EP1656565A1 - Measuring or test device comprising interchangeable functional units - Google Patents
Measuring or test device comprising interchangeable functional unitsInfo
- Publication number
- EP1656565A1 EP1656565A1 EP04763628A EP04763628A EP1656565A1 EP 1656565 A1 EP1656565 A1 EP 1656565A1 EP 04763628 A EP04763628 A EP 04763628A EP 04763628 A EP04763628 A EP 04763628A EP 1656565 A1 EP1656565 A1 EP 1656565A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- measuring
- testing device
- functional
- dynamic range
- unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2516—Modular arrangements for computer based systems; using personal computers (PC's), e.g. "virtual instruments"
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
Definitions
- the invention relates to a measuring or testing device with several interchangeable functional units.
- a measuring or testing device in the form of a signal generator with a plurality of functional units which can be variably connected to one another is known, for example, from DE 101 24 371 AI.
- measuring or testing devices of a certain type differ in their performance, which varies depending on the equipment, with almost all measuring properties being of a correspondingly higher quality or simpler at the same time. In quite a few cases, however, only one or a few properties of a higher quality are required for a specific application, although other properties may be carried out more simply.
- the user was forced to purchase a measuring or test device with high overall performance, even if he only used the high performance for some special measuring properties. This was relatively uneconomical for the user.
- the invention is therefore based on the object of providing a measuring or testing device which ensures an individual configuration of the performance for different measuring or test properties.
- the functional units are interchangeable and / or can be added or omitted, the measuring or testing device being configurable with functional units whose functional properties have a different accuracy and / or a different quality and / or a different scope of functions.
- Examples of the different functional properties are the frequency range, display variants, the signal-to-noise ratio, the dynamic range, the measuring speed, the measured value resolution, the measuring accuracy and the input sensitivity of the individual functional units.
- the functional properties can be characterized by high dynamics and high accuracy, but a relatively low measuring speed, since in research and development, accuracy plays a much greater role than the measuring speed.
- the functional properties for a production use can be characterized by a limited dynamic range, a medium accuracy but high measuring speed, since the measuring speed plays a very important role in production.
- the measuring device can also be designed for only a few or a few special measurements with the required high performance without other measuring options that are not required for the measuring task.
- the advantages of the invention result from the most optimal design of the measuring or testing device for the respective application, the user himself designing his measuring or testing device when procuring the measuring or testing device Test device can optimize itself. This avoids costly measurement functions with high performance that the user does not need at all.
- a measuring device can be offered as a platform, the decisive functional units or measuring modules being available in at least two, but generally in a large number of versions with different performance, so that the user can perform the measuring or Can configure the test device with the best possible suitability. It is also possible to adapt the measuring or test device to another application with different requirements within a modular system at a later point in time by “repackaging” one or more functional units. Even if other functional units are only available at a later date, they can be retrofitted.
- FIG. 1 shows a general embodiment of the measuring or testing device according to the invention
- FIG. 2 shows a first concrete exemplary embodiment of the measuring or testing device according to the invention as a spectrum analyzer
- FIG. 3 shows a second concrete exemplary embodiment of the measuring or test device according to the invention as a signal generator
- Fig. 4 shows a third concrete embodiment of the measuring or testing device according to the invention as a network analyzer.
- Fig. 1 shows an abstract representation of a measuring or test device 1 according to the invention. It can be seen that the measuring or test device 1 consists of a plurality of interconnected functional units 2 ⁇ ; 2 2 , 2 3 and 2 4 , which are connected together in series in the example shown along a signal path 3. However, as is clear from the following specific exemplary embodiments, a parallel or independent connection of the functional units is also possible.
- the decisive difference compared to known measuring or testing devices is that in the measuring or testing device 1 according to the invention the functional units 2 ⁇ ; 2 2 , 2 3 , 2 4 are interchangeable and / or that the functional units 2 ⁇ r 2 2 , 2 3 , 2 4 can be added or omitted.
- the measuring or testing device 1 according to the invention can be configured with different functional units, the functional properties of which, which are denoted in FIG. 1 by FE ⁇ FE 2 , FE 3 or FE 4 , have a different accuracy and / or a different quality and / or have a different range of functions.
- the measuring or testing device 1 according to the invention can be configured differently for different tasks, for example in research and development use, in production use or in service use, which meets different requirements for the different tasks.
- FIG. 2 shows the measuring or testing device 1 according to the invention as a spectrum analyzer 20.
- the intermediate frequency signal designated IF is filtered in a bandpass filter 21.
- This bandpass filter 21 can be a first interchangeable functional unit, the functional properties here being the bandwidth and / or the signal-to-noise ratio and / or the linear dynamic range and / or the input sensitivity.
