EP1642328A1 - Pieges destines a pieger des particules dans des chambres de depot - Google Patents

Pieges destines a pieger des particules dans des chambres de depot

Info

Publication number
EP1642328A1
EP1642328A1 EP04751945A EP04751945A EP1642328A1 EP 1642328 A1 EP1642328 A1 EP 1642328A1 EP 04751945 A EP04751945 A EP 04751945A EP 04751945 A EP04751945 A EP 04751945A EP 1642328 A1 EP1642328 A1 EP 1642328A1
Authority
EP
European Patent Office
Prior art keywords
projections
component
ring
region
pvd
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP04751945A
Other languages
German (de)
English (en)
Inventor
Jaeyeon Kim
Terry J. Phelan
John D. Mize
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honeywell International Inc
Original Assignee
Honeywell International Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell International Inc filed Critical Honeywell International Inc
Publication of EP1642328A1 publication Critical patent/EP1642328A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/564Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4401Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/02Details
    • H01J2237/022Avoiding or removing foreign or contaminating particles, debris or deposits on sample or tube

Abstract

La présente invention comprend des appareils de dépôt possédant des chambres de réaction et des éléments de piégeage de particules formés le long d'une ou de plusieurs surfaces à l'intérieur de ces chambres. Dans des aspects particuliers de cette invention, les éléments de piégeage de particules peuvent comprendre une structure de projections recourbées formant des réceptacles et, peut comprendre des microstructures sur ces projections recourbées. Cette invention concerne aussi des procédés de formation d'éléments de piégeage de particules qui commencent par la formation d'une structure de projection, l'incurvation de ces projections puis, l'exposition de ces projections aux particules de façon à former des microstructures sur ces projections recourbées.
EP04751945A 2003-06-11 2004-05-11 Pieges destines a pieger des particules dans des chambres de depot Withdrawn EP1642328A1 (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US47781003P 2003-06-11 2003-06-11
US49803603P 2003-08-26 2003-08-26
PCT/US2004/014800 WO2005001918A1 (fr) 2003-06-11 2004-05-11 Pieges destines a pieger des particules dans des chambres de depot

Publications (1)

Publication Number Publication Date
EP1642328A1 true EP1642328A1 (fr) 2006-04-05

Family

ID=33555476

Family Applications (1)

Application Number Title Priority Date Filing Date
EP04751945A Withdrawn EP1642328A1 (fr) 2003-06-11 2004-05-11 Pieges destines a pieger des particules dans des chambres de depot

Country Status (4)

Country Link
EP (1) EP1642328A1 (fr)
KR (1) KR20060023115A (fr)
TW (1) TW200508409A (fr)
WO (1) WO2005001918A1 (fr)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7374648B2 (en) * 2004-06-28 2008-05-20 Honeywell International Inc. Single piece coil support assemblies, coil constructions and methods of assembling coil constructions
WO2007084114A2 (fr) 2005-01-12 2007-07-26 New York University Systeme et procede de traitement de nanofils avec des pinces optiques holographiques
EP3254305B1 (fr) * 2015-02-06 2023-05-10 Applied Materials, Inc. Composants de chambre imprimés par impression 3d configurés pour une contrainte de film plus faible et une température de fonctionnement plus basse
US11569069B2 (en) 2015-02-06 2023-01-31 Applied Materials, Inc. 3D printed chamber components configured for lower film stress and lower operating temperature
JP2018523013A (ja) * 2015-07-23 2018-08-16 ハネウェル・インターナショナル・インコーポレーテッドHoneywell International Inc. 改良されたスパッタリングコイル製品及び製造方法
WO2019007488A1 (fr) * 2017-07-04 2019-01-10 Cleanpart Group Gmbh Composant de chambre de traitement et procédé de formation d'une texture de surface
US11183373B2 (en) 2017-10-11 2021-11-23 Honeywell International Inc. Multi-patterned sputter traps and methods of making
US11739411B2 (en) 2019-11-04 2023-08-29 Applied Materials, Inc. Lattice coat surface enhancement for chamber components

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5474649A (en) * 1994-03-08 1995-12-12 Applied Materials, Inc. Plasma processing apparatus employing a textured focus ring
US5942041A (en) * 1996-09-16 1999-08-24 Mosel-Vitelic, Inc. Non-sticking semi-conductor wafer clamp and method of making same
US6277194B1 (en) * 1999-10-21 2001-08-21 Applied Materials, Inc. Method for in-situ cleaning of surfaces in a substrate processing chamber

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See references of WO2005001918A1 *

Also Published As

Publication number Publication date
TW200508409A (en) 2005-03-01
KR20060023115A (ko) 2006-03-13
WO2005001918A1 (fr) 2005-01-06

Similar Documents

Publication Publication Date Title
US20040206804A1 (en) Traps for particle entrapment in deposition chambers
EP1552033B1 (fr) Procedes de traitement de regions non pulverisees de structures cibles de pvd pour former des pieges a particules et structures cibles de pvd comprenant des saillies le long d'une region non pulverisee
US6699375B1 (en) Method of extending process kit consumable recycling life
US7993470B2 (en) Fabricating and cleaning chamber components having textured surfaces
US7732056B2 (en) Corrosion-resistant aluminum component having multi-layer coating
US20040099285A1 (en) Method of cleaning a coated process chamber component
TWI259502B (en) Cleaning process residues on a process chamber component
US20070056688A1 (en) Methods of treating deposition process components to form particle traps, and deposition process components having particle traps thereon
EP1642328A1 (fr) Pieges destines a pieger des particules dans des chambres de depot
KR20100114901A (ko) 변형된 스퍼터링 타겟 및 증착 구성요소, 이의 제조방법 및 용도
JP4785834B2 (ja) 半導体被覆基板の製造方法
WO2005077677A1 (fr) Constituants de depot physique en phase vapeur, et procedes de traitement de constituants
US8097089B2 (en) Methods for cleaning process kits and chambers, and for ruthenium recovery
JP4999264B2 (ja) 薄膜製造装置及びその製造方法
EP1682689A2 (fr) Procedes permettant de traiter les composants d'un processus de depot afin de former des pieges a particules, et composants de processus de depot munis de pieges a particules
KR101190804B1 (ko) 플라즈마처리방법
CN1806316A (zh) 沉积室中用于捕集粒子的阱
US6291358B1 (en) Plasma deposition tool operating method
KR100520502B1 (ko) 공정 챔버의 세정 방법
TW202338153A (zh) 經由臭氧處理用於處理腔室部件的先進阻障氧化鎳(BNiO)塗佈發展
TW202340528A (zh) 用於處理腔室部件的先進阻障氧化鎳(BNiO)塗佈發展
JP2021535277A (ja) コーティングal含有コーティングの剥離

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

17P Request for examination filed

Effective date: 20060105

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): DE FR GB

DAX Request for extension of the european patent (deleted)
RBV Designated contracting states (corrected)

Designated state(s): DE FR GB

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN

18D Application deemed to be withdrawn

Effective date: 20081202