EP1685428A4 - NEUTRON DETECTION DEVICE AND MANUFACTURING METHOD - Google Patents

NEUTRON DETECTION DEVICE AND MANUFACTURING METHOD

Info

Publication number
EP1685428A4
EP1685428A4 EP04821349A EP04821349A EP1685428A4 EP 1685428 A4 EP1685428 A4 EP 1685428A4 EP 04821349 A EP04821349 A EP 04821349A EP 04821349 A EP04821349 A EP 04821349A EP 1685428 A4 EP1685428 A4 EP 1685428A4
Authority
EP
European Patent Office
Prior art keywords
manufacture
detection device
neutron detection
neutron
detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP04821349A
Other languages
German (de)
English (en)
French (fr)
Other versions
EP1685428A2 (en
Inventor
Robert A August
Harold L Hughes
Patrick J Mcmarr
Robert R Whitlock
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
US Department of Navy
Original Assignee
US Department of Navy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by US Department of Navy filed Critical US Department of Navy
Publication of EP1685428A2 publication Critical patent/EP1685428A2/en
Publication of EP1685428A4 publication Critical patent/EP1685428A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T3/00—Measuring neutron radiation
    • G01T3/08—Measuring neutron radiation with semiconductor detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/115—Devices sensitive to very short wavelength, e.g. X-rays, gamma-rays or corpuscular radiation

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Health & Medical Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Measurement Of Radiation (AREA)
EP04821349A 2003-10-20 2004-10-12 NEUTRON DETECTION DEVICE AND MANUFACTURING METHOD Withdrawn EP1685428A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/693,847 US7271389B2 (en) 2003-10-20 2003-10-20 Neutron detection device and method of manufacture
PCT/US2004/033686 WO2005076779A2 (en) 2003-10-20 2004-10-12 Neutron detection device and method of manufacture

Publications (2)

Publication Number Publication Date
EP1685428A2 EP1685428A2 (en) 2006-08-02
EP1685428A4 true EP1685428A4 (en) 2006-11-22

Family

ID=34522487

Family Applications (1)

Application Number Title Priority Date Filing Date
EP04821349A Withdrawn EP1685428A4 (en) 2003-10-20 2004-10-12 NEUTRON DETECTION DEVICE AND MANUFACTURING METHOD

Country Status (4)

Country Link
US (1) US7271389B2 (ja)
EP (1) EP1685428A4 (ja)
JP (1) JP2007509345A (ja)
WO (1) WO2005076779A2 (ja)

Families Citing this family (28)

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Publication number Priority date Publication date Assignee Title
US7244947B2 (en) * 2004-04-13 2007-07-17 Science Applications International Corporation Neutron detector with layered thermal-neutron scintillator and dual function light guide and thermalizing media
US7491948B2 (en) * 2006-01-30 2009-02-17 International Business Machines Corporation Method of detecting and transmitting radiation detection information to a network
US7712535B2 (en) * 2006-10-31 2010-05-11 Clearwater International, Llc Oxidative systems for breaking polymer viscosified fluids
US7858425B2 (en) * 2007-05-21 2010-12-28 Sanders Thomas J Monolithic nuclear event detector and method of manufacture
US20090039270A1 (en) * 2007-08-08 2009-02-12 Cabral Jr Cyril Large-area alpha-particle detector and method for use
US7868362B2 (en) * 2007-10-16 2011-01-11 Honeywell International Inc. SOI on package hypersensitive sensor
US7645993B2 (en) * 2007-12-28 2010-01-12 Spansion, Llc Arrayed neutron detector with multi shielding allowing for discrimination between radiation types
US7550730B1 (en) 2008-04-08 2009-06-23 International Business Machines Corporation Method for detecting alpha particles in SOI technology
US7875854B2 (en) * 2008-04-08 2011-01-25 International Business Machines Corporation Design structure for alpha particle sensor in SOI technology and structure thereof
US7791031B2 (en) * 2008-06-09 2010-09-07 Honeywell International Inc. Neutron detection structure
US7902520B2 (en) * 2008-06-09 2011-03-08 Spansion Llc Radiation detecting electronic device and methods of operating
US8436289B1 (en) 2008-06-09 2013-05-07 Spansion Llc System and method for detecting particles with a semiconductor device
US8232515B2 (en) 2008-06-09 2012-07-31 Spansion Llc Imaging device having a radiation detecting structure disposed at a semiconductor substrate with a thermalizing material and a first radiation-reactive material sensitive to neutron radiation
US8237129B2 (en) * 2008-06-20 2012-08-07 Arradiance, Inc. Microchannel plate devices with tunable resistive films
WO2010002875A1 (en) * 2008-06-30 2010-01-07 Kerns David V Jr Neutron detection semiconductor device and method for manufacture
US7952075B2 (en) * 2008-08-14 2011-05-31 Ut-Battelle, Llc Neutron absorption detector
US20100155611A1 (en) * 2008-12-19 2010-06-24 Spansion Llc Radiation-detecting structures
US7838324B2 (en) * 2008-12-19 2010-11-23 Honeywell International Inc. Neutron detection structure and method of fabricating
US8569708B2 (en) * 2009-01-30 2013-10-29 Alliance For Sustainable Energy, Llc High sensitivity, solid state neutron detector
US8153985B2 (en) * 2009-01-30 2012-04-10 Honeywell International Inc. Neutron detector cell efficiency
US8203123B2 (en) 2009-03-10 2012-06-19 Alliant Techsystems Inc. Neutron detection by neutron capture-initiated relaxation of a ferroelectrically, ferromagnetically, and/or chemically metastable material
US8120131B2 (en) * 2009-03-13 2012-02-21 International Business Machines Corporation Array of alpha particle sensors
US20110186940A1 (en) * 2010-02-03 2011-08-04 Honeywell International Inc. Neutron sensor with thin interconnect stack
US8310021B2 (en) 2010-07-13 2012-11-13 Honeywell International Inc. Neutron detector with wafer-to-wafer bonding
US20130056641A1 (en) * 2011-09-01 2013-03-07 Massachusetts Institute Of Technology Solid-state neutron detector with gadolinium converter
WO2015156215A1 (ja) * 2014-04-08 2015-10-15 株式会社日立製作所 乱数発生器、シミュレーション装置およびメーター
US11175417B1 (en) * 2019-09-30 2021-11-16 National Technology & Engineering Solutions Of Sandia, Llc Mutli-layered neutron detector
CN112490319B (zh) * 2020-11-27 2023-03-28 东华理工大学 一种利用湿法刻蚀具有微沟槽的AlGaAs/GaAs中子探测器