- An analog / digital converter 22 connects to the bandpass 21.
- This analog / digital converter 22 is a further interchangeable functional unit, the functional properties of which are characterized by the dynamic range and / or the converter speed and / or the resolution and / or the accuracy.
- the I / Q mixture 23 then follows in an I / Q demodulator 24, which in the usual way consists of a local
- This I / Q demodulator 24 represents a further interchangeable functional unit, which has a different bandwidth and / or different linear dynamic range and / or different I / Q
- the digital IF filtering 28 with two low-pass filters 29, 30, which can also be designed as interchangeable variable functional units, the steepness of the edges of the low-pass filter and the frequency range usable without aliasing being able to characterize the functional properties here.
- envelope rectification 31 takes place in an envelope rectifier 32, which represents a further interchangeable functional unit.
- the logarithmization 33 takes place in a logarithmizer 34, which is a further interchangeable functional unit with different ones Represents functional properties.
- the logarithmizer 34 is followed by a video filter 36 in which the video filtering 35 takes place.
- the video filter 36 represents the next interchangeable functional unit.
- detectors 38 to 41 are available for detection 37, for example a peak detector 38, an auto-peak detector 39, a sample detector 40 and an RMS (Route Mean Square) detector.
- a peak detector 38 an auto-peak detector 39
- a sample detector 40 an RMS (Route Mean Square) detector.
- RMS Raster Mean Square
- microprocessor 42 which can also be designed as an interchangeable functional unit, wherein depending on the performance of the spectrum analyzer 20 different processors with different computing speeds, different cash memories, etc. can be used.
- FIG 3 shows a further exemplary embodiment of the invention, the measuring or test device here being in the form of a signal generator 100.
- the signal generator 100 comprises a first baseband unit 102a and a second baseband unit 102b and its structure is basically known from DE 101 24 371 AI.
- the baseband units 102a and 102b generate baseband signals at their I and Q outputs in accordance with predetermined standards which can be selected by the user, for example the GSM standard, the GSM EDGE standard or a wide-band CDMA standard.
- the baseband units 102a, 102b have clock signals on sockets 103a and 103b, trigger signals on sockets 104a and 104b and on sockets 105a and 105b Modulation data can be supplied.
- a digital baseband generator unit 106 which generates the I and Q components of a further baseband signal from digital I / Q values supplied at a socket 107.
- the output signal of the digital baseband generator 106 can be increased in a multiplier 108, to which the constant frequency of an adjustable local oscillator 109 is supplied.
- the possibly highly mixed baseband signal of the digital baseband generator unit 106 is fed to a digital adder unit purple or a digital adder unit 111b via a switch unit 110a or a second switch unit 110b.
- the output signal of the baseband units 102a and 102b or the adder units purple and 111b is fed to a fading unit 113a or 113b which applies fading (variable fading) to the baseband signal.
- the functions of the fading units 113a and 113b for example the number, the time delay and the attenuation of the signal delay paths implemented in the fading unit, can be defined by the user.
- the fading units 113a and 113b are each connected via an adder unit 114a and 114b to a noise unit 115a and 115b, respectively.
- the noise units 115a, 115b apply a user-definable noise signal to the baseband signal, for example the type of noise and the level of the noise signal generated by the noise unit 115a, 115b can be selected by the user.
- the output signals of the fading units 113a, 113b can also be added and supplied to one of the two noise units 115a or 115b become.
- the I / Q output signals at the output of the Noise units 115a and 115b can be coupled out at sockets 117a and 118a or 117b and 118b.
- the output signals of the noise units 117a and 117b can be supplied via adder and switching units 119a and 119b I / Q modulators 120a and 120b.
- I / Q modulators 120a and 120b there is a possibility via a switching unit 121 to add the output signals of the noise units 115a and 115b and to supply them to one of the two I / Q modulators 120a and 120b.
- the I / Q modulator 120a, 120b can be operated in such a way that it generates a burst sequence and the active bursts or the levels of the active bursts can be selected by the users.
- the I / Q modulators 120a and 120b are each connected to a high-frequency unit 122a and 122b, respectively, and the high-frequency signal can be taken from a socket 123a or 123b.
- the output frequency or a plurality of output frequencies of the high-frequency unit 122a and 122b which have been jumped in using the frequency hopping method can be selected by the user.
- signal display 124 which can be connected to the output of the noise unit 115a or the noise unit 115b in the exemplary embodiment via switching units 125a or 125b.
- the display device 124 can be connected directly to the outputs of the baseband units 102a and 102b.
