubishi Electric Corp Potential detecting circuit

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See references of WO2006025018A3 *

Also Published As

Publication number Publication date
CN101053155A (en) 2007-10-10
WO2006025018A3 (en) 2006-07-13
JP2008512026A (en) 2008-04-17
WO2006025018A2 (en) 2006-03-09

Similar Documents

Publication Publication Date Title
JP3841428B2 (en) Charge transfer device
US7236905B2 (en) Test apparatus and power supply circuit
US4841175A (en) ECL-compatible input/output circuits in CMOS technology
JPH03201818A (en) Comparing circuit
US20060203407A1 (en) Dc-dc converter
ATE305141T1 (en) INPUT BUFFER AND VOLTAGE LEVEL DETECTION METHOD
US7710089B2 (en) Automatic configuration for linear mode of switching power supply
KR940012849A (en) Stress Mode Circuits for Integrated Circuits with On-Chip Dropout Converters
CN103684295B (en) The apparatus and method of wide common mode difference
US20020075035A1 (en) Circuit for providing a logical output signal in accordance with crossing points of differential signals
EP1790076A2 (en) Device and method for comparing two supply voltages
US6462521B1 (en) High-speed charge-mode controller for a multi-phase switched-mode power converter
US6236268B1 (en) High-gain amplifier having a limited output dynamic range
US5914626A (en) Voltage clamping circuit for semiconductor devices
US8085092B2 (en) Amplifier arrangement and method for amplification
KR100526642B1 (en) Electronic circuit for converting a differential signal into a single-ended signal with common mode voltage rejection by resistor network
US6100738A (en) High-speed current switch with complementary stages
KR100272951B1 (en) Circuit for voltage applying
KR20000075637A (en) Current-limit circuit
US6198311B1 (en) Expandable analog current sorter based on magnitude
JP2004312993A (en) Current sensing circuit for dc/dc converter
US7236346B2 (en) Semiconductor apparatus and method of charging desired number of capacitors
US20030016547A1 (en) Circuit arrangement for gaining a direct voltage
JP3297361B2 (en) Semiconductor integrated circuit with hysteresis
KR100234873B1 (en) Clock signal input buffer

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

17P Request for examination filed

Effective date: 20070402

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: NXP B.V.

DAX Request for extension of the european patent (deleted)
STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE APPLICATION HAS BEEN WITHDRAWN

18W Application withdrawn

Effective date: 20090707