EP1642328A1 - Pieges destines a pieger des particules dans des chambres de depot - Google Patents
Pieges destines a pieger des particules dans des chambres de depotInfo
- Publication number
- EP1642328A1 EP1642328A1 EP04751945A EP04751945A EP1642328A1 EP 1642328 A1 EP1642328 A1 EP 1642328A1 EP 04751945 A EP04751945 A EP 04751945A EP 04751945 A EP04751945 A EP 04751945A EP 1642328 A1 EP1642328 A1 EP 1642328A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- projections
- component
- ring
- region
- pvd
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/02—Details
- H01J2237/022—Avoiding or removing foreign or contaminating particles, debris or deposits on sample or tube
Abstract
La présente invention comprend des appareils de dépôt possédant des chambres de réaction et des éléments de piégeage de particules formés le long d'une ou de plusieurs surfaces à l'intérieur de ces chambres. Dans des aspects particuliers de cette invention, les éléments de piégeage de particules peuvent comprendre une structure de projections recourbées formant des réceptacles et, peut comprendre des microstructures sur ces projections recourbées. Cette invention concerne aussi des procédés de formation d'éléments de piégeage de particules qui commencent par la formation d'une structure de projection, l'incurvation de ces projections puis, l'exposition de ces projections aux particules de façon à former des microstructures sur ces projections recourbées.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US47781003P | 2003-06-11 | 2003-06-11 | |
US49803603P | 2003-08-26 | 2003-08-26 | |
PCT/US2004/014800 WO2005001918A1 (fr) | 2003-06-11 | 2004-05-11 | Pieges destines a pieger des particules dans des chambres de depot |
Publications (1)
Publication Number | Publication Date |
---|---|
EP1642328A1 true EP1642328A1 (fr) | 2006-04-05 |
Family
ID=33555476
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP04751945A Withdrawn EP1642328A1 (fr) | 2003-06-11 | 2004-05-11 | Pieges destines a pieger des particules dans des chambres de depot |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP1642328A1 (fr) |
KR (1) | KR20060023115A (fr) |
TW (1) | TW200508409A (fr) |
WO (1) | WO2005001918A1 (fr) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7374648B2 (en) * | 2004-06-28 | 2008-05-20 | Honeywell International Inc. | Single piece coil support assemblies, coil constructions and methods of assembling coil constructions |
WO2007084114A2 (fr) | 2005-01-12 | 2007-07-26 | New York University | Systeme et procede de traitement de nanofils avec des pinces optiques holographiques |
EP3254305B1 (fr) * | 2015-02-06 | 2023-05-10 | Applied Materials, Inc. | Composants de chambre imprimés par impression 3d configurés pour une contrainte de film plus faible et une température de fonctionnement plus basse |
US11569069B2 (en) | 2015-02-06 | 2023-01-31 | Applied Materials, Inc. | 3D printed chamber components configured for lower film stress and lower operating temperature |
JP2018523013A (ja) * | 2015-07-23 | 2018-08-16 | ハネウェル・インターナショナル・インコーポレーテッドHoneywell International Inc. | 改良されたスパッタリングコイル製品及び製造方法 |
WO2019007488A1 (fr) * | 2017-07-04 | 2019-01-10 | Cleanpart Group Gmbh | Composant de chambre de traitement et procédé de formation d'une texture de surface |
US11183373B2 (en) | 2017-10-11 | 2021-11-23 | Honeywell International Inc. | Multi-patterned sputter traps and methods of making |
US11739411B2 (en) | 2019-11-04 | 2023-08-29 | Applied Materials, Inc. | Lattice coat surface enhancement for chamber components |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5474649A (en) * | 1994-03-08 | 1995-12-12 | Applied Materials, Inc. | Plasma processing apparatus employing a textured focus ring |
US5942041A (en) * | 1996-09-16 | 1999-08-24 | Mosel-Vitelic, Inc. | Non-sticking semi-conductor wafer clamp and method of making same |
US6277194B1 (en) * | 1999-10-21 | 2001-08-21 | Applied Materials, Inc. | Method for in-situ cleaning of surfaces in a substrate processing chamber |
-
2004
- 2004-05-11 KR KR1020057019973A patent/KR20060023115A/ko not_active Application Discontinuation
- 2004-05-11 EP EP04751945A patent/EP1642328A1/fr not_active Withdrawn
- 2004-05-11 WO PCT/US2004/014800 patent/WO2005001918A1/fr active Search and Examination
- 2004-05-21 TW TW093114538A patent/TW200508409A/zh unknown
Non-Patent Citations (1)
Title |
---|
See references of WO2005001918A1 * |
Also Published As
Publication number | Publication date |
---|---|
TW200508409A (en) | 2005-03-01 |
KR20060023115A (ko) | 2006-03-13 |
WO2005001918A1 (fr) | 2005-01-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 20060105 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): DE FR GB |
|
DAX | Request for extension of the european patent (deleted) | ||
RBV | Designated contracting states (corrected) |
Designated state(s): DE FR GB |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20081202 |