- the signal display 124 enables, for example, the representation of the constellation diagram so that the user can check the mode of operation of the switched signal path.
- bit error rate tester (BERT) 126 is provided, the input socket 127 of which can be supplied with a signal from the device under test (DUT), the bit error rate of the signal being able to be taken from the output socket 128.
- DUT device under test
- Further functional units may also be present and further combination variants of the functional units may be possible, which are not shown due to the clarity.
- All functional units 102a, 102b, 106, 108, 109, 110a, 110b, purple, 111b, 112a, 112b, 113a, 113b, 114a, 114b, 115a, 115b, 116, 119a, 119b, 120a, 120b, 121, 122a, 122b, 124 and 126 are connected to a control device 128a, for example a CPU, via a control bus 129, the connection of which to the functional units is identified by the symbol (*).
- the control unit 128a controls the interconnection and function of the individual functional units desired by the user.
- the current connection of the functional units is shown on a display device (a display) 129a, which can be located together with the operating elements 130 on the front of the signal generator 100.
- a graphical function block is assigned to each functional unit and the connection of the functional units is represented on the display device 129 by means of corresponding connecting elements which connect the functional blocks to one another.
- the selection of the connections of the function blocks and the selection of the functions of the function blocks takes place either by means of a rotary knob 131 and / or corresponding control buttons 132 or via a movable positioning element 133 (mouse).
- the functional units are interchangeable or can be variably added and omitted, so that the signal generator 100 can be configured with different performance, the performance depending on the functional properties of the functional units.
- the functional properties of the baseband units 102a, 102b are characterized by the number of encodable standards, for example GSM, EDGE, W-CDMA, COFDM for wireless LAN etc.
- the functional properties of the fading units 113a, 113b can be characterized by the number of delay channels, each delay channel requiring additional memory and thus causing additional costs. Depending on the desired performance, a fading unit with a different number of delay channels can therefore be used in the signal generator 100.
- the functional characteristic of the noise units 117a, 117b can be characterized by the number of types of noise that can be emulated (thermal noise, white noise, l / f noise, etc.).
- the functional properties of the I / Q modulators 120a, 120b can be characterized by the bandwidth and / or the linear dynamic range and / or the i / Q imbalance and further parameters characterizing the quality of the I / Q modulators.
- the functional properties of the high-frequency units 122a, 122b can be characterized by the bandwidth and / or the linear dynamic range and / or the output power.
- the measuring device 1 is a vector network analyzer 200.
- the exemplary embodiment of a 2-port network analyzer is shown. It should be emphasized here that the concept according to the invention in vectorial network analyzers is not limited to 2-port network analyzers, but is straight Particularly suitable for multi-port network analyzers with more than two measuring ports.
- a separate excitation / reception unit 202 x or 202 2 is present at each gate T1, T2 of the network analyzer 200.
- Each excitation / reception unit 202 x or 202 2 has a signal generator SOI or S02 with which the test object DUT can be subjected to an excitation signal. Either only one of the two signal generators SOI or S02 can be active, or both signal generators SOI and S02 can each send out an excitation signal.
- the test object is a 2-port, for example a bandpass, an amplifier, a damping circuit or the like.
- Each of the two gates of the DUT is connected to one of the two gates T1 and T2 of the network analyzer 200 via a measuring line 203 x or 203 2 .
- the signal generators SOI and S02 are each connected via a variable attenuator 203 x or 203 2 and an amplifier 204 x or 204 to a signal distributor (signal splitter) 205- L or 205 2 .
- a signal branch 206 x or 206 2 is connected via a bridge (directional coupler) 207-, ⁇ or 207 2 to the associated gate T1 or T2.
- the other branch 208 x or 208 2 is connected to a mixer 210 x or 210 2 of a first receiving device 209 x or 209 2 of the respective excitation / reception unit 202 x or 202 2 .
- the first receiving device 209 x or 209 2 thus receives the excitation signal when the associated signal generator SOI or S02 is active.
- the mixer 210 x or 210 2 is supplied with an oscillator signal which is generated by an internal oscillator L01 or L02 of the respective excitation / reception unit 202., ⁇ or 202 2 and the mixer 210- L or 210 2 via a signal distributor (signal splitter) 211- L and 211 2 and an amplifier 212 x or 212 2 is supplied.
- the same oscillator LO1 or L02 supplies the signal distributor 211 x or 211 2 and a corresponding amplifier 213 x or 213 2 to a mixer 214- L or 214 2 of a second receiving device 215 x or 215 2 via the other signal branch of the respective excitation / reception unit 202 x or 202 2 .
