WO2006025018A3 - Device and method for comparing two supply voltages - Google Patents

Device and method for comparing two supply voltages Download PDF

Info

Publication number
WO2006025018A3
WO2006025018A3 PCT/IB2005/052831 IB2005052831W WO2006025018A3 WO 2006025018 A3 WO2006025018 A3 WO 2006025018A3 IB 2005052831 W IB2005052831 W IB 2005052831W WO 2006025018 A3 WO2006025018 A3 WO 2006025018A3
Authority
WO
WIPO (PCT)
Prior art keywords
supply voltages
comparing
inverter
output
current
Prior art date
Application number
PCT/IB2005/052831
Other languages
French (fr)
Other versions
WO2006025018A2 (en
Inventor
Martin Kadner
Original Assignee
Philips Intellectual Property
Koninkl Philips Electronics Nv
Martin Kadner
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Intellectual Property, Koninkl Philips Electronics Nv, Martin Kadner filed Critical Philips Intellectual Property
Priority to JP2007529117A priority Critical patent/JP2008512026A/en
Priority to EP05781727A priority patent/EP1790076A2/en
Publication of WO2006025018A2 publication Critical patent/WO2006025018A2/en
Publication of WO2006025018A3 publication Critical patent/WO2006025018A3/en

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
    • H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
    • H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G01R19/16552—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies

Abstract

In order to provide a device (100) for comparing two supply voltages (V1, V2), comprising two inputs (1, 2) for the supply voltages (V1, V2) acid one output (8) for outputting a signal, which device always delivers correct results regardless of the magnitude of the supply voltages (V1 ,V2), it is proposed that the device (100) has two voltage/current converters (3, 4) which are tuned to one another and two respectively associated current mirrors (5, 6), and a current comparator (7) for the reflected currents ( 3,14), and an inverter (9) with two digital outputs (10, 11), which inverter is arranged at the output (8). A corresponding method is also specified.
PCT/IB2005/052831 2004-09-02 2005-08-30 Device and method for comparing two supply voltages WO2006025018A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2007529117A JP2008512026A (en) 2004-09-02 2005-08-30 Device and method for comparing two supply voltages
EP05781727A EP1790076A2 (en) 2004-09-02 2005-08-30 Device and method for comparing two supply voltages

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP04104217 2004-09-02
EP04104217.7 2004-09-02

Publications (2)

Publication Number Publication Date
WO2006025018A2 WO2006025018A2 (en) 2006-03-09
WO2006025018A3 true WO2006025018A3 (en) 2006-07-13

Family

ID=36000425

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IB2005/052831 WO2006025018A2 (en) 2004-09-02 2005-08-30 Device and method for comparing two supply voltages

Country Status (4)

Country Link
EP (1) EP1790076A2 (en)
JP (1) JP2008512026A (en)
CN (1) CN101053155A (en)
WO (1) WO2006025018A2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009239471A (en) * 2008-03-26 2009-10-15 Panasonic Corp Mos integrated circuit and electronic equipment including the same
JP5839593B2 (en) * 2012-12-05 2016-01-06 日本電信電話株式会社 Peak hold circuit
DE102017102499B4 (en) * 2017-02-08 2021-06-17 Infineon Technologies Ag Electrical components, integrated circuits and methods for monitoring voltages

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0174736A1 (en) * 1984-08-10 1986-03-19 Nec Corporation Circuit for detecting level of input voltage
EP0372647A2 (en) * 1988-12-08 1990-06-13 Philips Electronics Uk Limited Processing sampled analogue electrical signals
US5206552A (en) * 1990-10-12 1993-04-27 Nec Corporation Sense amplifier for non-volatile semiconductor storage device
US5568082A (en) * 1994-02-21 1996-10-22 Telefonaktiebolaget L M Ericsson Signal-receiving and signal-processing unit
US6008673A (en) * 1997-09-30 1999-12-28 Intel Corporation High speed, low power, current mode comparator
US6281716B1 (en) * 1998-07-01 2001-08-28 Mitsubishi Denki Kabushiki Kaisha Potential detect circuit for detecting whether output potential of potential generation circuit has arrived at target potential or not

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0174736A1 (en) * 1984-08-10 1986-03-19 Nec Corporation Circuit for detecting level of input voltage
EP0372647A2 (en) * 1988-12-08 1990-06-13 Philips Electronics Uk Limited Processing sampled analogue electrical signals
US5206552A (en) * 1990-10-12 1993-04-27 Nec Corporation Sense amplifier for non-volatile semiconductor storage device
US5568082A (en) * 1994-02-21 1996-10-22 Telefonaktiebolaget L M Ericsson Signal-receiving and signal-processing unit
US6008673A (en) * 1997-09-30 1999-12-28 Intel Corporation High speed, low power, current mode comparator
US6281716B1 (en) * 1998-07-01 2001-08-28 Mitsubishi Denki Kabushiki Kaisha Potential detect circuit for detecting whether output potential of potential generation circuit has arrived at target potential or not

Also Published As

Publication number Publication date
EP1790076A2 (en) 2007-05-30
JP2008512026A (en) 2008-04-17
WO2006025018A2 (en) 2006-03-09
CN101053155A (en) 2007-10-10

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