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6259099B1 (en) * 1996-12-18 2001-07-10 Commissariat A L'energie Atomique Ultra-thin ionizing radiation detector and methods for making same

Family Cites Families (13)

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Publication number Priority date Publication date Assignee Title
DE4190941C2 (de) * 1990-04-27 2001-07-26 Hitachi Ltd Neutronendosimeter und Verfahren für dessen Herstellung
JPH0458571A (ja) * 1990-06-28 1992-02-25 Mitsubishi Materials Corp 放射線検出素子
JPH0458570A (ja) * 1990-06-28 1992-02-25 Mitsubishi Materials Corp 中性子検出装置
JPH05281364A (ja) * 1992-04-06 1993-10-29 Aloka Co Ltd 中性子線量当量測定装置
JPH06180370A (ja) * 1992-12-15 1994-06-28 Hitachi Ltd 中性子モニタ
JPH07176777A (ja) * 1993-12-20 1995-07-14 Hitachi Ltd 中性子検出器及び中性子モニタ
FR2742878B1 (fr) * 1995-12-20 1998-01-16 Commissariat Energie Atomique Detecteur de rayonnements ionisants ultra-mince et procedes de realisation d'un tel detecteur
US5913131A (en) * 1996-11-14 1999-06-15 Advanced Micro Devices, Inc. Alternative process for BPTEOS/BPSG layer formation
US6075261A (en) * 1997-08-22 2000-06-13 Advanced Micro Devices Neutron detecting semiconductor device
JP2002040147A (ja) * 2000-07-28 2002-02-06 Matsushita Electric Ind Co Ltd 中性子検出装置
DE10132550B4 (de) * 2001-07-09 2008-07-10 Bundesrepublik Deutschland, vertr. d. d. Bundesministerium für Wirtschaft und Technologie, dieses vertr. d. d. Präsidenten der Physikalisch-Technischen Bundesanstalt Verfahren zur Bestimmung der Personendosis in gemischten Neutronen-/Photonen-Feldern sowie anderer Messgrößen in anderen Strahlenfeldern
DE10153319B4 (de) * 2001-10-29 2011-02-17 austriamicrosystems AG, Schloss Premstätten Mikrosensor
US20040178337A1 (en) * 2003-03-11 2004-09-16 Baker Hughes Incorporated Neutron detector for downhole use

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6259099B1 (en) * 1996-12-18 2001-07-10 Commissariat A L'energie Atomique Ultra-thin ionizing radiation detector and methods for making same

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
MCGREGOR D S ET AL: "Design considerations for thin film coated semiconductor thermal neutron detectors-I: basics regarding alpha particle emitting neutron reactive films", NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, SECTION - A: ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT, ELSEVIER, AMSTERDAM, NL, vol. 500, no. 1-3, 11 March 2003 (2003-03-11), pages 272 - 308, XP004434690, ISSN: 0168-9002 *

Also Published As

Publication number Publication date
EP1685428A2 (en) 2006-08-02
US7271389B2 (en) 2007-09-18
US20050082489A1 (en) 2005-04-21
WO2005076779A2 (en) 2005-08-25
WO2005076779A3 (en) 2006-07-27
JP2007509345A (ja) 2007-04-12

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Inventor name: WHITLOCK, ROBERT, R.

Inventor name: MCMARR, PATRICK, J.

Inventor name: HUGHES, HAROLD, L.

Inventor name: AUGUST, ROBERT, A.

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