- the mixer 214 x or 214 2 is connected via an insulation amplifier 216. ⁇ or 216 2 and the bridge 207 x or 207 2 with the associated gate T1 or T2.
- the second receiving device 215 x thus receives the signal received by the associated gate T1, reflected by the test object to the gate T1 or transmitted by the test object DUT from the gate T1 to the gate T2.
- the second receiving device 215 2 of the excitation / reception unit 202 2 receives the signal reflected by the measurement object DUT to the gate T2 or transmitted by the measurement object DUT from the gate T1 to the gate T2.
- Mixers 210, ⁇ and 214 x of the first excitation / reception unit 202 !
- the intermediate frequencies f IF1 and f IF2 are not necessarily identical.
- the x or of the mixers 210 210 2 generated intermediate frequency IF reference signal Ref 1 and Ref 2 and the IF and 214 x 2 intermediate-frequency IF measurement signal produced Meas 1 Meas 2 or IF by the mixers 214 is an analog / digital - Converter 217 supplied, which is connected to a signal evaluation and control unit 218.
- the reference signals and the measurement signals are evaluated in this.
- the signal evaluation and control unit 218 also controls the signal generators SOI and S02 and the oscillators LO1 and L02 via control lines 219, 220, 221 and 222 so that they generate a signal with a predetermined frequency f S01 , f Ou f so2 and f L02 and with a predetermined phase ⁇ i ' ⁇ ⁇ i' ⁇ so 2 and cp L02 .
- the evaluation and control unit 218 is connected to the adjustable attenuators 203 x and 203 2 via further control lines 223 and 224, so that the signal amplitude of the excitation signal generated by the signal generators SOI and S02 can be controlled. Since the actual amplitudes of the excitation signals are detected via the intermediate frequency reference signals IF Ref 1 and IF Ref 2, a control loop for exact regulation of the excitation amplitude can be formed in this way.
- control lines 219 to 223 can be combined to form a bus system 225, in particular a LAN bus system.
- the individual functional units are interchangeable or can be added and omitted, the network analyzer 200 being configurable with the functional units whose functional properties have a different accuracy and / or a different one Quality and / or have a different range of functions.
- the functional units consist of the different excitation / reception units 202 x or 202 2 .
- the number of excitation / reception units equipped determines the number of ports of the network analyzer 200. If only 2-port measurement objects are to be measured (e.g. amplifiers, attenuators, cables, etc.), a 2-port network analyzer is sufficient. If, for example, this network analyzer is used in production and is always to measure the same 2-port measurement objects, it would be nonsensical to equip the network analyzer with more than two excitation / reception units. In the case of another measuring task, it may well be the case that multi-port objects, for example crossovers, directional couplers, etc., must be measured.
- a further freedom of variation consists in the sweep bandwidth, the linear dynamic range and / or the input sensitivity of the excitation / reception units, i.e. Different excitation / reception units can be offered which have a differently high performance and, depending on the measurement task, several excitation / reception units with different performance can be combined. For example, if an amplifier is always to be excited with the same input signal at the same level, it would make no sense to use an excitation / reception unit with high dynamics of the output level. However, if the output of the same amplifier is to be measured and the gain factor has a clear frequency response, it is important that the excitation / reception unit, which is connected to the output of the amplifier to be measured, has a high input dynamic range and possibly a high one Has input sensitivity.
- the invention is not restricted to the exemplary embodiments described above. Rather, these serve only to illustrate the invention.
- the invention can be used in a large number of measuring and testing devices with different measuring tasks.
Abstract
Description
Claims
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10337913.4A DE10337913B4 (en) | 2003-08-18 | 2003-08-18 | Measuring or testing device with exchangeable functional units |
PCT/EP2004/008536 WO2005019847A1 (en) | 2003-08-18 | 2004-07-29 | Measuring or test device comprising interchangeable functional units |
Publications (1)
Publication Number | Publication Date |
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EP1656565A1 true EP1656565A1 (en) | 2006-05-17 |
Family
ID=34201640
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP04763628A Ceased EP1656565A1 (en) | 2003-08-18 | 2004-07-29 | Measuring or test device comprising interchangeable functional units |
Country Status (5)
Country | Link |
---|---|
US (1) | US7444250B2 (en) |
EP (1) | EP1656565A1 (en) |
JP (2) | JP2007502968A (en) |
DE (1) | DE10337913B4 (en) |
WO (1) | WO2005019847A1 (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10337913B4 (en) | 2003-08-18 | 2017-01-05 | Rohde & Schwarz Gmbh & Co. Kg | Measuring or testing device with exchangeable functional units |
JP2008005402A (en) * | 2005-08-25 | 2008-01-10 | Yokogawa Electric Corp | Testing device |
DE102007019543A1 (en) * | 2007-04-25 | 2008-10-30 | Rohde & Schwarz Gmbh & Co. Kg | Measuring device with serial digital interface |
DE102011084143A1 (en) * | 2011-10-07 | 2013-04-11 | Rohde & Schwarz Gmbh & Co. Kg | Measurement software supported measuring system and measuring method |
CN102749511B (en) | 2012-06-12 | 2015-08-12 | 大唐移动通信设备有限公司 | Distributed frequency spectrum analyser and apply the method that it carries out spectrum analysis |
DE102012217726B4 (en) | 2012-09-28 | 2014-11-20 | Rohde & Schwarz Gmbh & Co. Kg | Measuring device and measuring method with coupled representation |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
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US20030074489A1 (en) * | 2001-08-14 | 2003-04-17 | Steger Perry C. | Measurement system with modular measurement modules that convey interface information |
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DE2544329B2 (en) | 1975-10-03 | 1978-07-27 | Kathrein-Werke Kg, 8200 Rosenheim | Selective level meter for amplitude and frequency modulated signals as antenna measurement receiver |
JPS62274220A (en) * | 1986-05-23 | 1987-11-28 | Iwatsu Electric Co Ltd | Measuring instrument |
US5059892A (en) * | 1990-10-15 | 1991-10-22 | Hewlett-Packard Company | Radio frequency signal interface |
US5162723A (en) * | 1991-02-11 | 1992-11-10 | Hewlett-Packard Company | Sampling signal analyzer |
US5566088A (en) * | 1994-06-13 | 1996-10-15 | Motorola, Inc. | Modular radio test system and method |
JPH08241185A (en) | 1994-11-03 | 1996-09-17 | Motorola Inc | Integrated testing and measuring means as well as method foradoption of graphical user interface |
US5642039A (en) * | 1994-12-22 | 1997-06-24 | Wiltron Company | Handheld vector network analyzer |
JPH08248070A (en) * | 1995-03-08 | 1996-09-27 | Anritsu Corp | Frequency spectrum analyzer |
US6112067A (en) * | 1996-03-27 | 2000-08-29 | Anritsu Corporation | Radio communication analyzer suited for measurement of plurality of types of digital communication systems |
JP3294759B2 (en) * | 1996-03-27 | 2002-06-24 | アンリツ株式会社 | Spectrum analyzer |
JPH11118884A (en) | 1997-10-10 | 1999-04-30 | Advantest Corp | Testing system and method for controlling the same |
JP2001099877A (en) * | 1999-09-28 | 2001-04-13 | Ando Electric Co Ltd | Frequency spectrum analyzing method and frequency spectrum analyzer |
US6615148B2 (en) * | 2000-05-17 | 2003-09-02 | Tektronix, Inc. | Streaming distributed test and measurement instrument |
US6515276B2 (en) * | 2001-03-17 | 2003-02-04 | Agilent Technologies, Inc. | Heterodyne optical spectrum analyzer with provisions for intensity noise subtraction |
DE10124371A1 (en) * | 2001-05-18 | 2002-11-21 | Rohde & Schwarz | Measurement unit, especially a signal generator has a number of function units that can be connected in different manners and a control unit that determines their connections and represents them on a graphical display |
DE10337913B4 (en) | 2003-08-18 | 2017-01-05 | Rohde & Schwarz Gmbh & Co. Kg | Measuring or testing device with exchangeable functional units |
-
2003
- 2003-08-18 DE DE10337913.4A patent/DE10337913B4/en not_active Expired - Lifetime
-
2004
- 2004-07-29 US US10/569,326 patent/US7444250B2/en active Active
- 2004-07-29 JP JP2006523555A patent/JP2007502968A/en active Pending
- 2004-07-29 EP EP04763628A patent/EP1656565A1/en not_active Ceased
- 2004-07-29 WO PCT/EP2004/008536 patent/WO2005019847A1/en active Application Filing
-
2010
- 2010-12-01 JP JP2010268438A patent/JP2011107145A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030074489A1 (en) * | 2001-08-14 | 2003-04-17 | Steger Perry C. | Measurement system with modular measurement modules that convey interface information |
Also Published As
Publication number | Publication date |
---|---|
JP2011107145A (en) | 2011-06-02 |
JP2007502968A (en) | 2007-02-15 |
DE10337913A1 (en) | 2005-03-17 |
US20070021934A1 (en) | 2007-01-25 |
US7444250B2 (en) | 2008-10-28 |
WO2005019847A1 (en) | 2005-03-03 |
DE10337913B4 (en) | 2017-01-05 |
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